Patents by Inventor Tyler Gomm

Tyler Gomm has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Patent number: 7973577
    Abstract: Disclosed herein is a VDL/DLL architecture in which the power supply to the VDL, VccVDL, is regulated at least as a function of the entry point of the input signal (ClkIn) into the VDL. Specifically, VccVDL is regulated to be higher when the delay through the VDL is relatively small (when the entry point is toward the right (or minimum delay) edge of the VDL) and is reduced when the delay is relatively high (when the entry point is toward the left (or maximum delay) edge of the VDL). This provides for graduated delays across the stages of the VDL, but without the need to design each stage separately. Other benefits include a VDL/DLL design operable over a wider range of frequencies, and a reduced number of stages, including a reduced number of buffer stages. Moreover, when the disclosed technique is used, buffer stages may be dispensed with altogether.
    Type: Grant
    Filed: April 29, 2009
    Date of Patent: July 5, 2011
    Assignee: Micron Technology, Inc.
    Inventors: Tyler Gomm, Kang Yong Kim, Jongtae Kwak
  • Publication number: 20110134712
    Abstract: A system and method for trimming an unadjusted forward delay of a delay-locked loop (DLL) and trimming a duty cycle of first and second output clock signals provided by a DLL. For trimming an unadjusted forward delay, delay is added to one of a feedback clock signal path and an input clock signal path and a feedback clock signal is provided from the feedback clock signal path and an input clock signal is provided from the input clock signal path for phase comparison. For trimming a duty cycle of first and second output clock signals, one of a first delayed input clock signal and a second delayed input clock signal is delayed. The first and second delayed input clock signals are complementary. The delayed clock signal and the other clock signal are provided as the first and second output clock signals.
    Type: Application
    Filed: February 10, 2011
    Publication date: June 9, 2011
    Inventors: Tyler Gomm, Kang Yong Kim
  • Publication number: 20110102029
    Abstract: Locked loops, delay lines and methods for delaying signals are disclosed, such as a delay line and delay lock loop using the delay line includes a series of delay stages, each of which consists of a single inverting delay device. The inputs and outputs of a selected stage are applied to a phase inverter that inverts one of the signals and applies it to a first input of a phase mixer with the same delay that the other signal is applied to a second input of the phase inverter. The delay of the signals from the selected delay element are delayed from each other by a coarse delay interval, and the phase mixer interpolates within the coarse delay interval by fine delay intervals. A phase detector compares the timing of a signal generated by the phase interpolator to the timing of a reference clock signal applied to the delay line to determine the selected delay stage and a phase interpolation value.
    Type: Application
    Filed: January 7, 2011
    Publication date: May 5, 2011
    Applicant: Micron Technology, Inc.
    Inventor: TYLER GOMM
  • Publication number: 20110057698
    Abstract: Clock synchronization and skew adjustment circuits that utilize differing unit delay elements in their delay lines in either a graduated or a stepped unit time delay arrangement are for synchronizing with a clock signal. These graduated or a stepped unit time delays allow reduction in the number of the fine unit delay elements of the delay lines by placing a fine delay element granularity at the most critical timings to sense and adjust for the portion of the clock signal time period that are high speed or critical.
    Type: Application
    Filed: October 11, 2010
    Publication date: March 10, 2011
    Inventors: Tyler Gomm, Gary Johnson
  • Patent number: 7898308
    Abstract: A system and method for trimming an unadjusted forward delay of a delay-locked loop (DLL) and trimming a duty cycle of first and second output clock signals provided by a DLL. For trimming an unadjusted forward delay, delay is added to one of a feedback clock signal path and an input clock signal path and a feedback clock signal is provided from the feedback clock signal path and an input clock signal is provided from the input clock signal path for phase comparison. For trimming a duty cycle of first and second output clock signals, one of a first delayed input clock signal and a second delayed input clock signal is delayed. The first and second delayed input clock signals are complementary. The delayed clock signal and the other clock signal are provided as the first and second output clock signals.
    Type: Grant
    Filed: February 3, 2010
    Date of Patent: March 1, 2011
    Assignee: Micron Technology, Inc.
    Inventors: Tyler Gomm, Kang Yong Kim
  • Patent number: 7872507
    Abstract: Locked loops, delay lines and methods for delaying signals are disclosed, such as a delay line and delay lock loop using the delay line includes a series of delay stages, each of which consists of a single inverting delay device. The inputs and outputs of a selected stage are applied to a phase inverter that inverts one of the signals and applies it to a first input of a phase mixer with the same delay that the other signal is applied to a second input of the phase inverter. The delay of the signals from the selected delay element are delayed from each other by a coarse delay interval, and the phase mixer interpolates within the coarse delay interval by fine delay intervals. A phase detector compares the timing of a signal generated by the phase interpolator to the timing of a reference clock signal applied to the delay line to determine the selected delay stage and a phase interpolation value.
    Type: Grant
    Filed: January 21, 2009
    Date of Patent: January 18, 2011
    Assignee: Micron Technology, Inc.
    Inventor: Tyler Gomm
  • Patent number: 7812657
    Abstract: Clock synchronization and skew adjustment circuits that utilize differing unit delay elements in their delay lines in either a graduated or a stepped unit time delay arrangement are for synchronizing with a clock signal. These graduated or a stepped unit time delays allow reduction in the number of the fine unit delay elements of the delay lines by placing a fine delay element granularity at the most critical timings to sense and adjust for the portion of the clock signal time period that are high speed or critical.
    Type: Grant
    Filed: December 29, 2008
    Date of Patent: October 12, 2010
    Assignee: Micron Technology, Inc.
    Inventors: Tyler Gomm, Gary Johnson
  • Patent number: 7791388
    Abstract: A system and method for generating a correction signal for correcting duty cycle error of a first clock signal relative to a second complementary clock signal. Changes to a time difference between high- and low-portions of the first clock signal are detected and the correction signal is generated in response to and accordance with the detected changes.
    Type: Grant
    Filed: September 3, 2008
    Date of Patent: September 7, 2010
    Assignee: Micron Technology, Inc.
    Inventor: Tyler Gomm
  • Publication number: 20100182058
    Abstract: Locked loops, delay lines and methods for delaying signals are disclosed, such as a delay line and delay lock loop using the delay line includes a series of delay stages, each of which consists of a single inverting delay device. The inputs and outputs of a selected stage are applied to a phase inverter that inverts one of the signals and applies it to a first input of a phase mixer with the same delay that the other signal is applied to a second input of the phase inverter. The delay of the signals from the selected delay element are delayed from each other by a coarse delay interval, and the phase mixer interpolates within the coarse delay interval by fine delay intervals. A phase detector compares the timing of a signal generated by the phase interpolator to the timing of a reference clock signal applied to the delay line to determine the selected delay stage and a phase interpolation value.
    Type: Application
    Filed: January 21, 2009
    Publication date: July 22, 2010
    Applicant: Micron Technology, Inc.
    Inventor: Tyler GOMM
  • Publication number: 20100135090
    Abstract: A system and method for trimming an unadjusted forward delay of a delay-locked loop (DLL) and trimming a duty cycle of first and second output clock signals provided by a DLL. For trimming an unadjusted forward delay, delay is added to one of a feedback clock signal path and an input clock signal path and a feedback clock signal is provided from the feedback clock signal path and an input clock signal is provided from the input clock signal path for phase comparison. For trimming a duty cycle of first and second output clock signals, one of a first delayed input clock signal and a second delayed input clock signal is delayed. The first and second delayed input clock signals are complementary. The delayed clock signal and the other clock signal are provided as the first and second output clock signals.
    Type: Application
    Filed: February 3, 2010
    Publication date: June 3, 2010
    Inventors: TYLER GOMM, Kang Yong Kim
  • Patent number: 7728639
    Abstract: Disclosed herein is improved delay locked loop (DLL) initialization circuitry that alters the measurement used to initialize the variable delay line's delay (e.g., entry point or exit point) by using three clock phases: the DLL reference clock (input to the delay line), the reference clock as trimmed by a delay Tref, and the feedback clock as trimmed by a delay Tfb. By using these three phases at the appropriate time, the measurement is aware of the Tac trim for both positive (Tref) and negative (Tfb) trims. Specifically, measurement ‘start’ and ‘stop’ signals each pass through only one of delays Tref and Tfb, such that error in the measurement is a function of both Tref and Tfb. This improves the accuracy of the measurement such that additional shifting of the DLL is not necessary after initialization, and allows a wide trim range even for high clock frequencies.
    Type: Grant
    Filed: October 8, 2008
    Date of Patent: June 1, 2010
    Assignee: Micron Technology, Inc.
    Inventors: Tyler Gomm, Eric Booth, Jongtae Kwak
  • Patent number: 7671647
    Abstract: A system and method for trimming an unadjusted forward delay of a delay-locked loop (DLL) and trimming a duty cycle of first and second output clock signals provided by a DLL. For trimming an unadjusted forward delay, delay is added to one of a feedback clock signal path and an input clock signal path and a feedback clock signal is provided from the feedback clock signal path and an input clock signal is provided from the input clock signal path for phase comparison. For trimming a duty cycle of first and second output clock signals, one of a first delayed input clock signal and a second delayed input clock signal is delayed. The first and second delayed input clock signals are complementary. The delayed clock signal and the other clock signal are provided as the first and second output clock signals.
    Type: Grant
    Filed: January 26, 2006
    Date of Patent: March 2, 2010
    Assignee: Micron Technology, Inc.
    Inventors: Tyler Gomm, Kang Yong Kim
  • Publication number: 20090243677
    Abstract: Closed-loop duty-cycle correctors (DCCs), clock generators, memory devices, systems, and methods for generating an output clock signal having a particular duty cycle are provided, such as clock generators configured to generate an output clock signal synchronized with a received input clock signal having a predetermined duty cycle. Embodiments of clock generators include closed-loop duty cycle correctors that receive an already-controlled and corrected output signal. For example, DLL control circuitry and DCC control circuitry may each adjust a delay of a variable delay line. The DLL control circuitry adjusts the delay such that an output clock signal is synchronized with an input clock signal. The DCC control circuitry detects a duty cycle error in the output clock signal and adjusts the delay of the variable delay line to achieve a duty cycle corrected output signal.
    Type: Application
    Filed: March 25, 2008
    Publication date: October 1, 2009
    Applicant: Micron Technology, Inc.
    Inventors: Eric Becker, Eric Booth, Tyler Gomm
  • Publication number: 20090206898
    Abstract: Disclosed herein is a VDL/DLL architecture in which the power supply to the VDL, VccVDL, is regulated at least as a function of the entry point of the input signal (ClkIn) into the VDL. Specifically, VccVDL is regulated to be higher when the delay through the VDL is relatively small (when the entry point is toward the right (or minimum delay) edge of the VDL) and is reduced when the delay is relatively high (when the entry point is toward the left (or maximum delay) edge of the VDL). This provides for graduated delays across the stages of the VDL, but without the need to design each stage separately. Other benefits include a VDL/DLL design operable over a wider range of frequencies, and a reduced number of stages, including a reduced number of buffer stages. Moreover, when the disclosed technique is used, buffer stages may be dispensed with altogether.
    Type: Application
    Filed: April 29, 2009
    Publication date: August 20, 2009
    Applicant: Micron Technology, Inc.
    Inventors: Tyler Gomm, Kang Yong Kim, Jongtae Kwak
  • Patent number: 7541851
    Abstract: Disclosed herein is a VDL/DLL architecture in which the power supply to the VDL, VccVDL, is regulated at least as a function of the entry point of the input signal (ClkIn) into the VDL. Specifically, VccVDL is regulated to be higher when the delay through the VDL is relatively small (when the entry point is toward the right (or minimum delay) edge of the VDL) and is reduced when the delay is relatively high (when the entry point is toward the left (or maximum delay) edge of the VDL). This provides for graduated delays across the stages of the VDL, but without the need to design each stage separately. Other benefits include a VDL/DLL design operable over a wider range of frequencies, and a reduced number of stages, including a reduced number of buffer stages. Moreover, when the disclosed technique is used, buffer stages may be dispensed with altogether.
    Type: Grant
    Filed: December 11, 2006
    Date of Patent: June 2, 2009
    Assignee: Micron Technology, Inc.
    Inventors: Tyler Gomm, Kang Yong Kim, Jongtae Kwak
  • Publication number: 20090115479
    Abstract: Clock synchronization and skew adjustment circuits that utilize differing unit delay elements in their delay lines in either a graduated or a stepped unit time delay arrangement are for synchronizing with a clock signal. These graduated or a stepped unit time delays allow reduction in the number of the fine unit delay elements of the delay lines by placing a fine delay element granularity at the most critical timings to sense and adjust for the portion of the clock signal time period that are high speed or critical.
    Type: Application
    Filed: December 29, 2008
    Publication date: May 7, 2009
    Inventors: Tyler Gomm, Gary Johnson
  • Publication number: 20090027094
    Abstract: Disclosed herein is improved delay locked loop (DLL) initialization circuitry that alters the measurement used to initialize the variable delay line's delay (e.g., entry point or exit point) by using three clock phases: the DLL reference clock (input to the delay line), the reference clock as trimmed by a delay Tref, and the feedback clock as trimmed by a delay Tfb. By using these three phases at the appropriate time, the measurement is aware of the Tac trim for both positive (Tref) and negative (Tfb) trims. Specifically, measurement ‘start’ and ‘stop’ signals each pass through only one of delays Tref and Tfb, such that error in the measurement is a function of both Tref and Tfb. This improves the accuracy of the measurement such that additional shifting of the DLL is not necessary after initialization, and allows a wide trim range even for high clock frequencies.
    Type: Application
    Filed: October 8, 2008
    Publication date: January 29, 2009
    Applicant: MICRON TECHNOLOGY, INC.
    Inventors: Tyler Gomm, Eric Booth, Jongtae Kwak
  • Patent number: 7471130
    Abstract: Clock synchronization and skew adjustment circuits are described that utilize varying unit delay elements in their delay lines in either a graduated or a stepped unit time delay arrangement, allowing a reduced circuit implementation and improved lock characteristics. These graduated or a stepped unit time delays allow reduction in the number of the fine unit delay elements of the delay lines by placing a fine delay element granularity at the most critical timings to sense and adjust for the portion of the clock signal time period that are high speed or critical. This allows clock synchronization and skew adjustment circuits to be implemented in an optimized manner that exhibits a reduced overall circuit size and power consumption, while having improved lock characteristics over a wide range of frequencies.
    Type: Grant
    Filed: May 19, 2005
    Date of Patent: December 30, 2008
    Assignee: Micron Technology, Inc.
    Inventors: Tyler Gomm, Gary Johnson
  • Publication number: 20080315930
    Abstract: A system and method for generating a correction signal for correcting duty cycle error of a first clock signal relative to a second complementary clock signal. Changes to a time difference between high- and low-portions of the first clock signal are detected and the correction signal is generated in response to and accordance with the detected changes.
    Type: Application
    Filed: September 3, 2008
    Publication date: December 25, 2008
    Inventor: Tyler Gomm
  • Patent number: 7443216
    Abstract: Disclosed herein is improved delay locked loop (DLL) initialization circuitry that alters the measurement used to initialize the variable delay line's delay (e.g., entry point or exit point) by using three clock phases: the DLL reference clock (input to the delay line), the reference clock as trimmed by a delay Tref, and the feedback clock as trimmed by a delay Tfb. By using these three phases at the appropriate time, the measurement is aware of the Tac trim for both positive (Tref) and negative (Tfb) trims. Specifically, measurement ‘start’ and ‘stop’ signals each pass through only one of delays Tref and Tfb, such that error in the measurement is a function of both Tref and Tfb. This improves the accuracy of the measurement such that additional shifting of the DLL is not necessary after initialization, and allows a wide trim range even for high clock frequencies.
    Type: Grant
    Filed: February 20, 2007
    Date of Patent: October 28, 2008
    Assignee: Micron Technology, Inc.
    Inventors: Tyler Gomm, Eric Booth, Jongtae Kwak