Abstract: A computer device includes memory that stores a test plan for a coordinate measuring machine to perform an object measurement. The test plan includes at least one test feature for a plurality of reference elements of the object. The computer device includes at least one processor configured to execute instructions stored in the memory. The instructions include, for each of the reference elements, obtaining at least one accuracy variable. The accuracy variable specifies an accuracy of the measurement result of a respective reference element. The instructions include ascertaining an error effect of each reference element on the quantification of the test feature based on the respective accuracy variable. The instructions include ascertaining for each of the error effects whether it meets an error criterion and, if so, classifying a reference element assigned to this error effect as a critical reference element.

Abstract: A method and an arrangement for producing a workpiece using additive manufacturing techniques involve pre-process, in-process and post-process measurement in order to determine individual characteristics of one or more workpiece layers. In particular, dimensional and/or geometrical characteristics of a workpiece layer are measured before the next workpiece layer is produced. Advantageously, production parameters are controlled in response to individual material characteristics determined prior to the production process. Also advantageously, measurement results are fed back into a production process in order to increase accuracy, reliability, repeatability and precision of the production process.

Abstract: A position of an object is determined by optically capturing at least one capture structure arranged at the object or at a reference object captured from the object and thereby obtaining capture information, the at least one capture structure having a point-symmetrical profile of an optical property that varies along a surface of the capture structure, transforming a location-dependent mathematical function corresponding to the point-symmetrical profile of the optical property into a frequency domain, forming a second frequency-dependent mathematical function from a first frequency-dependent mathematical function, wherein the second mathematical function is formed from a relationship of in each case a real part and an imaginary part of complex function values of the first frequency-dependent mathematical function, and forming at least one function value of the second frequency-dependent mathematical function and determining the same as location information about a location of a point of symmetry of the locati

Abstract: A coordinate measuring machine for measuring coordinates or properties of a workpiece includes an extended stylus. The extended stylus includes an extension element and a connection element. The extension element includes a carrier portion mounted at the connection element so as to be rotatable about an axis of rotation. The extension element includes, on a side remote from the connection element, a shaft portion that is aligned so as to deviate from the axis of rotation. The coordinate measuring machine includes a measurement head to which the extended stylus is attached. The measurement head is configured to measure deflections of the stylus resulting from contacts of the extended stylus to the workpiece.

Abstract: A system for optical measurement of an object includes a radiation generating device, a capturing device, and an evaluation device. The radiation generating device is configured to emit electromagnetic radiation onto the object. The capturing device includes an image sensor. The capturing device is configured to capture a measurement image as a result of an exposure of the image sensor with radiation returned from the object. The capturing device is configured to vary a focus setting (D) during the exposure. The evaluation device is configured to determine coordinates of at least one location on the object based on the captured measurement image.

Abstract: An apparatus for determining a spatial position and orientation of a tracked measuring device includes a light detection and ranging (LIDAR) unit having at least one measurement channel configured to generate at least one measurement signal, and a control and evaluation unit including a reception unit configured to receive data from the tracked measuring device in wireless fashion, the LIDAR unit being configured to generate a LIDAR signal for the at least one measurement signal and to transfer said LIDAR signal to the control and evaluation unit, the apparatus having a synchronization channel integrated at least in part into the measurement channel of the LIDAR unit and configured to determine a synchronization information item, and the control and evaluation unit being configured to temporally synchronize the data of the tracked measuring device and the LIDAR signal by taking into account the at least one synchronization information item.

Abstract: A method evaluates a sample of measurement data from measuring multiple workpieces by at least one coordinate measuring machine. A system of statistical distributions describes a frequency of measurement data values. The distributions are distinguishable based on skewness and kurtosis. The method includes defining a set of statistical distributions that are able to describe a frequency of measurement data values in the entire value interval from the system of statistical distributions for a value interval of the measurement data, which is a specified value interval or a value interval of the measurement data actually arising in the sample. The method includes ascertaining the skewness and the kurtosis from the sample of measurement data corresponding to a first statistical distribution. The method includes checking, using the ascertained moment values, whether the defined set contains a statistical distribution that has the ascertained skewness and kurtosis, and producing a corresponding test result.

Abstract: A method of producing a workpiece includes obtaining CAD data representing the workpiece in multiple workpiece layers. The CAD data includes multiple workpiece layer definitions corresponding respectively to the workpiece layers. The method includes selecting a first workpiece layer definition, preparing a powder bed of powder material on a build platform, and producing, based on the selected workpiece layer definition, a workpiece layer on the build platform by controlling a layer tool to selectively melt or sinter the powder material on the build platform. The method includes assessing the produced workpiece layer, including measuring the produced workpiece layer using a measuring head, analyzing the measurements of the produced workpiece layer, and, in response to the analysis indicating that the produced workpiece layer is defective, reprocessing the produced workpiece layer by controlling the layer tool to selectively melt or sinter the powder material on the build platform.

Abstract: A method is described for measuring workpieces, each having structural features that form test features for measurement. The method determines an unstable one and a stable one of the test features, based on expected violation or satisfaction, respectively, of a statistical control rule. The method measures workpieces such that the unstable test feature is measured more frequently than the stable test feature. The method ascertains whether the unstable test feature remains unstable and whether the stable test feature remains stable. The method measures additional workpieces if the unstable test feature remained unstable and the stable test feature remaining stable. The determining is repeated if the unstable test feature is no longer unstable, the stable test feature is no longer stable, or any other measurement feature changes, such as if a new batch of workpieces is to be measured, environmental conditions change, or measurement has proceeded longer than a predefined threshold.

Abstract: A positioning apparatus with a pose measurement function includes a first and second kinematic links, a first measuring link attached to the second kinematic link, a joint connecting the first and second kinematic links, and a sensor capturing a measurement device. Either the measurement device or the sensor is arranged at the first measuring link and is movable jointly with the second kinematic link. The other one is arranged at the first kinematic link and is movable jointly with the first kinematic link. An attachment location of the first measuring link lies closer to an end of the second kinematic link that is remote from the joint than to the joint. The positioning apparatus is configured to ascertain, based on data captured by the sensor, a first relative pose value corresponding to the degree of freedom of the joint and a further relative pose value for another degree of freedom.

Abstract: A method creates a measurement plan of a dimensional measuring apparatus or controls a measurement of the dimensional measuring apparatus. The method includes receiving setting parameters defining a measurement or control command of multiple measurement or control commands of the dimensional measuring apparatus. The method includes evaluating the setting parameters based on at least one of a statistical evaluation and an evaluation using machine-assisted learning. The method includes determining a presetting that assigns at least one setting parameter of the evaluated setting parameters to the measurement or control command. The method includes outputting a setting parameter proposal based on the determined presetting in response to receiving an input command for selecting the measurement or control command.

Abstract: An apparatus, a method, and a computer program for determining a chamfer property of a workpiece chamfer are provided. The method includes generating measurement points along at least a first measuring path, the first measuring path running over a first chamfer edge, determining at least one unadapted compensating element for the measurement points of the first measuring path, and determining a spatial position of the first chamfer edge depending on a deviation between the measurement points of the first measuring path and the at least one unadapted compensating element.

Abstract: A method and an apparatus for isolating a vibration of a positioning device are provided. The apparatus includes a base plate for the positioning device, at least one active bearing element for bearing the base plate on/at a foundation and at least one evaluation and control device. The apparatus includes at least one means for determining a foundation movement-dependent quantity, wherein the active bearing element is controllable by the at least one control and evaluation device on the basis of the foundation movement-dependent quantity.

Abstract: A tactile and/or optical distance sensor includes a housing, which has at least one elongate portion, a measurement arm, which is arranged in the housing, at least partially extends through the elongate portion and has a tactile and/or an optical probe element at one end, a transducer, which is configured to capture a position of the tactile probe element or a signal of the optical probe element and to generate associated probe element measurement signals, and an advance unit, with which the housing is linearly dis-placeable along an advance direction. A strain sensor is located in the region of the measurement arm extending through the elongate portion or at an adjacent region directly adjoining said region. In addition, a system for measuring the roughness of a surface of a workpiece and a method for calibrating a distance sensor or a system are provided.

Abstract: Sensor signals from a sensor of a coordinate measuring machine or microscope describe a workpiece arranged within a space. The sensor and the space are movable relative to one another. A method of visualizing the sensor signals includes obtaining data relating to a three-dimensional scene that is stationary relative to the space. The method includes generating a two-dimensional view image of the scene. The view image has opposing edges predefined with respect to at least one of the two directions. A central region of the view image is located between the edges. The method includes, repeatedly, obtaining a two-dimensional sensor representation of the workpiece and combining the sensor representation with the view image to form a two-dimensional output image. The method includes, in response to movement between the sensor and the space, generating a new view image if the central region would extend beyond either of the edges.

Abstract: An apparatus for determining at least one spatial position and orientation of at least one object with at least three retroreflectors is provided. The apparatus has at least one LIDAR unit with at least three measurement channels. The LIDAR unit has at least one illumination device, which is configured to produce at least one frequency modulated input light beam. The LIDAR unit has at least one first beam splitter, wherein the first beam splitter is configured to divide the input light beam among the measurement channels in parallel and/or in sequence. The measurement channels are each configured to produce at least one measurement signal. The LIDAR unit is configured to produce at least one LIDAR signal for the measurement signals. The apparatus has at least one evaluation unit, which is configured to determine the spatial position and orientation of the object from the LIDAR signal.

Abstract: A method for determining measurement points of an adapted measurement path for measuring a measurement object includes determining measurement points of an ideal measurement path. The method includes determining target measurement points of at least one guide path, which differs from the ideal measurement path. The method includes capturing actual measurement points along the at least one guide path using a coordinate measuring device. The method includes determining deviations between the target measurement points and the actual measurement points of the at least one guide path. The method includes determining the measurement points of the adapted measurement path by changing the measurement points of the ideal measurement path based on the deviations.

Abstract: An optical measuring device includes at least one optical sensor configured for optical capture of at least one measurement object at multiple image recording positions. The optical measuring device includes at least one display device configured to display, for multiple predetermined and/or determinable image recording positions, in each case a schematic representation of an image to be recorded at the respective image recording position. The optical measuring device includes at least one data processing unit and at least one interface. The interface is configured to provide at least one item of manipulation information to the data processing unit. The data processing unit is configured to, based on the manipulation information, adapt at least one of the image recording position and an image recording parameter of at least one of the images to be recorded.

Abstract: Methods and devices for additive manufacturing of workpieces are provided. For analysis during production, a test is carried out using a selected test method. The test results are compared with simulated test results derived during a simulation of the manufacturing and testing. The test may use one or more of a laser ultrasound test unit, an electronic laser speckle interferometry test unit, an infrared thermography test unit, or an x-ray test unit.

Abstract: A method for evaluating measurement data from a measurement of a plurality of workpieces includes obtaining a set of measurement data. Each workpiece has an associated set of measurement data. The set of measurement data corresponds to measurement points of the workpieces. The set of measurement data has, for each measurement point of the workpieces, at least one measured coordinate and/or, for each measured coordinate, a divergence from a comparison coordinate. The method includes determining a measure of the correlation of the measured coordinates and/or of the divergences is determined for a plurality of the sets of measurement data, in each case in relation to a pair of measurement points that consists of two measurement points of the workpieces.