Abstract: A method of wireless communication includes receiving a plurality of parameter values at a user equipment (UE) using a first local oscillator (LO) frequency value, where the plurality of parameter values includes indications of a downlink frequency channel and an uplink frequency channel. The method further includes determining a second LO frequency value at the UE, where the second LO frequency value is determined using the indications of downlink and uplink frequency channels. The method further includes receiving downlink signals from an associated base station using the second LO frequency value.

Abstract: Certain embodiments are directed to compositions and methods for non-cytotoxic hematopoietic stem cell transplantation.

Abstract: A method of operating an additive manufacturing system feeds solid extrusion material into a heater using a slip clutch coupled to an actuator of a mechanical driver to supply thermoplastic material into a manifold in an extruder head. The method sets a speed of the actuator so the actuator operates at a rotational speed that is slightly greater than the rotational speed of the mechanical mover. This method helps maintain the pressure of the thermoplastic material in the manifold of the extruder head in a predetermined range no matter how many nozzles are opened in the extruder head.

Abstract: Embodiments of the invention provide a skylight assembly for an enclosure having an enclosure panel with an opening. The skylight assembly includes a lens, a gasket, and a nut. The lens includes an annular lens flange and a lens stem extending axially away from the annular lens flange. The gasket is receivable around the threaded lens stem and is adapted to be seated on the lens flange. The nut includes an annular nut flange and nut stem extending axially away from the nut flange. The nut stem is configured to engage the lens stem to secure the skylight assembly to the enclosure panel and compress the gasket against the enclosure panel.

Abstract: A 3-D printer includes build and support material development stations that electrostatically transfer build material and support material to an ITB. The ITB transfers a layer of build and support material to a platen each time the platen contacts one of the layers on the ITB, to successively form a freestanding stack of the layers on the platen. A sensor is positioned to generate a topographic measurement of the layer on the platen, and an aerosol applicator is positioned to propel build and support material on to the layer on the platen. The aerosol applicator controls the build and support material being propelled, based on the topographic measurement from the sensor through a feedback loop, to adjust the amount and location of the build material and the support material propelled on to the layer, and thereby control the flatness of surface topology of the layers in the freestanding stack on the platen.

Abstract: An additive manufacturing system includes a slip clutch coupled to an actuator of a mechanical driver that feeds solid extrusion material into a heater for supplying thermoplastic material to a manifold in an extruder head. A speed of the actuator can be set to enable the actuator to operate at a rotational speed that is slightly greater than the rotational speed of the mechanical mover. This configuration enables the pressure of the thermoplastic material in the manifold of the extruder head to be in a predetermined range no matter how many nozzles are opened in the extruder head.

Abstract: An electromechanical lock according to the present invention includes a lock extension and a blocking module having an interior region. A pivot bolt is mounted in the interior region for rotation about a rotation axis between a nominal position and an unsecured position. First and second blockers are also disposed in the interior for movement between their respective nominal positions and an unblocking position. The lock further includes an override disposed in the interior region for movement between a nominal position and an override position. The lock is in a secured condition when the first and second blockers and the override are in their respective nominal positions and an unsecured condition when the second blocker is in its unblocking position.

Abstract: A system for storing key information for duplicating a key includes a kiosk comprising a key identification module. After identifying key blank and bitting pattern information for one or more master keys associated with a user, the kiosk receives a user request to store the identified key information on a remote device associated with the user. Upon verification of the user's identity, the kiosk may encrypt the identified key information, and transmit it to the remote device for storage. On a future visit, upon verification of the user's identity, a kiosk comprising a key identification module and a key cutting module may receive and decrypt the previously stored key information from the remote device. The kiosk may cut the key for the user via the key cutting module based on the previously stored key information.

Abstract: A stabilizer system includes first and second base members each forming a passage; first and second rod members; each passage being sized for receipt of a corresponding one of the first and second rod members; each of the first and second base members forming a T-shaped receptacle; first and second barrel fasteners; each T-shaped receptacle being sized for selective engaged receipt of a corresponding one of the first and second barrel fasteners for securing the base members to corresponding ones of the first and second support legs of a target gameboard; first and second spike members each having a threaded tip; and each of the first and second rod members forming a threaded cavity that is sized for engaged receipt of the threaded tip of a respective one of the first and second spike members, wherein a second end of the spike member is sized for engaging the ground surface.

Abstract: A method of wireless communication includes receiving a plurality of parameter values at a user equipment (UE) using a first local oscillator (LO) frequency value, where the plurality of parameter values includes indications of a downlink frequency channel and an uplink frequency channel. The method further includes determining a second LO frequency value at the UE, where the second LO frequency value is determined using the indications of downlink and uplink frequency channels. The method further includes receiving downlink signals from an associated base station using the second LO frequency value.

Abstract: A method for filling recessed features with a low-resistivity metal. The method includes providing a patterned substrate containing a recessed feature formed in a first layer and a second layer that is exposed in the recessed feature, and pre-treating the substrate with a surface modifier that increases metal deposition selectivity on the second layer relative to on the first layer, depositing a metal layer on the substrate by vapor phase deposition, where the metal layer is preferentially deposited on the second layer in the recessed feature, and removing metal nuclei deposited on the first layer, including on a field area and on sidewalls of the first layer in the recessed feature, to selectively form the metal layer on the second layer in the recessed feature. The steps of pre-treating, depositing and removing may be repeated at least once to increase a thickness of the metal layer in the recessed feature.

Abstract: Methods and systems for channel mapping in a densely deployed network are disclosed. The system includes a node comprising a plurality of base stations configured to communicate with client devices in a wireless communication network, wherein transmission from the base stations to the client devices is conducted on a downlink (DL) frequency band and transmission from the client devices to the base stations is conducted on an uplink (UL) frequency band. The DL frequency band is different from the UL frequency band. DL and UL frequency pairs for the base stations are assigned according to a channel mapping scheme that determines DL and UL frequency pairs based on a plurality of channel parameters. The channel parameters include, for example, received signal strength indicator (RSSI), signal to noise (S/N) ratio, channel capacity, and bit error rate (BER).

Abstract: This disclosure relates to a high volume manufacturing system for processing and measuring workpieces in a semiconductor processing sequence without leaving the system's controlled environment (e.g., sub-atmospheric pressure). This system includes a distributed transfer system for transferring workpieces between The processing modules may include, one or more film-forming modules, etch modules, batch processing module, cleaning module, or any combination thereof. Further, the distributed transfer system include inspection system to measure attributes on the workpiece before and/or after being treated in the processing modules.

Abstract: This disclosure relates to a high volume manufacturing system for processing and measuring workpieces in a semiconductor processing sequence without leaving the system's controlled environment (e.g., sub-atmospheric pressure). The system includes an active interdiction control system to implement corrective processing within the system when a non-conformity is detected. The corrective processing can include a remedial process sequence to correct the non-conformity or compensate for the non-conformity during subsequent process. The non-conformity may be associated with fabrication measurement data, process parameter data, and/or platform performance data.

Abstract: This disclosure relates to a method for using a high volume manufacturing system for processing and measuring workpieces in a semiconductor processing sequence without leaving the system's controlled environment (e.g., sub-atmospheric pressure). The system includes an active interdiction control system to implement corrective processing within the system when a non-conformity is detected. The corrective processing method can include a remedial process sequence to correct the non-conformity or compensate for the non-conformity during subsequent process. The non-conformity may be associated with fabrication measurement data, process parameter data, and/or platform performance data.

Abstract: This disclosure relates to a high volume manufacturing system for processing and measuring workpieces in a semiconductor processing sequence without leaving the system's controlled environment (e.g., sub-atmospheric pressure). The systems process chambers are connected to each other via transfer chambers used to move the workpieces, in the controlled environment, between the process chambers. The transfer chambers include a measurement module capable of measuring workpiece attributes before and/or after process treatments. The measurement module may include an inspection system mounted above, below, or inside the transfer chamber.

Abstract: Methods and systems for channel mapping in a densely deployed network are disclosed. The system includes a node comprising a plurality of base stations configured to communicate with client devices in a wireless communication network, wherein transmission from the base stations to the client devices is conducted on a downlink (DL) frequency band and transmission from the client devices to the base stations is conducted on an uplink (UL) frequency band. The DL frequency band is different from the UL frequency band. DL and UL frequency pairs for the base stations are assigned according to a channel mapping scheme that determines DL and UL frequency pairs based on a plurality of channel parameters. The channel parameters include, for example, received signal strength indicator (RSSI), signal to noise (S/N) ratio, channel capacity, and bit error rate (BER).

Abstract: This disclosure relates to a high volume manufacturing system for processing and measuring workpieces in a semiconductor processing sequence without leaving the system's controlled environment (e.g., sub-atmospheric pressure). The systems process chambers are connected to each other via transfer chambers used to move the workpieces, in the controlled environment, between the process chambers. The transfer chambers include a measurement region with dedicated workpiece support chucks capable of translating and/or rotating the workpiece during the measurement.

Abstract: A mitochondrial-targeted PARP inhibitor is provided herein, as well as methods of making and using the mitochondrial-targeted PARP inhibitor.

Abstract: Disclosed herein are devices, systems, and methods for sorting a particle based on a characteristic of a particle.