Abstract: A method and a device for supervising the sensitivity of a protection function in an electrical power system including a metering device for measuring values of a feature, said protection function being configured to initialize an action based on a test value and a threshold value for the feature, wherein said test value is either a measured value or derived from the said measured values, the device includes a computing unit configured to receive the test values and, repeatedly during the operation of the protection function, to calculate a mean value and a deviation of the test values, to determine the probability of a false action based on the calculated mean value, the threshold value and the calculated deviation, and to indicate that the sensitivity is too high when the probability of a false action exceeds a first limit value for the probability of a false action.

Abstract: Provided is a transfer characteristic measurement apparatus that measures a transfer characteristic of a circuit under test between input and output, comprising a test signal input section that generates a test signal by adding together a carrier signal having a prescribed frequency and an additional signal having a frequency that differs from the prescribed frequency, and inputs the test signal to the circuit under test; and a transfer characteristic measuring section that measures the transfer characteristic of the circuit under test at the frequency of the additional signal based on a result from a measurement of an output signal output by the circuit under test. The circuit under test may be formed on a semiconductor chip. The circuit under test may correct a signal input to the semiconductor chip, and outputs the corrected signal. The semiconductor chip may further include a sampling circuit that samples the output signal of the circuit under test at the frequency of the carrier signal.

Abstract: A method of directly measuring hydrogen permeability of a film is provided. The method of evaluating a film includes acquiring, with respect to a specimen including a plurality of films stacked on each other, ion dose-dependence data of intensity of ?-beam generated by hydrogen resonant nuclear reaction, and fitting the data with a functional equation of the ion dose.

Abstract: In one embodiment, a method for testing a cable includes receiving a read-signal profile read at a receiving-end of a cable upon an initial test signal being input to a sending end of the cable, calculating a cross-correlation function between the read-signal profile and a matched filter output, and determining a peak value of the cross-correlation function. In another embodiment, a system includes a device, the device including logic for receiving a read-signal profile read at a receiving-end of the cable upon an initial test signal being input to a sending end of the cable, logic for calculating a cross-correlation function between the read-signal profile and a matched filter output, logic for determining a peak value of the cross-correlation function, and logic for storing the peak value to a computer readable medium. Other methods, systems, and computer program products are also described according to various embodiments.

Abstract: An evaluation apparatus for evaluating a transfer characteristic of a controlled object of a controller is disclosed. The evaluation apparatus includes a response detection section that detects an input/output response of a control system, based on a signal detected in the control system. The control system includes the controller and the controlled object. The evaluation apparatus further includes a transfer characteristic calculating section that calculates the transfer characteristic of the controlled object, based at least on the input/output response.

Abstract: A method for obtaining at least one calibration filter for a Mass Spectrometry (MS) instrument system. Measured isotope peak cluster data in a mass spectral range is obtained for a given calibration standard. Relative isotope abundances and actual mass locations of isotopes corresponding thereto are calculated for the given calibration standard. Mass spectral target peak shape functions centered within respective mass spectral ranges are specified. Convolution operations are performed between the calculated relative isotope abundances and the mass spectral target peak shape functions to form calculated isotope peak cluster data. A deconvolution operation is performed between the measured isotope peak cluster data and the calculated isotope peak cluster data after the convolution operations to obtain the at least one calibration filter. Provisions are made for normalizing peak widths, combining internal and external calibration, and using selected measured peaks as standards.

Abstract: A periodic broadband signal can be used to determine the S21 measurement for a channel by stimulating the channel across a spectrum of interest. The channel response to such broadband signal can be measured from undersampled data captured at the receiver. The Fourier transform of the broadband signal as received, divided by the Fourier transform of broadband signal as transmitted, constitutes the S21. A physically contiguous IC can integrate both a receiver circuit, at which S21 is to be measured, along with an undersampler for sampling the received broadband signal. To maximize signal to noise, a pattern for the broadband signal can be selected to maximize the minimum power across the spectrum of interest. A pattern generator for the broadband signal can be integrated on the same physically contiguous IC with a multiplexer that can select either the pattern generator, or a typical source of data, for transmission into the channel.

Abstract: An apparatus for measuring s-parameters using as few as one pulser and two samplers is described. The apparatus calibrates itself automatically using the internal calibration standards.

Abstract: A quantum state transfer system device comprises transmitting device that measures an input qubit and a first qubit array that includes not less than three qubits; and a receiving device that selects in accordance with the measurement result a qubit as an output qubit from among qubits included in a second qubit array that includes not less than three qubits and is quantum-mechanically entangled with the first qubit array.

Abstract: Methods and apparatuses for determining the depth and concentration of fluorophores in a turbid medium are disclosed. The method advantageously provides for a rapid estimation of the depth of the fluorophore using characteristics of a temporal point spread function. The concentration of the fluorophore can be determined using the method of the present invention by combining a calculated depth of the fluorophore with a measurement of the intensity of the emitted fluorescence. The intensity can be accurately measured by the apparatus disclosed herein which combine back-reflection and trans-illumination geometries for the source of light injecting and detection.

Abstract: A method, circuit, and computer program product for receiving a first intermediate signal that is at least partially based upon a first reference signal. A second intermediate signal is received that is a time-shifted version of the first intermediate signal. An output signal is generated that is based upon the difference between the first intermediate signal and the second intermediate signal. An anticipated differential change in the output signal is determined, the anticipated differential change to occur based upon a transition in the first reference signal. A realized differential change in the output signal is measured, the realized differential change occurring based upon a transition in the first reference signal. The realized differential change in the output signal is compared to the anticipated differential change in the output signal to determine a nonlinearity indicator.

Abstract: A system for collecting frequency response data from a generator system including: applying a perturbing signal to a signal input of an exciter system for a synchronous generator; collecting data regarding signal output from a multiplicity of signal points in the exciter system; transforming the collected data to predict a signal response at a signal output in the system different from the signal points used for collecting data, and analyzing the frequency response of the system.

Abstract: A method is provided for preventing islanding of a power source connected to an electric AC grid via an interface. The method senses an output voltage waveform of the interface, controls an output current waveform of the interface to track a reference current waveform having a mathematical relationship with the sensed output voltage waveform, and discontinues the output current waveform when the output voltage waveform is sensed to be outside a predetermined waveform range.

Abstract: A method is provided to improve the usability of Design-For-Testability Synthesis (DFTS) tools and to increase the design process productivity. The method comprises receiving a list of testability and design impact analysis functions, to be performed on the circuit, also referred to as a device under test (DUT). The impact analysis leads to the creation of logical transformations, which can be selected by a user with one or more available transformation methods from a list including, but not limited to, boundary scan test logic insertion, scan test logic insertion, memory BIST (built-in-self-test) logic insertion, and logic BIST logic insertion, and scan test data compression insertion logic insertion.

Abstract: A system and method for detecting the absence of contact between the hands of a driver of a vehicle and a steering wheel of the vehicle that have particular application in ensuring the proper functioning of various components of the driver assist steering systems and maintaining driver attentiveness. The method for detecting a no-contact condition between the hands of the driver of the vehicle and the steering wheel includes generating a model of the no-contact condition using a second-order transfer function. The method further includes obtaining a set of model-generated steering dynamics by estimating a plurality of parameters of the second-order transfer function and a set of measured steering dynamics using a plurality of sensors. The set of model-generated steering dynamics and the set of measured steering dynamics are then compared and the no-contact condition is detected based on this comparison.

Abstract: Various methods, designs, defect review tools, and systems for determining locations on a wafer to be reviewed during defect review are provided. One computer-implemented method includes acquiring coordinates of defects detected by two or more inspection systems. The defects do not include defects detected on the wafer. The method also includes determining coordinates of the locations on the wafer to be reviewed during the defect review by translating the coordinates of the defects into the coordinates on the wafer such that results of the defect review performed at the locations can be used to determine if the defects cause systematic defects on the wafer.

Abstract: The present invention relates to apparatus rating solar units and to a method for rating solar units that comprises multiple acquisition of at least one input parameter and a corresponding multiple acquisition of at least one output parameter in acquisition intervals, at least one acquisition interval being varied for purposes of subsequently acquiring at least one output parameter as a function of the minimum of one acquired input parameter. The invention also relates to a solar unit, to a computer program and to a computer program product with means implementing the rating method.

Abstract: A target turning angle calculation part 51 calculates a target turning angle ? on the basis of a steering angle ? and a vehicle speed V. A correction turning angle calculation part 52 calculates a transfer function K(s) which is a second transfer function, depending on the vehicle speed V, by using a difference between a transfer function G(s) which is a first transfer function determined on the basis of the specification of the vehicle and a stationary component G(0) of the transfer function G(s), the first transfer function having as an input a turning angle ? and as an output a yaw rate ? of the vehicle, the second transfer function having as an input a target turning rate ?*? obtained by temporally differentiating the target turning angle ?* and as an output a correction turning angle ?c. The correction turning angle calculation part 52 calculates a correction turning angle ?c by multiplying the transfer function K(s) by the target turning rate ?*?.

Abstract: A method for implementing program execution integrity (PEI) for a communication-based sensor includes receiving an output communication message from the sensor, the output communication message including sensor output data internally processed within the sensor. The output communication message further includes raw data used by the sensor in internally processing the sensor output data. The raw data is independently processed, and the results thereof are compared with the internally processed sensor output data so as to verify the processing integrity of the sensor to a desired tolerance.

Abstract: A method and a device for determining a reaction signal for a selected location in an information processing system (2) following the effect of at least one input signal (XIn) on the information processing system (2) over an application period T, wherein at least the following method steps are performed: a) application of the input signal (XIn) or of the input signals to the information processing system (2), b) detection of at least one output signal (YOut) associated with a selected location in the information processing system, wherein the output signal is brought about as a reaction to the effect of the input signal (XIn) or of the input signals, c) formation of a value set, preferably formation of a triple value set (XIn, YOut, Zt), from the input and output signals for the selected location, wherein each given time (Zt) of application in the application period T is respectively assigned an output signal (YOut) for the selected location and an input signal (XIn), and d) determination of the reaction sig

Abstract: In a method of estimating one of mechanical supporting states of a housing for an electronic apparatus, a drive signal is supplied to an oscillation device from which first oscillation is applied to the housing. A sensor detects a second oscillation transferred through the housing in response to the first oscillation to generate an oscillation signal, and a measurement response characteristic is obtained based on the drive signal and the oscillation signal, and is compared with reference response characteristics which are correlated with the mechanical supporting states, respectively, to estimate one of the mechanical supporting states of the housing.

Abstract: In order to determine various operational parameters of a power amplifier (for example, a complex load impedance or a complex forward and return power or a reflection factor or a voltage standing wave ratio) on a connecting line between an output of the power amplifier and a complex load, complex analog forward and return voltages on the connecting line are determined by an analog coupling device. These analog voltages are digitized and converted down into a baseband by one or more digital down-converters. From these digital values corresponding in absolute value and phase to the complex forward and return voltages and present in the baseband, desired operational parameters may then be calculated by a computer.

Abstract: Embodiments of the present invention provide a method for generating write and read commands used to test hardware device models. The method is able to generate multiple write commands to a location without having to generate intervening read commands to validate the data. In addition, the method enables read commands to be generated in a different sequence from the sequence of generated write commands, having different sizes than the sizes of the write commands, and that maximize the amount of data read (verified) and minimize the amount of unnecessary reads (re-verification).

Abstract: The invention is an apparatus and method including hardware and software, which allows collecting and analyzing data to obtain information about mechanical properties of soft materials in a much faster way. The apparatus can be used as a stand-alone device or an add-on to the existing AFM device. The apparatus allows collecting dynamical measurements using a set of multiple frequencies of interest at once, in one measurement instead of sequential, one frequency in a time, measurements.

Abstract: A method of verifying a digital design is disclosed. The method comprises generating a reference model for a first digital design and creating an operational model for a second digital design, wherein the first digital design and the second digital design are intended to have a same logical function. A plurality of testcase types are then created by constraining one or more internal signals, and one or more test scripts representing the plurality of testcase types are produced. The method also includes verifying the second digital design with a testing simulation program by comparing results of the test scripts from the operational model and the reference model.

Abstract: A system and method is disclosed for assessing a probability of failure of operation of a semiconductor wafer. The method includes inputting risk factor data into a memory and inputting a plurality of wafers into a semiconductor fabrication manufacturing process. A subset of wafers is select to obtain a sample population and at least one region of each wafer of the sample population is inspected. Circuit design data associated with each wafer of the sample population is obtained and one or more defects that present an increased risk to the operation of a particular wafer are identified. The identification is a function of the risk factor data, the inspecting step and the circuit design data. A probability of semiconductor wafer failure is calculated.

Abstract: A method for providing a pattern forecast for an object from a number of objects that are associated with one another, in which the pattern forecast is provided by taking into account consumption series of these associated objects. A device for providing a pattern forecast for an object from a number of objects that are associated with one another, the device being designed to provide the pattern forecast by taking into account consumption series of these associated objects.

Abstract: The present disclosure relates to a system and method for mapping system transfer functions. Accordingly, some operations may include receiving a first intermediate signal that is at least partially based upon a first reference signal. A second intermediate signal is received that is at least partially based upon a second reference signal. An output signal is generated that is based upon the difference between the first intermediate signal and the second intermediate signal. A first anticipated differential change in the output signal is determined, the first anticipated differential change to occur based upon a transition in the first reference signal. A second anticipated differential change in the output signal is determined, the second anticipated differential change to occur based upon a transition in the second reference signal. Numerous other operations are also within the scope of the present disclosure.

Abstract: Data structures and algorithms are provided to automatically generate an analog stimulus to apply to a simulation of the analog DUT. A constraint solver is provided to determine suitable values to use in the stimulus generation. The suitable values are random values within a range of allowed values. For example, a number of different stimuli are generated for successive application to the analog DUT, each with a different magnitude within a range of allowed magnitudes. Data structures and algorithms are provided to monitor analog electrical properties at nodes of the analog DUT. Data structures and algorithms are provided to define constraints on the analog electrical properties and determine whether the constraints were violated. Data structures and algorithms are provided to define simulation coverage conditions in the analog domain and determine whether the defined analog domain coverage conditions have been satisfied.

Abstract: Techniques for bisecting a symmetric, substantially transmissive two-port network (a THRU structure) through an optimization solution of the relevant equations defined by transmission matrix mathematics are described. Bisect de-embedding may be performed using a single substantially symmetric THRU structure, a first half of a first substantially symmetric THRU structure and a second half of a second substantially symmetric THRU structure, and by combining bisect de-embedding with conventionally known de-embedding techniques.

Abstract: A method for operating an integrated circuit tester information processing system includes: measuring current information from test structures for an integrated circuit having a stress liner; forming a transfer curve by simulating based on the current information with a first range of first mobility multipliers; forming an inverse transfer curve by applying an inverse transfer function to the transfer curve; forming a stress curve with second mobility multipliers from the inverse curve; and validating the second mobility multipliers by comparing a measured curve and a simulated curve with the measured curve based on the current information and the simulated curve based on stress curve.

Abstract: A method of testing an electronic circuit is provided. The method comprises radiating a laser beam onto the electronic circuit, and determining a plurality of samples of a response signal output by the electronic circuit during the period when the laser beam is radiated. The method further comprises accumulating the plurality of samples to generate a value, and generating a test result based on the value.

Abstract: The method comprises generating an acoustical volume velocity Q in the listening position, measuring a response quantity p, such as sound or vibration, at a suspected source position resulting from the volume velocity Q, and determining the acoustical transfer impedance Zt as the response quantity p divided by the acoustical volume velocity Q, Zt=p/Q. According to the invention the acoustical volume velocity Q is generated using a simulator (10) simulating acoustic properties of at least a head of a human being, the simulator comprising a simulated human ear (14, 15) with an orifice in the simulated head and a sound source (30) for outputting the acoustical volume velocity Q through the orifice. The output volume velocity Q from the orifice of an ear is estimated from measurements with two microphones inside the corresponding ear canal.

Abstract: A method and an apparatus for testing a power engineering device, for example a high-power transformer, are provided. A test signal is applied to the power engineering device, and this test signal, starting from an initial value, rises steadily and monotonically to a predetermined final value (U0), and retains this final value (U0) over a predetermined time interval.

Abstract: A method for analyzing data from a mass spectrometer including obtaining calibrated mass spectral data involving at least one ion with its isotopes, by processing raw spectral data; obtaining library spectral data which has been processed to form calibrated library data; and performing a regression analysis, preferably using matrix operations, between the calibrated mass spectral data and the calibrated library data; and reporting at least one regression coefficient representative of a relative concentrations of a component in a sample which generated the raw spectral data. The invention is also directed to a mass spectrometer system that operates in accordance with the method, a data library of transformed mass spectra, and a method for producing the data library.

Abstract: A Coriolis mass flow meter and method for compensation of transmission errors of its input circuit, wherein a high accuracy of measurement is achievable by determining the transmission error of the input circuit of at least two input branches on the basis of at least one reference signal, which travels simultaneously through all input branches.

Abstract: A method of identifying a flaw in a part is provided that includes vibrating a part to induce heat. The heat originates in any flaws in the part. A thermal image is obtained using, for example, an infrared camera. A mathematical representation of the thermophysics, such as the heat conduction or thermal energy equations using the boundary element method or finite element method is used to identify a source and an intensity of the heat identified with the thermal image. Using the source and intensity of the heat, flaw characteristics for the part can be determined. The method is employed using an inspection system that includes a vibration device for vibrating the part. An imaging device, such as an infrared camera, measures temperature on the surface of the part. An assumption is made or additional measurements are taken to obtain values for surface flux or surface heat transfer coefficients. A processor communicates with the imaging device for receiving the surface temperature.

Abstract: One embodiment of the present invention provides a system that facilitates high-sensitivity detection of an anomaly in telemetry data from an electronic system using a telemetric impulsional response fingerprint of the telemetry data. During operation, the system applies a sudden impulse step change to one or more operational parameters of the electronic system during operation. Next, the system generates a three-dimensional (3D) telemetric impulsional response fingerprint (TIRF) surface from a dynamic response in the telemetry data to the sudden impulse step change. The system then determines from the 3D TIRF surface whether the telemetry data contains an anomaly.

Abstract: Methods, devices, and systems establish an optical surface shape that mitigates or treats a vision condition in a patient. An optical surface shape for a particular patient can be determined using a set of patient parameters for the specific patient by using a compound modulation transfer function (CMTF). The compound modulation transfer function can include a combination of modulation transfer functions (MTF's) at a plurality of distinct frequencies.

Abstract: In a method of estimating one of mechanical supporting states of a housing for an electronic apparatus, a drive signal is supplied to an oscillation device from which first oscillation is applied to the housing. A sensor detects a second oscillation transferred through the housing in response to the first oscillation to generate an oscillation signal, and a measurement response characteristic is obtained based on the drive signal and the oscillation signal, and is compared with reference response characteristics which are correlated with the mechanical supporting states, respectively, to estimate one of the mechanical supporting states of the housing.

Abstract: The present invention is a method for determining the optimum operating practice for an industrial process. The methodology includes a combination of process control steps and data analysis techniques to investigate responses to controlled “black box” process inputs, e.g., coal and air feeds for coal-fired furnaces in the case studies above. A unique time-dependent perturbation is applied to individual process feed streams to give a signature in the data that permits the filtering and detection of various measured responses, e.g., continuous emission monitor readings for NOx, SO2, CO2, CO, and opacity for regulated electric utility furnaces. The perturbation is implemented using the plant control system. Individual control signal set points are perturbed for each piece of equipment supplying process inputs of interest. As a result, complex commercial processes can be evaluated for optimization without changing the normal configuration of the system.

Abstract: A method for obtaining at least one calibration filter for a Mass Spectrometry (MS) instrument system. Measured isotope peak cluster data in a mass spectral range is obtained for a given calibration standard. Relative isotope abundances and actual mass locations of isotopes corresponding thereto are calculated for the given calibration standard. Mass spectral target peak shape functions centered within respective mass spectral ranges are specified. Convolution operations are performed between the calculated relative isotope abundances and the mass spectral target peak shape functions to form calculated isotope peak cluster data. A deconvolution operation is performed between the measured isotope peak cluster data and the calculated isotope peak cluster data after the convolution operations to obtain the at least one calibration filter. Provisions are made for normalizing peak widths, combining internal and external calibration, and using selected measured peaks as standards.

Abstract: One embodiment of the present invention provides a system that generates a synthetic workload to test power utilization in a computer system. During operation, the system monitors power utilization of a reference computer system while the reference computer system executes a workload-of interest, wherein the monitoring process produces a power profile. Next, the system determines characteristics of the workload-of-interest from the power profile. Finally, the system uses the determined characteristics to construct the synthetic workload, wherein the synthetic workload has similar power utilization to the workload-of-interest.

Abstract: In a method for optimizing control parameters, a transfer function of a transformer that includes a controller and a system to be controlled is ascertained experimentally. Quality criteria are derived from the transfer function of the transformer, the quality criteria being used for optimizing control parameters. Following a variation of the control parameters, a modified transfer function is calculated from the transfer function of the unmodified transformer without a new experimental identification.

Abstract: An anomaly detection system and a method thereof are disclosed. The system comprises at least a light reflecting unit, a light-emitting unit, an image pick-up unit and a processing module. Each of the light reflecting unit is disposed on an object-to-be-detected that all of which are capable of reflecting light emitted from the light-emitting unit and thus cooperatively generating a reflection image relating to the object-to-be-detected to be received by the image pick-up unit for enabling the same to generate an image signal accordingly. The image signal is then transmitted to the processing module where it is analyzed and compared with a standard image signal so as to determine whether the position of the object-to-be-detected is abnormal.

Abstract: A method and apparatus adapted to calibrate a signal path of a signal analysis system such that loading effects of the system are substantially removed from measurements of a device under test. A signal under test from the device under test is coupled to a test probe in the signal path and used with selectable impedance loads in the test probe to characterize transfer parameters of the device under test. An equalization filter in either the frequency or time domain is computed from the device under test transfer parameters for reducing in signal error attributable to the measurement loading of the device under test.

Abstract: The model-based method tests compliance of production devices with the performance specifications of a device design. The production devices are manufactured in accordance with the device design by a manufacturing process. In the method, a simple model form based on the device design and the performance specifications is developed, a stimulus for testing the production devices is specified and each production device is tested. The model form has a basis function and model form parameters for the basis function. The model form parameters are dependent on the manufacturing process and differ in value among the production devices. A production device is tested by measuring the response of the production device to the stimulus; extracting, using the model form, the values of the model form parameters for the production device from the measured response and the stimulus; and checking compliance of the production device with the performance specifications using the extracted values of the model form parameters.

Abstract: Methods and apparatus to measure a transfer function of a control system are disclosed. An example method includes receiving a first signal from the power supply at a first point in the control loop at a digital signal processor, instructing the digital signal processor to add a reference signal having a predetermined frequency and a predetermined amplitude to the first signal to generate a combined signal in the digital signal processor, using the combined signal to generate a control signal for the power stage, sampling the control signal at a second point around the control loop in the digital signal processor to generate a sampled signal, comparing the sampled signal to the reference signal to determine a transfer function of the digital power supply, and displaying the transfer function on a user interface.

Abstract: A system and method for servicing a medical device, which provides for generation of a transfer function that correlates historical machine data with the health of the medical device. The transfer function may be validated and stored. The transfer function is automatically updated based on current machine data.

Abstract: The invention is an apparatus and method including hardware and software, which allows collecting and analyzing data to obtain information about mechanical properties of soft materials in a much faster way. The apparatus can be used as a stand-alone deice or an add-on to the existing AFM device. The apparatus allows collecting dynamical measurements using a set of multiple frequencies of interest at once, in one measurement instead of sequential, one frequency in a time; measurements.