Abstract: A device includes a memory and a controller coupled to the memory. The controller is configured to determine a first count of bits of a representation of data that are estimated to be erroneous and a second count of bits of the representation of data that have high estimated reliability and are estimated to be erroneous. The controller is further configured to modify at least one read parameter or at least one decode parameter based on the first count and the second count.

Abstract: A storage system is provided comprising a controller and a memory. The controller is configured to identify at least two physical blocks of memory that are designated as bad blocks because of at least one defective wordline; identify which wordlines in the at least two physical blocks of memory are defective; and create a logical block of memory from non-defective wordlines in the at least two physical blocks of memory, wherein some portions of the logical block are mapped to one of the at least two physical blocks of memory, and wherein other portions of the logical block are mapped to another one of the at least two physical blocks of memory.

Abstract: A device includes a memory configured to store syndromes, a first data processing unit coupled to the memory, and a second data processing unit coupled to the memory. The first data processing unit is configured to process a first value corresponding to a first symbol of data to be decoded. The second data processing unit is configured to process a second value corresponding to a second symbol of the data. Syndrome aggregation circuitry is coupled to the first data processing unit and to the second data processing unit. The syndrome aggregation circuitry is configured to combine syndrome change decisions of the first data processing unit and the second data processing unit.

Abstract: In an illustrative example, a decoder includes a variable node unit (VNU) that includes a variable-to-check lookup table circuit configured to output a variable-to-check message corresponding to a check node. The VNU also includes a hard-decision lookup table circuit configured to output a hard decision value corresponding to a variable node. The decoder also includes a check node unit (CNU) responsive to the variable-to-check message and configured to generate an updated check-to-variable message.

Abstract: A storage device may program data differently for different memory areas of a memory. In some embodiments, the storage device may use different codebooks for different memory areas. In other embodiments, the storage device may modify bit orders differently for different memory areas. What codebook the storage device uses or what bit order modification the storage device performs for a particular memory area may depend on the bad storage locations specific to that memory area. Where different codebooks are used, optimal codebooks may be selected from a library, or codebooks may be modified based on the bad storage locations of the memory areas.

Abstract: A storage device may program data differently for different memory areas of a memory. In some embodiments, the storage device may use different codebooks for different memory areas. In other embodiments, the storage device may modify bit orders differently for different memory areas. What codebook the storage device uses or what bit order modification the storage device performs for a particular memory area may depend on the bad storage locations specific to that memory area. Where different codebooks are used, optimal codebooks may be selected from a library, or codebooks may be modified based on the bad storage locations of the memory areas.

Abstract: A storage device may program data differently for different memory areas of a memory. In some embodiments, the storage device may use different codebooks for different memory areas. In other embodiments, the storage device may modify bit orders differently for different memory areas. What codebook the storage device uses or what bit order modification the storage device performs for a particular memory area may depend on the bad storage locations specific to that memory area. Where different codebooks are used, optimal codebooks may be selected from a library, or codebooks may be modified based on the bad storage locations of the memory areas.

Abstract: An apparatus includes a memory die including a group of storage elements and one or more unallocated redundant columns. A number of the unallocated redundant columns is based on a number of one or more bad columns of the memory die. The apparatus further includes a controller coupled to the memory. The controller is configured to receive data and redundancy information associated with the data from the memory. The data includes a first bit, and the redundancy information includes a second bit. The redundancy information is sensed from the one or more unallocated redundant columns and has a size that is based on the number of one or more bad columns. The controller is further configured to determine a value of the first bit based on one or more parity check conditions associated with the second bit.

Abstract: A decoder includes a processor and a scheduler coupled to the processor. The processor is configured to process a set of nodes related to a representation of a codeword during a first decode iteration. The nodes are processed in a first order. The scheduler is configured to generate a schedule that indicates a second order of the set of nodes. The second order is different from the first order.

Abstract: A storage system and method for handling a burst of errors is provided. In one embodiment, the method comprises generating a protograph using an error code generation method; generating a first partially-lifted protograph based on the generated protograph that avoids a first burst of errors; generating a fully-lifted protograph based on the generated protograph and the generated first partially-lifted protograph; and providing the fully-lifted protograph to a storage system comprising a memory.

Abstract: In an illustrative example, a device includes a memory and a controller that is coupled to the memory and that is configured to communicate with the memory using at least a first channel and a second channel. The controller includes a bit error rate (BER) estimator configured to estimate a first BER corresponding to the first channel and a second BER corresponding to the second channel. The controller also includes a throughput balancer configured to determine whether to adjust at least one of a first clock rate of the first channel or a second clock rate of the second channel based on the first BER and the second BER.

Abstract: A device includes a comparator configured to select a first threshold in response to a value of a variable node indicating a first logical value and to select a second threshold in response to the value of the variable node indicating a second logical value. The device also includes a variable node update circuit configured to adjust the value of the variable node in response to a number of unsatisfied check nodes associated with the variable node satisfying the selected threshold.

Abstract: In an illustrative example, a device includes a memory and a controller that is coupled to the memory and that is configured to communicate with the memory using at least a first channel and a second channel. The controller includes a bit error rate (BER) estimator configured to estimate a first BER corresponding to the first channel and a second BER corresponding to the second channel. The controller also includes a throughput balancer configured to determine whether to adjust at least one of a first clock rate of the first channel or a second clock rate of the second channel based on the first BER and the second BER.

Abstract: A device includes a low density parity check (LDPC) decoder that configured to receive a representation of a codeword. The LDPC decoder includes a message memory configured to store decoding messages, multiple data processing units (DPUs), a control circuit, and a reording circuit. The control circuit is configured to enable a first number of the DPUs to decode the representation of the codeword in response to a decoding mode indicator indicating a first decoding mode and to enable a second number of the DPUs to decode the representation of the codeword in response to the decoding mode indicator indicating a second decoding mode. The reordering circuit is configured to selectively reorder at least one of the decoding messages based on the decoding mode indicator.

Abstract: A device includes a memory and a controller coupled to the memory. The controller is configured to determine a first count of bits of a representation of data that are estimated to be erroneous and a second count of bits of the representation of data that have high estimated reliability and are estimated to be erroneous. The controller is further configured to modify at least one read parameter or at least one decode parameter based on the first count and the second count.

Abstract: In an illustrative example, a decoder includes a variable node unit (VNU) that includes a variable-to-check lookup table circuit configured to output a variable-to-check message corresponding to a check node. The VNU also includes a hard-decision lookup table circuit configured to output a hard decision value corresponding to a variable node. The decoder also includes a check node unit (CNU) responsive to the variable-to-check message and configured to generate an updated check-to-variable message.

Abstract: A device includes a memory configured to store syndromes, a first data processing unit coupled to the memory, and a second data processing unit coupled to the memory. The first data processing unit is configured to process a first value corresponding to a first symbol of data to be decoded. The second data processing unit is configured to process a second value corresponding to a second symbol of the data. Syndrome aggregation circuitry is coupled to the first data processing unit and to the second data processing unit. The syndrome aggregation circuitry is configured to combine syndrome change decisions of the first data processing unit and the second data processing unit.

Abstract: A carrier aggregation controller for providing an aggregated baseband signal from a plurality of baseband signals is provided. The controller comprises an accumulating memory, a selector and a time domain transformer. The selector is configured to add at least a first list of frequency domain samples obtained for the first baseband signal to first consecutive locations in the accumulating memory centered at a first preset location associated with the first baseband signal, and a second list of frequency domain samples obtained for the second baseband signal to second consecutive locations in the accumulating memory centered at a second preset location associated with the second baseband signal. The time domain transformer is configured to apply at least an inverse discrete Fourier transform to the frequency domain samples accumulated in the accumulating memory, obtaining the aggregated baseband signal.

Abstract: A device includes a memory a memory configured to store syndromes. The device also includes a pipelined data processing unit and routing circuitry. The routing circuitry includes a first input coupled to the memory and includes a second input coupled to an output of the pipelined data processing unit.

Abstract: A non-volatile memory system may be configured to generate a codeword with first-type parity bits and one or more second-type parity bits. If a storage location in which the codeword is to be stored includes one or more bad memory cells, the bit sequence of the codeword may be arranged so that at least some of the second-type parity bits are stored in the bad memory cells. During decoding, a first set of syndrome values may be determined for a first set of check nodes and a second set of syndrome values may be determined for a second set of check nodes. In some examples, a syndrome weight used for determining if convergence is achieved may be calculated using check nodes that are unassociated with the second-type parity bits.