Abstract: A method and apparatus for scanning multiple scanning probe microscopes in close proximity, to scan overlapping scan areas at the same time while avoiding collision employs a control system providing drive signals to a first Atomic Force Microscope (AFM) and calculated drive signals to additional AFMs based on the first drive signals and the relative position of the additional AFMs to the first AFM for consistent spaced motion. Scanning and Failure Analysis (FA) probing of multiple feature of interest using multiple APMs allows for reduced time for locating FA features to set up measurements.

Abstract: A method and apparatus for controlling communications in a data network comprises detecting a request to initiate communication between a data processor and the network and determining if the communication request is abnormal and if so, controlling the data processor to degrade the resulting communication.

Abstract: A method of operating a computing entity in a network having a log mapping computing entity network addresses to vulnerabilities, the method comprising the steps of: using the entity's network address, searching the log to establish what vulnerabilities the entity has; and if the log indicates the entity has a vulnerability, sending data identifying a user of the entity to an administrator of the network.

Abstract: A computer program product for monitoring a user computing entity's status, the program being adapted to: evaluate one more parameters of operation of one more functional elements of the user entity; if an evaluated parameter has a value outside of a predetermined range which is indicative of normal user entity behaviour, operate the user entity to enable, in a predetermined manner, administrative access to the user entity to be gained by an administrative computing entity, thereby to permit the administrative entity to perform an administrative operation on the user entity.

Abstract: A method and apparatus for scanning multiple scanning probe microscopes in close proximity, to scan overlapping scan areas at the same time while avoiding collision employs a control system providing drive signals to a first Atomic Force Microscope (AFM) and calculated drive signals to additional AFMs based on the first drive signals and the relative position of the additional AFMs to the first AFM for consistent spaced motion. Scanning and Failure Analysis (FA) probing of multiple feature of interest using multiple APMs allows for reduced time for locating FA features to set up measurements.

Abstract: A fuel transport tube having a corrugated or convoluting structure containing a plurality of alternating crests and valleys interconnected by shallow angled side walls wherein the crests extend radially outward from an outer surface of the fuel transport tube, the fuel transport tube comprising an inner conductive acrylonitrile-butadiene rubber layer containing carbon black; a fluorothermoplastic barrier layer comprising a tetrafluoroethylene-hexafluoropropylene-vinylidene fluoride terpolymer or a blend of fluorointerpolymers wherein at least one of the interpolymers exhibits fluorothermoplastic characteristics; an elastomeric acrylonitrile-butadiene rubber backing layer, and a chloropolyethylene cover layer.

Abstract: A method and apparatus for scanning multiple scanning probe microscopes in close proximity, to scan overlapping scan areas at the same time while avoiding collision employs a control system providing drive signals to a first Atomic Force Microscope (AFM) and calculated drive signals to additional AFMs based on the first drive signals and the relative position of the additional AFMs to the first AFM for consistent spaced motion. Scanning and Failure Analysis (FA) probing of multiple feature of interest using multiple APMs allows for reduced time for locating FA features to set up measurements.

Abstract: A submarine casing for a submarine cable is shielded by a metal sheath from the deleterious effects of hydrogen generated from a sea-earth by electrolysis. Cylindrical parts (3,4) are covered by a wrapped metal sheet (8) and tapering parts by a fitted or shrunk sleeve (9) overlapping the sheets and having a metal lining (10), making up the sheath.

Abstract: In a cable system for connecting to an electrical apparatus, an earthing electrode assembly includes an earthing electrode, a mechanism for attaching the electrode to the cable while maintaining electrical insulation from the cable, and an electrical connection of the electrode to the electrical apparatus, the connection being long enough that the electrode is located at a distance from the apparatus such that the apparatus is substantially protected from the electrochemical effects resulting from operation of the electrode. The earthing electrode may include a titanium core which is coated with platinum or a mixed metal oxide of tantalum and iridium. Methods of attachment are also disclosed.

Abstract: Apparatus and methods controlling a process producing segments of product wherein a destabilizing event of a particular type periodically destabilizes the process, resulting in product or process deviation from a target parameter associated with a number of segments of the product, from segment number 1 to segment number n. The method associates, with respective ones of the n units of product, deviation amounts corresponding to historical deviation amounts for the respective so-numbered units of product in past occurrences of the particular type destabilizing event, and applying to selected ones of the n segments of product correction factors derived from respective associated historical deviation amounts for the respective units of product, thereby making pro-active adjustments to respective ones of the n units of product, upon occurrence of the destabilizing event. Preferred methods include applying the correction factors to each of the n units of product.

Abstract: A method for determining the characteristics of a doped semiconductor substrate is disclosed, wherein a scanning probe microscope, preferably an atomic force microscope, is used to move a probe across a sample surface gathering electrical measurements at many locations. The probe tip is conductive and is connected to a control circuit that applies a voltage to the probe and to an electrode fixed to the semiconductor substrate. Preferably, the current that flows through the sample is measured and saved, together with the position of the probe on the surface of the sample. In this manner, the characteristics of the doped sample can be determined at many different locations with many different degrees of doping. The sample is prepared by doping its top surface, then machining off the top surface to provide access to the sample at different doping depths.