Abstract: The present invention relates to reflective masks and their use for reflecting extreme ultraviolet soft x-ray photons to enable the use of extreme ultraviolet soft x-ray radiation projection lithographic methods and systems for producing integrated circuits and forming patterns with extremely small feature dimensions. The projection lithographic method includes providing an illumination sub-system for producing and directing an extreme ultraviolet soft x-ray radiation &lgr; from an extreme ultraviolet soft x-ray source; providing a mask sub-system illuminated by the extreme ultraviolet soft x-ray radiation &lgr; produced by the illumination sub-system and providing the mask sub-system includes providing a patterned reflective mask for forming a projected mask pattern when illuminated by radiation &lgr;.

Abstract: The invention provides a means for making below 200 nm VUV optical microlithography lens elements and preforms therefor. The inventive methods include polishing a fluoride optical lithography crystal with cerium to a surface roughness less than five angstroms. The invention includes making a 157 nm VUV optical lithography element preform by polishing a calcium fluoride crystal with cerium oxide polish.

Abstract: An aqueous solution of colloidal silica buffered to a pH value of about 10 or above, and inorganic silicate substrates finished to a surface roughness (Ra) of about 5 Å or less using such aqueous solution. The polished silicate substrate surface is consistently below about 2 Å Ra.

Abstract: The invention includes a method of finishing a polycrystal silicon nitride surface. The method of finishing the polycrystal silicon nitride includes providing a polycrystal silicon nitride composite which includes a plurality of silicon nitride crystal grains and a glassy-phase grain boundary medium. The method further includes providing an abrading finishing mixture with the finishing mixture including an abrasive and an oxidant. The method includes concurrently oxidizing the silicon nitride grains and abrading the silicon nitride composite to provide a finished polycrystal silicon nitride surface.

Abstract: A polishing application uses alkali, colloidal silica for polishing silicate-based glasses. Preferably, the silica solutions are adjusted to a pH of or above 10. The polished silicate-based glass surfaces have surface finishes consistently below 2 Å Ra. The unique method first polishes a surface of the substrate with an aqueous solution of at least one metal oxide abrasive and further polishes the surface of the substrate with an alkali aqueous solution of colloidal silica. Preferably, to the final smoothness of 2 Å Ra or less.

Abstract: This colloidal silica soot is a byproduct of chemical vapor deposition processing of fused silica or ultra low expansion glasses in the finishing industry. The colloidal silica by product is referred to as "soot". Retaining the same physical properties as the parent glass and having a spherical morphology, the colloidal silica soot is an ideal candidate for polishing applications. The soot has a large particle size when compared to conventional colloidal or fumed silica. As a result, the large size produces less surface damage and allows for a higher (faster) removal rate. The large particle size also results in super polished surfaces.