Abstract: A slew-rate adjusting apparatus for use in a semiconductor memory device includes: a slew-rate modulation signal generator for generating a slew-rate modulation signal according to the number of control codes having a first logic level among a plurality of control codes, which are programmable at an exterior; and a pre-driver for adjusting a slew rate of a data signal by changing the number of switching elements turned on in response to the slew-rate modulation signal.

Abstract: A semiconductor memory device is capable of performing a normal operation, while detecting an internal voltage without a special bonding method during a test mode. The semiconductor memory device comprises a switching unit and an internal reference voltage generating unit. The switching unit transfers one of an internal and an external reference voltages according to whether a test mode is being performed, wherein the external reference voltage is input from outside of the semiconductor memory device. The internal reference voltage generating unit generates the internal reference voltage having the same level of the external reference voltage to thereby supply the internal reference inside the semiconductor memory device during the test mode.

Abstract: A voltage level of a boosted voltage is prevented from being targeted at voltage level that is too low, thereby improving a write recovery time (tWR) characteristic in a memory in a semiconductor memory device. The boosted voltage level detector includes: a voltage divider for dividing a boosted voltage and outputting a divided voltage; and a comparison unit for comparing a reference voltage corresponding to a voltage level of a target voltage with the divided voltage and outputting a level detecting signal, wherein the voltage divider includes: a first voltage drop element connected between a boosted voltage terminal and an output terminal of the voltage divider, having a negative temperature coefficient; and a second voltage drop element connected between the output terminal of the voltage divider and a ground voltage terminal, having a positive temperature coefficient.

Abstract: An output driving device includes a pull-up driver for pull-up driving an output node in response to a pull-up control signal; a pull-down driver for pull-down driving the output node in response to a pull-down control signal; and a first n-type metal oxide semiconductor (NMOS) transistor for pull-up driving the output node in response to a pre-pull-up control signal.

Abstract: A voltage generator reduces a stand by current in a stand by or a self-refresh mode and shortens a response time in an active mode by selectively driving a control transistor of a final driver. A core voltage control unit provides a power voltage. Pull-up and pull-down driving signals are generated based on the power voltage. An output driver generates an internal voltage according to the pull-up and pull-down driving signals. An active control unit controls drivability of the core voltage control unit in response to bank active signals.

Abstract: Provided is concerned with a voltage regulation circuit and method of regulating the voltage, including a reference voltage generator for generating a reference voltage by dividing a core voltage of a semiconductor memory device, a controller for controlling the reference voltage generator to adjust the reference voltage without handling the core voltage in response to a test signal of a test mode, and a voltage generator for generating a bit-line precharging voltage and/or a cell plate voltage in accordance with the reference voltage.

Abstract: A semiconductor memory device generates a control signal for regulating a potential of an internal power voltage when an extended mode register is set to adjust an operating speed and a tWR (time to write recovery) of a chip. The semiconductor memory device comprises an extended mode register setting unit and an internal power voltage generating unit. When an internal circuit enters into a specific mode for high-speed operation, the extended mode register setting unit outputs a plurality of internal power control signals to regulate a potential of an internal power voltage of the internal circuit. The internal power voltage generating unit generates an internal power voltage by regulating the potential of the internal power voltage in response to the plurality of internal power control signals.

Abstract: A bitline precharge voltage generator can generate multiple bitline precharge voltages when bitlines are precharged, thereby providing a stable operation regardless of a core voltage used as a high data voltage of a memory cell. In the bitline precharge voltage generator, a core voltage level detecting unit detects a core voltage level, activates a first enable signal when the core voltage level is lower than a specific voltage level, and activates a second enable signal when the core voltage level is higher than the specific voltage level. A bitline precharge voltage generating unit generates a bitline precharge voltage corresponding to half of the core voltage level when the first enable signal is activated. A bitline precharge voltage clamping unit generates a clamped bitline precharge voltage having a constant voltage level when the second enable signal is activated, regardless of the core voltage level.

Abstract: Provided is a test mode control circuit capable of preventing an MRS (mode register set) from changing in a test mode exit after a test mode entry. In the test mode control circuit, an MRS controller logically combines an MRS signal, a bank address, an MRS address, and a test mode control signal to output a latch control signal. A test mode control unit detects a test mode entry and a test mode exit to selectively activate one of a test mode set signal and a test mode exit signal, and outputs the test mode control signal having different voltage levels according to an activation state of the test mode set signal or the test mode exit signal. An address latch latches an input address when the MRS signal is activated, and outputs the latched input address as the MRS address when the latch control signal is activated.

Abstract: A semiconductor memory device includes: a command input buffer unit for buffering a command signal and for generating a detection signal in response to a write command; a data input enable control unit for generating a data input enable signal in response to the detection signal; a data input buffer unit for transferring a data in response to the data input enable signal; a command decoder for decoding the command signal to thereby generate a decoded signal; and a core region for storing the data transferred by the data input buffer unit in response to the decoded signal.

Abstract: A clock enable buffer for entry of a self-refresh mode. The clock enable buffer includes a current mirror load connected between a voltage source and first and second nodes, wherein the current mirror load has first and second transistors; a third transistor connected between the first node and a third node, wherein the third transistor is turned on according to a reference voltage; a fourth transistor connected between the second node and the third node, for controlling the current mirror load in response to a clock enable signal; a fifth transistor connected between the third node and a ground, wherein the fifth transistor is turned on according to a self-refresh signal; and a sixth transistor that is turned on according to an inverted self-refresh signal to make the potential of the first node a Low level.

Abstract: There is provided a circuit and a method for generating a power up signal. The circuit for generating a power up signal, includes an external power voltage divider for dividing a magnitude of an external power voltage so as to output the divided voltage, an external power voltage detector for activating a detection signal when the output voltage of the external power voltage divider reaches a preset level, and a power up signal generator for outputting a power up signal according to the detection signal and a first internal power voltage. Herein, the power up signal is generated when the internal power voltage as well as the external power voltage reaches a sufficient level so that a power up signal skew may be reduced to stabilize its operation and enhance reliability of a device.

Abstract: A semiconductor memory device improves test reliability by suppressing unnecessary leakage component in a USMC test which checks if data is normally transferred by extending a time margin between an active signal input time and a bit line sensing time. The semiconductor memory device includes at least one inner voltage adjusting unit for adjusting an inner voltage for limiting leakage portion that is generated in the semiconductor memory device during the USMC test by using a USMC signal for starting the USMC test and a termination signal for terminating the USMC test. The inner voltage adjusting unit includes a bulk bias voltage adjusting unit for supplying a bulk bias voltage to a cell transistor in the semiconductor memory device.

Abstract: The present invention discloses a circuit for detecting a negative word line voltage including a detecting unit for detecting a negative word line voltage in a detection node by using a plurality of loads coupled in series between a power supply terminal and a negative word line voltage terminal, a test signal generating unit for generating a plurality of test signals for detecting variations of the negative word line voltage, and a control unit driven according to the test signals, for controlling a potential of the detection node by adjusting a number of the loads of the detecting unit. The circuit for detecting the negative word line voltage can detect a wanted level of negative word line voltage by using the plurality of test signals without modifying the circuit, to reduce a development period of DRAM semiconductor products.

Abstract: A semiconductor memory device improves test reliability by suppressing unnecessary leakage component in a USMC test which checks if data is normally transferred by extending a time margin between an active signal input time and a bit line sensing time. The semiconductor memory device includes at least one inner voltage adjusting unit for adjusting an inner voltage for limiting leakage portion that is generated in the semiconductor memory device during the USMC test by using a USMC signal for starting the USMC test and a termination signal for terminating the USMC test. The inner voltage adjusting unit includes a bulk bias voltage adjusting unit for supplying a bulk bias voltage to a cell transistor in the semiconductor memory device.

Abstract: A semiconductor memory test device is capable of reducing the test time and increasing test reliability by applying an effective stress in a burn-in level or a wafer level. The semiconductor memory test device controls a sense amplifier using an additional sense amplifier driving signal when a 2rb pattern stress is applied. Therefore, the semiconductor memory test device applies a uniform stress by applying the constant supply voltage to a cell corresponding to the entire wordlines.

Abstract: A slew-rate adjusting apparatus for use in a semiconductor memory device includes: a slew-rate modulation signal generator for generating a slew-rate modulation signal according to the number of control codes having a first logic level among a plurality of control codes, which are programmable at an exterior; and a pre-driver for adjusting a slew rate of a data signal by changing the number of switching elements turned on in response to the slew-rate modulation signal.

Abstract: A semiconductor memory device for measuring a data access time by controlling data output operation, including: a pipe latch control unit for generating an input control signal based on a test mode signal; a pipe latch unit for receiving data and controlling the data according to a CAS latency in synchronization with a clock signal at a normal mode or passing the data without synchronization with the clock signal at a test mode based on the input control signal; an output control unit for generating an output node control signal based on the test mode signal; and an output unit for controlling an output data outputted from the pipe latch means according to the CAS latency in synchronization with the clock signal at the normal mode or passing the output data without synchronization with the clock signal at the test mode based on the output node control signal.

Abstract: Disclosed is a semiconductor memory device which is capable of reducing noise during an operation thereof by individually supplying clamping voltages to respective banks. The semiconductor memory device includes: a plurality of banks; a plurality of clamping voltage supply units corresponding to the plurality of banks, for supplying clamping voltages to the corresponding banks, in which the clamping voltages are obtained by clamping an external power supply voltage to a predetermined level; and a clamping voltage control units for controlling the plurality of clamping voltage supply units to allow the corresponding clamping voltages to be supplied to selected banks while the selected banks are activated.

Abstract: A power-up signal generator uses a deep power down power-up signal, which should be in a standby state in a deep power down entry, for an initialization of other semiconductor elements in a DRAM device that operates after an internal power supply voltage is generated. The generator also uses the power-up signal, which is disabled in the deep power down entry and enabled in a deep power down exit by the internal power supply voltage. The generator may include a power-up detector for generating a power-up detection signal, a deep power down power-up signal generator for generating a deep power down power-up signal, a power-up signal generator for generating a power-up signal and a power-up controller for determining whether or not to enable the power-up signal in the deep power down entry.