Testing System Patents (Class 702/108)
  • Patent number: 12248088
    Abstract: A radar semiconductor chip includes a radar circuit component configured to generate at least part of a frequency-modulated ramp signal or process at least part of a reflected frequency-modulated ramp signal according to a control parameter; a memory configured to store a sequencing program associated with regulating the control parameter, wherein the sequencing program specifies a first data source, external to the sequencing program, that is configured to provide a first data value corresponding to the control parameter; and a decoder configured to read the sequencing program, access the first data value from the first data source specified by the sequencing program, derive a first control value for the control parameter from the first data value, and provide the first control value to the radar circuit component. The radar circuit component regulates a controlled circuit function in accordance with the control parameter based on the first control value.
    Type: Grant
    Filed: December 3, 2021
    Date of Patent: March 11, 2025
    Assignee: Infineon Technologies AG
    Inventors: Rainer Findenig, Bernhard Greslehner-Nimmervoll, Grigory Itkin, Markus Josef Lang, Ulrich Moeller, Martin Wiessflecker
  • Patent number: 12189376
    Abstract: A method, apparatus, system, and computer program products for managing a set of outliers in test data. A computer system analyzes a set of features derived from the test data using different outlier detection methods to generate a result of the set of outliers identified by the different outlier detection methods. The test data is obtained from testing a physical structure. The computer system determines a causality for the set of outliers in the result. The physical structure is retested with a set of changes determined using the causality identified for the set of outliers. The retesting generates new test data for the physical structure.
    Type: Grant
    Filed: March 9, 2022
    Date of Patent: January 7, 2025
    Assignees: The Boeing Company, University of Washington
    Inventors: Mohammed H. Kabir, Alan Douglas Byar, John J. Dong, Alexandru I. Stere, Todd Clayton DePauw, Christina M. Doty, Ashith Paulson Kunnel Joseph, Navid Zobeiry
  • Patent number: 12181992
    Abstract: A solution is the iRiser. The iRiser is a PCIe riser, designed to work with SANBlaze test systems but capable of operation in any PCIe slot on any computer. The iRiser includes a dedicated ASIC or programmed FPGA that cycles any of 32 signals, including power and reset, and samples power at up to 1 million samples per second, to any connected PCIe devices (such as sixteen NVMe drives under test in a SANBlaze test system, or more if larger testing systems are used). This allows precise insertion of any signal, including power and reset, at any desired testing point, and precise measurement of power drawn during any test condition, including transitions such as power on/off, reset, and low power state returning to running state. The iRiser can write measurement data to a host controller through direct memory access, providing the data synchronized to precise test conditions with zero overhead.
    Type: Grant
    Filed: October 11, 2022
    Date of Patent: December 31, 2024
    Assignee: SANBlaze Technology, Inc.
    Inventors: B. Vincent Asbridge, Ulf Frisk
  • Patent number: 12182485
    Abstract: A shared memory is provided between simulation processors and emulation processors within an emulation chip. The shared memory is configured to enable the simulation processors and the emulation processors to exchange simulation data and emulation data respectively with each other during simulation and emulation operations. The simulation processors and the emulation processors may update their respective simulation and emulation operations in response to the simulation data and the emulation data exchanged via the shared memory.
    Type: Grant
    Filed: December 4, 2018
    Date of Patent: December 31, 2024
    Assignee: Cadence Design Systems, Inc.
    Inventors: Mitchell G. Poplack, Christopher Coffman, Hitesh Gannu
  • Patent number: 12170455
    Abstract: This invention provides an energy storage device manager, a system comprising the energy storage device manager, computer-readable media configured for providing the energy storage device manager, and methods of using the energy storage device manager. The energy storage device manager can optionally control charge buses and/or load buses to modulate the state of charge of an energy storage device. The energy storage device manager can optionally be configured with a plurality of modes that target different states of charge. The plurality of modes can optionally comprise a maintain mode which targets a nominal (e.g. 50%) charge state and a high-charge mode that targets a state of charge greater than the maintain mode. The plurality of modes can optionally further include an in-use mode which targets a state of charge greater than the maintain mode, and turns on a load bus that is turned off in the preparation mode.
    Type: Grant
    Filed: October 17, 2023
    Date of Patent: December 17, 2024
    Inventor: Thomas Zauli
  • Patent number: 12154058
    Abstract: Detecting a source business activity of an outlier of a business performance measure that falls outside of a statistical analysis-computed outlier boundary includes identifying the source business activity based on an impact rating indicating a likelihood that a business activity contributes a value to the computation of the outlier for a given dimension of business performance data representative of business activities.
    Type: Grant
    Filed: January 27, 2024
    Date of Patent: November 26, 2024
    Assignee: Dimensional Insight Incorporated
    Inventors: Frederick A. Powers, James Clark
  • Patent number: 12146908
    Abstract: The present invention discloses an in-situ testing system for semiconductor device in aerospace irradiation environment. The present invention includes a static testing unit, a static testing channel, a dynamic testing unit, a dynamic testing channel, and a channel switching control unit; the static testing unit is connected to the device under test through the static testing channel, and is used to output static testing signals and display the static testing data of the device under test; the dynamic testing unit is connected to the device under test through the dynamic testing channel, and is used to output dynamic testing signals and display the dynamic testing data of the device under test; the channel switching control unit is connected to the static testing channel and the dynamic testing channel, respectively. This invention can achieve static, dynamic, and degradation testing of third-generation semiconductor device in aerospace irradiation environment.
    Type: Grant
    Filed: April 10, 2024
    Date of Patent: November 19, 2024
    Assignee: NANJING UNIVERSITY
    Inventors: Feng Zhou, Wenfeng Wang, Hai Lu, Weizong Xu, Dong Zhou, Fangfang Ren
  • Patent number: 12140941
    Abstract: A method for determining a condition of a system is provided, wherein the system has at least one general functional component and at least one safety-critical functional component. The method includes generating a general prediction value and a safety prediction value for the system using at least one input signal that represents condition data relating to the functional components. The general prediction value represents a predicted condition of at least the at least one general functional component. The safety prediction value represents a predicted condition of the at least one safety-critical functional component.
    Type: Grant
    Filed: September 20, 2018
    Date of Patent: November 12, 2024
    Assignee: KNORR-BREMSE GESELLSCHAFT MIT BESCHRĂ„NKTER HAFTUNG
    Inventor: Johann Bramauer
  • Patent number: 12119702
    Abstract: Methods and systems for providing computer implemented services using configurable hardware components are disclosed. To update operation of a configurable hardware component, a large amount of data may be provided to a single input/output pin of the configurable hardware component. The large amount of data may be encoded in a complex waveform corresponding with at least eleven bits of digital data. The complex waveform may be interpreted by the configurable hardware component to obtain the large amount of data. Using the large amount of data, the configurable hardware component may update its operation to be in condition for providing the computer implemented services.
    Type: Grant
    Filed: March 29, 2023
    Date of Patent: October 15, 2024
    Assignee: Dell Products L.P.
    Inventors: Michael J. Stumpf, Sandor Tibor Farkas, Sanjiv Sinha
  • Patent number: 12098980
    Abstract: An equipment monitoring system includes an unmanned vehicle, an alarm circuit remote from the unmanned vehicle, and a vehicle control circuit remote from the unmanned vehicle. The unmanned vehicle can include a communications circuit and a flight controller. The alarm circuit detects a failure condition of a building component and outputs an indication of the failure condition. The vehicle control circuit receives the indication of the failure condition from the alarm circuit; generates, based on the indication of the failure condition, an equipment verification signal that includes an identifier of the building component, a position of the building component, and a test of the building component to be executed; and transmits the equipment verification signal to the flight controller of the unmanned vehicle via the communications circuit of the unmanned vehicle to cause the unmanned vehicle to execute the test of the building component.
    Type: Grant
    Filed: July 13, 2023
    Date of Patent: September 24, 2024
    Assignee: TYCO FIRE & SECURITY GMBH
    Inventors: Matthew Roberts, Stephen Tarmey
  • Patent number: 12092627
    Abstract: A signal processing system and method for inductive oil abrasive particle sensor, comprising a sensor, an excitation signal generator, an analog signal processing circuit, a MCU signal acquisition module and a computer signal processing module is disclosed. The sensor is provided with two groups of induction coils, the excitation signal generator generates excitation signals and drives the excitation coils of the sensor to output induction signals containing abrasive particle information, and the analog signal processing circuit receives the induction signals output by the sensor and demodulates and amplifies the induction signals. The signal processing system of the sensor applied to online monitoring of oil abrasive particles is simple in structure and convenient to apply, has a complete signal statistics and monitoring interface, and can be used to effectively monitor the size, concentration and other information of the metal abrasive particles in oil in real time.
    Type: Grant
    Filed: November 14, 2023
    Date of Patent: September 17, 2024
    Assignees: Suzhou Renzheng Zhitan Technology Co., Ltd., Nanjing University of Aeronautics and Astronautics
    Inventors: Zhenghua Qian, Mingming Wang, Peng Li, Xianwei Wu, Hairui Liu, Zhi Qian, Qi Li, Zelin Xu
  • Patent number: 12087710
    Abstract: An electronic device comprises a multilevel metallization structure over a semiconductor layer and including a first region, a second region, a pre-metal level on the semiconductor layer, and N metallization structure levels over the pre-metal level, N being greater than 3. The electronic device also comprises an isolation component in the first region, the isolation component including a first terminal and a second terminal in different respective metallization structure levels, as well as a conductive shield between the first region and the second region in the multilevel metallization structure, the conductive shield including interconnected metal lines and trench vias in the respective metallization structure levels that at least partially encircle the first region.
    Type: Grant
    Filed: April 27, 2022
    Date of Patent: September 10, 2024
    Assignee: TEXAS INSTRUMENTS INCORPORATED
    Inventor: Jeffrey A. West
  • Patent number: 12080362
    Abstract: Exemplary embodiments provide wear spreading among die regions (i.e., one or more circuits) in an integrated circuit or among dies by using operating condition data in addition to or instead of environmental data such as temperature data, from each of a plurality of die regions. Control logic produces a cumulative amount of time each of the plurality of die regions has spent at an operating condition based on operating condition data wherein the operating condition data is based on at least one of the following operating characteristics: frequency of operation of the plurality of die regions, an operating voltage of the plurality of die regions, an activity level of the plurality of die regions, a timing margin of the plurality of die regions, and a number of detected faults of the plurality of die regions. The method and apparatus spreads wear among the plurality of same type of die regions by controlling task execution among the plurality of die regions using the die wear-out data.
    Type: Grant
    Filed: January 13, 2023
    Date of Patent: September 3, 2024
    Assignee: ADVANCED MICRO DEVICES, INC.
    Inventors: Steven Raasch, Greg Sadowski, David A. Roberts
  • Patent number: 12068215
    Abstract: Exemplary embodiments provide thermal wear spreading among a plurality of thermal die regions in an integrated circuit or among dies by using die region wear-out data that represents a cumulative amount of time each of a number of thermal die regions in one or more dies has spent at a particular temperature level. In one example, die region wear-out data is stored in persistent memory and is accrued over a life of each respective thermal region so that a long term monitoring of temperature levels in the various die regions is used to spread thermal wear among the thermal die regions. In one example, spreading thermal wear is done by controlling task execution such as thread execution among one or more processing cores, dies and/or data access operations for a memory.
    Type: Grant
    Filed: January 9, 2023
    Date of Patent: August 20, 2024
    Assignee: ADVANCED MICRO DEVICES, INC.
    Inventors: David A. Roberts, Greg Sadowski, Steven Raasch
  • Patent number: 12046126
    Abstract: Methods, systems, and apparatuses for securing property are presented. Video content viewed by a user may be detected, and the user may be automatically prompted to change settings on a security system based on the detecting. A comparison of the current time with the duration of the video content may serve as the basis for such prompting. Additionally, a premise security system may be placed in a learning mode. Changes in position of a security sensor may be detected and used to set a permitted range of motion for the sensor. Further, a plurality of security sensor profiles may be stored, and each profile may identify a different predefined permitted range of motion of a sensor. The addition of a new sensor to a premise may be detected, and a user may be prompted, on a display, to identify a profile to be used for the new sensor.
    Type: Grant
    Filed: October 22, 2021
    Date of Patent: July 23, 2024
    Assignee: Comcast Cable Communications, LLC
    Inventors: Jim Poder, Mike Cook
  • Patent number: 11975822
    Abstract: A method of determining a service interval for an actuator of a landing gear assembly is suitable for used with a landing gear assembly in which the actuator positions the landing gear assembly between a stowed position and a deployed position. The method includes the steps of determining an actuator travel value for a time interval and increasing a total actuator accumulated travel value by the actuator travel value for the time interval. The method further includes the step of comparing the total actuator accumulated travel value to a predetermined value.
    Type: Grant
    Filed: November 9, 2020
    Date of Patent: May 7, 2024
    Assignees: Safran Landing Systems, Safran Landing Systems Canada Inc.
    Inventors: Andrew Michael Ellis, Graeme Peter Arthur Klim, Aakash Gohil, Pierrick GĂ©raud Alexandre Lemonnier, Leszek Marian Dacko
  • Patent number: 11929137
    Abstract: The present application provides a method for testing a memory, including the steps of: providing a database, the database including a deviation value between a data strobe signal and a clock signal and a corresponding relationship between the deviation value and a memory parameter; searching the database for a deviation value corresponding to a preset memory parameter when a read command is applied to the memory under the preset memory parameter; acquiring a time value at which an output signal is to be captured according to the deviation value; and capturing the output signal at the time value to perform the testing for the memory.
    Type: Grant
    Filed: November 17, 2021
    Date of Patent: March 12, 2024
    Assignee: CHANGXIN MEMORY TECHNOLOGIES, INC.
    Inventor: Yangyang Dai
  • Patent number: 11920807
    Abstract: An electronic apparatus is provided. The electronic apparatus includes a communication interface, a memory, and a processor. The processor according to the disclosure is configured to acquire weather information and information on a space where an air conditioner is installed, train a neural network model based on the weather information and the information on the space, based on acquiring driving information of the air conditioner and a measured temperature of the space through the communication interface, input the measured temperature of the space and the external temperature into the neural network model and acquire predicted temperature information per time for the space, determine whether a defect exists in the air conditioner based on the predicted temperature information and the measured temperature of the space, and based on determining that a defect exists in the air conditioner, generate a notification signal.
    Type: Grant
    Filed: July 27, 2021
    Date of Patent: March 5, 2024
    Assignee: Samsung Electronics Co., Ltd.
    Inventors: Sunggeun Song, Kyungjae Kim, Kwanwoo Song, Jehyeon Lee, Hyejung Cho
  • Patent number: 11906554
    Abstract: In a meter for performing a measurement of an electrical parameter, an output from a sensor is sampled to produce at least one sample, and an iterative method is performed comprising: producing further samples; holding in memory a stored array of samples comprising the at least one sample and each of the further samples from each iteration; determining a measure of statistical variability of a mean for the respective iteration from a measure of statistical variability and from the number of samples used to generate the measure of statistical variability; comparing the measure of statistical variability of the mean with a pre-determined threshold; and generating an electrical signal indicating a state of the measurement if the measure of statistical variability of the mean of the samples taken during the measurement is less than or equal to the pre-determined threshold.
    Type: Grant
    Filed: December 9, 2022
    Date of Patent: February 20, 2024
    Assignee: Megger Instruments Ltd.
    Inventors: Stanislaw Zurek, Jeffrey Jones
  • Patent number: 11900586
    Abstract: A hot spot defect detecting method and a hot spot defect detecting system are provided. In the method, hot spots are extracted from a design of a semiconductor product to define a hot spot map comprising hot spot groups, wherein local patterns in a same context of the design yielding a same image content are defined as a same hot spot group. During runtime, defect images obtained by an inspection tool performing hot scans on a wafer manufactured with the design are acquired and the hot spot map is aligned to each defect image to locate the hot spot groups. The hot spot defects in each defect image are detected by dynamically mapping the hot spot groups located in each defect image to a plurality of threshold regions and respectively performing automatic thresholding on pixel values of the hot spots of each hot spot group in the corresponding threshold region.
    Type: Grant
    Filed: December 15, 2020
    Date of Patent: February 13, 2024
    Assignee: Taiwan Semiconductor Manufacturing Company, Ltd.
    Inventors: Chien-Huei Chen, Pei-Chao Su, Xiaomeng Chen, Chan-Ming Chang, Shih-Yung Chen, Hung-Yi Chung, Kuang-Shing Chen, Li-Jou Lee, Yung-Cheng Lin, Wei-Chen Wu, Shih-Chang Wang, Chien-An Lin
  • Patent number: 11900297
    Abstract: Providing user-controllable visualization of an impact of each of a set of dimensions for a set of data from which at least one outlier value is detected includes computing an outlier boundary for a dimension data value via statistical analysis for data organized as assisted analytics time frame data sets. Further a dimension data value outlier factor may be produced for a detected outlier based on a weighting associated with an assisted analytics time frame that corresponds to the outlier. Dimension outlier factors may be derived therefrom and mapped to a corresponding dimension impact rating value for the user-controllable visualization.
    Type: Grant
    Filed: July 3, 2023
    Date of Patent: February 13, 2024
    Assignee: Dimensional Insight, Incorporated
    Inventors: Frederick A. Powers, James Clark
  • Patent number: 11888305
    Abstract: A method is disclosed. The method includes measuring at least one electrical parameter (R, L, C) of at least one wire (10) in a motor vehicle (100) at a certain time instance (ti) to obtain measurement data (M(ti)); comparing the measurement data (M(ti)) with comparative data (C(ti)) held in a data storage (5); and taking a predefined action (63) dependent on the comparing.
    Type: Grant
    Filed: March 15, 2021
    Date of Patent: January 30, 2024
    Assignee: Infineon Technologies AG
    Inventors: Andre Mourrier, Thomas Blasius
  • Patent number: 11852612
    Abstract: Methods for non-destructive inspection of parts for obtaining the properties and characteristics of the material of a part are disclosed. According to one embodiment, a method for non-destructive inspection of parts includes a step of creating a mathematical model describing the dynamic behavior of a part to be inspected, a step of exciting the part, and a step of measuring the vibratory response of the part. The method further includes a step of optimizing surrounding conditions, a step of selecting modal shapes and a step of selecting at least one excitation point with the excitation orientation and at least one measurement point with the measurement orientation which are performed in that order after the step of creating the mathematical model.
    Type: Grant
    Filed: December 1, 2020
    Date of Patent: December 26, 2023
    Assignee: PROMOCION Y DESARROLLO DE SISTEMAS AUTOMATICOS S.L.U.
    Inventor: Aitzol Iturrospe Iregui
  • Patent number: 11814080
    Abstract: A computer implemented method for evaluating autonomous vehicle safety that includes defining criteria for safety of autonomous vehicles in a test space, and dividing the test space into an intended test space and a un-intended test space for the criteria for safety of autonomous vehicles. The intended test space includes characterizations for the autonomous vehicle that can be quantified, and the un-intended test space includes characterizations that are not quantifiable. The method further includes measuring the safety of the autonomous vehicles in the intended test space. The applying the un-intended test space is applied to the intended test space as feedback into the intended test space; and evaluating the intended test space including the feedback from the unintended test space using a combined simulation of peripheral vehicles and autonomous vehicles to provide the evaluation of autonomous vehicle safety.
    Type: Grant
    Filed: February 28, 2020
    Date of Patent: November 14, 2023
    Assignee: INTERNATIONAL BUSINESS MACHINES CORPORATION
    Inventors: Yoshifumi Sakamoto, Kentaro Aota, John Maxwell Cohn, Hardy Groeger
  • Patent number: 11769565
    Abstract: A memory device which can perform various memory tests without increasing a size of the memory device. The memory device includes: a first pad for receiving external ROM data from a memory controller; a second pad for receiving an external clock signal corresponding to the external ROM data from the memory controller; and a control logic connected to the first pad and the second pad and configured to perform an operation corresponding to the external ROM data in response to the external clock signal in a test mode.
    Type: Grant
    Filed: July 15, 2021
    Date of Patent: September 26, 2023
    Assignee: SK hynix Inc.
    Inventor: Seung Hyun Chung
  • Patent number: 11748229
    Abstract: An information handling system includes a memory and a processor. The memory stores telemetry data, telemetry collection rules, and persona classifications for the information handling system. The processor collects first telemetry data for the information handling system based on first telemetry collection rules. The first telemetry collection rules are set based on a first persona classification for the information handling system. The processor determines whether user behaviors change from behaviors associated with the first persona classification. In response to an amount of change in the user behaviors being above a threshold amount, the processor changes a classification of the information handling system from the first persona classification to a second persona classification.
    Type: Grant
    Filed: May 5, 2021
    Date of Patent: September 5, 2023
    Assignee: Dell Products L.P.
    Inventors: Maheshwar Dattatri, Daniel L. Hamlin
  • Patent number: 11741416
    Abstract: Assisted analytics, facilitates responding to a user selection of a measure that is calculated from a data set that is characterized by a plurality of dimensions of data, populating, with a processor a set of dimensions of the data with dimensions that contribute at least one data value to the user selected measure by calculating, for each dimension of the data in the set of dimensions of data a measure outlier threshold for a set of timeframe-specific values of the measure. This outlier threshold is applied, for each dimension of the data in the set of dimensions of data to calculate a dimension-specific outlier factor by aggregating timeframe-specific outlier weights for each timeframe in which a timeframe-specific value in the set of timeframe-specific values exceeds the measure outlier threshold. The results of this aggregation can be displayed in a ranked list of dimensions based on the dimension-specific outlier factor.
    Type: Grant
    Filed: October 19, 2021
    Date of Patent: August 29, 2023
    Inventors: Frederick A. Powers, James Clark
  • Patent number: 11734156
    Abstract: Machine-learned prediction of a blame frame of a crash stack. Specifically, a crash stack associated with a crash is parsed into a sequence of frames. The blame frame of the crash stack is estimated by, for each of a plurality of the sequence of frames, identifying a plurality of features of the corresponding frame, feeding the plurality of features to a neural network, and using the output of the neural network to make a prediction on whether the corresponding frame is a blame frame of the crash. If this is done during training time, the predicted blame frame can be compared against the actual blame frame, resulting in an adjustment of the neural network. Through appropriate featurization of the frames, and by use of the neural network, the prediction can be made cross-application and considering the context of the frame within the crash stack.
    Type: Grant
    Filed: September 23, 2021
    Date of Patent: August 22, 2023
    Assignee: Microsoft Technology Licensing, LLC
    Inventors: Chetan Bansal, Manish Shetty Molahalli, Suman Kumar Nath, Siamak Ahari, Haitao Wang, Sean A. Bowles, Kamil Ozgur Arman
  • Patent number: 11716413
    Abstract: Systems and methods for monitoring mobile devices in a controlled environment are provided. One or more mobile devices may be accessible through a communication port of the mobile device. One or more monitoring devices may be configured to monitor the one or more mobile devices. A processor in communication with the one or more monitoring devices may control the monitoring devices and receive signals from the monitoring devices. A server in communication with the mobile devices may create a communication channel with each of the mobile devices, with each communication channel accessible through a network for use by software developers and testers. Thus, monitoring and detection of malfunctions or other abnormalities of the mobile devices is achieved, and remediation may be performed.
    Type: Grant
    Filed: February 2, 2021
    Date of Patent: August 1, 2023
    Assignee: T-MOBILE USA, INC.
    Inventors: Michael Mitchell, Peter Myron
  • Patent number: 11624522
    Abstract: A system for monitoring at least one HVAC system includes at least one remotely accessible server, at least one probe or sensor operatively connected to the at least one HVAC system and configured to acquire operational data, and a communication module operatively connected to the at least one probe or sensor and configured to transmit the operational data acquired to the at least one remotely accessible server. The remotely accessibly server includes a processor and a memory unit and is programmed to receive and store operational data acquired for the HVAC system, and identify any operational abnormalities by analysing the operational data. Responsive to an operational abnormality being identified, the server is further programmed to designate a tiered maintenance status for the HVAC system and transmit a corresponding tiered maintenance request to a technician based on the tiered maintenance status designated.
    Type: Grant
    Filed: October 11, 2018
    Date of Patent: April 11, 2023
    Assignee: AIRCONNECT HOLDINGS PTY LTD
    Inventor: David Paul Jones
  • Patent number: 11596917
    Abstract: A test system comprising a reactor having a fluid circuit and a test zone for an item under test. A plurality of control zones are included in the fluid circuit for controlling parameters of the fluid in accordance with control information. A control system receives input data specifying test values for the fluid parameters, predicts the behaviour of the fluid using the input data and a mathematical model of the reactor, calculates control information based on the predicted fluid behaviour, and communicates the control information to the control zones. The system can simulate transient test conditions by selective use of fluid evacuation and dilution, and by use of temperature and flow bypass circuits.
    Type: Grant
    Filed: September 12, 2017
    Date of Patent: March 7, 2023
    Assignee: Catagen Limited
    Inventors: Andrew Woods, Jonathan Stewart, Richard O'Shaughnessy, Rose Mary Stalker
  • Patent number: 11592480
    Abstract: An apparatus and method for analyzing phase noise in a signal. A plurality of signal samples, each signal sample representing a value of phase noise in a signal-under-test at a corresponding offset frequency, and filter data representing filter characteristics on a first side of a spectrum boundary, are used to derive filtered signal samples. A measure of noise is derived from the filtered signal samples. This abstract is not to be considered limiting, since other embodiments may deviate from the features described in this abstract.
    Type: Grant
    Filed: December 27, 2021
    Date of Patent: February 28, 2023
    Assignee: JitterLabs LLC
    Inventor: Gary Giust
  • Patent number: 11588540
    Abstract: Herein is disclosed a wireless communication device comprising two or more antennas; one or more transceivers, configured to process wireless signal for one or more processors received via the two or more antennas; and one or more processors, configured to determine a timing of data transmissions within the wireless signal; determine a timing of intervals between beam selection protocol transmissions in the wireless signal; determine a testing period corresponding to an overlap of one data transmission selected from the data transmissions and one interval of the intervals; and measure a signal quality of the selected data transmission during the testing period using a candidate receive-beam setting from a plurality of predefined receive-beam settings for receiving the wireless signals via the two or more antennas.
    Type: Grant
    Filed: September 6, 2019
    Date of Patent: February 21, 2023
    Assignee: INTEL CORPORATION
    Inventors: Zhibin Yu, Michael Ruder
  • Patent number: 11562709
    Abstract: The present application provides a method, a device and a system for determining an actual option common voltage of a display panel. The method for determining the actual option common voltage of the display panel includes the following steps: acquiring a first common voltage and a second common voltage for fitting a curve; acquiring a first flicker corresponding to the first common voltage and a second flicker corresponding to the second common voltage; acquiring a first Vcom-Flicker curve according to the first common voltage and the first flicker, and acquiring a second Vcom-Flicker curve according to the second common voltage and the second flicker; and determining a common voltage at an intersection of the first Vcom-Flicker curve and the second Vcom-Flicker curve, in which the common voltage at the intersection is the actual option common voltage.
    Type: Grant
    Filed: December 4, 2018
    Date of Patent: January 24, 2023
    Assignee: HKC CORPORATION LIMITED
    Inventor: Chia-Hang Lee
  • Patent number: 11543435
    Abstract: The present invention relates to an improved recording of context information for a measurement. For this purpose, it is suggested to receive context information from a user and to generate a dataset comprising the received context information. The context information may comprise one or more voice annotation. By using voice annotations for specifying context information of a measurement, a very simple and easy format for acquiring the context information from a user is achieved.
    Type: Grant
    Filed: December 17, 2019
    Date of Patent: January 3, 2023
    Assignee: ROHDE & SCHWARZ GMBH & CO. KG
    Inventor: Tobias Frede
  • Patent number: 11531525
    Abstract: Various methods, apparatuses/systems, and media for implementing a language agnostic packaging platform are disclosed. A receiver receives a user request of a process flow corresponding to develop, test, or manage a desired application. A data source stores ready to use modules written for corresponding application programming interface (API) for a plurality of resources. A processor coupled to the receiver and the data source accesses the data source to obtain the ready to use modules written for corresponding application programming interface (API) for the plurality of resources to determine what resources are necessary to develop, test, or manage the desired application and creates an index file based on the resources accessed from the data source. The processor also causes a language agnostic packaging platform to receive the index file as input and automatically creates the desired application as output of the process flow based on the received index file.
    Type: Grant
    Filed: April 23, 2021
    Date of Patent: December 20, 2022
    Assignee: JPMORGAN CHASE BANK, N.A.
    Inventors: Sudheendra Ayyalasomayajula, Raghuram Vudathu
  • Patent number: 11494895
    Abstract: Methods and systems for detecting defects in an array region on a specimen are provided. One method includes determining a center of a page break in output generated by an inspection subsystem for a specimen in an array region. The page break separates cell regions in the array region, and the cell regions include repeating patterned features. The method also includes determining an offset between the center of the page break in the output and a center of the page break in a design for the specimen and identifying portions of the output that correspond to care areas in the array region based on the offset. In addition, the method includes detecting defects in the array region by applying a defect detection method to the portions of the output that correspond to the care areas.
    Type: Grant
    Filed: August 26, 2020
    Date of Patent: November 8, 2022
    Assignee: KLA Corp.
    Inventors: Siqing Nie, Chunwei Song, Zhuang Liu, Weifeng Zhou
  • Patent number: 11486798
    Abstract: Disclosed are a water quality analyzer and a method for analyzing water quality. The water quality analyzer includes a first disc system, a second disc system, a colorimetric system, a cleaning system, a mechanical sampling system, an analysis system and a central control display. The first disc system and the second disc system are axially rotatable. A plurality of sample locating positions and a chemical locating positions are provided on the first disc system along a circumference of the first disc system. A plurality of colorimetric cuvette locating positions are provided on the second disc system, and the colorimetric system is arranged at a circumference edge of the second disc system. The cleaning system and the mechanical sampling system are provided between the first disc system and the second disc system. The method includes water sampling, water sample injection, cleaning, reagent extraction, reagent injection, cleaning and colorimetric analysis.
    Type: Grant
    Filed: September 18, 2019
    Date of Patent: November 1, 2022
    Assignee: FUJIAN KELUNGDE ENV. TECH. CO., LTD
    Inventors: Shuiji Wang, Jianping Cui
  • Patent number: 11481305
    Abstract: An information handling system includes an analysis block configured to obtain monitoring results from a monitoring data repository, to analyze the monitoring results to identify at least one monitoring gap, and to provide a monitoring gap result identifying the at least one monitoring gap. A machine learning recommender produces a recommendation to reduce the monitoring gap, and a user interface displays the recommendation.
    Type: Grant
    Filed: December 27, 2019
    Date of Patent: October 25, 2022
    Assignee: Dell Products L.P.
    Inventors: Rodrigo Mohr, Rafael Mohr, Douglas Torgo Fabretti, Mauricio Rissi
  • Patent number: 11436025
    Abstract: Systems, methods and devices are disclosed for a smart compute memory circuitry that has the flexibility to perform a wide range of functions inside the memory via logic circuitry and an integrated processor. In one embodiment, the smart compute memory circuitry comprises an integrated processor and logic circuitry to enable adaptive System on a Chip (SOC) and electronics subsystem power or performance improvements, and adaptive memory management and control for the smart compute memory circuitry. A resistive memory array is coupled to the integrated processor.
    Type: Grant
    Filed: July 9, 2020
    Date of Patent: September 6, 2022
    Assignee: NUMEM INC.
    Inventors: Eric Hall, Doug Smith, Nicholas T. Hendrickson, Jack Guedj
  • Patent number: 11436174
    Abstract: Configuration switch-for setting a specific configuration from a plurality of settable configurations, wherein the configuration switch-has at least one plurality of selectable, mutually differing RC combinations, wherein each RC combination has at least one specific, characteristic variable, which is associated with a settable configuration and wherein to set the specific configuration a specific RC combination is selected/selectable, so that via an output signal-on an output-of the configuration switch, which output signal-comprises the specific, characteristic variable of the selected RC combination, the specific configuration to be set is established based on the specific, characteristic variable.
    Type: Grant
    Filed: February 15, 2018
    Date of Patent: September 6, 2022
    Assignee: ENDRESS+HAUSER SE+CO. KG
    Inventors: Harald Schäuble, Tobias Paul, Simon Gerwig, Max Bauer
  • Patent number: 11424710
    Abstract: A motor driving device includes an acquisition unit configured to acquire multiple pieces of data in data acquisition periods having different lengths; a selection unit configured to select a piece of data from among the multiple pieces of data, based on timing at which a switching circuit switches switching devices; and a control unit configured to control the switching circuit based on the selected data.
    Type: Grant
    Filed: July 31, 2020
    Date of Patent: August 23, 2022
    Assignee: FANUC CORPORATION
    Inventors: Masaya Tateda, Yasuyuki Matsumoto
  • Patent number: 11415622
    Abstract: An automated testing machine with data processing function and an information processing method thereof are introduced. The automated testing machine includes a test head for testing more than one device under testing (DUT), and the test head further includes a test processing unit for providing more than one electrical test signal to the DUTs and conducting a processing and analyzing on more than one electrical feedback data fed back from the DUTs, so as to generate analysis result information. With the test processing unit capable of conducting data processing directly provided in the test head, signals obtained from the DUTs can be directly analyzed and processed to enable increased data processing efficiency, increased convenience in use and reduced costs of the automated test machine and the information processing method thereof.
    Type: Grant
    Filed: October 29, 2020
    Date of Patent: August 16, 2022
    Assignee: HEFEI SPIROX TECHNOLOGY CO., LTD.
    Inventor: Hsing-Fu Lin
  • Patent number: 11353799
    Abstract: A metrology system includes a controller communicatively coupled to one or more metrology tools, the controller including one or more processors configured to execute program instructions causing the one or more processors to receive one or more metrology measurements of one or more metrology targets of a metrology sample, a metrology target of the one or more metrology targets including one or more target designs with one or more cells, the one or more target designs being generated on one or more layers of the metrology sample; determine one or more errors based on the one or more metrology measurements; and determine one or more correctables to adjust one or more sources of error corresponding to the one or more errors, the one or more correctables being configured to reduce an amount of noise in the one or more metrology measurements generated by the one or more sources of errors.
    Type: Grant
    Filed: July 14, 2020
    Date of Patent: June 7, 2022
    Inventors: Roie Volkovich, Liran Yerushalmi, Anna Golotsvan, Rawi Dirawi, Chen Dror, Nir BenDavid, Amnon Manassen, Oren Lahav, Shlomit Katz
  • Patent number: 11329893
    Abstract: A method, a device, and a non-transitory storage medium provide a network evaluation service. The service collects live network traffic data for a client device in a network; stores a benchmark pattern model; determines a category of the live network traffic data based on a segment size; detects a first traffic pattern of the live network traffic data based on measured segment parameters for the category; matches the first traffic pattern to a second traffic pattern in the benchmark pattern model to identify a result; compares the live network traffic data with a benchmark application pattern from the benchmark pattern model; and identifies, based on the comparing, a level of degraded performance in the network.
    Type: Grant
    Filed: March 21, 2019
    Date of Patent: May 10, 2022
    Assignee: Verizon Patent and Licensing Inc.
    Inventors: Ying Wang, Rick L. Halstead
  • Patent number: 11288346
    Abstract: A system and method uses different authentication techniques, including weak passive authentication techniques, to authenticate users by generating a score and comparing it to a threshold selected according to the feature the user is requesting.
    Type: Grant
    Filed: March 3, 2015
    Date of Patent: March 29, 2022
    Assignee: Charles Schwab & Co., Inc.
    Inventors: Valery Zubovsky, Charles E. Gotlieb
  • Patent number: 11240062
    Abstract: An example embodiment includes a plurality of flight modules including a primary flight module and a secondary flight module. The embodiment includes a CAN controller, a second CAN controller, a first CAN bus configured to transmit primary control signals from the first CAN controller to the primary flight module and to the secondary flight module, and a second CAN bus configured to transmit secondary control signals from the second CAN controller to the primary flight module and the secondary flight module. The primary flight module is configured to perform functions responsive to receiving the primary control signals, and not in response to receiving the secondary control signals and the secondary flight module is configured to perform functions responsive to receiving the secondary control signals, and not in response to receiving the primary control signals.
    Type: Grant
    Filed: July 9, 2019
    Date of Patent: February 1, 2022
    Assignee: Wing Aviation LLC
    Inventors: Parsa Dormiani, Brian Viele
  • Patent number: 11226213
    Abstract: The capacitive proximity sensor includes an oscillation means, an LCR resonance circuit including a sensor electrode, a sensor circuit that outputs a determination voltage signal corresponding to the capacitance of the sensor electrode, and a control unit that detects the proximity of a human body to the sensor electrode based on the determination voltage signal. The control unit performs control that alternatingly and repeatedly executes calibration steps for updating a detection frequency f1 and a first threshold value Vth1 and a detection step for detecting the proximity of the human body to the sensor electrode.
    Type: Grant
    Filed: October 28, 2019
    Date of Patent: January 18, 2022
    Assignee: Tokyo Parts Industrial Co., Ltd.
    Inventor: Mamoru Kubo
  • Patent number: 11195268
    Abstract: Techniques and systems to achieve more accurate design alignment to an image by improved pixel-to-design alignment (PDA) target selection are disclosed. PDA targets in an image frame of a die can be biased to include a hotspot location in one of the PDA targets. The PDA targets can be evaluated for repetitive patterns by analyzing the uniqueness of the points used as the PDA targets.
    Type: Grant
    Filed: August 30, 2018
    Date of Patent: December 7, 2021
    Assignee: KLA-Tencor Corporation
    Inventors: Santosh Kumar, Pavan Kumar Perali
  • Patent number: 11188451
    Abstract: An embodiment features a method of generating test data. An application-level schema corresponding to a source relational database is received. The schema defines constraints comprising one or more of inter-field, inter-record, and inter-object constraints between related data in the source relational database. A random walk is performed on a graph of nodes representing data in the source relational database. At respective ones of the nodes, corresponding ones of the data in the source relational database are selected along a path ordered in accordance with the constraints defined in the schema. Synthetic test data is generated based on one or more statistical models of the data selected from the source relational database. Data values are generated for respective fields of an object defined in the schema, and data values are generated for records related to the object based on one or more of the constraints defined in the schema.
    Type: Grant
    Filed: March 8, 2020
    Date of Patent: November 30, 2021
    Assignee: OWNBACKUP LTD.
    Inventor: Shai Rubin