Patents Examined by Roy Punnoose
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Patent number: 7986415Abstract: The invention relates to an apparatus and a method for optical 3D measurement, comprising a first beam deflector for deflecting an illuminating beam onto a measurement object and for deflecting the observation beam which is radiated back by the measurement object, wherein the first beam deflector can move along a path distance S.Type: GrantFiled: July 21, 2009Date of Patent: July 26, 2011Assignee: Sirona Dental Systems GmbHInventors: Frank Thiel, Joachim Pfeiffer, Peter Fornoff
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Patent number: 7986400Abstract: A fingerprint imaging system configured to capture an image of a friction ridge pattern of a subject (e.g., a fingerprint, a palm print, a hand print, a footprint, etc.). The system may include one or more components that reduce the impact of ambient light on the performance of the system. In some implementations, the system may reduce the impact of ambient light without requiring additional power (e.g., to generate an increased amount of radiation) and without including “external” hoods and/or covers designed to block ambient light prior to the ambient light entering system. Instead, the system may reduce the impact of ambient light on performance by blocking ambient light internally within the system along an optical path of radiation used to electronically capture an image of the friction ridge pattern.Type: GrantFiled: February 24, 2011Date of Patent: July 26, 2011Assignee: Identification International, Inc.Inventors: Richard Karl Fenrich, Lin Li
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Patent number: 7978327Abstract: There is provided a molecularity measurement instrument capable of working out the number of molecules in a sample by comparing a measured value of a light quantity with a theoretical light quantity per a single molecule, and a molecularity measurement method using the same. The molecularity of the sample is quantitatively estimated on the basis of a light quantity having correlation with the molecularity. The molecularity measurement method comprises the step of working out a theoretical light quantity per a single molecule, the step of measuring a light quantity of the sample by use of an image detector, and the step of working out the molecularity of the sample on the basis of a ratio of the light quantity of the sample to the theoretical light quantity as worked out.Type: GrantFiled: February 4, 2009Date of Patent: July 12, 2011Assignee: Yokogawa Electric CorporationInventors: Takeo Tanaami, Hidetoshi Aoki, Saya Satou, Yumiko Sugiyama
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Patent number: 7969586Abstract: An electronic leveling apparatus for optically measuring a height difference relative to a leveling staff comprises a telescope, a camera fixed to the telescope, a first actuator for rotating both said telescope and said camera in a horizontal plane about a fixed vertical axis of the apparatus, and a controller. The camera has a depth of focus that is at least twice a depth of focus of the telescope. The controller uses a first output signal from said telescope to output a leveling signal representing a detected height difference. The controller uses a second output signal from said camera to identify a representation of a leveling staff and to control the first actuator based on the identified representation of the leveling staff. Furthermore a method for optically measuring a height difference of an electronic leveling apparatus relative to a leveling staff is provided.Type: GrantFiled: January 22, 2009Date of Patent: June 28, 2011Assignee: Trimble Jena GmbHInventors: Bernd Donath, Thomas Marold
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Image plane measurement method, exposure method, device manufacturing method, and exposure apparatus
Patent number: 7965387Abstract: A main controller moves a reticle stage in a scanning direction, illuminates an area on a reticle including a mark area in which predetermined marks are formed with illumination light, forms an aerial image of at least one mark existing in the mark area via a projection optical system, and measures the aerial image using an aerial image measuring unit. The main controller repeatedly performs such aerial image measurement while moving the reticle stage in the scanning direction. Then, the main controller computes a scanning image plane on which an image of a pattern formed on a reticle is formed by the projection optical system, based on the measurement result of the aerial image of each mark at each movement position. Based on the computation result, the main controller performs focus leveling control of a wafer during scanning exposure. Thus, highly accurate exposure is realized without using a sensor for reticle (mask) position measurement.Type: GrantFiled: July 21, 2005Date of Patent: June 21, 2011Assignee: Nikon CorporationInventor: Tsuneyuki Hagiwara -
Patent number: 7965386Abstract: A defect inspection apparatus is capable of inspecting an extremely small defect present on the top and edge surfaces of a sample such as a semiconductor substrate or a thin film substrate with high sensitivity and at high speed. The defect inspection apparatus has an illumination optical system, a plurality of detection optical units and a signal processor. One or more of the detection optical units receives either light diffracted from an edge portion of the sample or light diffracted from an edge grip holding the sample. The one or more of the detection optical units shields the diffracted light received by the detection optical unit based on a signal obtained by monitoring an intensity of the diffracted light received by the detection optical unit in order to inspect a sample portion located near the edge portion and a sample portion located near the edge grip.Type: GrantFiled: December 9, 2010Date of Patent: June 21, 2011Assignee: Hitachi High-Technologies CorporationInventors: Yuta Urano, Toshiyuki Nakao, Yoshimasa Oshima
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Patent number: 7961318Abstract: A system and method for detection and measurement of circular birefringences in materials that exhibit the Faraday effect. The method and apparatus permit detection of optical activities via the difference in the directions of propagation the left- and the right-circularly polarized light (components). A beam of light is directed at an interface formed by the optically active medium and another medium such that a difference in the angles of refraction and/or reflection and/or diffraction between the left- and the right-circularly polarized components of the light beam can be detected. The difference in the propagation directions between the two circularly polarized light components is measured on a position sensitive detector and/or is detected as an intensity difference.Type: GrantFiled: June 27, 2007Date of Patent: June 14, 2011Assignee: President and Fellows of Harvard CollegeInventors: Peer Fischer, Ambarish Ghosh
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Patent number: 7957003Abstract: The present invention provides a nitrogen analyzing apparatus comprising: a nitrogen concentration measuring device configured to measure the concentration of an nitrogen impurities in a mixed gas including argon and oxygen as main components on the basis of emission intensity of a light emitted from the nitrogen impurities by an electric discharge in a discharge tube and an oxygen concentration of a sample gas introduced into the discharge tube, and a diluting oxygen-introducing device configured to add a diluting oxygen in the sample gas sampled from the mixed gas according to the oxygen concentration of the mixed gas.Type: GrantFiled: February 9, 2007Date of Patent: June 7, 2011Assignee: Taiyo Nippon Sanso CorporationInventor: Naoho Baba
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Patent number: 7952727Abstract: An optical contour digitizer including a radiation source for emitting radiation therefrom, a first mirror for folding the radiation emitted from the radiation source towards an object being measured, a second mirror for folding a reflection of the radiation from the object being measured and a sensor for sensing the reflected radiation folded by the second mirror, and a method of using the same.Type: GrantFiled: June 12, 2006Date of Patent: May 31, 2011Assignee: Amfit, Inc.Inventors: Arjen Sundman, Jeff Davis
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Patent number: 7952697Abstract: A coffee refractometer includes a prism that receives a brewed coffee sample, thus forming a prism-sample interface. A processor or microcontroller controls a light source to provide incident light to the prism-sample interface. The prism-sample interface refracts light toward a photodetector. A temperature sensor provides temperature information to the processor. The refractometer includes a memory store that stores a TDS formula that expresses the TDS of brewed coffee as a function of the index of refraction (ns) of brewed coffee and the temperature of brewed coffee. The processor determines the TDS of the brewed coffee sample by accessing the TDS formula in the memory store and employing the determined index of refraction (ns) of the brewed coffee sample to find the TDS from the TDS formula. The refractometer displays the resultant TDS % on a display of the refractometer and/or transmits such information to an information handling system.Type: GrantFiled: October 8, 2008Date of Patent: May 31, 2011Assignee: Voice Systems Technology, Inc.Inventors: Vincent Fedele, Philip Gaudet, Daniel Henri Raguin
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Patent number: 7948641Abstract: A hand-held device (10, 10?) for contactless distance measurement measures a distance (d) between a target object (18) and at least one reference point (20) of the device (10) using an emitted modulated measurement signal (16). The device includes a housing (12, 13, 56) with a first end (34) that faces the object (18) to be measured, and a second end (35) facing away from the object (18) to be measured. The housing includes an output unit (22, 28, 29, 31) for depicting measured results. Several measured distance values are to be assigned to at least one subsection of the path between the object (18) to be measured and the opposite end (35) of the housing (12, 13, 56) via a length-measurement scale (36, 38, 54) that is displayable in the output unit (22, 28, 29, 31).Type: GrantFiled: March 9, 2007Date of Patent: May 24, 2011Assignee: Robert Bosch GmbHInventors: Heiner Lukas, Wolfgang Adamczak, Steffen Tiede
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Patent number: 7944569Abstract: An apparatus for determining surface topology of a portion of a three-dimensional structure is provided, that includes a probing member, an illumination unit, a light focusing optics, a translation mechanism, a detector and a processor.Type: GrantFiled: December 29, 2009Date of Patent: May 17, 2011Assignee: Cadent Ltd.Inventors: Noam Babayoff, Isaia Glaser-Inbari
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Patent number: 7940379Abstract: An identification apparatus that keeps the conditions for imaging uniform among successive identifications and requires a user to perform only a series of simple maneuvers. An identification apparatus comprising a guide member, a light source, and an imaging unit. The guide member includes a pattern or a structure that inspires a user to position his/her finger thereon or to approach his/her specific finger region thereto. A contact member such as a button switch is preferably located at a position in the guide member at which a fingertip is to be positioned. An optical opening is formed at a position coincident with a position at which a portion of a finger to be imaged for identification should be placed. The light source radiates near-infrared light through the portion of the finger to be imaged. The imaging means acquires an image of the finger, and the apparatus compares the image to previously registered images.Type: GrantFiled: June 5, 2009Date of Patent: May 10, 2011Assignee: Hitachi, Ltd.Inventors: Akio Nagasaka, Takafumi Miyatake, Naoto Miura, Yoshiaki Amano, Yoshimi Kasai, Shinichiro Umemura, Miyuki Kono
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Patent number: 7940382Abstract: A method for inspecting a defect of a hollow fiber porous membrane having substantially uniform, continuous inner hollow portions comprises steps for introducing a part of the hollow fiber porous membrane into an irradiation chamber, for irradiating the hollow fiber porous membrane with light from the outside in the irradiation chamber, and for detecting light exiting the hollow fiber porous membrane on the outside of the irradiation chamber.Type: GrantFiled: March 16, 2007Date of Patent: May 10, 2011Assignee: Asahi Kasei Chemicals CorporationInventors: Makoto Ikeda, Ryuhei Uchiyama, Osamu Nagasawa
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Patent number: 7940389Abstract: A pressure sensing apparatus has a light source for transmitting pulses of light along a monomode optical fiber. The polarization of light backscattered from the light pulses in the optical fiber is detected by a polarization processing unit (PPU) and a photo detector. The optical fiber is adapted to deform asymmetrically under the influence of applied external isotropic pressure, e.g. from a fluid. The deformation causes the birefringence of the optical fiber to change proportionally to the applied pressure. The change in birefringence can be determined from the detected polarization of the backscattered light, allowing detection of pressure distribution in the fluid. Importantly, the construction of the optical fiber is such that the birefringence beat length of the optical fiber at the wavelength of light propagated by the fiber remains more than twice the spatial length of the light pulses transmitted along the optical fiber.Type: GrantFiled: May 25, 2005Date of Patent: May 10, 2011Assignee: Fotech Solutions LimitedInventors: Alan John Rogers, Sotiris Emil Kanellopoulos, Sergey Vladimir Shatalin
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Patent number: 7936451Abstract: The invention relates to a method for machining and estimating an optical lens which is designed as a semi-finished product, with a pre-finished form of a first side and a second side to be machined, in which a pre-specified form of a surface of the second side to be machined is estimated, wherein prior to estimating the pre-specified form of the surface of the second side, an actual form of the surface of the first side is measured using measuring means and is incorporated into the estimation of the pre-specified form of the surface of the second side.Type: GrantFiled: December 4, 2009Date of Patent: May 3, 2011Assignee: Schneider GmbH & Co. KGInventors: Gunter Schneider, Helwig Buchenauer, Stephan Huttenhuis
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Patent number: 7936452Abstract: An inspection apparatus includes a projecting unit, a first receiving unit, a second receiving unit, and a controller. The projection unit is configured to project linear light on a surface of an object. The first and second receiving units are configured to receive scattered light of the projected linear light. The controller is configured to scan the projecting unit, the first and second receiving units and determine the present or absence of a foreign substance on the surface based on intensity distribution signals output from the first and second receiving units.Type: GrantFiled: July 20, 2009Date of Patent: May 3, 2011Assignee: Canon Kabushiki KaishaInventor: Atsushi Kawahara
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Patent number: 7933006Abstract: A tilt inspection apparatus which detects tilt of an object to be observed with respect to a placement surface on which the object is placed, including: a light source which irradiates light or projects an image onto the object to be observed; a light shield plate which has a first slit extended in a first direction and a second slit extended in a second direction normal to the first direction, and is disposed between the light source and the object to be observed; and a carriage mechanism which supports the light shield plate so as to be rotatable in the in-plane direction of the light shield plate, and fixes the light shield plate while aligning the first slit normal to the placement surface is provided.Type: GrantFiled: October 1, 2009Date of Patent: April 26, 2011Assignee: Renesas Electronics CorporationInventor: Tooru Kumamoto
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Patent number: 7929122Abstract: A method for the determination of the red blood cell indices including the volume, and hemoglobin content and concentration for individual red blood cells, as well as red blood cell population statistics, including total number of red blood cells present in the sample, and mean values for each of the aforementioned indices within a substantially undiluted blood sample is provided.Type: GrantFiled: November 15, 2010Date of Patent: April 19, 2011Assignee: Abbott Point of Care, Inc.Inventors: Stephen C. Wardlaw, Robert A. Levine, Darryn W. Unfricht, Niten V. Lalpuria, Jeremy R. Hill
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Patent number: 7929142Abstract: Photodiode-based bi-directional reflectance distribution function (BRDF) measurement is described. Multiple photodiodes are distributed approximately symmetrically at a fixed distance from a surface to be measured. One or more of the photodiodes are directed to emit light, while readings are gathered from the other photodiodes that are not emitting light. The readings are processed based on previously measured calibration data to generate BRDF values.Type: GrantFiled: July 15, 2008Date of Patent: April 19, 2011Assignee: Microsoft CorporationInventors: Moshe Ben-Ezra, Yasuyuki Matsushita, Bennett S Wilburn, Xiaoyang Li