Patents Assigned to Leica Microsystems Heidelberg GmbH
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Patent number: 6958858Abstract: A method for scanning microscopy is disclosed. It contains the step of generating an illuminating light beam that exhibits at least a first substantially continuous wavelength spectrum whose spectral width is greater than 5 nm; the choosing of a second wavelength spectrum that is arranged spectrally within the first wavelength spectrum; the step of selecting the light of the second wavelength spectrum out of the illuminating light beam using an acoustooptical component; and the step of illuminating a specimen with the illuminating light beam. A scanning microscope is also disclosed.Type: GrantFiled: July 29, 2002Date of Patent: October 25, 2005Assignee: Leica Microsystems Heidelberg GmbHInventors: Johann Engelhardt, Juergen Hoffmann
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Patent number: 6958470Abstract: The invention discloses a scanning microscope for optical measurement with high spatial resolution of a specimen point of a specimen, having a light source for emitting an exciting light beam suitable for exciting an energy state of the specimen; a detector for detection of the emitted light; and a stimulating light beam, coming from the light source, for generating stimulated emission of the specimen excited by the exciting light beam at the specimen point, the exciting light beam and the stimulating light beam being arranged in such a way that their intensity distributions in the focal region partially overlap, wherein optical elements which shape the stimulating light beam are combined into at least one module that is positionable in the beam path of the scanning microscope.Type: GrantFiled: February 6, 2002Date of Patent: October 25, 2005Assignee: Leica Microsystems Heidelberg GmbHInventor: Juergen Hoffmann
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Patent number: 6954306Abstract: A scanning microscope with a light source for illumination of a specimen, a means for spatial spectral division of the detection light, and a detector is disclosed. The scanning microscope has means for selecting a lower limit wavelength that defines a lower exclusion region, and means for selecting an upper limit wavelength that defines an upper exclusion region, as well as a first and a second adjustable stop that block light components of the lower and the upper exclusion region of the detection light. A bandpass filter and a method for scanning microscopy are also disclosed.Type: GrantFiled: November 13, 2002Date of Patent: October 11, 2005Assignee: Leica Microsystems Heidelberg GmbHInventor: Johann Engelhardt
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Patent number: 6952006Abstract: A microscope having a light source that emits light pulses for illumination of a specimen, the light pulses containing photons having a photon energy, is disclosed. The microscope is characterized in that a detector, which has an energy band gap between a quiescent state and an active state that is greater than the photon energy, is provided for determination of a time-defined pulse width of the light pulses. Also described are a detector for determination of a time-defined pulse width of light pulses for illumination of a microscopic specimen, and a method for microscopy.Type: GrantFiled: February 13, 2003Date of Patent: October 4, 2005Assignee: Leica Microsystems Heidelberg GmbHInventor: Kyra Moellmann
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Patent number: 6947861Abstract: The method implements time-optimized acquisition of special spectra using a scanning microscope, for which purpose the spectrum is subjected to bisecting interval measurements. The method for time-optimized acquisition of special spectra (emission spectra) using a scanning microscope is implemented in several steps. Firstly a complete spectrum to be examined, within which at least one special spectrum (emission spectrum) is located, is split into at least two intervals. The interval in which the intensity lies above a specific threshold is selected. That interval is split into at least two further intervals, and the procedure is continued until the size of the interval corresponds to the lower limit of the scanning microscope's measurement accuracy. The location of the special spectrum in the complete spectrum is defined, and an interval around it is created and is measured linearly.Type: GrantFiled: March 20, 2003Date of Patent: September 20, 2005Assignee: Leica Microsystems Heidelberg GmbHInventor: Frank Olschewski
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Publication number: 20050201441Abstract: A device for generating a laser light beam includes a module. The module includes at least one laser light source, and a mechanical, an electrical and/or an optical interface defined towards an outside of the module.Type: ApplicationFiled: December 14, 2004Publication date: September 15, 2005Applicant: Leica Microsystems Heidelberg GmbHInventors: Volker Seyfried, Rafael Storz
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Patent number: 6934022Abstract: The invention relates to a method for examining different structures in preferably biological preparations in a differential manner, especially by means of confocal laser scanning microscopy. The method is characterized in that particles having a specific diameter and specific characteristics are assigned to the structures and in that said structures are detected by detecting the particles which have specifically bonded in or to the preparations. The detection process is carried out in an advantageous manner by marking the structures with metal particles with diameters of 10 nm to 1,500 nm and detecting Mie scattering or a plasmon signal.Type: GrantFiled: December 10, 1999Date of Patent: August 23, 2005Assignee: Leica Microsystems Heidelberg GmbHInventor: Johann Engelhardt
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Patent number: 6914236Abstract: The scanning microscope comprises an illumination beam path (41), microscope optics (37) and at least one light source (17, 21, 61, 67), which generates an excitation light beam (19, 63) of a first wavelength and an emission light beam (23, 69) of a second wavelength. The first focal region and the second focal region overlap partially. The optical properties of the components arranged in the illumination beam path (41) are matched to one another such that optical aberrations are corrected in such a way that the focal regions remain static relative to one another irrespective of the scanning movement.Type: GrantFiled: December 17, 2001Date of Patent: July 5, 2005Assignee: Leica Microsystems Heidelberg GmbHInventor: Juergen Hoffmann
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Patent number: 6914238Abstract: A method and an apparatus for point-by-point scanning of a specimen (15) are disclosed. The method is characterized by the steps of generation (45) of a nominal signal (10) for each scan point and transfer (47) of the nominal signal to a scanning device (7). In further steps, determination (49) of an actual signal (25) for each scan point from the setting of the scanning device (7), detection (51) of at least one detection signal (21) for each scan point, calculation (53) of a display signal (27) and an image point position (29) from the actual signal (25) and/or the nominal signal (10) and the detection signal (21), and assignment (55) of the display signal (27) to the image point position (29), are performed.Type: GrantFiled: May 29, 2002Date of Patent: July 5, 2005Assignee: Leica Microsystems Heidelberg GmbHInventors: Johann Engelhardt, Bernd Widzgowski
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Publication number: 20050141081Abstract: In an optical device (2), in particular a microscope, drift is sensed by the fact that a first image of an immovable specimen (30) is acquired at a first time (T(n-1)), and a second image thereof at a second time (T(n)). The drift is calculated from a comparison between the first and the second image.Type: ApplicationFiled: December 8, 2004Publication date: June 30, 2005Applicant: Leica Microsystems Heidelberg GmbHInventor: Frank Olschewski
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Patent number: 6909540Abstract: A microscope objective that comprises an objective housing and contains several lens elements, at least one lens element being arranged displaceably in motor-driven fashion within the objective housing, is disclosed. A microscope and a method for imaging a specimen are additionally disclosed.Type: GrantFiled: December 2, 2002Date of Patent: June 21, 2005Assignee: Leica Microsystems Heidelberg GmbHInventors: Johann Engelhardt, Rafael Storz
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Patent number: 6906312Abstract: A scanning microscope has a microscope stand and a light source that emits an illuminating light beam for illumination of a sample. The illuminating light beam is scanned over a sample with a beam deflection device, arranged in the microscope stand. A Bauernfeind prism is arranged between the sample and the detector for deflecting the detection light out of the microscope beam.Type: GrantFiled: April 17, 2003Date of Patent: June 14, 2005Assignee: Leica Microsystems Heidelberg GmbHInventor: Johann Engelhardt
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Publication number: 20050121603Abstract: A method for separating different emission wavelengths in a scanning microscope includes scanning a specimen with an illuminating light beam by passing the illuminating light beam over the specimen using a beam deflector, and selectively applying each of a plurality of excitation wavelengths to the illuminating light beam during the scanning according to a predefinable illumination scheme. Emission light coming from the specimen is detected using a detector, the emission light including emission wavelengths corresponding to the excitation wavelengths. The detector is read out when an excitation wavelength is applied so as to provide detected signals. The detected signals are associated with the respective excitation wavelengths using the illumination scheme.Type: ApplicationFiled: December 22, 2003Publication date: June 9, 2005Applicant: Leica Microsystems Heidelberg GmbHInventors: Volker Seyfried, Rafael Storz
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Patent number: 6900935Abstract: An optical arrangement, in particular a microscope, having a light source (1) for illuminating an object, and a glass fiber (3), arranged between the light source (1) and the object, for transporting light along a prescribable distance between the light source (1) and the object, is configured with regard to the avoidance of fluctuations in the illuminating light power without a handicap in the optical adjustment of the arrangement in such a way that the glass fiber (3) is a polarizing glass fiber (3).Type: GrantFiled: July 16, 2001Date of Patent: May 31, 2005Assignee: Leica Microsystems Heidelberg GmbHInventors: Johann Engelhardt, Juergen Hoffmann
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Publication number: 20050111816Abstract: A microscope includes a light source that emits an illuminating light beam for illumination of a specimen, a beam splitter separating measuring light out of the illuminating light beam, and an apparatus for determining the light power level of the illuminating light beam. The apparatus for determining the light power level of the illuminating light beam receives the measuring light and includes an apparatus for simultaneous color-selective detection of the measuring light.Type: ApplicationFiled: October 13, 2004Publication date: May 26, 2005Applicant: Leica Microsystems Heidelberg GmbHInventors: Holger Birk, Rafael Storz, Johann Engelhardt, Kyra Moellmann
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Publication number: 20050109949Abstract: A method and a system for the analysis of co-localizations of dyes present in a specimen (15) are disclosed. For that purpose, the various fluorescence spectra of all dyes present in the specimen (15) are determined. A tolerance region around each of the fluorescence spectra is selected. The spectra of the specimen (15), in which at least two dyes are present, are then acquired pixel by pixel. Those spectra that lie within the tolerance region around the fluorescence spectra are then calculated. A lambda vector is calculated for each pixel and assigned to a spectrum. Images can be outputted on the display in accordance with the assignment to the spectra.Type: ApplicationFiled: November 9, 2004Publication date: May 26, 2005Applicant: Leica Microsystems Heidelberg GmbHInventor: Frank Olschewski
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Patent number: 6898367Abstract: A method for illuminating is disclosed, which is characterized by the steps of injecting (1) the light beam (13) from a laser (9) into a optical element (19), which spectrally broadens the light of the light beam (13) and shaping (3) the spectrally broadened light (31) to form an illumination light beam (29). An instrument (7) for illuminating is furthermore disclosed, which comprises a laser (9) that emits a light beam (13), which is directed onto a optical element (19) that spectrally broadens the light from the laser. A optical means (33) which shapes the spectrally broadened light (31) to form an illumination light beam (29) is arranged downstream of the microstructured optical element (19).Type: GrantFiled: June 15, 2001Date of Patent: May 24, 2005Assignee: Leica Microsystems Heidelberg GmbHInventors: Holger Birk, Rafael Storz, Johann Engelhardt, Kyra Moellmann
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Patent number: 6894271Abstract: A method for operating a positioning apparatus that moves a positioning element comprises the steps of: generating a first and at least one further reference signal, the first reference signal corresponding to a first reference position and the further reference signal to a further reference position; generating a first and at least one further estimated value for the present position of the positioning drive; transferring the first reference signal and the estimated value to the positioning apparatus; establishing the first reference position using the positioning apparatus, and measuring the present position and generating a position signal that corresponds to the measured present position; transferring the further reference signal to the positioning apparatus; generating a further estimated value of the positioning drive position; transferring the further estimated value to the positioning apparatus; establishing the further reference position, and measuring a further present position and generating a furtType: GrantFiled: November 4, 2002Date of Patent: May 17, 2005Assignee: Leica Microsystems Heidelberg GmbHInventor: Bernd Widzgowski
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Publication number: 20050099673Abstract: A scanning microscope that defines an illumination beam path and a detection beam path, having an objective that is arranged in both the illumination beam path and the detection beam path, is disclosed. The scanning microscope is characterized by an interchangeable module that is also arranged in the illumination beam path and a [sic] detection beam path and that separates the illumination beam path and detection beam path at a fixed angular relationship to one another and comprises at least a first acoustooptical component. Also disclosed is an optical element having at least three ports.Type: ApplicationFiled: December 15, 2004Publication date: May 12, 2005Applicant: Leica Microsystems Heidelberg GmbHInventors: Holger Birk, Johann Engelhardt
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Patent number: 6891670Abstract: The present invention concerns a double confocal scanning microscope having an illuminating beam path (1) of a light source (2) and a detection beam path (3) of a detector (4), and in order to eliminate at their cause the problems of reconstruction methods. To do so, at least one optical component (24, 25) acting on the illuminating and/or detection beam path (1, 3) is provided, and is configured in such a way that it influences the amplitude and/or phase and/or polarization of the light; and the characteristics of the double confocal illumination and/or detection are thereby modifiable.Type: GrantFiled: February 6, 2002Date of Patent: May 10, 2005Assignee: Leica Microsystems Heidelberg GmbHInventors: Hilmar Gugel, Joerg Bewersdorf, Stefan W. Hell