Abstract: An x-ray examination arrangement includes an x-ray radiation source arranged at a source position, at least two x-ray detectors having active detector areas and being arranged such that the active detector areas capture different solid angle ranges with respect to x-ray radiation produced by the x-ray radiation source and emanating from the source position, and a control device configured to calculate a projection onto a virtual detector plane based on radiographs respectively captured by the at least two x-ray detectors and spatial poses of the at least two x-ray detectors relative to the source position, and provide a combined radiograph for the virtual detector plane based on the projection. In addition, a method for operating the x-ray examination arrangement and a computed tomography device are provided.

Abstract: An apparatus for determining at least one of dimensional and geometric properties of a measurement object has a first measurement arrangement, which records first measurement values. The first measurement values represent respective positions of first selected measurement points relative to a first coordinate system. The apparatus has a second measurement arrangement, which records second measurement values. The second measurement values represent respective surface normals at second selected measurement points. The first and second measurement arrangements are arranged spatially fixedly with respect to one another on a housing body. The apparatus further has a third measurement arrangement, which records third measurement values. The third measurement values represent a respective current position of the housing body relative to a further coordinate system.

Abstract: A stylus is arranged on a coordinate measuring machine. A method for aligning a component in relation to the coordinate measuring machine includes positioning the stylus and the component in relation to one another according to a defined arrangement. The method includes acquiring at least one coordinate of the component. The method includes changing at least one of a position and an orientation of the component in relation to the coordinate measuring machine while maintaining the defined arrangement.

Abstract: A signal generator includes a processing unit. The signal generator is configured to generate at least one periodic output signal. The output signal comprises a triangular-waveform signal. A frequency and an amplitude of the output signal are adjustable. The signal generator is configured to receive an input parameter. The input parameter comprises at least one piece of information about a setpoint amplitude and a setpoint frequency of the output signal. The processing unit is configured to determine a signal direction of the output signal. The processing unit is configured to determine a step size. The processing unit is configured to apply the step size to an actual amplitude based on the signal direction for a number of clock cycles. The number of clock cycles is dependent on the setpoint frequency of the output signal.

Abstract: The invention is directed to a method for correcting scattered radiation in a computed tomography apparatus, wherein x-ray radiation emanating from an x-ray radiation source is divided into a plurality of partial beams by a grid structure such that irradiated regions and non-irradiated regions alternate, wherein a grid position of the grid structure is changed parallel to a detector surface. In a changed grid position, previously non-irradiated regions are irradiated and previously irradiated regions are not irradiated, wherein at least one radiograph of the test object is captured for each of the grid positions, wherein the radiographs captured at different grid positions are used to generate a bright field radiograph from the respectively irradiated regions and a dark field radiograph from the respectively non-irradiated regions and wherein a corrected radiograph is generated on the basis of the bright field radiograph and the dark field radiograph.

Abstract: An illumination device includes first, second, and third light-emitting diode chips arranged around a center axis along virtual outlines of first, second, and third geometric figures, respectively. The geometric figures are concentric. A bond wire is connected to a connection point of each chip in its peripheral region. Multiple groups are defined, with each including one each of the first, second, and third chips. Within a first group, the first, second, and third chips are arranged on first, second, and third virtual rays, respectively. The rays each intersect only a single light-emitting diode chip, are transverse to the center axis, and originate at, and extend outwardly from, the center axis. In the first group, the second chip neighbors the first chip, the third chip neighbors the second chip, and the chips are rotated relative to one another such that the respective connection points are oriented in different directions.

Abstract: A method and an arrangement for capturing a mark arrangement including an optical mark arranged on an object, the method including capturing images of the mark arrangement together with points in time, determining first evaluation information by evaluating images captured with a first capturing device and further evaluation information by evaluating images captured with a further capturing device, each of the first and further evaluation information relating to respective points in time at which the images were captured, determining a value of a movement variable describing a relative movement between the object and the capturing devices at a predetermined point in time based on the evaluation information determined at the predetermined point in time; and determining the evaluation information of the capturing devices at the predetermined point in time based on images captured at other points in time when no image was captured at the predetermined point in time.

Abstract: A method includes generating image signals from which a two-dimensional image is generated. The method includes generating object image signals by capturing an examination object arranged in a space. The method includes generating overview image signals by capturing an overview of the space. The method includes receiving image information included in the generated object image signals and the generated overview image signals. The method includes combining a two-dimensional object image, generated from the object image signals, with a two-dimensional perspectively distorted overview image of the space, generated from the overview image signals, to form a two-dimensional output image. The method includes scaling the received image information with respect to an image size for forming the output image in a manner such that at least one dimension of the examination object captured both in the object image and in the overview image has a same size in the output image.

Abstract: A measuring apparatus for determining object data of at least one test object includes at least one distribution of retroreflectors. The retroreflectors are arranged on the measuring apparatus. The distribution has at least so many retroreflectors that at least three retroreflectors are observable at at least three spatially different observation locations in at least 90% of all possible spatial orientations of the measuring apparatus. A distance range of the observation locations is 0.1 m to 30 m. Each of the retroreflectors has a maximum acceptance angle. Each of the retroreflectors has a diameter of 1 mm to 50 mm. The retroreflectors are arranged such that, for each of the observation locations, a minimum spacing of measured retroreflector distances of the observable retroreflectors is 0.1 mm to 50 mm.

Abstract: A target for a radiation source of invasive electromagnetic radiation has at least one target element, which is configured to generate invasive electromagnetic radiation when irradiated with particles and is coupled to a substrate arrangement for dissipating heat out of the target element, wherein: the target element has a peripheral surface which forms a first part of the outer surface of the target element; the outer surface of the target element is also formed by a side surface of the target element; an extension of the side surface defines a thickness (D) of the target element; a peripheral line of the side surface forms a borderline of the peripheral surface; the target has an end face, as part whereof the side surface of the target element is exposed for irradiation with particles; and the substrate arrangement is in contact with the peripheral surface.

Abstract: A computer-implemented method automatically produces a test plan for measuring a measured object. The method includes obtaining a desired dataset of the measured object. The method includes providing a starting pattern. The providing comprises producing a division. The producing the division comprises applying at least one division function. The division has a plurality of division indices. The method includes producing a target pattern by generating a comparison between the desired dataset and the division. At least one division index is adapted in response to a deviation of the division from the desired dataset. The method includes creating at least one element with at least one piece of pattern information in the test plan in accordance with the target pattern.

Abstract: A method of producing a workpiece by using additive manufacturing techniques includes obtaining CAD data representing the workpiece with workpiece layer definitions defining workpiece layers. The method includes selecting a first workpiece layer definition. The method includes preparing a powder bed of powder material on a build platform. The method includes measuring individual characteristics of the powder material on the build platform using a measuring head. The method includes producing, based on the selected workpiece layer definition, a workpiece layer on the build platform. The producing includes controlling a layer tool to selectively melt or sinter the powder material on the build platform. The producing is further based on the measured individual characteristics of the powder material to correct for detected flaws in the powder bed. The method includes selecting each one of the workpiece layer definitions and repeating the preparing, the measuring, and the producing for the selected definition.

Abstract: A holder is configured to hold multiple reference standards for calibrating a measurement system. The holder includes a first receptacle that is configured to receive a first reference standard. The holder includes a second receptacle that is configured to receive a second reference standard. The holder includes a calibration jig that is configured to facilitate a bijective determination of a position and orientation of the holder in space.

Abstract: A method and an arrangement for increasing the throughput in a workpiece measurement with a coordinate measuring machine (CMM) is provided. The CMM measures a workpiece, and the measurement is described by at least one measurement parameter, a value of which is variable. The method includes setting an initial value of the at least one measurement parameter, the initial value being a predetermined value of the at least one measurement parameter valid for measuring the workpiece, measuring the workpiece with the initial value, determining a value of at least one predetermined test characteristic based on results of the measuring of the workpiece, determining whether the at least one predetermined test characteristic satisfies a predetermined iteration criterion; and changing the initial value of the at least one measurement parameter and repeating the prior steps upon determining that the at least one test characteristic satisfies the predetermined iteration criterion.

Abstract: A device for a 3D measurement of object coordinates of a measurement object or parts of the measurement object in a coordinate measuring machine is provided. The device includes at least one illumination device configured to generate at least one illumination light beam and to illuminate the measurement object, at least one lens, wherein the lens has a longitudinal chromatic aberration, at least one color sensor arranged in an image plane of the lens, wherein the color sensor is configured to capture a measurement light beam generated by the measurement object in response to the illumination light beam and to determine at least one spectrally dependent image space content; at least one evaluation unit configured to determine at least one item of depth information from the spectrally dependent image space content.

Abstract: A method and an apparatus for generating positional sensor data of a coordinate measuring device are provided. A sensor generates sensor data points and a trigger signal with a trigger frequency. A sensor data record is generated which includes the sensor data points and a sensor data time. The trigger signal is transmitted to a device for determining a sensor position, a position data record is determined upon or after the reception of the trigger signal, the position data record includes at least one position data point and one position data time, an assignment of position data points to sensor data points is determined depending on the sensor data time and the position data time, and a positional sensor data record is generated which includes at least one sensor data point and a position data point assigned to this sensor data point.

Abstract: An optical measuring system includes a calibration apparatus having at least one optical marker and a code. The optical measuring system includes a memory unit that stores a metadata record with calibration parameters that have physical state and change variables that are specific to the calibration apparatus. The calibration apparatus is configured to encrypt a link to the metadata record stored in the memory unit. The optical measuring system includes an optical sensor configured to capture image data containing the at least one optical marker and the code. The optical measuring system includes a control unit configured to evaluate the image data captured by the optical sensor, decrypt the code captured by the optical sensor, access the memory unit via the link, read the metadata record stored therein, and include the read calibration parameters and the at least one optical marker in the evaluation of the image data.

Abstract: A method for correcting a detector configured to generate object radiographs and an arrangement to implement the method is provided. The method includes the steps of (a) providing the detector having setting values for a gain and offset correction, (b) capturing a plurality of object radiographs of a test object by the detector and generating a reconstructed three-dimensional representation of the test object based on of the object radiographs, (c) determining at least one quality value of the reconstructed three-dimensional representation, repeating the steps (b) and (c) at least once, wherein before the repetition, a parameter set is generated and a measurement sequence is implemented on the basis thereof, at least one setting value for a gain and offset correction of the detector being determined anew based on the measurement sequence; and (e) determining a preferred gain and offset correction based on overall determined quality values.

Abstract: A specimen of an artificial marker is arranged on an object, the position of which is to be determined. The artificial marker defines a nominal marker pattern with nominal characteristics. The specimen embodies the nominal marker pattern with individual characteristics. One or more images of the specimen are captured while the specimen is arranged on the object. An image representation of the specimen is analyzed using a data set. The data set comprises measured data values representing the individual characteristics as individually measured on the first specimen. Position values representing a 3D position of the specimen relative to a coordinate system are determined. A 3D position of the object is determined based on the position values of the specimen.

Abstract: An object radiography apparatus includes a radiation source configured to generate and emit an electromagnetic radiation for radiographing an object, a detector device, which is arranged in such a way that the emitted electromagnetic radiation which passes at least partly through the object impinges at least proportionally on the detector device, and which is configured to generate a radiograph of the object. In addition to the detector device, a sensor arrangement is provided, which is configured to determine a radiation characteristic variable assigned to the radiation source. An evaluation unit is configured to determine or to receive a quality parameter of the detected radiograph, to evaluate the radiation characteristic variable and to make a statement about a state of the detector device and/or of the radiation source on the basis of the quality parameter and the radiation characteristic variable.