Abstract: A data storage device includes a memory device and a controller coupled to the memory device. The controller is configured to receive a command, such as from a host device, to write data to the memory device, perform toggle mode (TM) encoding on the data, and send the TM encoded data to the memory device. The memory device is configured to receive the TM encoded data, decode the TM encoded data, and write the decoded data to a location within the memory device. The memory device is further configured to receive a read command to read data from a location within the memory device, read the data, TM encode the data, and send the TM encoded data to the controller. The controller is configured to receive and decode the TM encoded data, and send the decoded data to a host device.

Abstract: A storage system generates a low-density parity check (LDPC) code from a plurality of subcodes. The storage system stores each subcode in a different page of a word line in the memory. The subcode can be stored in one plane in the memory or across multiple planes. When the subcodes are stored across multiple planes, they can be stored in a checkboard pattern.

Abstract: Technology for error correcting data stored in memory dies is disclosed. Codewords, which may contain data bits and parity bits, are stored on a memory die. The memory die is bonded to a control die through bond pads that allow communication between the memory die and the control die. The codewords are decoded at the control die based on the parity bits. If the control die successfully decodes a codeword, the control die may send the data bits but not the parity bits to a memory controller. By not sending the parity bits to the memory controller, substantial bandwidth is saved. Also, substantial power may be saved. For example, the interface between the control die and the memory controller could be a high speed interface.

Abstract: A memory includes, in one embodiment, one or more storage elements; read/write circuitry; and compressed bit circuitry. The read/write circuitry is configured to read a set of hard bits from the one or more storage elements, and sense a set of soft bits while reading the set of hard bits from the one or more storage elements, the set of soft bits having a first fixed size, and the set of soft bits indicating a reliability of the set of hard bits. The compressed soft bit circuitry is configured to generate, with a fixed size soft bit lossy compression algorithm, a fixed size compressed soft bits by compressing the set of soft bits, the fixed size compressed soft bits having a second fixed size that is smaller than the first fixed size, and output the fixed size compressed soft bits to a memory-to-controller bus.

Abstract: A storage system generates a low-density parity check (LDPC) code from a plurality of subcodes. The storage system stores each subcode in a different page of a word line in the memory. The subcode can be stored in one plane in the memory or across multiple planes. When the subcodes are stored across multiple planes, they can be stored in a checkboard pattern.

Abstract: A storage apparatus includes non-volatile memory cells formed on a memory die, each memory cell configured to hold bits of data, and a control circuit. The control circuit is configured to calculate parity data for data to be stored in the memory cells and program the memory cells to first distributions. The control circuit is also configured to read memory cells in the first distributions, recover the data from results of reading the memory cells in the first distributions combined with the parity data, and further program the memory cells from the first distributions to second distributions to store the data. To improve the accuracy of recovering the encoded foggy phase data, techniques are presented to calibrate the voltage levels used in sensing the foggy state distributions.

Abstract: A control circuit on a control die compensates for interference caused by adjacent memory cells on target memory cells on a memory die. The compensation may be based on the data states of the adjacent memory cells. Data latches may be used to store data states of the memory cells. However, reading the target memory cells can over-write the data states of the adjacent memory cells in the data latches. The control die may store data state information for the adjacent memory cells prior to sensing the target memory cells (e.g., prior to a decoding error of a codeword in the target cells). Saving the data state information on the control die reduces storage requirements of the memory die and alleviates the need to sense the adjacent memory cells again if decoding the codeword in the target memory cells fails.

Abstract: A data storage device is configured to mark data for refresh in response to determining that a first measured temperature associated with writing the data to the memory exceeds a first threshold. The data storage device is further configured to refresh the marked data in response to determining that a second measured temperature associated with the memory is below a second threshold.

Abstract: A storage apparatus includes non-volatile memory cells formed on a memory die, each memory cell configured to hold bits of data, and a control circuit formed on the memory die. The control circuit is configured to calculate parity data for data to be stored in the memory cells and program the memory cells to first distributions. The control circuit is also configured to read memory cells in the first distributions, recover the data from results of reading the memory cells in the first distributions combined with the parity data, and further program the memory cells from the first distributions to second distributions to store the data. In some cases, the recovered data may have a high bit error rate. To handle higher bit error rates, the use of soft bit data is incorporated into an encoded foggy-fine scheme.

Abstract: A memory array includes strings that are configured to store keywords and inverse keywords corresponding to keys according to content addressable memory (CAM) storages schemes. A read circuit performs a CAM read operation over a plurality of iterations to determine which of the keywords are matching keywords that match a target keyword. During the iterations, a read controller biases word lines according to a plurality of modified word line bias setting that are each modified from an initial word line bias setting corresponding to the target keyword. At the end of the CAM read operation, the read controller detects which of the keywords are matching keywords, even if the strings are storing the keywords or inverse keywords with up a certain number of bit errors.

Abstract: Technology for two-sided adjacent memory cell interference mitigation in a non-volatile storage system is disclosed. During reading of target memory cells, the storage system applies a suitable magnitude read pass voltage to a first unselected word line adjacent to a target word line to compensate for interference from adjacent cells on the first unselected word line while applying a suitable magnitude read reference voltage to the target word line to compensate for interference from adjacent cells on a second unselected word line on the other side of the target word line. The read pass voltage may compensate for interference due to charge being added to when programming cells on the first unselected word line after programming the target cells. The read reference voltage may compensate for interference due to charge movement near the target cells that results from charge stored in the cells on the second unselected word line.

Abstract: Methods and apparatus for managing and optimizing data storage devices that include non-volatile memory (NVM) are described. One such method involves deriving a hint for one or more logical block addresses (LBAs) of a storage device based on information received from a host device and/or physical characteristics of the storage device, such as LBAs that are invalidated together; grouping the LBAs into one or more clusters of LBAs based on the derived hint and a statistical analysis of the physical characteristics of the storage devices; allocating available physical block addresses (PBAs) in the storage device to one of the LBAs based on the one or more clusters of LBAs to achieve optimization of a data storage device.

Abstract: A non-volatile storage system includes a memory controller connected to an integrated memory assembly. The integrated memory assembly includes a memory die comprising non-volatile memory cells and a control die bonded to the memory die. The memory controller provides data to the control die for storage on the memory die. Data is initially stored on the memory die as single bit per memory cell data to increase the performance of the programming process. Subsequently, the control die performs an adaptive folding process which comprises reading the single bit per memory cell data from the memory die, adaptively performing one of multiple decoding options, and programming the data back to the memory die as multiple bit per memory cell data.

Abstract: A control circuit on a control die compensates for interference caused by adjacent memory cells on target memory cells on a memory die. The compensation may be based on the data states of the adjacent memory cells. Data latches may be used to store data states of the memory cells. However, reading the target memory cells can over-write the data states of the adjacent memory cells in the data latches. The control die may store data state information for the adjacent memory cells prior to sensing the target memory cells (e.g., prior to a decoding error of a codeword in the target cells). Saving the data state information on the control die reduces storage requirements of the memory die and alleviates the need to sense the adjacent memory cells again if decoding the codeword in the target memory cells fails.

Abstract: A method and apparatus for calibrating read threshold for cells of a target wordline (WL) that may be conducted on a die, in a controller connected to a memory die, or both. Voltage values of one or more adjacent WL cells are read, and based on the voltage values of the adjacent cells, cells of the target WL are grouped. A read threshold calibration is carried out on each group. The calibration thresholds are then used for read operations on the cells of each distinct group of the target WL.

Abstract: A memory includes, in one embodiment, one or more storage elements; read/write circuitry; and compressed bit circuitry. The read/write circuitry is configured to read a set of hard bits from the one or more storage elements, and sense a set of soft bits while reading the set of hard bits from the one or more storage elements, the set of soft bits having a first fixed size, and the set of soft bits indicating a reliability of the set of hard bits. The compressed soft bit circuitry is configured to generate, with a fixed size soft bit lossy compression algorithm, a fixed size compressed soft bits by compressing the set of soft bits, the fixed size compressed soft bits having a second fixed size that is smaller than the first fixed size, and output the fixed size compressed soft bits to a memory-to-controller bus.

Abstract: A non-volatile memory system comprises an integrated memory assembly in communication with a memory controller. The integrated memory assembly comprises a memory die bonded to a control die with bond pads. The control die includes one or more control circuits for controlling the operation of the memory die. The one or more control circuits are configured to receive data to be programmed into the memory die, select a number of parity bits, encode the data to add error correction information and form a codeword that includes the number of parity bits, shape the codeword, and program the shaped codeword into the memory die.

Abstract: A controller utilizes dual sense bin balancing (DSBB) to adjust a read level between memory states of an array of NAND flash memory cells. One or more iterations of DSBB may be performed to provide a read level. Each iteration of the DSBB includes performing a first sense read, performing a second sense read, determining a read error, and adjusting the initial read level. The first sense read is performed at a first offset of an initial read level of memory cells. The second sense read is performed at a second offset of the initial read level of memory cells. A read error is determined from the first sense read and the second sense read. The read level is adjusted by the read error. A read of the randomized data pattern is conducted with the adjusted read level of a last iteration of the DSBB.

Abstract: Power regulation in an integrated memory assembly having control semiconductor dies and memory semiconductor is disclosed herein. A master control die regulates power usage by the integrated memory assembly. Each control die reports information about its expected power usage to the master control die. The master control die determines a plan that meets a power criterion for the integrated memory assembly. The plan may maximize the power usage in each time period, while staying within a power budget. The plan can include selecting which of the memory dies perform a memory operation (or phase of a memory operation) during a given time period. The master control die may send a die scheduling plan to each of the other control dies. Each die scheduling plan indicates when memory operations and/or phases of memory operations are to be performed.

Abstract: A method for calibrating read threshold voltages includes receiving, from at least one memory die, a number of page bits corresponding to a number of read operations performed on a page associated with the at least one memory die. The method further includes determining voltage bins for each bit of the number of page bits. The method further includes determining, for each voltage bin, a bit error rate. The method further includes adjusting read threshold voltages associated with the at least one memory die using the bite error rate for each voltage bin.