Patents by Inventor Jin-Aun Ng
Jin-Aun Ng has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).
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Patent number: 10692769Abstract: Integrated circuit devices having optimized fin critical dimension loading are disclosed herein. An exemplary integrated circuit device includes a core region that includes a first multi-fin structure and an input/output region that includes a second multi-fin structure. The first multi-fin structure has a first width and the second multi-fin structure has a second width. The first width is greater than the second width. In some implementations, the first multi-fin structure has a first fin spacing and the second multi-fin structure has a second fin spacing. The first fin spacing is less than the second fin spacing. In some implementations, a first adjacent fin pitch of the first multi-fin structure is greater than or equal to three times a minimum fin pitch and a second adjacent fin pitch of the second multi-fin structure is less than or equal to two times the minimum fin pitch.Type: GrantFiled: October 31, 2017Date of Patent: June 23, 2020Assignee: TAIWAN SEMICONDUCTOR MANUFACTURING CO., LTDInventors: Chia Ming Liang, Yi-Shien Mor, Huai-Hsien Chiu, Chi-Hsin Chang, Jin-Aun Ng, Yi-Juei Lee
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Patent number: 10651090Abstract: Integrated circuit devices having optimized fin critical dimension loading are disclosed herein. An exemplary integrated circuit device includes a core region that includes a first multi-fin structure and an input/output region that includes a second multi-fin structure. The first multi-fin structure has a first width and the second multi-fin structure has a second width. The first width is greater than the second width. In some implementations, the first multi-fin structure has a first fin spacing and the second multi-fin structure has a second fin spacing. The first fin spacing is less than the second fin spacing. In some implementations, a first adjacent fin pitch of the first multi-fin structure is greater than or equal to three times a minimum fin pitch and a second adjacent fin pitch of the second multi-fin structure is less than or equal to two times the minimum fin pitch.Type: GrantFiled: October 31, 2017Date of Patent: May 12, 2020Assignee: TAIWAN SEMICONDUCTOR MANUFACTURING CO., LTDInventors: Chia Ming Liang, Yi-Shien Mor, Huai-Hsien Chiu, Chi-Hsin Chang, Jin-Aun Ng, Yi-Juei Lee
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Publication number: 20200135729Abstract: A structure and a formation method of a semiconductor device are provided. The semiconductor device structure includes a semiconductor substrate and an isolation structure over the semiconductor substrate. The semiconductor device structure also includes a first fin structure over the semiconductor substrate and surrounded by the isolation structure and a stack of nanostructures over the first fin structure. The nanostructures are separated from each other. The semiconductor device structure further includes a second fin structure over the semiconductor substrate. The second fin structure has an embedded portion surrounded by the isolation structure and a protruding portion over the isolation structure. The embedded portion is separated from the protruding portion by a distance.Type: ApplicationFiled: December 27, 2019Publication date: April 30, 2020Applicant: TAIWAN SEMICONDUCTOR MANUFACTURING CO., LTD.Inventors: Jin-Aun NG, Kuo-Cheng CHIANG, Hung-Li CHIANG, Tzu-Chiang CHEN, I-Sheng CHEN
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Publication number: 20190341263Abstract: A method forming a gate dielectric over a substrate, and forming a metal gate structure over the semiconductor substrate and the gate dielectric. The metal gate structure includes a first metal material. The method further includes forming a seal on sidewalls of the metal gate structure. The method further includes forming a dielectric film on the metal gate structure, the dielectric film including a first metal oxynitride comprising the first metal material and directly on the metal gate structure without extending over the seal formed on sidewalls of the metal gate structure.Type: ApplicationFiled: July 16, 2019Publication date: November 7, 2019Inventors: Jin-Aun Ng, Bao-Ru Young, Harry-Hak-Lay Chuang, Maxi Chang, Chih-Tang Peng, Chih-Yang Yeh, Ta-Wei Lin, Huan-Just Lin, Hui-Wen Lin, Jen-Sheng Yang, Pei-Ren Jeng, Jung-Hui Kao, Shih-Hao Lo, Yuan-Tien Tu
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Publication number: 20190312138Abstract: Embodiments relate to integrated circuit fabrication, and more particularly to a metal gate electrode. An exemplary structure for a semiconductor device comprises a substrate comprising a major surface; a first gate electrode on the major surface comprising a first layer of multi-layer material; a first dielectric material adjacent to one side of the first gate electrode; and a second dielectric material adjacent to the other 3 sides of the first gate electrode, wherein the first dielectric material and the second dielectric material collectively surround the first gate electrode.Type: ApplicationFiled: June 24, 2019Publication date: October 10, 2019Inventors: Jr-Jung Lin, Chih-Han Lin, Jin-Aun Ng, Ming-Ching Chang, Chao-Cheng Chen
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Patent number: 10388531Abstract: An integrated circuit includes a semiconductor substrate, a gate dielectric over the substrate, and a metal gate structure over the semiconductor substrate and the gate dielectric. The metal gate structure includes a first metal material. The integrated circuit further includes a seal formed on sidewalls of the metal gate structure. The integrated circuit further includes a dielectric film on the metal gate structure, the dielectric film including a first metal oxynitride comprising the first metal material and directly on the metal gate structure without extending over the seal formed on sidewalls of the metal gate structure.Type: GrantFiled: September 27, 2017Date of Patent: August 20, 2019Assignee: TAIWAN SEMICONDUCTOR MANUFACTURING COMPANY, LTD.Inventors: Jin-Aun Ng, Bao-Ru Young, Harry-Hak-Lay Chuang, Maxi Chang, Chih-Tang Peng, Chih-Yang Yeh, Ta-Wei Lin, Huan-Just Lin, Hui-Wen Lin, Jen-Sheng Yang, Pei-Ren Jeng, Jung-Hui Kao, Shih-Hao Lo, Yuan-Tien Tu
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Patent number: 10332991Abstract: Embodiments relate to integrated circuit fabrication, and more particularly to a metal gate electrode. An exemplary structure for a semiconductor device comprises a substrate comprising a major surface; a first gate electrode on the major surface comprising a first layer of multi-layer material; a first dielectric material adjacent to one side of the first gate electrode; and a second dielectric material adjacent to the other 3 sides of the first gate electrode, wherein the first dielectric material and the second dielectric material collectively surround the first gate electrode.Type: GrantFiled: June 4, 2018Date of Patent: June 25, 2019Assignee: Taiwan Semiconductor Manufacturing Company, Ltd.Inventors: Jr-Jung Lin, Chih-Han Lin, Jin-Aun Ng, Ming-Ching Chang, Chao-Cheng Chen
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Publication number: 20190189614Abstract: A method includes forming a first fin on a semiconductor substrate, forming an isolation dielectric material over the first fin, and planarizing the isolation dielectric material. A top surface of the first fin is covered by the isolation dielectric material after planarizing the isolation dielectric material. The method further includes etching back the isolation dielectric material until the first fin protrudes from the isolation dielectric material.Type: ApplicationFiled: February 11, 2019Publication date: June 20, 2019Applicant: TAIWAN SEMICONDUCTOR MANUFACTURING CO., LTD.Inventors: Yi-Juei LEE, Chia-Ming LIANG, Chi-Hsin CHANG, Jin-Aun NG, Yi-Shien MOR, Huai-Hsien CHIU
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Publication number: 20190067112Abstract: Integrated circuit devices having optimized fin critical dimension loading are disclosed herein. An exemplary integrated circuit device includes a core region that includes a first multi-fin structure and an input/output region that includes a second multi-fin structure. The first multi-fin structure has a first width and the second multi-fin structure has a second width. The first width is greater than the second width. In some implementations, the first multi-fin structure has a first fin spacing and the second multi-fin structure has a second fin spacing. The first fin spacing is less than the second fin spacing. In some implementations, a first adjacent fin pitch of the first multi-fin structure is greater than or equal to three times a minimum fin pitch and a second adjacent fin pitch of the second multi-fin structure is less than or equal to two times the minimum fin pitch.Type: ApplicationFiled: October 31, 2017Publication date: February 28, 2019Inventors: Chia Ming Liang, Yi-Shien Mor, Huai-Hsien Chiu, Chi-Hsin Chang, Jin-Aun Ng, Yi-Juei Lee
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Patent number: 10204905Abstract: A semiconductor structure includes a substrate, a first gate structure, and a second gate structure. The substrate has a plurality of first fins and a plurality of second fins, wherein a first pitch between two adjacent first fins is greater than a second pitch between two adjacent second fins. The first gate structure crosses over the first fins. The second gate structure crosses over the second fins, wherein the second gate structure includes an upper portion having two first sidewalls substantially parallel to each other and a lower portion tapers toward the substrate.Type: GrantFiled: June 23, 2017Date of Patent: February 12, 2019Assignee: TAIWAN SEMICONDUCTOR MANUFACTURING CO., LTD.Inventors: Yi-Juei Lee, Chia-Ming Liang, Chi-Hsin Chang, Jin-Aun Ng, Yi-Shien Mor, Huai-Hsien Chiu
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Publication number: 20180350966Abstract: Embodiments relate to integrated circuit fabrication, and more particularly to a metal gate electrode. An exemplary structure for a semiconductor device comprises a substrate comprising a major surface; a first gate electrode on the major surface comprising a first layer of multi-layer material; a first dielectric material adjacent to one side of the first gate electrode; and a second dielectric material adjacent to the other 3 sides of the first gate electrode, wherein the first dielectric material and the second dielectric material collectively surround the first gate electrode.Type: ApplicationFiled: June 4, 2018Publication date: December 6, 2018Inventors: Jr-Jung Lin, Chih-Han Lin, Jin-Aun Ng, Ming-Ching Chang, Chao-Cheng Chen
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Publication number: 20180308842Abstract: A semiconductor structure includes a substrate, a first gate structure, and a second gate structure. The substrate has a plurality of first fins and a plurality of second fins, wherein a first pitch between two adjacent first fins is greater than a second pitch between two adjacent second fins. The first gate structure crosses over the first fins. The second gate structure crosses over the second fins, wherein the second gate structure includes an upper portion having two first sidewalls substantially parallel to each other and a lower portion tapers toward the substrate.Type: ApplicationFiled: June 23, 2017Publication date: October 25, 2018Inventors: Yi-Juei LEE, Chia-Ming LIANG, Chi-Hsin CHANG, Jin-Aun NG, Yi-Shien MOR, Huai-Hsien CHIU
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Patent number: 9991375Abstract: The invention relates to integrated circuit fabrication, and more particularly to a metal gate electrode. An exemplary structure for a semiconductor device comprises a substrate comprising a major surface; a first rectangular gate electrode on the major surface comprising a first layer of multi-layer material; a first dielectric material adjacent to one side of the first rectangular gate electrode; and a second dielectric material adjacent to the other 3 sides of the first rectangular gate electrode, wherein the first dielectric material and the second dielectric material collectively surround the first rectangular gate electrode.Type: GrantFiled: May 30, 2012Date of Patent: June 5, 2018Assignee: Taiwan Semiconductor Manufacturing Company, Ltd.Inventors: Jr-Jung Lin, Chih-Han Lin, Jin-Aun Ng, Ming-Ching Chang, Chao-Cheng Chen
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Patent number: 9947528Abstract: The present disclosure provides an integrated circuit. The integrated circuit includes a semiconductor substrate; a n-type filed effect transistor (nFET) formed on the semiconductor substrate and having a first gate stack including a high k dielectric layer, a capping layer on the high k dielectric layer, a p work function metal on the capping layer, and a polysilicon layer on the p work function metal; and a p-type filed effect transistor (pFET) formed on the semiconductor substrate and having a second gate stack including the high k dielectric layer, the p work function metal on the high k dielectric layer, and a metal material on the p work function metal.Type: GrantFiled: September 16, 2014Date of Patent: April 17, 2018Assignee: TAIWAN SEMICONDUCTOR MANUFACTURING COMPANY, LTD.Inventors: Ming Zhu, Jin-Aun Ng, Chi-Wen Liu
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Publication number: 20180019133Abstract: An integrated circuit includes a semiconductor substrate, a gate dielectric over the substrate, and a metal gate structure over the semiconductor substrate and the gate dielectric. The metal gate structure includes a first metal material. The integrated circuit further includes a seal formed on sidewalls of the metal gate structure. The integrated circuit further includes a dielectric film on the metal gate structure, the dielectric film including a first metal oxynitride comprising the first metal material and directly on the metal gate structure without extending over the seal formed on sidewalls of the metal gate structure.Type: ApplicationFiled: September 27, 2017Publication date: January 18, 2018Inventors: Jin-Aun Ng, Bao-Ru Young, Harry-Hak-Lay Chuang, Maxi Chang, Chih-Tang Peng, Chih-Yang Yeh, Ta-Wei Lin, Huan-Just Lin, Hui-Wen Lin, Jen-Sheng Yang, Pei-Ren Jeng, Jung-Hui Kao, Shih-Hao Lo, Yuan-Tien Tu
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Patent number: 9865510Abstract: A semiconductor device having five gate stacks on different regions of a substrate and methods of making the same are described. The device includes a semiconductor substrate and isolation features to separate the different regions on the substrate. The different regions include a p-type field-effect transistor (pFET) core region, an input/output pFET (pFET IO) region, an n-type field-effect transistor (nFET) core region, an input/output nFET (nFET IO) region, and a high-resistor region.Type: GrantFiled: December 18, 2015Date of Patent: January 9, 2018Assignee: TAIWAN SEMICONDUCTOR MANUFACTURING COMPANY, LTDInventors: Po-Nien Chen, Bao-Ru Young, Harry-Hak-Lay Chuang, Jin-Aun Ng, Ming Zhu
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Patent number: 9779947Abstract: An integrated circuit includes a semiconductor substrate, a gate dielectric over the substrate, a metal gate structure over the semiconductor substrate and the gate dielectric, a dielectric film on the metal gate structure, the dielectric film comprising oxynitride combined with metal from the metal gate, and an interlayer dielectric (ILD) on either side of the metal gate structure.Type: GrantFiled: January 6, 2016Date of Patent: October 3, 2017Assignee: TAIWAN SEMICONDUCTOR MANUFACTURING COMPANY, LTD.Inventors: Jin-Aun Ng, Jen-Sheng Yang, Pei-Ren Jeng, Jung-Hui Kao, Shih-Hao Lo, Yuan-Tien Tu, Bao-Ru Young, Harry-Hak-Lay Chuang, Maxi Chang, Chih-Tang Peng, Chih-Yang Yeh, Ta-Wei Lin, Huan-Just Lin, Hui-Wen Lin
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Patent number: 9576855Abstract: A method for fabricating a semiconductor device includes providing a semiconductor substrate having regions for an n-type field-effect transistor (nFET) core, an input/output nFET (nFET IO), a p-type field-effect transistor (pFET) core, an input/output pFET (pFET IO), and a high-resistor, forming an oxide layer on the IO regions of the substrate, forming an interfacial layer on the substrate and the oxide layer, depositing a high-k (HK) dielectric layer on the interfacial layer, depositing a first capping layer of a first material on the HK dielectric layer, depositing a second capping layer of a second material on the HK dielectric layer and on the first capping layer, depositing a work function (WF) metal layer on the second capping layer, depositing a polysilicon layer on the WF metal layer, and forming gate stacks on the regions of the substrate.Type: GrantFiled: April 6, 2015Date of Patent: February 21, 2017Assignee: TAIWAN SEMICONDUCTOR MANUFACTURING COMPANY, LTD.Inventors: Wei Cheng Wu, Bao-Ru Young, Harry-Hak-Lay Chuang, Jin-Aun Ng, Po-Nien Chen
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Publication number: 20160196979Abstract: An integrated circuit includes a semiconductor substrate, a gate dielectric over the substrate, a metal gate structure over the semiconductor substrate and the gate dielectric, a dielectric film on the metal gate structure, the dielectric film comprising oxynitride combined with metal from the metal gate, and an interlayer dielectric (ILD) on either side of the metal gate structure.Type: ApplicationFiled: January 6, 2016Publication date: July 7, 2016Inventors: Jin-Aun Ng, Bao-Ru Young, Harry-Hak-Lay Chuang, Maxi Chang, Chih-Tang Peng, Chih-Yang Yeh, Ta-Wei Lin, Huan-Just Lin, Hui-Wen Lin, Jen-Sheng Yang, Pei-Ren Jeng, Jung-Hui Kao, Shih-Hao Lo, Yuan-Tien Tu
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Publication number: 20160190018Abstract: A semiconductor device having five gate stacks on different regions of a substrate and methods of making the same are described. The device includes a semiconductor substrate and isolation features to separate the different regions on the substrate. The different regions include a p-type field-effect transistor (pFET) core region, an input/output pFET (pFET IO) region, an n-type field-effect transistor (nFET) core region, an input/output nFET (nFET IO) region, and a high-resistor region.Type: ApplicationFiled: December 18, 2015Publication date: June 30, 2016Inventors: Po-Nien Chen, Bao-Ru Young, Harry-Hak-Lay Chuang, Jin-Aun NG, Ming Zhu