Abstract: The disclosure relates in some aspects to on-chip processing circuitry formed within the die of a non-volatile (NVM) array to perform data searches. In some aspects, the die includes components configured to sense wordlines of stored data in the NVM array by applying voltages on the wordlines serially, and then search for an input data pattern within the serially-sensed wordlines. In some examples, the components of the die include latches and circuits configured to perform bitwise latch logic search operations. In other examples, the search components are configured with under-the-array or next-to-the-array dedicated search circuitry that uses registers and/or random access memory (RAM). Other aspects relate to a separate controller device for controlling the on-chip NVM search operations. For example, the controller may determine whether to search for data using search components of the NVM die or processors of the controller based, e.g., on a degree of fragmentation of data.

Abstract: A non-volatile memory system comprises an integrated memory assembly in communication with a memory controller. The integrated memory assembly includes a memory die bonded to a control die. The control die includes one or more control circuits for controlling the operation of the memory die. The control circuits are configured to receive a request to copy data on the memory die, read codewords on the memory die in response to the request, decode the codewords to identify errors in the codewords, correcting the errors in the codewords, and program the codewords back into the memory die. In one embodiment, the codewords read are stored in the memory die as single bit per memory cell data and the codewords programmed back into the memory die after correcting errors are programmed as multiple bit per memory cell data.

Abstract: Dual sense bin balancing (DSBB) to adjust a read level between memory states of an array of NAND flash memory cells implemented in a logic circuit of a NAND flash die or in a storage device controller. Reading a randomized data pattern stored in an array of memory cells includes performing one or more iterations of a DSBB to provide a read level. Each iteration of the DSBB includes performing a first sense read, performing a second sense read, determining a read error, and adjusting the initial read level. The first sense read is performed at a first offset of an initial read level of memory cells to determine a first number of memory cells relative to the first offset. The second sense read is performed at a second offset of the initial read level of memory cells to determine a second number of memory cells relative to the second offset. A read error of the initial read level is determined from the first sense read and the second sense read.

Abstract: Example systems and methods provide differentiated data recovery configurations based on memory health data. A distributed storage system, such as a cloud-based storage system, stores backup data from a remote storage device using a first data recovery configuration. Based on memory health data collected from the remote storage device, a change in a memory health state of the remote storage device may be determined. Responsive to the change in the memory health state, a different data recovery configuration may be used for storing backup data going forward and reallocating previously stored backup data in the distributed storage system.

Abstract: Technology for error correcting data stored in memory dies is disclosed. Codewords, which may contain data bits and parity bits, are stored on a memory die. The memory die is bonded to a control die through bond pads that allow communication between the memory die and the control die. The codewords are decoded at the control die based on the parity bits. If the control die successfully decodes a codeword, the control die may send the data bits but not the parity bits to a memory controller. By not sending the parity bits to the memory controller, substantial bandwidth is saved. Also, substantial power may be saved. For example, the interface between the control die and the memory controller could be a high speed interface.

Abstract: Power regulation in an integrated memory assembly having control semiconductor dies and memory semiconductor is disclosed herein. A master control die regulates power usage by the integrated memory assembly. Each control die reports information about its expected power usage to the master control die. The master control die determines a plan that meets a power criterion for the integrated memory assembly. The plan may maximize the power usage in each time period, while staying within a power budget. The plan can include selecting which of the memory dies perform a memory operation (or phase of a memory operation) during a given time period. The master control die may send a die scheduling plan to each of the other control dies. Each die scheduling plan indicates when memory operations and/or phases of memory operations are to be performed.

Abstract: The present disclosure generally relates to a flexible or soft architecture solution of a host-data storage device system. The host is permitted different, intermediate levels of responsibility to the memory management. The different levels of host involvement in the memory management of the memory device are anywhere between an existing zone namespace (ZNS) solution and an open channel solution. The data storage device offers a selection of specific memory management options to the host device. The host device then selects the level of memory management desired and configures the data storage device to meet the memory management selection. In so doing, the host device controls the trade-off between host device overhead of memory management and host device flexibility.

Abstract: A data storage device includes a non-volatile memory and a controller coupled to the non-volatile memory. The controller is operable to measure a first threshold voltage (VT) of a memory cell under a first parameter at a read temperature and measure a second VT of the memory cell under a second parameter at the read temperature in which the first parameter is different from the second parameter. A VT correction term for the memory cell is determined based upon the first VT measurement and the second VT measurement. A read VT of the memory cell is adjusted by using the VT correction term.

Abstract: A non-volatile memory system comprises an integrated memory assembly in communication with a memory controller. The integrated memory assembly includes a memory die bonded to a control die. The control die includes one or more control circuits for controlling the operation of the memory die. The control circuits are configured to receive a request to copy data on the memory die, read codewords on the memory die in response to the request, decode the codewords to identify errors in the codewords, correcting the errors in the codewords, and program the codewords back into the memory die. In one embodiment, the codewords read are stored in the memory die as single bit per memory cell data and the codewords programmed back into the memory die after correcting errors are programmed as multiple bit per memory cell data.

Abstract: A programmable and reprogrammable processor on a control semiconductor die is disclosed. The processor controls various operations on a memory semiconductor die to which it is bonded, such as read, write, and erase. The processor issues control signals to operate circuits such as voltage regulators, sense amplifiers, and data latches. Because the processor is reprogrammable, it is possible to modify the operation of the circuits. For example, the processor can execute updated instructions to control the voltage regulators to modify the timing and/or magnitude of voltages applied to control lines in the memory semiconductor die. In one aspect, a page mapping scheme is updated in order to more evenly distribute a bit error rate (BER) across the pages. In one aspect, a read equalization scheme is updated. In one aspect, a technique for reading soft bits is updated.

Abstract: A non-volatile memory system comprises an integrated memory assembly in communication with a memory controller. The integrated memory assembly comprises a memory die bonded to a control die with bond pads. The control die includes one or more control circuits for controlling the operation of the memory die. The one or more control circuits are configured to receive data to be programmed into the memory die, select a number of parity bits, encode the data to add error correction information and form a codeword that includes the number of parity bits, shape the codeword, and program the shaped codeword into the memory die.

Abstract: An error correcting code (ECC) decoder for a non-volatile memory device is configured to decode data stored by the non-volatile memory device using a parity check matrix with columns of different column weights. The ECC decoder is further configured to artificially slow processing of one or more of the columns of the parity check matrix in response to column weights for the one or more columns satisfying a threshold.

Abstract: A programmable and reprogrammable processor on a control semiconductor die is disclosed. The processor controls various operations on a memory semiconductor die to which it is bonded, such as read, write, and erase. The processor issues control signals to operate circuits such as voltage regulators, sense amplifiers, and data latches. Because the processor is reprogrammable, it is possible to modify the operation of the circuits. For example, the processor can execute updated instructions to control the voltage regulators to modify the timing and/or magnitude of voltages applied to control lines in the memory semiconductor die. In one aspect, a page mapping scheme is updated in order to more evenly distribute a bit error rate (BER) across the pages. In one aspect, a read equalization scheme is updated. In one aspect, a technique for reading soft bits is updated.

Abstract: A non-volatile storage system includes a memory controller connected to an integrated memory assembly. The integrated memory assembly includes a memory die comprising non-volatile memory cells and a control die bonded to the memory die. The memory controller provides data to the control die for storage on the memory die. Data is initially stored on the memory die as single bit per memory cell data to increase the performance of the programming process. Subsequently, the control die performs an adaptive folding process which comprises reading the single bit per memory cell data from the memory die, adaptively performing one of multiple decoding options, and programming the data back to the memory die as multiple bit per memory cell data.

Abstract: A non-volatile memory system comprises an integrated memory assembly in communication with a memory controller. The integrated memory assembly includes a memory die bonded to a control die. The control die includes one or more control circuits for controlling the operation of the memory die. The control circuits are configured to receive a request to copy data on the memory die, read codewords on the memory die in response to the request, decode the codewords to identify errors in the codewords, correcting the errors in the codewords, and program the codewords back into the memory die. In one embodiment, the codewords read are stored in the memory die as single bit per memory cell data and the codewords programmed back into the memory die after correcting errors are programmed as multiple bit per memory cell data.

Abstract: The present disclosure generally relates to a flexible or soft architecture solution of a host-data storage device system. The host is permitted different, intermediate levels of responsibility to the memory management. The different levels of host involvement in the memory management of the memory device are anywhere between an existing zone namespace (ZNS) solution and an open channel solution. The data storage device offers a selection of specific memory management options to the host device. The host device then selects the level of memory management desired and configures the data storage device to meet the memory management selection. In so doing, the host device controls the trade-off between host device overhead of memory management and host device flexibility.

Abstract: The disclosure relates in some aspects to on-chip processing circuitry formed within the die of a non-volatile (NVM) array to perform data searches. In some aspects, the die includes components configured to sense wordlines of stored data in the NVM array by applying voltages on the wordlines serially, and then search for an input data pattern within the serially-sensed wordlines. In some examples, the components of the die include latches and circuits configured to perform bitwise latch logic search operations. In other examples, the search components are configured with under-the-array or next-to-the-array dedicated search circuitry that uses registers and/or random access memory (RAM). Other aspects relate to a separate controller device for controlling the on-chip NVM search operations. For example, the controller may determine whether to search for data using search components of the NVM die or processors of the controller based, e.g., on a degree of fragmentation of data.

Abstract: Technology for recovering data in memory dies is disclosed. A set of codewords may be stored across a set of memory dies. One of the memory dies stores redundancy information that is based on information from each codeword in the set of codewords. Each of the memory dies is bonded to control die through bond pads that allow communication between the control die and the memory die. If decoding of one of more codewords fails, the redundancy information may be used to recover data bits of all the codewords in the set. The redundancy information may be sent to a memory controller that is in communication with the control dies, which performs the data recovery.

Abstract: Example systems and methods provide differentiated data recovery configurations based on memory health data. A distributed storage system, such as a cloud-based storage system, stores backup data from a remote storage device using a first data recovery configuration. Based on memory health data collected from the remote storage device, a change in a memory health state of the remote storage device may be determined. Responsive to the change in the memory health state, a different data recovery configuration may be used for storing backup data going forward and reallocating previously stored backup data in the distributed storage system.

Abstract: A black box device for a vehicle includes a data storage system for recording event data fed to the black box from various vehicle sensors. The data storage system includes a memory having memory cells and a controller in communication with the memory. The controller is configured to receive data and determine one or more memory cells as a destination for the data to be written. The controller is configured to determine a wear level of the memory cells and select a subset of program states of the memory cells based on the wear level; and program the memory cells using respective subsets of program states for each respective memory cell.