Patents by Inventor Yu Kou

Yu Kou has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Patent number: 8918696
    Abstract: A method for decoding data is disclosed. The method includes partitioning a low-density parity check (LDPC) matrix into a plurality of groups, each comprising one or more check node layers. The method further includes selecting one of the groups based at least in part on a cost function, the cost function based at least in part on information associated with a variable node, or information associated with a check node, or both. The method further includes performing LDPC layered decoding on the selected group.
    Type: Grant
    Filed: April 11, 2011
    Date of Patent: December 23, 2014
    Assignee: SK hynix memory solutions inc.
    Inventors: Kin Man Ng, Kwok W. Yeung, Lingqi Zeng, Yu Kou, Aditi R. Ganesan
  • Patent number: 8914705
    Abstract: A plurality of random bit sequences is generated. Each of the random bit sequences is different and is based at least in part on an input bit sequence. A plurality of metrics corresponding to the plurality of random bit sequences is generated. The plurality of metrics is associated with one or more transition run lengths. One of the random bit sequences is selected based at least in part on the metrics. An output bit sequence is generated that includes the selected random bit sequence and an index associated with demodulating the selected random bit sequence.
    Type: Grant
    Filed: October 31, 2012
    Date of Patent: December 16, 2014
    Assignee: SK hynix memory solutions inc.
    Inventors: Lingqi Zeng, Yu Kou
  • Patent number: 8914709
    Abstract: A storage system includes a channel detector, an LDPC decoder, and an erasure block. The channel detector is configured to receive data corresponding to data read from a storage and output an LLR signal. The LDPC decoder is configured to receive the LLR signal and output a feedback signal to the channel detector. The erasure block is configured to erase at a portion of at least one of the LLR signal and the feedback signal. A method for testing includes generating an error rate function corresponding to an erasure pattern. The function is a function of a number of LDPC iterations. The method includes determining testing parameters at least in part based on the error rate function, wherein the testing parameters comprise a testing number of LDPC iterations, a passing error rate, and the erasure pattern. The method includes testing storage devices using the testing parameters.
    Type: Grant
    Filed: March 4, 2011
    Date of Patent: December 16, 2014
    Assignee: SK hynix memory solutions inc.
    Inventors: Yu Kou, Lingqi Zeng, Jason Bellorado, Marcus Marrow
  • Publication number: 20140362463
    Abstract: Aspects of the disclosure pertain to an apparatus for detecting timing errors including an analog to digital converter circuit, a diversity loop detector and a timing error calculation circuit. The analog to digital converter circuit is operable to convert an input signal into a series of digital samples. The diversity loop detector is operable to apply a data detection algorithm to a plurality of signals derived from the series of digital samples at different phase offsets, to select one of the phase offsets, and to yield a detected output with the selected phase offset. The timing error calculation circuit is operable to calculate a timing error of the analog to digital converter circuit based at least in part on the selected phase offset.
    Type: Application
    Filed: July 13, 2013
    Publication date: December 11, 2014
    Inventors: Bruce Wilson, Yang Han, Yu Kou, Rui Cao
  • Patent number: 8898546
    Abstract: Data is processed by selecting one or more bits in a codeword to replace with an erasure. The selected bits in the codeword are replaced with the erasure and error correction decoding is performed on the codeword with the erasure in place for the selected bits.
    Type: Grant
    Filed: September 7, 2012
    Date of Patent: November 25, 2014
    Assignee: SK hynix memory solutions inc.
    Inventors: Yu Kou, Xiangyu Tang
  • Publication number: 20140327981
    Abstract: Determining a parameter associated with whether a portion of a storage device is defective is disclosed. Determining comprises: obtaining known data associated with the portion; reading back from the portion to produce a read-back waveform; decoding the read-back waveform, including producing statistical information; and determining a parameter associated with whether the portion is defective based at least in part on the statistical information.
    Type: Application
    Filed: April 30, 2014
    Publication date: November 6, 2014
    Applicant: SK hynix memory solutions inc.
    Inventors: Marcus Marrow, Jason Bellorado, Yu Kou
  • Publication number: 20140286149
    Abstract: A hard disk drive includes a processor to automatically adjust a threshold level for finding sync-marks. The processor determines all possible sync-mark patterns for a particular pattern length and analyzes each pattern with reference to real world data. The pattern with the largest distance gap is used. The threshold level is then adjusted dynamically to produce the lowest possible failure rate for the given pattern.
    Type: Application
    Filed: March 26, 2013
    Publication date: September 25, 2014
    Applicant: LSI Corporation
    Inventors: Rui Cao, Haitao Xia, Yu Kou
  • Patent number: 8843812
    Abstract: A plurality of metrics associated with a plurality of partially decoded codewords is obtained. The plurality of partially decoded codewords has been processed at least once by a first soft output decoder and a second soft output decoder and the plurality of partially decoded codewords is stored in a memory. At least one of the plurality of partially decoded codewords is selected based at least in part on the plurality of metrics; the memory is instructed to vacate the at least one selected codeword.
    Type: Grant
    Filed: June 5, 2012
    Date of Patent: September 23, 2014
    Assignee: SK hynix memory solutions inc.
    Inventors: Xiangyu Tang, Yu Kou, Lingqi Zeng
  • Publication number: 20140268400
    Abstract: The present inventions are related to systems and methods for data processing, and more particularly to systems and methods for performing loop feedback in a data processing system.
    Type: Application
    Filed: March 13, 2013
    Publication date: September 18, 2014
    Applicant: LSI Corporation
    Inventors: Jianzhong Huang, Yu Kou, Haitao Xia, Seongwook Jeong
  • Publication number: 20140281790
    Abstract: Systems, methods, devices, circuits for data processing, and more particularly to systems and methods for multi-stage encoding for concatenated low density parity check codes.
    Type: Application
    Filed: June 6, 2013
    Publication date: September 18, 2014
    Inventors: Zongwang Li, Yu Kou, Chung-Li Wang, Shaohua Yang, Shu Li
  • Patent number: 8837263
    Abstract: A hard disk drive includes a processor to automatically adjust a threshold level for finding sync-marks. The processor determines all possible sync-mark patterns for a particular pattern length and analyzes each pattern with reference to real world data. The pattern with the largest distance gap is used. The threshold level is then adjusted dynamically to produce the lowest possible failure rate for the given pattern.
    Type: Grant
    Filed: March 26, 2013
    Date of Patent: September 16, 2014
    Assignee: LSI Corporation
    Inventors: Rui Cao, Haitao Xia, Yu Kou
  • Patent number: 8819524
    Abstract: An amount of time and an error rate function are received, where the error rate function defines a relationship between a number of iterations associated with iterative decoding and an error rate. A testing error rate is determined based at least in part on the amount of time. The number of iterations which corresponds to the testing error rate in the error rate function is selected to be a testing number of iterations; the testing error rate and the testing number of iterations are associated with testing storage media using iterative decoding.
    Type: Grant
    Filed: August 9, 2012
    Date of Patent: August 26, 2014
    Assignee: SK hynix memory solutions inc.
    Inventors: Yu Kou, Lingqi Zeng
  • Publication number: 20140237329
    Abstract: Systems, methods, devices, circuits for data processing, and more particularly to systems and methods for detecting a sync mark with a ratio-adjustable detection system.
    Type: Application
    Filed: February 26, 2013
    Publication date: August 21, 2014
    Applicant: LSI Corporation
    Inventors: Rui Cao, Yu Kou, Shaohua Yang
  • Patent number: 8799752
    Abstract: A method for reducing a number of bits for representing a value is disclosed. A first value represented with a first number of bits is transformed to a second value represented with a second number of bits, wherein the first number of bits is greater than the second number of bits. The transformed second value is scaled by a scale factor to a third value. Transforming includes selecting a target window with a width of a third number of bits, wherein the third number of bits is smaller than the first number of bits. Transforming further includes saturating the first value to a most significant bit (MSB) within the selected target window and extracting bits within the selected target window from the saturated value.
    Type: Grant
    Filed: November 6, 2013
    Date of Patent: August 5, 2014
    Assignee: SK hynix memory solutions inc.
    Inventors: Yu Kou, Lingqi Zeng
  • Publication number: 20140200849
    Abstract: Aspects of the disclosure pertain to a system and method for providing component detector switching for a diversity loop detector. Switching between component detectors is performed via one of: a periodic state likelihood reset process, a slope-based switching process, or a cross-over connection process. The joint decision circuit switches among component detectors to promote improved performance with present of constant or transition phase offset.
    Type: Application
    Filed: January 15, 2013
    Publication date: July 17, 2014
    Applicant: LSI CORPORATION
    Inventors: Yang Han, Yu Kou, Xuebin Wu, Bruce A. Wilson
  • Publication number: 20140195877
    Abstract: It is decided whether to adjust data associated with a decoder. In the event it is decided to adjust the data associated with the decoder, the data is adjusted to obtain adjusted data and decoding is performed on the adjusted data. In the event it is decided to not adjust the data associated with the decoder, decoding is performed on the data associated with the decoder.
    Type: Application
    Filed: January 30, 2014
    Publication date: July 10, 2014
    Applicant: SK hynix memory solutions inc.
    Inventors: Lingqi Zeng, Yu Kou
  • Patent number: 8773799
    Abstract: An apparatus comprises read channel circuitry and associated signal processing circuitry comprising frontend processing circuitry and backend processing circuitry. The frontend processing circuitry comprises a loop detector and equalizer configured to determine an equalized read channel signal from a read channel signal and a decoding module configured to apply verification and scrambling processing on a decoded read channel signal. The backend processing circuitry comprises a backend detector, an interleaver, a backend decoder, and a de-interleaver configured to perform an iterative decoding process on the equalized read channel signal to determine the decoded read channel signal. The frontend processing circuitry is controlled by a first clock having an associated first clock rate and the backend processing circuitry is controlled by a selected one of the first clock and a second clock having an associated second clock rate determined at least in part by the first clock rate and a maximum clock rate.
    Type: Grant
    Filed: December 21, 2012
    Date of Patent: July 8, 2014
    Assignee: LSI Corporation
    Inventors: Suharli Tedja, Shaohua Yang, Fan Zhang, Qi Zuo, Joseph Garofalo, Yu Kou
  • Publication number: 20140181570
    Abstract: An apparatus comprises read channel circuitry and associated signal processing circuitry comprising frontend processing circuitry and backend processing circuitry. The frontend processing circuitry comprises a loop detector and equalizer configured to determine an equalized read channel signal from a read channel signal and a decoding module configured to apply verification and scrambling processing on a decoded read channel signal. The backend processing circuitry comprises a backend detector, an interleaver, a backend decoder, and a de-interleaver configured to perform an iterative decoding process on the equalized read channel signal to determine the decoded read channel signal. The frontend processing circuitry is controlled by a first clock having an associated first clock rate and the backend processing circuitry is controlled by a selected one of the first clock and a second clock having an associated second clock rate determined at least in part by the first clock rate and a maximum clock rate.
    Type: Application
    Filed: December 21, 2012
    Publication date: June 26, 2014
    Applicant: LSI Corporation
    Inventors: Suharli Tedja, Shaohua Yang, Fan Zhang, Qi Zuo, Joseph Garofalo, Yu Kou
  • Patent number: 8755135
    Abstract: Determining a parameter associated with whether a portion of a storage device is defective is disclosed. Determining comprises: obtaining known data associated with the portion; reading back from the portion to produce a read-back waveform; decoding the read-back waveform, including producing statistical information; and determining a parameter associated with whether the portion is defective based at least in part on the statistical information.
    Type: Grant
    Filed: March 4, 2011
    Date of Patent: June 17, 2014
    Assignee: SK hynix memory solutions inc.
    Inventors: Marcus Marrow, Jason Bellorado, Yu Kou
  • Publication number: 20140143616
    Abstract: A method for detecting a defect in a portion of a storage device is disclosed. Reference data and data read from the portion are compared to determine a number of error bits and a number of error symbols. An error ratio is computed, wherein the error ratio comprises a ratio of the number of error bits to the number of error symbols. A defect is detected based on whether the error ratio exceeds a threshold. In some embodiments, the reference data and the read data are compared to determine an error vector, wherein a bit in the error vector with a value one indicates a bit error in the read data. For each of a plurality of windows of the error vector, a corresponding number of error bits is determined. A defect is detected based on whether any of the numbers of error bits exceeds a threshold.
    Type: Application
    Filed: October 15, 2013
    Publication date: May 22, 2014
    Applicant: SK hynix memory solutions inc.
    Inventors: Yu Kou, Lingqi Zeng