Patents Assigned to St Assembly Test Services Ltd.
  • Patent number: 9034693
    Abstract: A method of manufacturing an integrated circuit package includes: forming a substrate including: forming a core layer, and forming vias in the core layer; forming a conductive layer having a predetermined thickness on the core layer and having substantially twice the predetermined thickness in the vias; and forming connections between an integrated circuit die and the conductive layer.
    Type: Grant
    Filed: September 28, 2011
    Date of Patent: May 19, 2015
    Assignee: ST ASSEMBLY TEST SERVICES LTD.
    Inventors: Il Kwon Shim, Kwee Lan Tan, Jian Jun Li, Dario S. Filoteo, Jr.
  • Patent number: 8207598
    Abstract: A semiconductor heat spreader from a unitary metallic plate is provided. The unitary metallic plate is formed into a panel, channel walls, at least two feet, and at least one external reversing bend. The channel walls depend from the panel to define a channel between the channel walls and the panel for receiving a semiconductor therein. The feet extend from respective channel walls for attachment to a substrate.
    Type: Grant
    Filed: July 6, 2009
    Date of Patent: June 26, 2012
    Assignee: ST Assembly Test Services Ltd.
    Inventors: Virgil Cotoco Ararao, Il Kwon Shim, Seng Guan Chow, Sheila Marie L. Alvarez
  • Patent number: 8035204
    Abstract: A method for fabricating large die package structures is provided wherein at least portions of the leadtips of at least a plurality of leadfingers of a leadframe are electrically insulated. A die is positioned on the electrically insulated leadtips. The die is electrically connected to at least a plurality of the leadfingers.
    Type: Grant
    Filed: February 19, 2010
    Date of Patent: October 11, 2011
    Assignee: ST Assembly Test Services Ltd.
    Inventors: Jeffrey D. Punzalan, Jose Alvin Caparas, Jae Hun Ku
  • Patent number: 8030783
    Abstract: A method of manufacturing an integrated circuit package includes: forming a substrate that includes: forming a core layer, forming vias in the core layer, and forming a conductive layer having a predetermined thickness on the core layer and having substantially twice the predetermined thickness in the vias; and forming connections between an integrated circuit die and the conductive layer.
    Type: Grant
    Filed: October 20, 2009
    Date of Patent: October 4, 2011
    Assignee: St Assembly Test Services Ltd.
    Inventors: Il Kwon Shim, Kwee Lan Tan, Jian Jun Li, Dario S. Filoteo, Jr.
  • Patent number: 7960816
    Abstract: A system is provided for an integrated circuit package including a leadframe with a lead finger. A groove is in a lead finger for a conductive bonding agent and a passive device is in the groove to be held by the conductive bonding agent.
    Type: Grant
    Filed: December 23, 2005
    Date of Patent: June 14, 2011
    Assignee: ST Assembly Test Services Ltd.
    Inventors: Seng Guan Chow, Il Kwon Shim, Ming Ying, Byung Hoon Ahn
  • Patent number: 7863730
    Abstract: A method for forming a heat spreader, and the heat spreader formed thereby, are disclosed. An array heat spreader having a plurality of connected heat spreader panels is formed. Slots are formed in opposing sides of the heat spreader panels. Legs are formed on and extending downwardly from each of the heat spreader panels in at least an opposing pair of the slots on the heat spreader panels. The legs are integral with the respective heat spreader panels from which they depend.
    Type: Grant
    Filed: August 18, 2004
    Date of Patent: January 4, 2011
    Assignee: ST Assembly Test Services Ltd.
    Inventors: Il Kwon Shim, Kambhampati Ramakrishna, Diane Sahakian, Seng Guan Chow, Dario S. Filoteo, Jr., Virgil Cotoco Ararao
  • Patent number: 7786593
    Abstract: An integrated circuit die is provided having a body portion having a singulation side and a pedestal portion extending from the body portion and having a singulation side coplanar with the singulation side of the body portion.
    Type: Grant
    Filed: June 8, 2007
    Date of Patent: August 31, 2010
    Assignee: ST Assembly Test Services Ltd.
    Inventors: Virgil Cotoco Ararao, Il Kwon Shim, Seng Guan Chow
  • Patent number: 7700404
    Abstract: A method for fabricating large die package structures is provided wherein at least portions of the leadtips of at least a plurality of leadfingers of a leadframe are electrically insulated. A die is positioned on the electrically insulated leadtips. The die is electrically connected to at least a plurality of the leadfingers.
    Type: Grant
    Filed: September 28, 2006
    Date of Patent: April 20, 2010
    Assignee: ST Assembly Test Services Ltd.
    Inventors: Jeffrey D. Punzalan, Jose Alvin Caparas, Jae Hun Ku
  • Patent number: 7626277
    Abstract: An integrated circuit package comprises a substrate including a core layer with a through opening and vias. A first conductive layer is on the core layer covering the through opening and a second conductive layer is on the core layer opposite the first conductive layer in the through opening and in the vias contacting the first conductive layer. An integrated circuit die is bonded to the second conductive layer and in the through opening. Connections are between the integrated circuit die and the second conductive layer, and the integrated circuit die and the connections are encapsulated.
    Type: Grant
    Filed: November 18, 2005
    Date of Patent: December 1, 2009
    Assignee: St Assembly Test Services Ltd.
    Inventors: Il Kwon Shim, Kwee Lan Tan, Jian Jun Li, Dario S. Filoteo, Jr.
  • Patent number: 7595551
    Abstract: A semiconductor package is provided. A semiconductor package has a die pad and a plurality of bonding fingers. A spacer is attached to the die pad, and a large die is attached to the spacer. The large die is wire bonded to the plurality of bonding fingers using a plurality of bonding wires. The die pad, plurality of bonding fingers, spacer, large die, and bonding wires are encapsulated to form the semiconductor package. The semiconductor package can be either a single or dual row package, such as a QFN or BGA package.
    Type: Grant
    Filed: June 28, 2005
    Date of Patent: September 29, 2009
    Assignee: ST Assembly Test Services Ltd.
    Inventor: Kambhampati Ramakrishna
  • Patent number: 7575956
    Abstract: A method for fabricating a semiconductor heat spreader from a unitary metallic plate is provided. The unitary metallic plate is formed into a panel, channel walls, at least two feet, and at least one external reversing bend. The channel walls depend from the panel to define a channel between the channel walls and the panel for receiving a semiconductor therein. The feet extend from respective channel walls for attachment to a substrate.
    Type: Grant
    Filed: November 24, 2003
    Date of Patent: August 18, 2009
    Assignee: ST Assembly Test Services Ltd.
    Inventors: Virgil Cotoco Ararao, Il Kwon Shim, Seng Guan Chow, Sheila Marie L. Alvarez
  • Patent number: 7443039
    Abstract: An integrated circuit package is provided with a substrate having first and second contact pads exposed through a passivation layer on the substrate. A first metallurgy layer is over the substrate. A second metallurgy layer is over the first metallurgy layer. A protective layer is over the first contact pad.
    Type: Grant
    Filed: December 23, 2005
    Date of Patent: October 28, 2008
    Assignee: ST Assembly Test Services Ltd.
    Inventors: Lun Zhao, Wan Lay Looi, Kyaw Oo Aung, Yonggang Jin, Jae-Yong Song, Won Sun Shin
  • Patent number: 7413933
    Abstract: A semiconductor including a leadframe having a die attach paddle and a number of leads is provided. The die attach paddle has a recess to provide a number of mold dams around the periphery of the die attach paddle. An integrated circuit is positioned in the recess. Electrical connections between the integrated circuit and the number of leads are made, and an encapsulant is formed over the integrated circuit and around the number of mold dams.
    Type: Grant
    Filed: April 9, 2007
    Date of Patent: August 19, 2008
    Assignee: ST Assembly Test Services Ltd.
    Inventors: Jeffrey D. Punzalan, Jae Hun Ku, Byung Joon Han
  • Patent number: 7381593
    Abstract: A method and apparatus for stacked die packaging provide a leadframe configured for supporting a lower semiconductor die. At least one pillar is formed on the leadframe for supporting an upper semiconductor die. The pillar is formed integrally with and of the same material as the leadframe, and is sized to have a predetermined height that is higher than the height of such a lower semiconductor die plus the height of bonding wires for such a lower semiconductor die plus a predetermined spacing between such bonding wires and the bottom of an upper semiconductor die to be supported on the at least one pillar.
    Type: Grant
    Filed: August 5, 2004
    Date of Patent: June 3, 2008
    Assignee: ST Assembly Test Services Ltd.
    Inventors: Virgil Cotoco Ararao, Harvey Kong
  • Patent number: 7339258
    Abstract: A semiconductor package is provided. A leadframe including a die attach paddle, a number of inner leads, and a number of outer leads, and a number of extended lead tips on the number of outer leads. The inner edges of the number of extended lead tips are in substantial alignment with the inner edges of the number of inner leads. A die is attached to the die attach paddle. A number of bonding wires is used to connect the die to the number of inner leads and the extended lead tips on the number of outer leads, and an encapsulant is formed over the leadframe and the die.
    Type: Grant
    Filed: April 21, 2006
    Date of Patent: March 4, 2008
    Assignee: ST Assembly Test Services Ltd.
    Inventors: Jeffrey D. Punzalan, Jose Alvin Caparas, Jae Hun Ku
  • Patent number: 7327025
    Abstract: An electronic device having a substrate carrier is provided. A semiconductor connected to the substrate carrier. A heat spreader having upper and lower surfaces and legs recessed below the lower surface is connected to the substrate carrier. The Z-dimension between the heat spreader and the substrate carrier is maintained over substantially the entire area of the substrate carrier.
    Type: Grant
    Filed: April 30, 2004
    Date of Patent: February 5, 2008
    Assignee: St Assembly Test Services Ltd.
    Inventors: Il Kwon Shim, Sheila Marie L. Alvarez, Virgil Cotoco Ararao
  • Patent number: 7309913
    Abstract: A stacked semiconductor package includes a substrate and a first semiconductor device on the substrate. An interposer is supported above the first semiconductor device opposite the substrate. The interposer is electrically connected to the substrate. A second semiconductor device is mounted on the interposer.
    Type: Grant
    Filed: November 10, 2004
    Date of Patent: December 18, 2007
    Assignee: St Assembly Test Services Ltd.
    Inventors: Il Kwon Shim, Kambhampati Ramakrishna, Seng Guan Chow, Byung Joon Han
  • Patent number: 7306133
    Abstract: A system is provided for reflow soldering a part that includes: replacing air around an unsoldered part with a first inert gas; removing the first inert gas to form a vacuum around the unsoldered part; vacuum reflow soldering the unsoldered part to form a reflow-soldered part; providing a second inert gas to fill the vacuum around the reflow-soldered part; and replacing the second inert gas with air around the reflow-soldered part.
    Type: Grant
    Filed: April 16, 2004
    Date of Patent: December 11, 2007
    Assignee: ST Assembly Test Services Ltd.
    Inventors: Yonggang Jin, Shelley Yong, Puay Gek Chua, Won Sun Shin
  • Patent number: 7242101
    Abstract: An integrated circuit die is provided having a body portion having a singulation side and a pedestal portion extending from the body portion and having a singulation side coplanar with the singulation side of the body portion.
    Type: Grant
    Filed: July 19, 2004
    Date of Patent: July 10, 2007
    Assignee: St Assembly Test Services Ltd.
    Inventors: Virgil Cotoco Ararao, Il Kwon Shim, Seng Guan Chow
  • Patent number: 7217599
    Abstract: A semiconductor including a leadframe having a die attach paddle and a number of leads is provided. The die attach paddle has a recess to provide a number of mold dams around the periphery of the die attach paddle. An integrated circuit is positioned in the recess. Electrical connections between the integrated circuit and the number of leads are made, and an encapsulant is formed over the integrated circuit and around the number of mold dams.
    Type: Grant
    Filed: May 19, 2004
    Date of Patent: May 15, 2007
    Assignee: ST Assembly Test Services Ltd.
    Inventors: Jeffrey D. Punzalan, Jae Hun Ku, Byung Joon Han