Specified Memory Location Generation For Storage Patents (Class 702/80)
  • Patent number: 10666645
    Abstract: A method of performing operations by a processor of a computer terminal, includes determining an operation system (OS) speed scaling gain used by the OS to transform mouse movement data, which is received from a mouse device via a device interface circuit, into mouse speed data that controls positioning of a mouse pointer relative to pixel locations on a display device. A computer terminal identifier is generated based on the OS speed scaling gain. A computer identification message containing the computer terminal identifier is communicated through a network interface circuit. Related computer terminals and computer authentication nodes are disclosed.
    Type: Grant
    Filed: September 4, 2018
    Date of Patent: May 26, 2020
    Assignee: CA, Inc.
    Inventors: Himanshu Ashiya, Atmaram Shetye
  • Patent number: 9811391
    Abstract: Embodiments in the disclosure are directed to the use of distributed computing to align reads against multiple portions of a reference dataset. Aligned portions of the reference dataset that correspond with an above-threshold alignment score can be assessed for the presence of sparse indicators that can be categorized and used to influence a determination of a state transition likelihood. Various tasks associated with the processing of reads (e.g., alignment, sparse indicator detection, and/or determination of a state transition likelihood) may be able to take advantage of parallel processing and can be distributed among the machines while considering the resource utilization of those machines. Different load-balancing mechanisms can be employed in order to achieve even resource utilization across the machines, and in some cases may involve assessing various processing characteristics that reflect a predicted resource expenditure and/or time profile for each task to be processed by a machine.
    Type: Grant
    Filed: March 3, 2017
    Date of Patent: November 7, 2017
    Assignee: COLOR GENOMICS, INC.
    Inventors: Ryan Barrett, Taylor Sittler, Krishna Pant, Zhenghua Li
  • Patent number: 8935127
    Abstract: A method for recording pulse signals which allows the reconstruction of a time reference. The time of every pulse signal event can be determined by counting sampling result bits preceding the respective sampling result bit using the known sampling frequency. For this purpose, every period of the sampling frequency is associated with a bit representing the respective sampling result and the sampling result bits are stored one by one and per channel in data blocks. The sampling frequency is preferably higher than a pixel clock, a sampling result bit associated with a flank of the pixel clock being marked. The pixel clock can thus be synchronized with the individual events exactly per sampling period. The invention further relates to the field of fluorescence correlation spectroscopy using confocal microscopes or laser scanning microscopes.
    Type: Grant
    Filed: December 16, 2010
    Date of Patent: January 13, 2015
    Assignee: Carl Zeiss Microscopy GmbH
    Inventors: Mirko Liedtke, Frank Klemm, Manfred Loth
  • Patent number: 8909493
    Abstract: A non-volatile memory system that has two or more sub-blocks in a block performs a check before accessing memory cells to see if the condition of a sub-block that is not being accessed could affect the memory cells being accessed. If such a sub-block is found then parameters used to access the cells may be modified according to a predetermined scheme.
    Type: Grant
    Filed: May 15, 2014
    Date of Patent: December 9, 2014
    Assignee: SanDisk Technologies Inc.
    Inventors: Chris Avila, Yingda Dong, Man Lung Mui
  • Publication number: 20140005967
    Abstract: The present disclosure provides a method and a system for characterizing and identifying an electronic device using a physical fingerprint. In one aspect, the characterizing method includes determining the physical fingerprint of a test device using selected memory cells of an SRAM array in the test device, and storing data associated with the physical fingerprint in a database. The physical fingerprint of the test device includes data retention voltages respectfully corresponding to the selected memory cells. In one aspect, the identifying method includes characterizing a test device using data retention voltages of selected memory cells in the test device as a physical fingerprint of the test device, and comparing the physical fingerprint of the test device with a predetermined fingerprint of a target device.
    Type: Application
    Filed: June 28, 2013
    Publication date: January 2, 2014
    Inventors: Kevin E. Fu, Daniel E. Holcomb, Wayne P. Burleson
  • Patent number: 8498830
    Abstract: Example embodiments relate to testing of a battery of a computing device. In example embodiments, a battery test may include determining whether charge control is available for a battery and reading battery data from the battery based on whether charge control is available for the battery. In addition, in example embodiments, the battery test may include determining whether the battery should be replaced based on the battery data.
    Type: Grant
    Filed: August 31, 2010
    Date of Patent: July 30, 2013
    Assignee: Hewlett-Packard Development Company, L.P.
    Inventors: John A. Landry, Robert D. Matthews, John A. Wozniak
  • Patent number: 8339613
    Abstract: A method for making a sample for evaluation of laser irradiation position and evaluating the sample, and an apparatus which is switchable between a first mode of modification of semiconductor and a second mode of making and evaluating the sample. Specifically, a sample is made by irradiating a semiconductor substrate for evaluation with a pulse laser beam while the semiconductor substrate is moved for evaluation at an evaluation speed higher than a modifying treatment speed, each relative positional information between pulse-irradiated regions in the sample is extracted, and stability of the each relative positional information between pulse-irradiated regions is evaluated. The evaluation speed is such a speed that separates the pulse-irradiated regions on the sample from each other in a moving direction.
    Type: Grant
    Filed: March 23, 2012
    Date of Patent: December 25, 2012
    Assignee: Semiconductor Energy Laboratory Co., Ltd.
    Inventors: Ryusuke Kawakami, Miyuki Masaki
  • Patent number: 8271222
    Abstract: Provided is a sampling apparatus that samples a signal under measurement, including a sample processing section that outputs sample data obtained by sampling the signal under measurement with a sampling timing at non-uniform intervals obtained by thinning a reference clock, a storage section that stores the sample data, and a waveform generating section that generates a waveform of the signal under measurement based on the sample data read from the storage section. The sample processing section includes a sampler that samples the signal under measurement in synchronization with the reference clock and a data thinning section that thins the sample data output by the sampler and outputs this thinned data as sample data with the sampling timing at non-uniform intervals.
    Type: Grant
    Filed: June 10, 2008
    Date of Patent: September 18, 2012
    Assignee: Advantest Corporation
    Inventors: Eiji Kanoh, Takayuki Akita, Masayuki Kawabata
  • Patent number: 8195426
    Abstract: Data analysis systems and related methods. An implementation of a method of determining a relationship between a variable of interest and one or more process variables represented by a corresponding plurality of tags may include accessing a data historian including historical data including a variable of interest and a plurality of tags. The method may include defining a plurality of bins, retrieving historical data corresponding with the plurality of bins using the data historian, filtering the historical data for each of the plurality of bins using one or more filters to produce filtered historical data, generating an output display using the filtered historical data for the variable of interest and each of the plurality of tags, and determining which of the plurality of tags correlate with the variable of interest using the output display. The output display may include an overlay CUSUM chart and a correlation plot.
    Type: Grant
    Filed: October 21, 2008
    Date of Patent: June 5, 2012
    Inventor: John Antanies
  • Patent number: 8046180
    Abstract: A model-based system and method for analyzing power source performance and optimizing operational costs are provided. Data from the power source (such as a battery) and/or a device associated with the power source is analyzed and processed to predict an operating life of the power source. This could allow, for example, a power source replacement schedule to be generated for the device. If the analysis indicates that abnormal conditions exist or that any user-defined alerts are warranted, a message could also be sent to an operator terminal. The system and method may continue to monitor the device and thus provide real-time data. The data may also be stored in memory, collected over time, and analyzed or used in various ways. The system and method thus provide a cost effective and reliable analysis of power source performance and any associated operational and replacement costs.
    Type: Grant
    Filed: July 13, 2007
    Date of Patent: October 25, 2011
    Assignee: Honeywell International Inc.
    Inventors: Steve D. Huseth, Andrew G. Berezowski
  • Patent number: 7809515
    Abstract: A protection device for detecting electricity is composed of a control unit, a set of input ends for sampling, a display unit, an acoustic signal generating unit, and a power unit. The aforementioned control unit includes a microprocessor (CPU), a clock pulse wave generator, a first memory, a second memory, an input/output port, and a timer. The microprocessor processes defects in sampled electrical data, such as voltage and current, to display power consumed and accumulated time of use, such that a user can be aware of the electricity information at any time for preparation. The sampled data are compared with each setting value pre-stored in the second memory, and if any one of the data exceeds the setting value, the microprocessor will output a warning signal or shut down the power, to maintain safety.
    Type: Grant
    Filed: November 17, 2006
    Date of Patent: October 5, 2010
    Assignee: Mig Technology, Inc.
    Inventor: Jian-Lin Zhou
  • Patent number: 7769554
    Abstract: There is implemented an instrument check system for storing check data of an instrument for a long period of time in an instrument body in a stylized format. The instrument check system comprises an instrument provided with an AD converter for converting a voltage value applied to an input terminal into a digital value, a checking PC connected to the instrument so as to communicate with the instrument, a voltage generation unit for applying a checking voltage value to the input terminal, a check data storage unit formed in the instrument, wherein the checking PC comprises an input check means for acquiring data that is converted from the voltage value into the digital value by the AD converter upon giving an instruction to the voltage generation unit, and storing the data in the check data storage unit.
    Type: Grant
    Filed: November 30, 2007
    Date of Patent: August 3, 2010
    Assignee: Yokogawa Electric Corporation
    Inventor: Yuichi Kikuchi
  • Patent number: 7765088
    Abstract: Storing data records associated with an extreme value are disclosed. Signal data is stored in a first buffer of a set of buffers. If a local extreme value for the first buffer exceeds a global extreme value, signal data is stored in a second buffer of the set of buffers. This process is repeated, wrapping around and overwriting buffers until the signal data in a current buffer does not have a local extreme value that exceeds the global extreme value. When this happens, signal data may be stored in a subsequent buffer and if a local extreme value of the subsequent buffer does not exceed the global extreme value, further signal data may be stored in the subsequent buffer in a circular manner until either an instantaneous extreme value exceeds the global extreme value or the recording period ends. In an embodiment, the extreme value may be a peak value.
    Type: Grant
    Filed: February 26, 2008
    Date of Patent: July 27, 2010
    Assignee: Medtronic, Inc.
    Inventor: Touby A. Drew
  • Patent number: 7542862
    Abstract: A method and system for calibration of multi-metric sensitive delay measurement circuits provides for reduction of process-dependent variation in delays and their sensitivities to circuit metrics. A process corner for the delay circuit(s) is determined from at least one delay measurement for which the variation of delay due to process variation is previously characterized. The delay measurement(s) is made at a known temperature(s), power supply voltage(s) and known values of any other environmental metric which the delay circuit is designed to measure. Coefficients for delay versus circuit metrics are then determined from the established process corner, so that computation of circuit metric values from the delay measurements have improved accuracy and reduced variation due to the circuit-to-circuit and/or die-to-die process variation of the delay circuits.
    Type: Grant
    Filed: May 18, 2007
    Date of Patent: June 2, 2009
    Assignee: International Business Machines Corporation
    Inventors: Harmander Singh, Alan J. Drake, Fadi H. Gebara, John P. Keane, Jeremy D. Schaub, Robert M. Senger
  • Publication number: 20080215268
    Abstract: Disclosed are various embodiments for outage detection. In one embodiment, an outage detection system includes a signal sampler configured to sample a signal on a communications link and to determine a noise level and a signal level of the sample. An outage detection system also includes a comparator configured to compare a critical value with a sum of signal and noise of the sample. An outage detection system further includes a binomial probability analyzer configured to calculate a binomial probability of false outage of the sample and the previous N samples.
    Type: Application
    Filed: March 3, 2008
    Publication date: September 4, 2008
    Inventors: Damian Bonicatto, Chad Wolter, Verne Olson
  • Patent number: 7415370
    Abstract: A method of compressing values of a waveform of a monitored electrical power signal. The method includes acquiring data representative of periods of the waveform, decomposing the waveform of the power signal into a plurality of components over a plurality of periods of the waveform, compressing the values of at least some of the components over a plurality of periods, and storing these values and extents.
    Type: Grant
    Filed: April 18, 2004
    Date of Patent: August 19, 2008
    Assignee: ELSPEC Ltd.
    Inventors: Pol Nisenblat, Amir Mordehay Broshi, Ofir Efrati
  • Patent number: 7401005
    Abstract: A recording of a first selectable process signal of a system is indexed by a second process signal that is different from the timing signal of the system. First process signals acquired in this way are stored in a memory as a function of the index-forming second process signal, wherein a measurement value represented by a first process signal is distributed over adjacent memory locations of the memory if the first acquired process signal has a non-integer index.
    Type: Grant
    Filed: January 8, 2003
    Date of Patent: July 15, 2008
    Assignee: Siemens Aktiengesellschaft
    Inventor: Gerhard Heinemann
  • Publication number: 20080147342
    Abstract: A data analysis technique for a long data record in a memory uses a reference, either user-provided or calculated from the data in the long data record, as a representative event. Each event in the long data record is compared with the reference to determine whether there are significant deviations from the reference. Those events having significant deviations are identified as events of particular interest for a user. The reference may be either a waveform shape or a mean time interval between events. A tolerance value may be added to the waveform reference and varied for dynamic limit testing. Events that are outside the waveform reference as modified by the tolerance value are identified as outliers and may be reduced to iconic images for display simultaneously with the long data record and a selected one of the outliers.
    Type: Application
    Filed: October 27, 2006
    Publication date: June 19, 2008
    Inventors: Patricia A. Heuser, Tristan A. Robinson
  • Publication number: 20080133159
    Abstract: There is implemented an instrument check system capable of storing check data of an instrument for a long period of time in an instrument body in a stylized format.
    Type: Application
    Filed: November 30, 2007
    Publication date: June 5, 2008
    Applicant: YOKOGAWA ELECTRIC CORPORATION
    Inventor: Yuichi KIKUCHI
  • Patent number: 7359837
    Abstract: Methods and apparatus for storing data records associated with an extreme value are disclosed. Signal data is stored in a first buffer of a set of buffers. If a local extreme value for the first buffer exceeds a global extreme value, signal data is stored in a second buffer of the set of buffers. This process is repeated, wrapping around and overwriting buffers until the signal data in a current buffer does not have a local extreme value that exceeds the global extreme value. When this happens, signal data may be stored in a subsequent buffer and if a local extreme value of the subsequent buffer does not exceed the global extreme value, further signal data may be stored in the subsequent buffer in a circular manner until either an instantaneous extreme value exceeds the global extreme value or the recording period ends. In an embodiment, the extreme value may be a peak value.
    Type: Grant
    Filed: April 27, 2006
    Date of Patent: April 15, 2008
    Assignee: Medtronic, Inc.
    Inventor: Touby A. Drew
  • Patent number: 7359820
    Abstract: Disclosed are a method, information processing system and computer readable medium for performing a system test on a program. The method comprises creating a test plan associated with a system test. The system test is for testing a program within an environment. At least one test trigger to be monitored for during the system test is defined within the test plan. Execution of the system test on a system under test for the at least one test trigger is monitored. An occurrence of the at least one test trigger is determined. The test plan is modified to take into account the occurrence of the at least one test trigger in response to determining the occurrence. Execution of the system test is continued based on the modified test plan.
    Type: Grant
    Filed: January 3, 2007
    Date of Patent: April 15, 2008
    Assignee: International Business Machines Corporation
    Inventors: Michael E. Browne, Andrew P. Wack, Monica J. Lemay, Derwin D. Gavin
  • Patent number: 7272532
    Abstract: A method is provided for predicting a quality characteristic of a product to be manufactured. The method may integrate one or more of feature and tolerance information associated with the product, manufacturing characteristic information associated with the manufacture of the product, measurement capability characteristic information associated with the manufacture of the product, assembly characteristic information associated with an assembly of the product, and desired quality characteristic information associated with the product. Based on the integrated information, the quality characteristic of the product may be predicted.
    Type: Grant
    Filed: September 28, 2004
    Date of Patent: September 18, 2007
    Assignee: Caterpillar Inc.
    Inventors: Scott Shafer, Alan Stockner, Ye Tian
  • Patent number: 7260490
    Abstract: In a method and device measuring a delay time of a section of a digital circuit, an output signal of the section is saved in different memory locations with a clock and earlier by a time interval with respect to the clock, different durations being assigned to the time interval. The delay time is determined as a function of the greatest of the different durations during which a test proceeds in a positive manner. The test proceeds in a positive manner if the value saved with the clock corresponds with the value saved so as to be earlier by the corresponding time interval.
    Type: Grant
    Filed: August 30, 2005
    Date of Patent: August 21, 2007
    Assignee: Infineon Technologies, Inc.
    Inventor: Stefan Linz
  • Patent number: 7260493
    Abstract: There is provided a method that includes (a) sampling a data signal and a clock signal by applying strobes for obtaining a corresponding bit values each for the data signal and for the clock signal, each of the strobes having a different phase offset with respect to a tester clock signal, (b) deriving first comparison results for the bit values of the data signal by comparing the bit values of the data signal each with an expected data bit value of expected data, (c) deriving second comparison results for the bit values of the clock signal by comparing the bit values of the clock signal each with an expected clock bit value, (d) deriving for the strobes combined comparison results by applying logical operations each on pairs of corresponding first and second comparison results, and (e) deriving a test result based on the combined comparison results.
    Type: Grant
    Filed: February 14, 2006
    Date of Patent: August 21, 2007
    Assignee: Verigy (Singapore) Pte. Ltd.
    Inventors: Bernd Laquai, Joerg-Walter Mohr
  • Patent number: 7246017
    Abstract: A waveform measuring apparatus can sequentially and continuously read measurement data from an acquisition memory, where the measurement data has been written by multiple acquisitions, after acquisition stops. The waveform measuring apparatus writes measurement data to the acquisition memory based on a trigger signal, and includes a pseudo trigger signal generation unit that continuously reads measurement data that is written in the acquisition memory.
    Type: Grant
    Filed: April 13, 2005
    Date of Patent: July 17, 2007
    Assignee: Yokogawa Electric Corporation
    Inventor: Shin'ichi Nakano
  • Patent number: 7236894
    Abstract: A circuit, system and method adjusts a reference voltage, such as an internal or external reference voltage VREF, in response to a first voltage at a first contact, such as a pin on a memory controller used for reading or writing data, and a second voltage at a second contact in embodiments. Logic is coupled to the first and second contacts to provide a control signal in response to the first and second voltages. A comparator provides an input signal to the logic in response to a target reference voltage and the reference voltage during a calibration or initialization mode of operation. In an alternate embodiment, a plurality of data values at a first contact are compared to a predetermined plurality of test data. An up/down signal is then provided to a counter and a register stores a counter value used to provide a reference voltage.
    Type: Grant
    Filed: December 23, 2004
    Date of Patent: June 26, 2007
    Assignee: Rambus Inc.
    Inventors: Kyung Suk Oh, Frank Lambrecht, David Nguyen
  • Patent number: 7225105
    Abstract: A performance monitor includes at least one Monitor Mode Control Register (MMCR) and plural Performance Control Monitors (PMCs). Each PMC is controlled by the MMCR to pair or group the PMCs so that the overflow from one PMC can be directed to its pair/group. By coupling the PMCs so that overflow from one can be directed to another, the effective size of the counters can be increased.
    Type: Grant
    Filed: December 10, 2003
    Date of Patent: May 29, 2007
    Assignee: International Business Machines Corporation
    Inventor: Alexander E. Mericas
  • Patent number: 7225110
    Abstract: A performance monitor includes at least one Monitor Mode Control Register (MMCR) and plural Performance Control Monitors (PMCs). Each PMC is controlled by the MMCR to pair or group the PMCs so that the overflow from one PMC can be directed to its pair/group. By coupling the PMCs so that overflow from one can be directed to another, the effective size of the counters can be increased.
    Type: Grant
    Filed: August 16, 2001
    Date of Patent: May 29, 2007
    Assignee: International Business Machines Corporation
    Inventor: Alexander E. Mericas
  • Patent number: 7184920
    Abstract: Performing delay measurement between master and slave devices. The master transmits a delay measuring signal at a fixed timing relative to a synchronous pattern signal in an overhead and transmits a frame signal in which an internal delay time, associated with a frame signal generation, from a delay measurement start timing to a transmission timing of the delay measuring signal is stored in the delay measuring signal as a master offset value. The slave adds an internal delay time associated with a frame signal generation to the master offset value of the frame signal, making a slave offset value and transmits an updated delay measuring signal with the slave offset value. The master calculates a delay time by subtracting the slave offset value from a time difference between a timing at which the delay measuring signal transmitted from the slave is received and the delay measurement start timing.
    Type: Grant
    Filed: May 18, 2004
    Date of Patent: February 27, 2007
    Assignee: Fujitsu Limited
    Inventors: Hironobu Sunden, Mitsunori Hamada
  • Patent number: 7162376
    Abstract: A system comprises a master device and a plurality of memory devices coupled to the master device by an interconnect in an embodiment. The master device obtains a plurality of values representing reference voltage values and selects a first value in the plurality of values representing reference voltage values to generate an internal reference voltage value when reading data from a selected memory device in the plurality of memory devices. A method comprises obtaining a plurality of values representing reference voltages for a plurality of memory devices in an embodiment. A first value is selected in the plurality of values representing reference voltages. A reference voltage value is adjusted in response to the first value to an adjusted reference voltage value. Data is transferred to a selected memory device in the plurality of memory devices using the adjusted reference voltage value.
    Type: Grant
    Filed: February 22, 2005
    Date of Patent: January 9, 2007
    Assignee: Rambus Inc.
    Inventors: Kyung Suk Oh, Frank Lambrecht, David Nguyen
  • Patent number: 7143008
    Abstract: To provide a method of collecting and storing storage network performance information that allows tracking of the cause of application performance deterioration. It is automatically judged whether or not performance information collected, to be stored, from components of a storage network including a host server and a storage system has a possibility of ever being used in a search for the cause of application performance deterioration, and the degree of importance of performance information is determined based on the result of the judgment. The preservation period of performance information that is high in degree of importance is set long, while a short preservation period is set to performance information of low degree of importance. After the preservation period set to the respective performance information expires, the corresponding performance information is deleted.
    Type: Grant
    Filed: November 30, 2004
    Date of Patent: November 28, 2006
    Assignee: Hitachi, Ltd.
    Inventors: Hiroyuki Ochi, Hideo Ohata, Kei Takeda
  • Patent number: 7075313
    Abstract: An electronic measuring instrument encompasses a sensor for the acquisition of process variables, a main memory for the operating parameters of the measuring instrument as well as several additional memory blocks for at least part of the operating parameters of the measuring instrument: The additional memory blocks includes a first memory block which serves to store active operating parameters, a second memory block for storing delivered preset operating parameters and a third memory block for storing application-specific operating parameters. An electronic measuring instrument of this design allows the user to access different versions of the operating parameters, enabling him for instance in the event of a failure or upon exchanging a component of the measuring instrument to activate the respectively appropriate version of operating parameters. A method for operating the instrument is also disclosed.
    Type: Grant
    Filed: November 8, 2004
    Date of Patent: July 11, 2006
    Assignee: Krohne Messtechnik GmbH & Co. KG
    Inventor: Jurgen Wolter
  • Patent number: 7076375
    Abstract: A method and apparatus for charging and testing a battery wherein the battery is monitored throughout the process and loads are adjusted by a microprocessor based upon the data collected during the process. Furthermore, the microprocessor allows battery information to be collected and transmitted to a variety of sources.
    Type: Grant
    Filed: September 6, 2002
    Date of Patent: July 11, 2006
    Assignee: SPX Corporation
    Inventors: Kurt Raichle, Weixing Xia
  • Patent number: 7053790
    Abstract: The present invention relates to a remote meter reading system using a grouped data structure. The central processing unit of the electronic electric power meter collects the data having similar function and groups the same. Each group is classified into main items, and each main item is classified into sub-items and is stored in the memory apparatus, and when a data transmission request signal of the wired and wireless meter reading terminal and the remote meter reading server is inputted in accordance with a data address system corresponding to a grouped data stored in the memory apparatus, a collecting data corresponding to the data address system that the data transmission request signal represents is selected, and is transmitted to the wired and wireless meter reading terminal and the remote meter reading server, respectively.
    Type: Grant
    Filed: July 24, 2003
    Date of Patent: May 30, 2006
    Assignee: Korea Electric Power Corporation
    Inventors: Moon Jong Jang, Seon Ku Cho, Bong Jae Lee, Jin Ho Shin, Jae Hee Lee, Eui Yeul Kim, Keon Hang Lee
  • Patent number: 7047138
    Abstract: A method and apparatus for providing a zero dead time for flow analyzers, flow cytometers, and other measurement devices. A circular buffer is used to store data from a flow analyzer in a plurality of data storage areas, until it is convenient to implement more time-consuming data processing procedures. User specified parameters, including sampling rate and/or sampling period, size and number of data storage areas, size of the circular or other buffer, signal-to-noise threshold, order of processing when a plurality of Digital Signal Processors (DSPs) is used, and fixed trailing distance, are used to provide flexible and convenient operation by a user. The probability of missing a rare event occurring within the laser beam or other light beam of a flow analyzer or other measurement device is reduced to zero.
    Type: Grant
    Filed: October 28, 2003
    Date of Patent: May 16, 2006
    Assignee: Luminex Corporation
    Inventor: Van S. Chandler
  • Patent number: 7035959
    Abstract: A measuring device, a measuring device controller, a measuring system, a measurement process performing method and a recording medium thereof which can easily and adequately perform a measurement process are provided. The present invention is constructed to include a program receiving unit 110 for receiving a control program, which comprises contents prescribing a measurement process, from said network; a memorizing unit 120 for memorizing the control program; an initiating instruction receiving unit 130 for receiving a program initiating instruction of the control program from the network; and a measurement control unit 156 for letting a measuring unit 160 perform the measurement process based on the control program memorized by the memorizing unit 120 in case the initiating instruction receiving unit 130 receives the program initiating instruction.
    Type: Grant
    Filed: April 17, 2001
    Date of Patent: April 25, 2006
    Assignee: Advantest Corporation
    Inventors: Satoshi Umezu, Jun Miyajima, Takahiro Yamaguchi, Norio Arakawa
  • Patent number: 7013243
    Abstract: Since a multiplexed signal quality display system according to the present invention is provided with a memory means which stores measurement results obtained by measuring electric powers of signals present in all of channels within a band used and a display means which specifies a channel where the presence of a signal is predicted and which reads and displays the measured value of the specified channel, it is possible to display the waveform quality of a channel which is determined by desired Walsh code and Walsh code length.
    Type: Grant
    Filed: June 8, 2001
    Date of Patent: March 14, 2006
    Assignee: Advantest Corporation
    Inventors: Satoshi Koizumi, Juichi Nakada, Eiji Nishino, Hideki Ichikawa
  • Patent number: 7006933
    Abstract: A switching semiconductor device (11) provided in a semiconductor module (10) includes a plurality of switching semiconductor elements. A loss calculating section (12) calculates a power loss generated in the switching semiconductor device (11) based on a voltage of each of the switching semiconductor elements which is measured by a voltage measuring section (13) and a current of each of the switching semiconductor elements which is measured by a current measuring section (14). The loss calculating section (12) outputs loss data indicative of the power loss thus calculated as a data signal to a motor control section (82) provided on the outside of the semiconductor module (10). The motor control section (82) can recognize the power loss generated in the switching semiconductor device (11) from the loss data.
    Type: Grant
    Filed: December 13, 2002
    Date of Patent: February 28, 2006
    Assignee: Mitsubishi Denki Kabushiki Kaisha
    Inventor: Noboru Miyamoto
  • Patent number: 6956422
    Abstract: A circuit and method for generating a delayed event following a trigger pulse occurring at a random time between clock pulses is disclosed. The circuit includes a clock circuit, a voltage converter, an analog-to-digital converter circuit, a memory storage circuit, and a summing circuit. The method includes representing the time between the triggering pulse and a subsequent clock pulse as a voltage, converting the voltage to a stored digital value, and defining a desired delay time by adding a first time determined by counting a predetermined number of clock cycles to a second time determined by converting the stored digital value first to an analog value and then to a time value.
    Type: Grant
    Filed: December 23, 2003
    Date of Patent: October 18, 2005
    Assignee: Indiana University Research and Technology Corporation
    Inventors: James P. Reilly, Noah P. Christian
  • Patent number: 6954838
    Abstract: A virtual counter for dynamically calculating memory addresses at a digital switch that receives data streams of different data rates. The switch has a memory that is divisible into partitions with each partition being divisible into multiple locations. A virtual counter is implemented for each data stream in a rate conversion architecture at the switch to optimize usage of the switch memory. An input virtual counter is used to calculate a data memory address and an output virtual counter is used to calculate a connection memory address.
    Type: Grant
    Filed: May 1, 2003
    Date of Patent: October 11, 2005
    Assignee: Zarlink Semiconductor Inc.
    Inventors: Wenbao Wang, Kwok Fai Chan
  • Patent number: 6947854
    Abstract: The present invention comprises systems and methods related to monitoring of energy usage on a power line. In a preferred embodiment, this system comprises (a) an electronic microprocessor-controlled digital electricity metering device coupled to the power line and comprising a non-volatile non-battery-powered data-storage device, wherein the metering device is capable of interval metering and of receiving a data request and transmitting data in response to the request over the power line; and (b) a data collector (preferably, a transponder) coupled to the metering device via the power line. The data collector is preferably capable of (i) receiving data from and transmitting data to the metering device over the power line, (ii) storing data received from the metering device over the power line, and (iii) receiving data from and transmitting data to a remotely located computer (preferably, a billing computer).
    Type: Grant
    Filed: February 28, 2001
    Date of Patent: September 20, 2005
    Assignee: Quadlogic Controls Corporation
    Inventors: Sayre A. Swarztrauber, Doron Shafrir, Stanley C. Lo, Michael Newsome, Eric Jacobson
  • Patent number: 6937965
    Abstract: A method for creating a guardband that incorporates statistical models for test environment, system environment, tester-to-system offset and reliability into a model and then processes a final guardband by factoring manufacturing process variation and quality against yield loss.
    Type: Grant
    Filed: March 7, 2000
    Date of Patent: August 30, 2005
    Assignee: International Business Machines Corporation
    Inventors: Mark R. Bilak, Joseph M. Forbes, Curt Guenther, Michael J. Maloney, Michael D. Maurice, Timothy J. O'Gorman, Regis D. Parent, Jeffrey S. Zimmerman
  • Patent number: 6917898
    Abstract: A method and system are provided for generating statistical information from input data relating to the operation of a monitored system over time. The monitored system is preferably a contact center or call centre. The method involves pegging input data relating to the operation of the system over a finite time interval and storing this pegged data in a record so that the contents of the record are identifiable according to the finite time interval to which the data relates. This pegging is repeated continually resulting in a large number of records being stored, each containing data relating to a short time interval. The pegged data from the revelant records can then be used multiple times in a variety of statistical threads or windows rather than having each statistical thread engine peg the information it requires separately.
    Type: Grant
    Filed: September 30, 2003
    Date of Patent: July 12, 2005
    Assignee: Nortel Networks Limited
    Inventors: Nithyaganesh Kirubalaratnam, Tony McCormack, Paul D'Arcy
  • Patent number: 6909979
    Abstract: The present invention is intended to provide a waveform measuring instrument whose waveform reproducibility in the equivalent time sampling system is improved. The present invention is characterized by that, in a waveform measuring instrument configured so that the repeated waveform data items are acquired and sent to the acquisition memory by means of the equivalent time sampling, the above acquisition memory is divided into a plurality of time slot regions corresponding to the interval of equivalent time sampling and a plurality of memory address groups is assigned to each time slot region.
    Type: Grant
    Filed: December 18, 2002
    Date of Patent: June 21, 2005
    Assignee: Yokogawa Electric Corporation
    Inventors: Takuya Saitou, Shigeru Takezawa
  • Patent number: 6892167
    Abstract: A real-time data acquisition and storage network for real-time acquisition and storage of analog and digital data from one or multiple network-connected data sources to one or multiple network-connected storage devices during a data recording session, and precise reconstruction of the acquired data from one or multiple of the network-connected storage devices during a playback session. The data source are connected to the network through one or multiple real-time data acquisition network (“R-T DAN”) modules which form one or multiple network-connected data acquisition nodes on the network. Each storage device forms a network-connected storage node on the network so that data acquired at any data acquisition node may be applied to the network and stored at any storage node during a data recording session. The stored data may be retrieved from the storage nodes through the network and routed to the data acquisition nodes for reconstruction of the data during a playback session.
    Type: Grant
    Filed: November 26, 2002
    Date of Patent: May 10, 2005
    Assignee: Sypris Data Systems, Inc.
    Inventors: Jeffrey S. Polan, William A. Bullers
  • Patent number: 6892149
    Abstract: Identifying data loss in a transmission system includes shifting one of a received waveform and a transmitted waveform, determining differences between the transmitted and received waveforms at various shift points, and identifying a smallest of the differences between the transmitted and received waveforms. A plot of the differences relative to the shift points may be generated. The smallest of the differences may be a low vertex point on the plot.
    Type: Grant
    Filed: May 31, 2001
    Date of Patent: May 10, 2005
    Assignee: Intel Corporation
    Inventor: Stuart W. Sherlock
  • Patent number: 6885953
    Abstract: A method and apparatus for saving the operational settings of an instrument. The method comprises the steps of: initiating the saving operation, initializing, by each software object, of any software object below it, initializing the internal variables belonging to the software objects, and saving the results to a file. The file is modular, is human readable text and is a computer program. The internal variable is designated in the file by a hierarchical path and is designated in the file by a hierarchical address. The computer program in an industry standard programming language such as Visual Basic Script.
    Type: Grant
    Filed: November 16, 2001
    Date of Patent: April 26, 2005
    Assignee: LeCroy Corporation
    Inventors: Rudolf Farkas, Anthony Cake
  • Patent number: 6792392
    Abstract: A system and method are described for configuring and collecting performance counter information of a computer system. The method includes providing one or more performance objects, each object containing a predetermined set of events. A user is allowed to select the entire set or a subset of events to be monitored during a collection session from the predetermined set of events contained in the performance objects. The performance counters associated with the subset of events selected are programmed to increment in response to an occurrence of a respective event. The data stored in each of the performance counters associated with the subset of events selected is periodically read during the collection session.
    Type: Grant
    Filed: June 30, 2000
    Date of Patent: September 14, 2004
    Assignee: Intel Corporation
    Inventor: Robert P. Knight
  • Patent number: 6792378
    Abstract: A method for testing I/O ports of a computer motherboard under test. A non-volatile memory on the computer motherboard under test is provided with a test code for initializing the computer motherboard and testing its I/O ports, in which the test code includes a plurality of test routines corresponding to the I/O ports to be tested. Upon power-up or reboot, the computer motherboard under test is booted from the test code in the non-volatile memory. One of the I/O ports is selected from an interactive display menu, and then a CPU on the computer motherboard under test executes the corresponding test routine for the selected I/O port to test it. If there is an abnormal signal pin in the selected I/O port, a failure message is displayed to indicate which signal pin of the selected I/O port is not operating correctly. Otherwise, a pass message is displayed.
    Type: Grant
    Filed: November 21, 2002
    Date of Patent: September 14, 2004
    Assignee: Via Technologies, Inc.
    Inventors: Zhiguo Chen, Chih-Wei Huang, Chao-An Chen
  • Patent number: 6768703
    Abstract: Delay induced apparent amplitude desensitization in a data signal channel and its accompanying worm-like distortion in an Eye Diagram Analyzer is avoided by altering the measurement to avoid the need for any substantial delay in the path of the data channel threshold comparison signals. In a first technique, only enough delay will be inserted in the data channels to produce the relative adjustments needed to compensate for skew between the data channels, as determined by a calibration operation, and it is these de-skewed, but otherwise un-delayed, data threshold comparison signals that are, in rapid succession, clocked into the latches whose difference registers a hit at a given (time, voltage) pair. The clock path delay is then varied from a minimal value to a sufficiently large value capable of spanning a desired the number of eye diagram cycles.
    Type: Grant
    Filed: April 25, 2002
    Date of Patent: July 27, 2004
    Assignee: Agilent Technologies, Inc.
    Inventors: Richard A Nygaard, Jr., David D. Eskeldson