Patents Assigned to Leica Microsystems Heidelberg GmbH
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Patent number: 6888674Abstract: The arrangement for examining microscope preparations with a scanning microscope comprises a laser (1) and an optical means (12) which images the light generated by the laser (1) onto a specimen (13) that is to be examined. Provided between the laser (1) and the optical means (12) is an optical component (3, 20) that spectrally spreads, with a single pass, the light generated by the laser (1). The optical component (3, 20) is made of photonic band-gap material. It is particularly advantageous if the photonic band-gap material is configured as a light-guiding fiber (20).Type: GrantFiled: June 15, 2001Date of Patent: May 3, 2005Assignee: Leica Microsystems Heidelberg GmbHInventors: Holger Birk, Rafael Storz
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Patent number: 6888118Abstract: The present invention concerns a method and an apparatus for stabilizing the temperature of optical, in particular optically active, electrooptical, or acoustooptical components, preferably in scanning microscopy, in particular in confocal scanning microscopy, such that the temperature of the component can be held in stable fashion at a constant value in a space-saving manner, as simply as possible, and with as few additional assemblies as possible, and is characterized in that the energy that interacts with the component serves for stabilization.Type: GrantFiled: June 11, 2001Date of Patent: May 3, 2005Assignee: Leica Microsystems Heidelberg GmbHInventor: Johann Engelhardt
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Publication number: 20050078361Abstract: The present invention concerns a microscope, in particular a confocal or double confocal scanning microscope, as well as a method for operating a microscope, at least one specimen support unit associated with the specimen being provided, at least one reference specimen of known configuration being provided, and the reference specimen being detectable by light microscopy for calibration, alignment or adjustment of the microscope. With the microscope according to the present invention and the method according to the invention for operating a microscope, drift-related changes can be detected and compensated for. Auxiliary means with which a specimen can easily and reliably be focused are also provided.Type: ApplicationFiled: August 17, 2004Publication date: April 14, 2005Applicant: Leica Microsystems Heidelberg GmbHInventors: Joerg Bewersdorf, Hilmar Gugel
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Publication number: 20050078362Abstract: A microscope contains a light source that emits illuminating light, and an apparatus that generates an illumination pattern in an image field of the microscope. The illumination patterns serves for photochemical modification of the sample.Type: ApplicationFiled: October 8, 2004Publication date: April 14, 2005Applicant: Leica Microsystems Heidelberg GmbHInventor: Rolf Borlinghaus
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Publication number: 20050078363Abstract: In a scanning microscope that impinges upon a sample with a first light pulse and a second light pulse, a dispersive medium that modifies the time offset between the first and the second light pulse is provided in the beam path of at least one of the light pulses.Type: ApplicationFiled: October 12, 2004Publication date: April 14, 2005Applicant: Leica Microsystems Heidelberg GmbHInventor: Hilmar Gugel
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Patent number: 6878948Abstract: The invention discloses a method for locating specimen regions of interest in a stimulatable microscopic specimen (13) that comprises the steps of: introducing into a specimen (13) of at least two stimulation-specific stains, illuminating with at least one illuminating light beam (7), initiating a stimulation, detection (4) of the light (16) emerging from the stimulation-specific stains, and identifying (5) of the spatial position of the regions within the specimen (13) from which light of at least two different wavelengths that are emission wavelengths of the stimulation-specific stains is emerging.Type: GrantFiled: December 19, 2001Date of Patent: April 12, 2005Assignee: Leica Microsystems Heidelberg GmbHInventor: Werner Knebel
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Patent number: 6867919Abstract: An optical arrangement for directing illumination light to a sample and for directing the detection light proceeding from the sample to a detector has a spectrally selective influencing means in the beam path of the detection light, which influences the polarization properties of the illumination light reflected or scattered from the sample in such a way that a polarizing beam splitter splits the illumination light reflected or scattered from the sample out of the detection light.Type: GrantFiled: October 8, 2003Date of Patent: March 15, 2005Assignee: Leica Microsystems Heidelberg GmbHInventor: Volker Seyfried
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Patent number: 6867899Abstract: A microscope with a light source that emits light for illumination of a specimen and with a spectrometer that receives detection light proceeding from the specimen, has an optical arrangement which has an acoustooptical component, and which directs the light of the light source to the specimen and delivers the detection light proceeding from the specimen to a spectrometer in spectrally undivided fashion. A flow cytometer and a method for examination of a specimen are also disclosed.Type: GrantFiled: December 11, 2002Date of Patent: March 15, 2005Assignee: Leica Microsystems Heidelberg GmbHInventor: Werner Knebel
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Patent number: 6864989Abstract: A method for illuminating an object with light (2) from a laser light source (3), preferably in a confocal scanning microscope (1). With the method according to the invention, it is possible to reduce the coherence length of the laser light, so that disruptive interference phenomena can be substantially eliminated. Should interference phenomena nevertheless be formed, these are to be influenced in such a way that they have no effect on the detection. The method according to the invention is characterized in that the phase angle of the light field is varied by a modulator in such a way that interference phenomena do not occur in the optical beam path, or occur only to an undetectable extent, within a predeterminable time interval.Type: GrantFiled: August 28, 2001Date of Patent: March 8, 2005Assignee: Leica Microsystems Heidelberg GmbHInventors: Rafael Storz, Johann Engelhardt, Holger Birk
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Publication number: 20050045812Abstract: A device for selectively detecting specific wavelength components of a light beam includes a spectral spreading element for spectrally spreading the light beam, and a detector array arranged downstream of the element. The detector array includes light-insensitive regions and light-sensitive regions. The element and the detector array are matched to each other so that selectable wavelength components of the light beam hit the light-insensitive regions and remaining wavelength components of the light beam hit the light-sensitive regions.Type: ApplicationFiled: August 20, 2004Publication date: March 3, 2005Applicant: Leica Microsystems Heidelberg GmbHInventors: Holger Birk, Volker Seyfried, Rafael Storz
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Publication number: 20050046836Abstract: A system and a method for setting a fluorescence spectrum measurement system for microscopy is disclosed. Using illuminating light (3) from at least one laser that emits light of one wavelength, a continuous wavelength region is generated. Dyes are stored, with the pertinent excitation and emission spectra, in a database of a computer system (23). For each dye present in the specimen (15), a band of the illuminating light (3) and a band of the detected light (17) are calculated, the excitation and emission spectra read out from the database being employed. Setting of the calculated band in the illuminating light and in the detected band [sic] is performed on the basis of the calculation. Lastly, data acquisition is accomplished with the spectral microscope (100).Type: ApplicationFiled: August 24, 2004Publication date: March 3, 2005Applicant: Leica Microsystems Heidelberg GmbHInventor: Frank Olschewski
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Publication number: 20050046835Abstract: A method for separating fluorescence spectra of dyes present in a specimen (15) is disclosed. Firstly a spectral scan of the fluorescence spectrum of all the dyes present in the specimen (15) is performed. The fluorescence spectra associated with the respective dyes are stored in a database of the computer system. After spectral deconvolution of the acquired mixed fluorescence spectrum, a comparison is made between the measured individual spectra ascertained by spectral deconvolution and the fluorescence spectra associated with the respective dyes. Lastly, a linear deconvolution of the acquired mixed fluorescence spectrum is performed.Type: ApplicationFiled: August 24, 2004Publication date: March 3, 2005Applicant: Leica Microsystems Heidelberg GmbHInventor: Frank Olschewski
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Publication number: 20050041861Abstract: As a user works at a microscope, image details are constantly present in the user's field of view. The user usually analyzes those image details, marks them with a suitable graphical software mechanism on the screen, and selects a desired function. According to the present invention, the user is offered a user interface that is based substantially on the user's knowledge of the world. A suitable combination of automated adjustment operations, automatic and semiautomatic image analysis, appropriate visualization technology, and integration is automatically used for image depiction.Type: ApplicationFiled: August 12, 2004Publication date: February 24, 2005Applicant: Leica Microsystems Heidelberg GmbHInventor: Frank Olschewski
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Patent number: 6859294Abstract: A scanning microscope is disclosed. The scanning microscope comprises a light source which emits an illuminating light beam for illumination of a specimen, a resonant beam deflection device, for guiding the illuminating light beam over the specimen, which has a resonant frequency and a resonant frequency range, and an independent oscillator with which a drive oscillation, which has a drive frequency within the resonant frequency range can be generated which drives the beam deflection device. Furthermore a method is disclosed for controlling a scanning microscope having a resonant beam deflection.Type: GrantFiled: September 5, 2002Date of Patent: February 22, 2005Assignee: Leica Microsystems Heidelberg GmbHInventor: Bernd Widzgowski
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Publication number: 20050036186Abstract: A deflection means which is rotatably and/or pivotably mounted in a bearing which comprises a Ferrofluid. The deflection means is part of an adjustable beam deflection device for deflecting a light beam. The deflection means is rotatable and/or pivotable about several axes.Type: ApplicationFiled: August 10, 2004Publication date: February 17, 2005Applicant: Leica Microsystems Heidelberg GmbHInventor: Reiner Rygiel
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Patent number: 6852964Abstract: The present invention discloses a method and an arrangement for scanning microscopic specimens (15) with a scanning device. The microscopic specimen (15) is displaceable on a specimen stage (35) in at least two spatial directions. A light beam (3) scans the specimen (15) within a defined scan field (52) by way of a scanning module (7), and the light (17) proceeding from the specimen is detected. A PC (34) is also provided for analysis and calculation. The scan field (52) is defined in such a way that it incompletely encompasses a specimen region that is to be examined. Means (23, 31) are provided which displace the specimen stage (35) in such a way that the entire specimen region of interest can be covered by the plurality of resulting scan fields (521, 522, . . . 52n). The data of the individual scan fields (521, 522, . . . 52n) detected from the specimen region being examined are assembled in the PC (34) into an overall image.Type: GrantFiled: November 19, 2001Date of Patent: February 8, 2005Assignee: Leica Microsystems Heidelberg GmbHInventors: Johann Engelhardt, Werner Knebel
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Patent number: 6852967Abstract: A scanning microscope for examination of a sample (31), having at least one optical component (89) that exhibits a wavelength-dependent characteristic and having an apparatus for wavelength-dependent detection that acquires measured values in at least two wavelength regions each characterized by a spectral width and a spectral position, is disclosed. The scanning microscope is characterized in that the wavelength-dependent characteristic of the at least one optical component (89) can be ascertained, can be at least temporarily stored in the form of a data set in a memory (49, 81), and can be considered upon acquisition and/or upon utilization of the measured values.Type: GrantFiled: July 3, 2002Date of Patent: February 8, 2005Assignee: Leica Microsystems Heidelberg GmbHInventors: Johann Engelhardt, Werner Knebel
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Publication number: 20050024721Abstract: A detector, arranged in the detection beam path of a scanning microscope, for the detection of detected light proceeding from a sample can be used to detect other than the detected light for example of external optical experiments. The scanning microscope comprises an incoupling apparatus with which light other than the detected light can be coupled into the detection beam path and conveyed to the detector.Type: ApplicationFiled: July 30, 2004Publication date: February 3, 2005Applicant: Leica Microsystems Heidelberg GmbHInventors: Rafael Storz, Werner Knebel
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Patent number: 6850358Abstract: A scanning microscope that defines an illumination beam path and a detection beam path, having an objective that is arranged in both the illumination beam path and the detection beam path, is disclosed. The scanning microscope is characterized by an interchangeable module that is also arranged in the illumination beam path and a detection beam path and that separates the illumination beam path and detection beam path at a fixed angular relationship to one another and comprises at least a first acoustooptical component. Also disclosed is an optical element having at least three ports.Type: GrantFiled: July 29, 2002Date of Patent: February 1, 2005Assignee: Leica Microsystems Heidelberg GmbHInventors: Holger Birk, Johann Engelhardt
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Publication number: 20050017197Abstract: A scanning microscope has a detector for detecting the detected light proceeding from a sample. A bandpass filter, containing a combination of a short-pass filter and at least one long-pass filter, is arranged in the light path of the detected light. The detector is a non-descan detector.Type: ApplicationFiled: July 26, 2004Publication date: January 27, 2005Applicant: Leica Microsystems Heidelberg GmbHInventors: Heinrich Ulrich, Werner Knebel