Using Radiant Energy Patents (Class 702/28)
  • Patent number: 7006919
    Abstract: Methods and apparatus for continuous real-time measurement of bulk material using gamma irradiation and neutron irradiation. A DGA device monitors bulk material flow and produces a spectrum that is compared to a baseline spectrum to produce a relative weight/impurity ratio. A PGNAA device monitors the same bulk material flow and produces a spectrum that is compared to a library of spectrums to produce a relative component ratio. The relative component ratio is processed with the relative weight/impurity ratio to produce an absolute weight and impurity value, which is then processed with the relative component ratio to produce absolute component, or analyte, values.
    Type: Grant
    Filed: May 25, 2004
    Date of Patent: February 28, 2006
    Assignee: Energy Technologies, Inc.
    Inventors: Peter M. Osucha, David K. Swindell
  • Patent number: 7006927
    Abstract: A method and system for extracting data signals from a scanned image resulting from optical, radiometric, or other types of analysis of a molecular array. The positions of corner features are first located. Then, an initial feature coordinate grid is determined from the positions of the corner features. A refined feature coordinate grid is then calculated based on the positions of strong features, and is used to identify the positions of weak features and the positions of the local background regions surrounding all features. Finally, signal intensity values are extracted from the features and their respective local background regions in the scanned image, and background-subtracted signal intensity values, background-subtracted and normalized signal intensity ratios, and variability information and confidence intervals are determined based on the extracted values.
    Type: Grant
    Filed: February 28, 2002
    Date of Patent: February 28, 2006
    Assignee: Agilent Technologies, Inc.
    Inventors: Zohar Yakhini, Cynthia Y. Enderwick, Glenda C. Delenstarr, Paul K. Wolber, Nicholas M. Sampas, Herbert F. Cattell, Scott D. Connell
  • Patent number: 6965113
    Abstract: A method for distinguishing samples having flourescent particles includes (a) monitoring intensity fluctuations of fluorescence emitted by the particles in at least one measurement volume by detecting sequences of photon counts by at least one photon detector, (b) determining, from the sequences of photon counts, intermediate statistical data involving at least two probability functions of the number of photon counts detected in different sets of counting time intervals, and (c) determining from the intermediate statistical data a distribution of particles as a function of at least two arguments, wherein one argument is a specific brightness of the particles, or a measure thereof, and another argument is a diffusion coefficient of the particles, or a measure thereof.
    Type: Grant
    Filed: February 9, 2001
    Date of Patent: November 15, 2005
    Assignee: Evotec AG
    Inventors: Peet Kask, Stefan Jäger, Kaupo Palo, Ülo Mets, Karsten Gall
  • Patent number: 6949384
    Abstract: The present invention provides a method for monitoring degradation of Hb-based blood substitutes, in a sample. This method involves determining a concentration of met-Hb within the sample, by applying a calibration algorithm for met-Hb to an absorbance obtained from the sample at one or more than one wavelengths, and using the concentration of met-Hb, as a measurement of degradation of the Hb-based blood substitutes. Using this assay, a concentration of met-Hb that is equal to or greater than 3% may be used as an indicator of degradation of Hb. Alternatively, by obtaining samples over a period of time, the concentration of met-Hb and the concentration of Hb-based blood substitute may be determined in each of these samples, and an increase in the concentration of met-Hb over the period of time is an indicator of degradation of Hb.
    Type: Grant
    Filed: May 2, 2002
    Date of Patent: September 27, 2005
    Assignee: Spectromedical Inc.
    Inventor: James Samsoondar
  • Patent number: 6947850
    Abstract: A system for characterizing periodic structures on a real time basis is disclosed. A multi-parameter measurement module generates output signals as a function of wavelength or angle of incidence. The output signals are supplied to a parallel processor, which creates an initial theoretical model and calculates the theoretical optical response. The calculated optical response is compared to measured values. Based on the comparison, the model configuration is modified to be closer to the actual measured structure. Thereafter, the complexity of the model is iteratively increased, by dividing the model into layers each having an associated width and height. The model is fit to the data in an iterative manner until a best fit model is obtained which is similar in structure to the periodic structure.
    Type: Grant
    Filed: December 11, 2003
    Date of Patent: September 20, 2005
    Assignee: Therma-Wave, Inc.
    Inventors: Jon Opsal, Hanyou Chu
  • Patent number: 6941230
    Abstract: The invention relates to a method of determining mainly the compressibility number K, the standard volumetric gross calorific value Hv,n and the standard density ?n of test gases using values determined from a spectrum of the test gases. The invention describes various approaches of translating the values for determining the desired values using the data of the spectrum in the operational condition to the standard reference condition using two-step iteration processes without having to subject the test gases to time-consuming treatments. The invention further relates to devices for determining the values required for the methods and which further develop devices for carrying out the methods.
    Type: Grant
    Filed: January 4, 2000
    Date of Patent: September 6, 2005
    Assignee: Flowcomp Systemtechnik GmbH
    Inventors: Dieter Stirnberg, Joachim Kastner
  • Patent number: 6929951
    Abstract: A method and system for calibrating molecular arrays to a reference molecular array, and for subsequently calibrating the molecular arrays to maintain a constant signal-intensity-to-label-concentration ratio. In the first step of the two-step calibration method, a reference array coated with the fluorophore or chromophore used to label probe molecules is employed, while in the second step of the two-step method, a reference array coated with a stable dye is employed.
    Type: Grant
    Filed: February 28, 2002
    Date of Patent: August 16, 2005
    Assignee: Agilent Technologies, Inc.
    Inventors: John F. Corson, Andreas N. Dorsel, Russell A. Parker, Andre B. Chow
  • Patent number: 6922645
    Abstract: A method of multivariate spectral analysis, termed augmented classical least squares (ACLS), provides an improved CLS calibration model when unmodeled sources of spectral variation are contained in a calibration sample set. The ACLS methods use information derived from component or spectral residuals during the CLS calibration to provide an improved calibration-augmented CLS model. The ACLS methods are based on CLS so that they retain the qualitative benefits of CLS, yet they have the flexibility of PLS and other hybrid techniques in that they can define a prediction model even with unmodeled sources of spectral variation that are not explicitly included in the calibration model. The unmodeled sources of spectral variation may be unknown constituents, constituents with unknown concentrations, nonlinear responses, non-uniform and correlated errors, or other sources of spectral variation that are present in the calibration sample spectra.
    Type: Grant
    Filed: October 12, 2004
    Date of Patent: July 26, 2005
    Assignee: Sandia Corporation
    Inventors: David M. Haaland, David K. Melgaard
  • Patent number: 6909973
    Abstract: A process system adapted for processing of or with a material therein. The process system includes: a sampling region for the material; an infrared photometric monitor constructed and arranged to transmit infrared radiation through the sampling region and to responsively generate an output signal correlative of the material in the sampling region, based on its interaction with the infrared radiation; and process control means arranged to receive the output of the infrared photometric monitor and to responsively control one or more process conditions in and/or affecting the process system.
    Type: Grant
    Filed: August 14, 2003
    Date of Patent: June 21, 2005
    Assignee: Advanced Technology Materials, Inc.
    Inventor: Jose I. Arno
  • Patent number: 6907351
    Abstract: A method and system for predicting the content level of components in materials based on the response of the materials to near infrared radiation. One embodiment comprises electronically receiving a near infrared reflectance spectrum of a material from a customer, predicting the content level of a component in the material based on the spectrum, and electronically reporting the prediction to the customer. Another embodiment includes the exchange of the customer request and prediction report on a Web site or by electronic mail. Other embodiments include the prediction reports, and uses of the predictions, for example in quality control and toxicity evaluation.
    Type: Grant
    Filed: August 1, 2001
    Date of Patent: June 14, 2005
    Assignee: Aventis Animal Nutrition S.A.
    Inventors: Thierry Julia, Jean-Christophe Bodin
  • Patent number: 6898533
    Abstract: Methods are disclosed for establishing a quantitative relationship between spectral properties of molecules and a biological, chemical, or physical endpoint of the molecules. Spectral data including data from nuclear magnetic resonance, mass spectrometric, infrared, and ultraviolet-visible techniques are used along with endpoint data to train a pattern-recognition program. The training yields a spectral data-activity relationship that may be used to predict the endpoint value of a molecule from its spectral data alone. Methods for rapidly screening isolated compounds or mixtures of compounds based upon their spectral data are included.
    Type: Grant
    Filed: July 31, 2000
    Date of Patent: May 24, 2005
    Assignee: The United States of America as represented by the Department of Health and Human Services
    Inventors: Dwight W. Miller, Richard Beger, Jackson O. Lay, Jr., Jon G. Wilkes, James P. Freeman
  • Patent number: 6842702
    Abstract: A method of multivariate spectral analysis, termed augmented classical least squares (ACLS), provides an improved CLS calibration model when unmodeled sources of spectral variation are contained in a calibration sample set. The ACLS methods use information derived from component or spectral residuals during the CLS calibration to provide an improved calibration-augmented CLS model. The ACLS methods are based on CLS so that they retain the qualitative benefits of CLS, yet they have the flexibility of PLS and other hybrid techniques in that they can define a prediction model even with unmodeled sources of spectral variation that are not explicitly included in the calibration model. The unmodeled sources of spectral variation may be unknown constituents, constituents with unknown concentrations, nonlinear responses, non-uniform and correlated errors, or other sources of spectral variation that are present in the calibration sample spectra.
    Type: Grant
    Filed: September 11, 2003
    Date of Patent: January 11, 2005
    Assignee: Sandia Corporation
    Inventors: David M. Haaland, David K. Melgaard
  • Publication number: 20040254741
    Abstract: Methods and apparatuses are disclosed that model the lineshapes of mass spectrometry data. Ions can be modeled with an initial distribution that models molecules as having multiple positions and/or energies prior to traveling in the mass spectrometer. These initial distributions can be pushed forward by time of flight functions. Fitting can be performed between the modeled lineshapes and empirical data. Filtering can greatly reduce dimensions of the empirical data, remove noise, compress the data, recover lost and/or damaged data.
    Type: Application
    Filed: June 12, 2003
    Publication date: December 16, 2004
    Applicant: Biospect, Inc.
    Inventors: Hans Bitter, Zulfikar Ahmed
  • Patent number: 6820014
    Abstract: The invention relates to a new method for determination of realistic UV protection factors or bread spectrum indices of a sunscreen preparation. Realistic UV protection factors are calculable by determination of the theoretical and the experimental UV absorbances of known UV filters in wavelength steps of about 5 nm in the range of 290-400 nm from a definite basic formulation (emulsion, gel etc.) and on a transparent substrate and introducing of the values in a mathematical model. These factors are in conformity with values measured in vivo. The number of the experiments for developing new formulations are significant reduced because only basic formulation, kind and concentration of the filters have to enter.
    Type: Grant
    Filed: December 18, 2002
    Date of Patent: November 16, 2004
    Assignee: Coty B.V.
    Inventors: Louis Ferrero, Marc Pissavini, Leonhard Zastrow
  • Patent number: 6820013
    Abstract: The invention relates to a method and an apparatus for the on-line analysis of liquid substance mixtures by means of NIRS. For evaluation by spectral data comparison, merely the binary mixtures of the possible components in quantitative graduations are used as calibration spectra. In order to accelerate the evaluation, all data points of a spectrum are summated, and each spectrum is characterized by only one characteristic number.
    Type: Grant
    Filed: October 16, 2002
    Date of Patent: November 16, 2004
    Assignee: Merck Patent GmbH
    Inventors: Hans Frickel, Hanshelmut Itzel, Joachim Born
  • Patent number: 6813567
    Abstract: Systems and methods are described for processing an emission signal, such as a fluorescent signal, to compensate for noise in an excitation beam, such as a laser beam. As one example, a scanning system is described that includes an excitation signal generator that provides an excitation signal having one or more representative excitation values representative of an excitation beam; an excitation reference provider that provides at least one excitation reference value; a normalization factor generator that compares the excitation reference value to at least one representative excitation value, thereby generating a normalization factor; and a comparison processor that adjusts at least one emission value corresponding to the at least one representative excitation value based, at least in part, on the normalization factor.
    Type: Grant
    Filed: November 25, 2002
    Date of Patent: November 2, 2004
    Assignee: Affymetrix, Inc.
    Inventors: Nathan K. Weiner, Peter D. Honkanen, Timothy J. Woolaver
  • Publication number: 20040207844
    Abstract: The present invention provides a thin film property measuring method using a spectroscopic ellipsometer. With the measuring method, a model including a combination of the film thickness, complex refractive index, or the like, of each layer is formed, and fitting is made for the measured spectra and the spectra calculated based upon the model, with the model and the incident angle being modified over a predetermined number of repetitions, thereby determining the structure, the wavelength dependency of the dielectric constant, and the composition ratio, of a thin film including a compound semiconductor layer on a substrate. Furthermore, new approximate calculation is employed in the present invention, thereby enabling the concentration of the atom of interest contained in polycrystalline compound semiconductor to be calculated.
    Type: Application
    Filed: June 12, 2004
    Publication date: October 21, 2004
    Inventors: Nataliya Nabatova-Gabain, Yoko Wasai
  • Publication number: 20040210402
    Abstract: A method for modeling samples includes the use of control points to define lines profiles and other geometric shapes. Each control point used within a model influences a shape within the model. Typically, the control points are used in a connect-the-dots fashion where a set of dots defines the outline or profile of a shape. The layers within the sample are typically modeled independently of the shape defined using the control points. The overall result is to minimize the number of parameters used to model shapes while maintaining the accuracy of the resulting scatterometry models.
    Type: Application
    Filed: February 23, 2004
    Publication date: October 21, 2004
    Inventors: Jon Opsal, Hanyou Chu, Xuelong Cao, Youxian Wen
  • Patent number: 6795777
    Abstract: According to one embodiment of the present invention, identifying a molecule of a sample includes illuminating the sample with a preparation light beam, where the preparation light beam can initiate a substantially maximized coherence of a target molecule to yield a molecular signature corresponding to the target molecule. The sample is illuminated with a probe light beam, where the probe light beam can scatter radiation from the sample. Radiation scattered from the sample is detected, and whether the radiation exhibits the molecular signature is determined. The target molecule is identified in accordance with the determination of whether the radiation exhibits the molecular signature.
    Type: Grant
    Filed: March 4, 2003
    Date of Patent: September 21, 2004
    Assignee: The Texas A&M University System
    Inventors: Marlan O. Scully, George W. Kattawar, Robert P. Lucht, Tomas Opatrny, Herschel S. Pilloff, Alexei V. Sokolov, M. Suhail Zubairy
  • Patent number: 6792357
    Abstract: A system for measuring pitting corrosion in metal using a digital camera having a lens and an output unit for identifying the color of a metal coupon on a gray scale and providing an output in the midrange of the scale when non corroded and different output after exposure to a corrosive environment. A computer is connected to the output of the camera to display the photographs to permit observation of the gray scale output based upon a minimum and maximum threshold inputs which are adjustable based on an observation of pitting. The points of interest on the coupon representing observed pitting are recorded and summed to calculate an estimated corrosion area corresponding to pitting the said coupon as a percentage of the total coupon area.
    Type: Grant
    Filed: August 27, 2002
    Date of Patent: September 14, 2004
    Assignee: Honeywell International Inc.
    Inventors: Sunil Menon, Lewis P. Olson, Russell Braunling
  • Publication number: 20040167837
    Abstract: A method for billing customers over the Internet or other means of electronic communication between an access provider and a customer for use of services. The provider creates access to measurement data obtained by the customer for electronic data loggers which have been programmed for one time use by the manufacturers, distributor or agent for use by the customer or customers. A unique identity is embedded within the measurement device so that the provider can associate measurement data and/or billing information with the customer or end user. The provider then bills the transaction to either the user's account or those of designated account holders. This method for billing customers is applicable for all sensor based technologies to include temperatures, humidity, pressures, light, events, voltage, acceleration, shock, strain, flows and any other discipline where electronic sensors are embedded in devices programmed for one-time use and used in either remote locations or during transportation.
    Type: Application
    Filed: February 17, 2004
    Publication date: August 26, 2004
    Inventors: Greg T. Reel, Jon Y. Nakagawa, Kevin E. Flynn
  • Publication number: 20040167722
    Abstract: A database interpolation method is used to rapidly calculate a predicted optical response characteristic of a diffractive microstructure as part of a real-time optical measurement process. The interpolated optical response is a continuous and (in a preferred embodiment) smooth function of measurement parameters, and it matches the theoretically-calculated optical response at the database-stored interpolation points.
    Type: Application
    Filed: February 12, 2004
    Publication date: August 26, 2004
    Inventors: Kenneth C. Johnson, Fred E. Stanke
  • Patent number: 6778911
    Abstract: A system for characterizing periodic structures on a real time basis is disclosed. A multi-parameter measurement module generates output signals as a function of wavelength or angle of incidence. The output signals are supplied to a parallel processor, which creates an initial theoretical model and calculates the theoretical optical response. The calculated optical response is compared to measured values. Based on the comparison, the model configuration is modified to be closer to the actual measured structure. Thereafter, the complexity of the model is iteratively increased, by dividing the model into layers each having an associated width and height. The model is fit to the data in an iterative manner until a best fit model is obtained which is similar in structure to the periodic structure.
    Type: Grant
    Filed: April 2, 2003
    Date of Patent: August 17, 2004
    Assignee: Therma-Wave, Inc.
    Inventors: Jon Opsal, Hanyou Chu
  • Patent number: 6778912
    Abstract: A method and apparatus are described by which previously identified aerosol particles that may have precipitated onto surfaces and/or into specific physical regions are detected, removed from said regions, and stored for later examination or destruction. The method includes means such as an ultrasonic probe to loosen said aerosol particles from the surfaces to which they have precipitated and then withdraw them into an optical read head for measurement. The optical read head illuminates each particle, previously diluted and entrained in a sheath flow, as it passes therethrough with a fine beam of light such as produced by a laser. The scattered light produced by each such particle is collected over a range of scattering angles, converted into a digital representation for each value collected, and stored in a computer means.
    Type: Grant
    Filed: October 23, 2002
    Date of Patent: August 17, 2004
    Assignee: Wyatt Technology Corporation
    Inventor: Philip J. Wyatt
  • Publication number: 20040155202
    Abstract: The invention provides a system and method utilizing fluorescence spectroscopy in the ultraviolet portion of the electromagnetic spectrum to determine species and concentration of gases, solids and liquids from a substantial standoff distance. Target materials under investigation may include explosives, drugs, bio-aerosols, and controlled substances such as narcotics. The basic measuring system comprises optics, a spectrograph, a detector, and an energy source (“head” components), along with a computer and control electronics and power source.
    Type: Application
    Filed: November 21, 2003
    Publication date: August 12, 2004
    Applicant: CDEX, INC.
    Inventors: Wade Martin Poteet, Harold K. Cauthen, Timothy D. Shriver
  • Publication number: 20040133362
    Abstract: A method is provided for rapidly reconstructing the surface, shape and material composition of objects reflecting and scattering electromagnetic radiation of a broad band spectrum, and analyzing the reflected intensity of the scattered radiation from complex 2D and 3D structures, applicable to nano-structures as well as micro-wave technologies. This method is done by simultaneously analyzing all unpolarized as well as incident polarized waves, both for TE and TM polarizations. A numerical grid is used that is larger than the feature sizes, but that accurately yields feature size predictions much smaller than the critical dimensions of the structure. This method enables in-situ and on-line analysis to be carried out on a single processor. The method also improves the ability of detecting the composition of the scattering object, by analyzing the scattered radiation. This method is applicable to the microchip and nano-technology industry, as well as to microwave applications.
    Type: Application
    Filed: October 21, 2003
    Publication date: July 8, 2004
    Applicant: EMIT Systems Co.
    Inventors: Eytan Barouch, Stephen L. Knodle
  • Publication number: 20040124357
    Abstract: A gas analysis system. The system includes a Fourier transform infrared (FTIR) spectrometer, a signal transformation module, an unknown chemical analysis module, a calibration model determination module, and a gas concentration calculation module. The signal transformation module receives electronic signals corresponding respectively to background and sample interferograms corresponding to a sample gas from the FTIR spectrometer for further calculation to obtain an absorption spectrum of the sample gas. The unknown chemical analysis module qualitatively analyzes the absorption spectrum of the sample gas to determine the chemical species in the sample gas. The calibration model determination module decides a calibration model. The gas concentration calculation module calculates the gas concentration of each chemical species according to the absorption spectrum, the calibration model and a standard spectrum of the chemical species.
    Type: Application
    Filed: August 29, 2003
    Publication date: July 1, 2004
    Applicant: Industrial Technology Research Institute
    Inventors: Gen-Hou Leu, Shin-Fu Chiou, Shao-I Yen, Kuang-Sheng Wang, Hui Ya Shih
  • Publication number: 20040098205
    Abstract: A microscope system and a method that record spectra (60a, 61a, 62a, 63a, and 66a) of the dyes present in the specimen (15) using an SP module (20) are disclosed. A transformation of the data of the ascertained spectra, and of the dye spectra (60b, 61b, 62b, 63b, and 66b) stored in a database, is performed. The spectra are entered into a correspondingly into a divided transformation space. Allocation of the dye spectra (60b, 61b, 62b, 63b, and 66b) to the measured spectra (60a, 61a, 62a, 63a, and 66a) is accomplished by way of a comparison in the transformation space. allocates the transformed dye spectra to the measured spectra, in which context a comparison can be performed.
    Type: Application
    Filed: October 27, 2003
    Publication date: May 20, 2004
    Applicant: Lecia Microsystems Heidelberg GmbH
    Inventor: Frank Olschewski
  • Patent number: 6732054
    Abstract: A relational database is built and used for the identification of single crystals by electron diffraction. Selected area electron diffraction (SAED) patterns (a lattice net of spots) produced in an electron diffractometer or a transmission electron microscope (TEM) are matched against database patterns calculated from reduced unit cells of known materials. The effects of double diffraction on electron diffraction patterns are fully incorporated into the database by rigorous calculation.
    Type: Grant
    Filed: November 21, 2002
    Date of Patent: May 4, 2004
    Assignee: Shell Oil Company
    Inventor: Haskell Vincent Hart
  • Publication number: 20040083064
    Abstract: A method and apparatus are described by which previously identified aerosol particles that may have precipitated onto surfaces and/or into specific physical regions are detected, removed from said regions, and stored for later examination or destruction. The method includes means such as an ultrasonic probe to loosen said aerosol particles from the surfaces to which they have precipitated and then withdraw them into an optical read head for measurement. The optical read head illuminates each particle, previously diluted and entrained in a sheath flow, as it passes therethrough with a fine beam of light such as produced by a laser. The scattered light produced by each such particle is collected over a range of scattering angles, converted into a digital representation for each value collected, and stored in a computer means.
    Type: Application
    Filed: October 23, 2002
    Publication date: April 29, 2004
    Inventor: Philip J. Wyatt
  • Publication number: 20040064263
    Abstract: One aspect of the invention discloses a method of determining the dopant profile of doped regions in a semiconductor substrate. A pump laser is used to create excess carriers in this semiconductor substrate. The excess carrier concentration will influence the reflection of a probe laser. From the reflected probe laser not only the bulk components but also the near-surface components are eliminated to only yield the bulk components.
    Type: Application
    Filed: July 16, 2003
    Publication date: April 1, 2004
    Inventors: Trudo Clarysse, Wilfried Vandervorst
  • Patent number: 6711516
    Abstract: Described is a method for calibrating a spectrophotometric apparatus. This method involves obtaining a first set of absorbance measurements of a set of calibrators on a First Apparatus that is in control at wavelengths from a first wavelength calibration table. A second wavelength calibration table on a second apparatus is established, wherein the first and the second wavelength calibration tables may be the same or different. A second set of absorbance measurements of the set of calibrators is obtained on the Second Apparatus, at wavelengths from the second wavelength calibration table. First and second interpolated absorbances are determined, for the first and the second absorbance measurement, respectively, for at least one wavelength of a Standard Set of Wavelengths. Using the first and the second interpolated absorbances, a linear regression equation for each wavelength of said Standard Set of Wavelengths is determined.
    Type: Grant
    Filed: June 7, 2001
    Date of Patent: March 23, 2004
    Assignee: Spectromedical Inc.
    Inventor: James Samsoondar
  • Patent number: 6704661
    Abstract: A system for characterizing periodic structures formed on a sample on a real time basis is disclosed. A multi-parameter measurement module generates output signals as a function of either wavelength or angle of incidence. The output signals are supplied to a parallel processor. The processor creates an initial theoretical model and then calculates the theoretical optical response of that sample. The calculated optical response is compared to measured values. Based on the comparison, the model configuration is modified to be closer to the actual measured structure. The processor recalculates the optical response of the modified model and compares the result to the measured data. This process is repeated in an iterative manner until a best fit is achieved. The steps of calculating the optical response of the model is distributed to the processors as a function of wavelength or angle of incidence so these calculations can be performed in parallel.
    Type: Grant
    Filed: July 16, 2001
    Date of Patent: March 9, 2004
    Assignee: Therma-Wave, Inc.
    Inventors: Jon Opsal, Hanyou Chu
  • Publication number: 20040039533
    Abstract: A method and system for indexing powder diffraction data are disclosed comprising choosing a maximum impurity peak tolerance level for a crystallography data search, choosing a range of number of calculated peaks for possible indexing solutions having a minimum number of peaks and a maximum number of peaks, selecting a crystal system to search, selecting powder extinction classes to search for indexing solutions, performing an exhaustive unit cell search of each of the selected powder extinction classes using a successive dichotomy approach to determine a set of indexing results, and ranking the obtained solutions according to likelihood.
    Type: Application
    Filed: May 22, 2003
    Publication date: February 26, 2004
    Inventor: Marcus A. Neumann
  • Publication number: 20040024539
    Abstract: A method and system of identifying individual aerosol particles in real time. Sample aerosol particles are compared against and identified with substantially matching known particle types by producing positive and negative test spectra of an individual aerosol particle using a bipolar single particle mass spectrometer. Each test spectrum is compared to spectra of the same respective polarity in a database of predetermined positive and negative spectra for known particle types and a set of substantially matching spectra is obtained. Finally the identity of the individual aerosol particle is determined from the set of substantially matching spectra by determining a best matching one of the known particle types having both a substantially matching positive spectrum and a substantially matching negative spectrum associated with the best matching known particle type.
    Type: Application
    Filed: October 24, 2002
    Publication date: February 5, 2004
    Applicant: The Regents of the University of California
    Inventors: Eric Evan Gard, David Philip Fergenson
  • Publication number: 20040024541
    Abstract: An information measuring apparatus and a measuring method of a specific component are obtained that can achieve high signal strength without being affected by an interfering substance on a surface of a sample.
    Type: Application
    Filed: September 11, 2003
    Publication date: February 5, 2004
    Inventors: Shinji Uchida, Kiyoko Ooshima
  • Publication number: 20040024540
    Abstract: A method of identifying and unknown compound comprises: (a) obtaining an absorption spectrum of the compound; (b) obtaining an absorbance value An(&ngr;n) wherein An is the absorption value at a wavenumber &ngr;n; (c) generating an array of values A′n(&ngr;′n) wherein A′n(&ngr;′n)=An(&ngr;′n)−A″ where A″ is an absorbance value which is modified from the measured absorbance, such as Aavg where Aavg is the average of An(&ngr;n); (d) generating an array of values In(&ngr;n) by integrating A′n(&ngr;′n) over a region of the spectrum; (e) normalizing the array of values In(&ngr;n) with values I′n(&ngr;′n) obtained for a known compound. The system of this invention employs the above-described method in cooperation with a computer capable of receiving the absorption spectrum data and calculating values from the data using algorithms provided to the computer.
    Type: Application
    Filed: June 11, 2003
    Publication date: February 5, 2004
    Inventors: John L. Bove, Sheldon Walfish
  • Patent number: 6675106
    Abstract: A method of determining the properties of a sample from measured spectral data collected from the sample by performing a multivariate spectral analysis. The method can include: generating a two-dimensional matrix A containing measured spectral data; providing a weighted spectral data matrix D by performing a weighting operation on matrix A; factoring D into the product of two matrices, C and ST, by performing a constrained alternating least-squares analysis of D=CST, where C is a concentration intensity matrix and S is a spectral shapes matrix; unweighting C and S by applying the inverse of the weighting used previously; and determining the properties of the sample by inspecting C and S. This method can be used to analyze X-ray spectral data generated by operating a Scanning Electron Microscope (SEM) with an attached Energy Dispersive Spectrometer (EDS).
    Type: Grant
    Filed: June 1, 2001
    Date of Patent: January 6, 2004
    Assignee: Sandia Corporation
    Inventors: Michael R. Keenan, Paul G. Kotula
  • Patent number: 6671630
    Abstract: A system and method of detecting gases in the exhaust of a moving vehicle with a small engine, such as a motorcycle or moped. The system employs a gas analyzer with a beam which makes more than two passes through a detection space. Through multiple passes through the detection space, the gas analyzer generates a signal indicative of the concentrations of one or more components of interest in the exhaust plume. The system also includes a processor for obtaining information about one or more vehicle exhaust components from the generated signal.
    Type: Grant
    Filed: April 9, 2003
    Date of Patent: December 30, 2003
    Assignee: Environmental Systems Products Holdings Inc.
    Inventors: Donald Hugh Stedman, Gary Bishop
  • Patent number: 6671629
    Abstract: A method and a device for measuring the characteristics of a sample by spectral analysis. According to the method, the characteristics are calculated from the spectral data obtained by the spectral analysis, using a calibration model that has been established on the basis of reference samples. In order to improve the stability of the measuring process, an additional calculation of the characteristics (16) of the samples (1) takes place, using at least one additional calibration model (14) that has been established on the basis of additional reference samples (1″). Deviations between the characteristics (12, 16) calculated by the respective calibration models (11, 14) are determined and output.
    Type: Grant
    Filed: June 17, 2002
    Date of Patent: December 30, 2003
    Assignee: Siemens Aktiengesellschaft
    Inventor: Peter Maier
  • Patent number: 6651015
    Abstract: Described is a method for determining the concentration of an analyte in a future sample that is measured on a second apparatus. This method involves incorporating, in a second apparatus, at least one primary calibration algorithm that is developed using absorbances of samples from a primary calibration set. The absorbances, which are optionally pre-processed prior to primary calibration algorithm development, are obtained from one or more first apparatus. The absorbance values of the future sample are measured on the second apparatus at one or more than one wavelength from a standard set of wavelengths, and a concentration of the analyte in the future sample is calculated by applying the Primary Calibration Algorithm to the optionally pre-processed absorbance of the future sample obtained from the second apparatus.
    Type: Grant
    Filed: September 30, 2002
    Date of Patent: November 18, 2003
    Inventor: James Samsoondar
  • Patent number: 6643603
    Abstract: A chromatic dispersion distribution measurement apparatus, comprises: a chromatic dispersion value calculation unit for calculating a plurality of actual chromatic dispersion values in an optical device at a plurality of wavelengths; and a chromatic dispersion interpolation unit for interpolating an expected chromatic dispersion value between the actual chromatic dispersion values calculated by the chromatic dispersion value calculation unit, in order to obtain a chromatic dispersion distribution as a function of wavelength.
    Type: Grant
    Filed: January 18, 2002
    Date of Patent: November 4, 2003
    Assignee: Ando Electric Co., Ltd.
    Inventors: Shoichi Aoki, Akio Ichikawa
  • Publication number: 20030204327
    Abstract: A system and method of detecting gases in the exhaust of a moving vehicle with a small engine, such as a motorcycle or moped. The system employs a gas analyzer with a beam which makes more than two passes through a detection space. Through multiple passes through the detection space, the gas analyzer generates a signal indicative of the concentrations of one or more components of interest in the exhaust plume. The system also includes a processor for obtaining information about one or more vehicle exhaust components from the generated signal.
    Type: Application
    Filed: April 9, 2003
    Publication date: October 30, 2003
    Inventors: Donald Hugh Stedman, Gary Allen Bishop
  • Publication number: 20030204326
    Abstract: A system for characterizing periodic structures formed on a sample on a real time basis is disclosed. A spectroscopic measurement module is provided which generates output signals as a function of wavelength. The output signals are supplied to a processor for evaluation. The processor creates an initial theoretical model having a rectangular structure. The processor than calculates the theoretical optical response of that sample to broad band radiation. The calculated optical response is compared to normalized measured values at each of a plurality of wavelengths. Based on the comparison, the model configuration is modified to be closer to the actual measured structure. The processor recalculates the optical response of the modified model and compares the result to the normalized data. This process is repeated in an iterative manner until a best fit rectangular shape is achieved.
    Type: Application
    Filed: April 2, 2003
    Publication date: October 30, 2003
    Inventors: Jon Opsal, Hanyou Chu
  • Patent number: 6640199
    Abstract: A system and method for remotely determining at least one of the temperature of, and the relative concentrations of species making up, a hot fluid, based on the spectral structure of radiation emitted from the fluid. Thermal radiation over a field of view including the hot fluid is collected. At least a portion of the emission spectrum from the collected radiation is resolved. The resolved emission spectrum is resolved into spectra that are characteristic of specific emitting species and emitter temperatures. The temperature of, and the relative concentrations of species making up, the hot fluid, are determined from the relative amounts of at least two resolved spectra.
    Type: Grant
    Filed: October 24, 2001
    Date of Patent: October 28, 2003
    Assignee: Spectral Sciences, Inc.
    Inventors: Neil Goldstein, John Gruninger, Fritz Bien, Jamine Lee
  • Publication number: 20030175160
    Abstract: Rapid spectrum assay of multiple samples with infrared light is made possible by devices and methods that increase total light throughput. Multiple wavelength scan with Fourier analysis is combined with large numbers of sample wells located within infrared light compatible solid materials. In particular, very large scale measurement devices and systems for their use are fabricated from lithography and other techniques used for semiconductor processing.
    Type: Application
    Filed: February 14, 2003
    Publication date: September 18, 2003
    Inventors: William B. Archibald, Alfred W. Archibald
  • Publication number: 20030168585
    Abstract: The field of the present invention is in the area of mass spectroscopy and purity analysis. Specifically the invention is related to determining the purity of sample of materials. The invention also relates to identifying an unknown sample. The present invention also provides a web-based system for scientists to interact with a computer to implement the method. Further the scientist is able to upload and download information to and from the method to and from a database or laboratory information management system. The present invention also provides for an efficient hardware architecture to implement the method.
    Type: Application
    Filed: March 5, 2002
    Publication date: September 11, 2003
    Inventor: Michael Wall
  • Patent number: 6611777
    Abstract: Described is a method for calibrating a spectrophometric apparatus and determining the concentration of an analyte in a sample. This method involves incorporating at least one primary calibration algorithm that uses an order of derivative of absorbance obtained for at least one of a standard set of wavelengths, on a second apparatus. The absorbance values of the sample are measured on the second apparatus at three or more wavelengths from a wavelength calibration table. Interpolated absorbance values are derived from the measured absorbance values for wavelengths from a standard set of wavelengths. A derivative of the interpolated absorbance values is obtained, using the same order of derivative used by the first apparatus. Followed by calculating a concentration of the Analyte in the sample, by applying the Primary Calibration Algorithm to the derivative.
    Type: Grant
    Filed: June 7, 2001
    Date of Patent: August 26, 2003
    Inventor: James Samsoondar
  • Publication number: 20030143751
    Abstract: A method of using a chemical array reader, chemical array readers, and computer program products for use with a chemical array reader. The chemical array reader may include a holder to mount an array and hold the array at a reading position. A light system illuminates a mounted array when at a reading position. A detection system having a focal plane, to detect light from different regions across the array emitted in response to the illumination, when at the reading position, and which generates a resulting signal for each of the regions across the array. An autofocus system which detects and reduces offset between the different regions of an array at the reading position and a determined position of the focal plane.
    Type: Application
    Filed: January 31, 2002
    Publication date: July 31, 2003
    Inventor: John F. Corson
  • Publication number: 20030139886
    Abstract: The present invention is directed to deconvolution and normalization of assay data. The present invention includes a control and analysis system, used in conjunction with a signal generation and detection apparatus, for capturing, processing and analyzing images of samples having resonance light scattering (RLS) particle labels. The control and analysis system processes instructions and algorithms for performing multiplexed assays of two or more colors, for example, to allow separation and analysis of detected light that contains information from two or more different types or sizes of RLS particles. The multiplexing analysis software is preferably incorporated within the system of the present invention, and the multiplexing analysis is preferably performed in real-time during a scanning or assay procedure. The invention provides for a computer readable medium containing instructions for carrying out the same.
    Type: Application
    Filed: September 5, 2002
    Publication date: July 24, 2003
    Inventors: Leon J. Bodzin, Juan Yguerabide, Laurence Warden, Richard R. Anderson, Kate Rhodes