Patents Assigned to Leica Microsystems Heidelberg GmbH
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Patent number: 6796699Abstract: A method for illuminating an object (79). The method is characterized by the steps of injecting (1) the light beam (13) from a laser (9) into a microstructured optical element (19), which spectrally broadens the light of the light beam (13), shaping (3) the spectrally broadened light (31) to form an illumination light beam (29), and directing (5) the illumination light beam (29) onto the object (79). An instrument (7) for illuminating an object (79). The instrument comprises a laser (9) that emits a light beam (13), which is directed onto a microstructured optical element (19) that spectrally broadens the light from the laser. A optical means (33) which shapes the spectrally broadened light (31) to form an illumination light beam (29) is arranged downstream of the microstructured optical element (19).Type: GrantFiled: June 15, 2001Date of Patent: September 28, 2004Assignee: Leica Microsystems Heidelberg GmbHInventors: Holger Birk, Rafael Storz, Johann Engelhardt, Kyra Moellmann
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Patent number: 6798569Abstract: The present invention concerns a microscope, in particular a confocal or double confocal scanning microscope, as well as a method for operating a microscope, at least one specimen support unit associated with the specimen being provided, at least one reference specimen of known configuration being provided, and the reference specimen being detectable by light microscopy for calibration, alignment or adjustment of the microscope. With the microscope according to the present invention and the method according to the invention for operating a microscope, drift-related changes can be detected and compensated for. Auxiliary means with which a specimen can easily and reliably be focused are also provided.Type: GrantFiled: January 4, 2002Date of Patent: September 28, 2004Assignee: Leica Microsystems Heidelberg GmbHInventors: Joerg Bewersdorf, Hilmar Gugel
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Patent number: 6788456Abstract: When specimens are illuminated in a scanning microscope, it is often necessary to use radiations of different wavelengths in order to examine the sample. A device and a method for illumination of specimens in a scanning microscope is proposed, a laser being used to generate a laser beam, and an optical system being used to image the laser beam onto the specimen. The optical system comprises a switchable beam deflection device that can direct the laser beam onto the specimen either along a first beam path or along an alternative beam path. In addition, a device for frequency conversion is arranged in the beam path of the alternative beam path.Type: GrantFiled: August 2, 2002Date of Patent: September 7, 2004Assignee: Leica Microsystems Heidelberg GmbHInventor: Werner Knebel
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Publication number: 20040169134Abstract: A scanning microscope having an acoustooptical component that splits out illuminating light for illumination of a sample from the output light of at least one light source, and conveys detected light proceeding from the sample to a detector, comprises, in the beam path of the output light from which the illuminating light is split out, at least one monitoring detector which is the measuring element of a control circuit. The scanning microscope is characterized in that fluctuations over time in the illuminating light power level are largely eliminated.Type: ApplicationFiled: January 22, 2004Publication date: September 2, 2004Applicant: Leica Microsystems Heidelberg GmbHInventors: Werner Knebel, Rafael Storz, Kyra Moellmann
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Patent number: 6785302Abstract: The invention relates to an optical system in the ray path of a confocal fluorescence microscope, comprising at least one laser light source (1, 2), a device positioned in the illuminating/detecting beam (3, 4, 5) for separating the exciting light (8) from the fluorescent light (9), an objective (10) arranged between the device and the object (7), and a detector (11) positioned downstream of the device situated in the detecting beam (5). The aim of the invention is to increase the fluorescence yield of the system while retaining its compact structure.Type: GrantFiled: May 12, 2000Date of Patent: August 31, 2004Assignee: Leica Microsystems Heidelberg GmbHInventors: Johann Engelhardt, Heinrich Ulrich, William C. Hay
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Patent number: 6781752Abstract: A confocal scanning microscope has an illuminating beam path and at least one light source. The light of the light source is coupled into a fiber in which laser transitions can be induced. At least laser light induced in the fiber serves for specimen illumination after passing through an excitation pinhole.Type: GrantFiled: December 9, 2003Date of Patent: August 24, 2004Assignee: Leica Microsystems Heidelberg GmbHInventors: Johann Engelhardt, Juergen Hoffmann
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Publication number: 20040156102Abstract: A method for generating a multicolor image of a specimen with a microscope is disclosed. The method comprises the step of determining the spacing of the focal planes of a first illuminating light beam that has a first wavelength and of a second illuminating light beam that has a second wavelength; the step of scanning the specimen with the first illuminating light beam and generating a first partial image; the step of performing a relative displacement, by an amount equal to the spacing, between the specimen and the focal plane of the illuminating light beam of the second wavelength; the step of scanning the specimen with the second illuminating light beam and generating a second partial image; and the step of superimposing the first and second partial images to yield the multicolor image. Further more a microscope and a confocal scanning microscope are disclosed.Type: ApplicationFiled: February 3, 2004Publication date: August 12, 2004Applicant: Leica Microsystems Heidelberg GmbHInventors: Ingo Boehm, Frank Schreiber
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Patent number: 6771405Abstract: The present invention concerns a method and an apparatus for scanning a specimen (1) with a light beam (2) of a light source (3), preferably in confocal scanning microscopy, the light beam (2) being deflected with a beam deflection device (4) and the scanning operation being controlled by a control device (5). A specimen can be scanned with the greatest possible timing accuracy in order to trigger a measurement operation, during or shortly after an external influence. The method and the apparatus according to the present invention are characterized in that as a function of at least one definable scan position (10), the control device (5) makes available at least one signal (11) for influencing the specimen (1) and/or for triggering a measurement operation.Type: GrantFiled: May 17, 2001Date of Patent: August 3, 2004Assignee: Leica Microsystems Heidelberg GmbHInventor: Johann Engelhardt
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Patent number: 6754003Abstract: A scanning microscope possesses at least one illumination source for emitting an illuminating beam that is conveyed via a beam deflection device and an optical system to a specimen and scans the latter, the beam deflection device defining at least one illuminating beam rotation point. A device for axial displacement in particular of the beam deflection device, or of a lens preceding the objective, is provided for imaging of an image of the illuminating beam rotation point into the pupil of the objective.Type: GrantFiled: August 14, 2002Date of Patent: June 22, 2004Assignee: Leica Microsystems Heidelberg GmbHInventor: Johann Engelhardt
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Patent number: 6754000Abstract: An optical arrangement having a light source, preferably a laser, for generating a light beam (1); at least one acoustooptical deflection device (3) for the light beam (1); and a correction device for correcting beam aberrations produced by the deflection device (3) is configured, in the interest of flexible and reliable correction of aberrations occurring because of the deflection, in such a way that the correction device comprises an adaptive optical system (2). Also described is a method for the deflection of light beams (1) with a light source, preferably a laser, for generating a light beam (1); at least one acoustooptical deflection device (3) for the light beam (1); and a correction device for correcting beam aberrations produced by the deflection device (3), in which an adaptive optical system (2) is used as the correction device.Type: GrantFiled: October 3, 2001Date of Patent: June 22, 2004Assignee: Leica Microsystems Heidelberg GmbHInventors: Johann Engelhardt, Juergen Hoffmann
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Publication number: 20040114226Abstract: A confocal scanning microscope has an illuminating beam path and at least one light source. The light of the light source is coupled into a fiber in which laser transitions can be induced. At least laser light induced in the fiber serves for specimen illumination after passing through an excitation pinhole.Type: ApplicationFiled: December 9, 2003Publication date: June 17, 2004Applicant: Leica Microsystems Heidelberg GmbHInventors: Johann Engelhardt, Juergen Hoffmann
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Publication number: 20040114225Abstract: A microscope (1), preferably a confocal laser scanning microscope, having at least one light source, a detector, and two objectives (2), one of the objectives (2) being arranged on each of the two sides of the specimen plane (3) and the objectives (2) being directed toward one another and having a common focus; and at least one beam splitter (5) for distributing the illuminating light (6) to the objectives (2), and a beam recombiner (5) for combining the detected light (7) coming from the objectives (2), being provided in the illumination/detection beam path (4), is characterized, for selectable, subsequent implementation of ultrahigh-resolution microscope techniques, in that the objectives (2) and the beam splitter/beam recombiner (5) are grouped into a modular assembly (8); and the assembly (8) has an interface (9) for connection to the illumination/detection beam path (4) of the microscope (1).Type: ApplicationFiled: November 21, 2003Publication date: June 17, 2004Applicant: LEICA MICROSYSTEMS HEIDELBERG GmbHInventors: Johann Engelhardt, Joachim Bradl
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Publication number: 20040109169Abstract: A method and an arrangement for automatic three-dimensional recording of structures of interest in a sample (15) are disclosed. The arrangement possesses a microscope having at least one microscope objective (13). The images of a sample (15) are acquired using a detector unit (19). A computer system (23) controls acquisition of the images and the microscope functions. The computer system (23) possesses a means (25) for automatically recording the entire marked specimen region in three dimensions.Type: ApplicationFiled: July 10, 2003Publication date: June 10, 2004Applicant: LEICA MICROSYSTEMS HEIDELBERG GMBHInventor: Frank Olschewski
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Publication number: 20040105146Abstract: A method and an arrangement for monitoring and controlling a microscope (100, 102) are disclosed. The user is provided with a switch (41) with which he or she can initiate the method. A detector unit (19) and a computer system (23) are provided, with which the information content of at least one image can be ascertained. The computer system (23) analyzes the information content of an image and ascertains therefrom a control variable which is conveyed to at least one actuator (38) of the microscope (100, 102).Type: ApplicationFiled: July 8, 2003Publication date: June 3, 2004Applicant: LEICA MICROSYSTEMS HEIDELBERG GMBHInventor: Frank Olschewski
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Patent number: 6740868Abstract: A method and a scanning microscope for application of the method for optical-light scanning of a specimen; preferably in scanning microscopy, in particular in confocal laser scanning microscopy, the intensity of the light being regulated, is characterized, in order to optimize signal yield already during the actual data recording or measurement, in that regulation is accomplished as a function of the current focus position in the specimen region of the scanned, focused light beam.Type: GrantFiled: November 28, 2000Date of Patent: May 25, 2004Assignee: Leica Microsystems Heidelberg GmbHInventors: Werner Knebel, Joachim Bradl
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Publication number: 20040095624Abstract: A scanning microscope, having a detector, arranged in a detection beam path, for receiving detection light proceeding from a sample, has between the sample and the detector an optical shutter means with which the detection beam path can be blocked. A control means for controlling the shutter means is provided. The detection light beam path can be blocked automatically outside the scanning operation and in the event of an excessive detection light power level.Type: ApplicationFiled: November 14, 2003Publication date: May 20, 2004Applicant: Leica Microsystems Heidelberg GmbHInventors: Werner Knebel, Rafael Storz
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Patent number: 6737635Abstract: The present invention concerns an apparatus for combining light from at least two laser light sources, preferably in the context of confocal scanning microscopy, and in order to make laser light sources of low output power usable as light sources, in particular for confocal scanning microscopy, is characterized in that the light from the laser light sources has at least approximately the same wavelength; and that at least one beam combining unit that combines the light beams in at least largely lossless fashion is provided.Type: GrantFiled: April 3, 2001Date of Patent: May 18, 2004Assignee: Leica Microsystems Heidelberg GmbHInventors: Johann Engelhardt, Juergen Hoffmann, Rafael Storz, Heinrich Ulrich, Joerg Bewersdorf, Holger Birk
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Patent number: 6738190Abstract: A method for examining a specimen (11) by means of a confocal scanning microscope having at least one light source (1), preferably a laser, to generate an illuminating light beam (4) for the specimen (11), and a beam deflection device (9) to guide the illuminating light beam (4) over the specimen (11) comprises the following method steps: Firstly a preview image is acquired. Then at least one region of interest in the preview image is marked. This is followed by allocation of individual illuminating light beam wavelengths and/or illuminating light beam power levels to the region or regions. Illumination of the region or regions of the specimen (11) in accordance with the allocation is then accomplished. Lastly, the reflected and/or fluorescent light proceeding from the specimen (11) is detected.Type: GrantFiled: September 5, 2001Date of Patent: May 18, 2004Assignee: Leica Microsystems Heidelberg GmbHInventors: Johann Engelhardt, Juergen Hoffmann, Werner Knebel
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Patent number: 6738189Abstract: The invention relates to a microscope, in particular a confocal microscope, designed to measure an object from several angular positions while avoiding any rotation of the object to be measured. The microscope has an optical device for rotation of the image to be positioned in the ray path of the microscope.Type: GrantFiled: November 29, 1999Date of Patent: May 18, 2004Assignee: Leica Microsystems Heidelberg GmbHInventors: Heinrich Ulrich, Johann Engelhardt
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Publication number: 20040092828Abstract: The invention concerns a method and an apparatus for investigating layers (1) of tissues in living animals using a microscope (2). The microscope (2) is focused onto a layer (1), and images of the layer (1) are acquired or optical measurements are performed on it. Positional changes of the layer (1) are brought about by movements of the animal or of its organs. The positional changes are sensed, and corresponding signals are generated. The signals are stored, together with the corresponding images or measurement results, for later evaluation; or they are processed in such a way that the positional changes are compensated for in order to investigate the layer (1). As a result, the layer (1) can be qualitatively or quantitatively investigated microscopically, irrespective of the movement of the animal or its organs.Type: ApplicationFiled: November 4, 2003Publication date: May 13, 2004Applicant: Leica Microsystems Heidelberg GmbHInventors: Martin Hoppe, Werner Knebel, Kyra Moellmann, Rafael Storz