Abstract: A shunt and shunt control circuit are connected to the wires of an on-chip terminated I/O bus. Each instance monitors the wire that it is connected to. If the wire has been pulled low by any device on the bus, the circuit does nothing. If, however, the wire was not pulled low, then current is shunted from the termination voltage supply to ground. The turn on and turn off rates for this shunt are matched to the ramps of current through the termination impedance of the bus. This makes the variability in current drawn from the termination voltage supply less data dependent.

Abstract: The switching transistors in multiple switching regulators sharing the same input power source are coordinated to lower the peak current drain on the input power source. The turn on times of the transistors in each regulator are set so that each switching transistor turns on at a predetermined time in a cycle. The predetermined time for each regulator is chosen so that the maximum peak current drain on the input power source is minimized. The predetermined times may be changed on-the-fly by inputs to the system when information about current or projected output loads are known. The transistors in each regulator may also be turned on when the transistor in the previous regulator in a sequence turns off. Another embodiment lets the regulator with the largest change in input current over a cycle run independently. The other regulators then switch in a designated order, or at designated times after the first regulator turns its switch off.

Abstract: A device for connection to a Universal Serial Bus (USB) signals connection and disconnection from the bus without physically removing or reinserting the USB cable. The devices system controller controls the signaling so that connection or disconnection may be signaled in a variety of situations to accomplish certain tasks. Connection signaling may be delayed until power-up reset procedures are complete to prevent the device from being polled by the host. A disconnect then a connect may be signaled to help recover from certain error conditions. The same data lines may also be used for interfaces other than the USB bus. A switched connection from a USB data line through a pull-up resistor to a positive supply voltage. The switched connection is controlled by a logic function so that it will not be connected when the power supply on the USB cable is not present. The switched connection is also controlled by a logic signal that may be supplied by the USB device's system controller.

Abstract: The present invention is generally directed to a driver circuit for a high speed transceiver. In accordance with one aspect of the invention, the driver circuit includes a first driver segment disposed to receive a control signal and configured to drive the control signal from a logic zero state to a logic one state and place the driven signal on a first driver segment output. Similarly, the driver circuit includes a second driver segment disposed to receive the control signal and configured to drive the control signal from a logic one state to a logic zero state and place the driven signal on a second driver segment output. In this regard, the control signal is a signal generated internally (i.e., within the chip) to be driven across a bus to another chip. The strength of the control signal must be increased before driving the control signal onto the bus.

Abstract: The present invention is directed to a method and apparatus for testing integrated circuit package devices using automatic testing equipment. The automatic testing equipment may be provided with a light source to enable the testing of image capture type integrated circuit devices. Alternatively, the automatic testing equipment may be provided with an imaging device, e.g., a camera, or both an imaging device and a light source to additionally enable the testing of display type integrated circuit devices.

Abstract: A static logic signal to dynamic logic interface that produces a monotonic output. An inverse of a dynamic logic evaluate clock is fed to the clock input of a transparent latch with clock and enable inputs. A delayed version of the inverse of the evaluate clock is generated by a delay element. The delayed inverse of the evaluate clock is fed to the enable input of the latch. The input to the latch comes from static logic and the output of the latch is fed to the dynamic logic. The net result is a latch that is open until the evaluate clock is instructing the dynamic logic to evaluate, and remains closed until a delay element delay time after the evaluate clock instructs the dynamic logic to reset.

Abstract: An optical barrier made of tungsten (W) or titanium-tungsten (TiW). A layer of the optical barrier material is deposited over a transparent layer such as indium tin oxide (ITO). The optical barrier material is then patterned using photolithography processing steps and hydrogen peroxide as an etchant. The patterned optical barrier material acts as a light-shielding layer over a light-sensing device to form a dark reference device or dark pixel.

Abstract: A system that can test individual components having tolerances on a circuit board without complete access to every node on the board is disclosed. The system uses a method that develops test limits from a model of the board, component tolerances, and a list of accessible nodes. A method of reducing the complexity of the test problem by limiting the number of components under consideration is also disclosed. A method of reducing the complexity of the test problem by limiting the number of nodes under consideration is also disclosed. A method of picking nodes to apply stimulus to a board is also disclosed. Finally, a method of correcting for certain parasitics associated with tester hardware is disclosed.

Abstract: An SRAM that has a column clear function with only three vertical lines and six total lines across a cell and a method of operating that cell and an array of those cells. Instead of two bit lines per port and two access devices per port as in a traditional SRAM cell, one bit line and one access device per port is used. In addition, one additional bit line, one additional word line, and two devices in series are used to perform the column clear operation and complete a write operation. The cell is operated by performing write operations using a two step process. To perform a write, each cell in a row to be written is preset during a first step. Then, each cell that is to have a zero written to it is cleared using the additional bit line and additional word line to address the cells to be cleared. A column of cells may be cleared by enabling all the rows for clearing, then asserting column clear control signals for each of the columns in the array to be cleared.

Abstract: A bit position, M, that determines the accuracy and efficiency of the approximation is selected from an N bit binary number. The multiplicand is generated by removing the Mth bit from the binary number, shifting the bits of lower order than the Mth bit up on position, then filling the lowest order bit with a zero. The multiplier is generated by removing the Mth bit, and all lower order bits from the binary number. Booth's algorithm is then used to multiply the multiplicand and the multiplier except that the Mth bit is used instead of an assumed zero during the first step of the multiplication. In hardware, a partial Booth-encoded multiplier is used to produce and approximate square of a binary number. For an N bit number, and a selected bit in the Mth position, the partial Booth-encoded multiplier has N columns, and N−M rows and N−M booth encoders.

Abstract: The present invention is directed to a method and apparatus for testing integrated circuit package devices using automatic testing equipment. The automatic testing equipment may be provided with a light source to enable the testing of image capture type integrated circuit devices. Alternatively, the automatic testing equipment may be provided with an imaging device, e.g., a camera, or both an imaging device and a light source to additionally enable the testing of display type integrated circuit devices.

Abstract: A process, voltage, and temperature calibration system that shares a single calibration resistor among multiple calibration circuits. The use of single calibration resistor among several calibration circuits is accomplished through time division multiplexing. N-channel and P-channel field effect transistor calibration also share the same resistor. Turning on transistors in calibration circuits of the type not being calibrated creates a low impedance path from one terminal of the calibration resistor to a power supply. This biases the calibration resistor for the calibration circuit.

Abstract: The switching transistors in multiple switching regulators sharing the same input power source are coordinated to lower the peak current drain on the input power source. The turn on times of the transistors in each regulator are set so that each switching transistor turns on at a predetermined time in a cycle. The predetermined time for each regulator is chosen so that the maximum peak current drain on the input power source is minimized. The predetermined times may be changed on-the-fly by inputs to the system when information about current or projected output loads are known. The transistors in each regulator may also be turned on when the transistor in the previous regulator in a sequence turns off. Another embodiment lets the regulator with the largest change in input current over a cycle run independently. The other regulators then switch in a designated order, or at designated times after the first regulator turns its switch off.

Abstract: A system that can test individual components having tolerances on a circuit board without complete access to every node on the board is disclosed. The system uses a method that develops test limits from a model of the board, component tolerances, and a list of accessible nodes. A method of reducing the complexity of the test problem by limiting the number of components under consideration is also disclosed. A method of reducing the complexity of the test problem by limiting the number of nodes under consideration is also disclosed. A method of picking nodes to apply stimulus to a board is also disclosed. Finally, a method of correcting for certain parasitics associated with tester hardware is disclosed.

Abstract: A comparator detects rising transitions of an input waveform and another comparator detects falling transitions. Each comparator detects their respective transition with a different threshold voltage. The outputs of these comparators are multiplexed into the clock input of a flip-flop. The flip-flop's inverted output is connected through a time delay to the input of the flip-flop to form a toggling configuration. The output of the time delay is also connected to the select input of a multiplexer that controls the multiplexer to multiplex the outputs of the two comparators into the clock input of the flip-flop. The threshold voltages chosen for the two comparators are chosen to be in the center of the incident edges of the distorted signal of a source-terminated transmission line. The time delay is chosen to be longer than the difference between the arrival of the incident wave and the arrival of the first reflected wave.

Abstract: A termination structure is shown whereby multiple transmission lines designed to have the same intrinsic impedance and same delay are driven from a central node. The central node is driven by a driver and calibration resistor connected in series to produce a drive impedance that is equal to the parallel combination of the intrinsic impedances of the multiple transmission lines. At the other end of the multiple transmission lines is a receiver and a feedback circuit. The feedback circuit provides a modest amount of positive feedback from the output of the receiver to the input of the receiver. This positive feedback prevents the output of the receiver from being affected by small reflections and perturbations that result from mismatches among the multiple transmission lines.

Abstract: A system that can test individual components having tolerances on a circuit board without complete access to every node on the board is disclosed. The system uses a method that develops test limits from a model of the board, component tolerances, and a list of accessible nodes. A method of reducing the complexity of the test problem by limiting the number of components under consideration is also disclosed. A method of reducing the complexity of the test problem by limiting the number of nodes under consideration is also disclosed. A method of picking nodes to apply stimulus to a board is also disclosed. Finally, a method of correcting for certain parasitics associated with tester hardware is disclosed.

Abstract: A system that can test individual components having tolerances on a circuit board without complete access to every node on the board is disclosed. The system uses a method that develops test limits from a model of the board, component tolerances, and a list of accessible nodes. A method of reducing the complexity of the test problem by limiting the number of components under consideration is also disclosed. A method of reducing the complexity of the test problem by limiting the number of nodes under consideration is also disclosed. A method of picking nodes to apply stimulus to a board is also disclosed. Finally, a method of correcting for certain parasitics associated with tester hardware is disclosed.

Abstract: An AC signal is switched between two circuit branches using a transformer or at least one directional coupler as a coupling device. Electronically controlled switches shunt one of two terminals of the coupling device to AC ground. The input signal is propagated out of the non-shunted terminal to one of the two circuit branches. The electronically controlled switches may be relays, transistors, or diodes. Diodes prevent the AC signal from being shunted to AC ground when reverse biased and shunt the AC signal to AC ground when forward biased.

Abstract: Two complementary clocks that are well matched are produced from a single input clock. A clock buffer includes an alternating series of edge-rate-controlled inverters and level restoring inverters. The output of this series of inverters is compared to the input clock by a race timer. If the output of the series of inverters switches in the opposite direction before the input clock, the edge rates of the series of inverters are slowed down. If the output of the series of inverters switches in the opposite direction after the input clock, the edge rates of the series of inverters are speeded up. The output of the series of inverters eventually approaches the timing of the input clock but complemented. These signals form a pair of complementary clocks with well matched timing.