Abstract: A system and method of use thereof that enables determining and setting sample alignment based on the location of, and geometric attributes of a monitored image formed by reflection of an electromagnetic beam from a sample and into an image monitor, which beam is directed to be incident onto the sample along a locus which is substantially normal to the surface of the sample.
Abstract: System for, and method of ellipsometric investigation of and analysis of samples which have, for instance, a non-random effectively “regular” textured surface, and/or a surface characterized by an irregular array of faceted structures.
Type:
Grant
Filed:
December 8, 2008
Date of Patent:
November 15, 2011
Assignee:
J.A. Woollam Co., Inc
Inventors:
James N. Hilfiker, Jianing Sun, Ping He, Martin M. Liphardt
Abstract: Systems which utilize electromagnetic radiation to investigate samples and include at least one spatial filter which has an aperture having an opening therethrough of an arbitrary shape, including methodology for fabracting the aperture on an end of an optical fiber per se.
Type:
Grant
Filed:
May 12, 2009
Date of Patent:
September 6, 2011
Assignee:
J.A. Woollam Co., Inc.
Inventors:
Martin M. Liphardt, Ping He, Blaine D. Johs, Craig M. Herzinger
Abstract: A method of impacting a flow of fluid, preferably water, onto a cable which comprises an outer jacket and a plurality of coverings on metal wires therewithin, to simultaneously remove a substantial majority of the outer jacket, and at least some of at least one of the coverings, on the metal wires.
Abstract: A method of conducting a competition with remote controlled vehicles involving young, or young-at-heart people from a plurality of local institutions or establishments, and involving a hierarchy of competitions.
Abstract: A system which automatically reduces change in effective angle and plane of incidence of a reflected focused beam of electromagnetic radiation entering a detector, via use of a detector with dimensions less than is the spatial spread of a reflected focused beam at a location distal to the location on said sample from which it is caused to reflect, preferably after passing through a collimating lens. The basis of operation is that the portion of a reflected focused beam intercepted by the detector changes with change in sample position and/or orientation.
Abstract: Disclosed is a method of promoting oral hygiene and teeth re-calcification involving increasing crevicular fluid flow in a subject in the presence of hydroxide containing material such that OH? ions are formed and caused to contact the teeth. The method further involves causing calcium Ca++ ion containing material to simultaneously, or subsequently, contact the teeth.
Abstract: Horizontally oriented attenuated total reflection (HATR) system applied in spectroscopic ellipsometer or polarimeter systems, and methodology of use.
Abstract: A method of configuring a system for introducing a relative phase retardation into orthogonally polarized components of an electromagnetic beam entered thereinto, wherein the system involves a substantially achromatic multiple element retarder system for use in wide spectral range (for example, 190-1700 nm) rotating compensator spectroscopic ellipsometer and/or polarimeter systems.
Type:
Grant
Filed:
November 4, 2008
Date of Patent:
March 15, 2011
Assignee:
J.A. Woollam Co., Inc.
Inventors:
Blaine D. Johs, Steven E. Green, Craig M. Herzinger, Duane E. Meyer, Martin M. Liphardt
Abstract: A sample investigation system (ES) in functional combination with an alignment system (AS), and methodology of enabling very fast, (eg. seconds), sample height, angle-of-incidence and plane-of-incidence adjustments, with application in mapping ellipsometer or the like systems.
Type:
Grant
Filed:
November 25, 2008
Date of Patent:
January 18, 2011
Assignee:
J.A. Woollam Co., Inc.
Inventors:
Martin M. Liphardt, Jeffrey S. Hale, Ping He, Galen L. Pfeiffer
Abstract: An ellipsometer or polarimeter system and method for controlling intensity of an electromagnetic beam over a spectrum of wavelengths by applying control (P2) and beam (P) polarizers, optionally in combination with an intervening and control compensator (C).
Abstract: Disclosed is a system for controlling focus, angle of incidence and intensity of an electromagnetic beam over a spectrum of wavelengths, and methodology for optimizing investigation of samples which demonstrate low specular reflectance and/or are depolarizing of a polarized beam of electromagnetic radiation, such as solar cells.
Type:
Grant
Filed:
February 21, 2008
Date of Patent:
October 26, 2010
Assignee:
J.A. Woollam Co., Inc.
Inventors:
Galen L. Pfeiffer, Martin M. Liphardt, James N. Hilfiker
Abstract: A small internal volume cell having fluid entry, and exit ports wherein bubble traps are present in a bifurcated fluid pathway continuous with the fluid exit port. There further being present input and output apertures, for entering and exiting electromagnetic radiation, positioned to allow causing a beam of electromagnetic radiation to impinge on a sample substrate at a location thereon at which, during use, fluid contacts; as well as methodology of its use.
Abstract: A system and method of substantially achromatically controlling the intensity of a spectroscopic beam with application in spectrophotometers, reflectometers, ellipsometers, polarimeters or the like systems.
Type:
Grant
Filed:
April 21, 2007
Date of Patent:
September 14, 2010
Assignee:
J.A. Woollam Co., Inc.
Inventors:
Blaine D. Johs, Christopher A. Goeden, Galen L. Pfeiffer
Abstract: Application of digital light processor (DLP) systems in monochromator, spectrophotometer or the like systems to mediate selection of individual wavelengths, and/or to image elected regions of a sample in an imaging ellipsometer, imaging polarimeter, imaging reflectometer, imaging spectrophotometer, and/or to provide chopped beams.
Abstract: A system for reducing reflections of a beam of electromagnetic radiation from the opposite, back, surface of an anisotropic sample, including methodology for investigating the incident, front, surface thereof with electromagnetic radiation, and analyzing the data as if the sample is isotropic.
Abstract: Disclosed is the use of a focused electromagnetic beam which is caused to impinge on the top surface of a tube shaped sample, to investigate a film coating on its inner surface during fabrication thereof and/or thereafter.
Type:
Grant
Filed:
August 30, 2007
Date of Patent:
August 3, 2010
Assignee:
J.A. Woollam Co., Inc.
Inventors:
Gregory K. Pribil, John A. Woollam, Martin M. Liphardt, James D. Welch
Abstract: A system and method of conditioning acceleration signals and/or preventing “glitch” actions due to spurious signals, and/or causing termination a competition, and/or disabling a specific contestant in a competition involving remote controlled miniature race vehicles.
Type:
Grant
Filed:
May 16, 2005
Date of Patent:
July 6, 2010
Inventors:
Kerry T. Namanny, Keith E. Namanny, Kenneth D. Namanny, Barrett D. Moser
Abstract: A substantially self-contained “on-board” material system investigation system for effecting relative translational and rotational motion between a source and detector of electromagnetic radiation and a sample, which system is functionally mounted on a three dimensional locational system to enable positioning at desired locations on, and distances from, the surface of a sample, including the capability to easily and conveniently effect rotation and/or to change the angle-of-incidence of a beam of electromagnetic radiation onto a sample surface and/or to provide gas flow confined in a mini-chamber near the surface of a sample, at a location at which a beam having UV, VUV, IR and/or NIR wavelengths of electromagnetic radiation is caused to be impinged thereupon.
Type:
Grant
Filed:
August 5, 2007
Date of Patent:
June 29, 2010
Assignee:
J.A Woollam Co., Inc.
Inventors:
Blaine D. Johs, Ping He, Martin M. Liphardt, Christopher A. Goeden, John A. Woollam, James D. Welch
Abstract: Systems and methodology for orienting the tip/tilt and vertical height of samples, preferably automated, as applied in ellipsometer and the like systems.
Type:
Grant
Filed:
August 29, 2008
Date of Patent:
June 29, 2010
Assignee:
J.A. Woollam Co., Inc.
Inventors:
Blaine D. Johs, Ping He, Martin M. Liphardt, Christopher A. Goeden, John A. Woollam, James D. Welch