Electrical Test Sensing Property Of Item Patents (Class 209/571)
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Patent number: 6194679Abstract: In a machine for testing and sorting miniature electrical inductors of the type having spaced-apart, opposed first and second metal-terminated ends, wherein the machine includes a feed station having an inlet, an outlet and adapted to receive bulk quantities of inductors, a rotatably mounted transport wheel the wheel having an outer rim portion that includes a plurality of separate, spaced-apart compartments adapted to receive inductors from the feed station whereby each of the compartments has a central axis that is oriented perpendicular to the axis of the wheel, a test station including testing apparatus, and a sorting station operatively connected to the testing apparatus whereby an electrical inductor that is within the sorting station can be directed by a transfer means into one of at least two receiving means based on the testing performed at the test station, wherein when an electrical inductor is located in one of the compartments of the wheel.Type: GrantFiled: August 6, 1999Date of Patent: February 27, 2001Inventors: Douglas J. Garcia, Jakob Herrmann
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Patent number: 6149867Abstract: Improved flow cytometer system particularly adapted to use for sex-selected sperm sorting include enhanced sheath fluid and other strategies which minimize stress on the sperm cells, including a 2.9 percent sodium citrate sheath solution for bovine species and a hepes bovine gamete media for equine species. Improved collection systems and techniques for the process are described so that commercial applications of sperms samples as well as the resulting animals may be achieved.Type: GrantFiled: December 31, 1997Date of Patent: November 21, 2000Assignee: XY, Inc.Inventors: George Seidel, Lisa Herickhoff, John Schenk
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Patent number: 6147316Abstract: An inventive method for sorting integrated circuit (IC) devices of the type having a substantially unique identification (ID) code, such as a fuse ID, includes automatically reading the ID code of each of the IC devices, and sorting the IC devices in accordance with their automatically read ID codes. The inventive method can be used in conjunction with an IC manufacturing process that includes providing semiconductor wafers, fabricating the IC's on each of the wafers, causing each of the IC's to store its ID code, separating each of the IC's from its wafer to form IC dice, assembling the IC dice into IC devices, and testing the IC devices.Type: GrantFiled: August 13, 1998Date of Patent: November 14, 2000Assignee: Micron Technology, Inc.Inventor: Raymond J. Beffa
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Patent number: 6135291Abstract: A method for dispensing, receiving, storing, testing or binning packaged integrated circuit devices using at least one vertically-oriented, removable, tubular magazine disposed above a controllably-driven, rod-like indexing element extending from a drive below the magazine. A magazine, with an associated indexing element and drive, is configurable as an individual magazine module. The indexing element, under power of the drive, raises or lowers a vertical stack of devices to a desired level adjacent the top of the magazine to dispense or receive an individual device from a feed mechanism, such as a pick-and-place mechanism. A number of magazine modules may be assembled in a multi-module array, which is particularly suitable for binning tested devices, with a sort category being directed to each magazine.Type: GrantFiled: January 16, 1998Date of Patent: October 24, 2000Assignee: Micron Electronics, Inc.Inventor: Robert L. Canella
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Patent number: 6100486Abstract: An inventive method for sorting integrated circuit (IC) devices of the type having a substantially unique identification (ID) code, such as a fuse ID, includes automatically reading the ID code of each of the IC devices, and sorting the IC devices in accordance with their automatically read ID codes. The inventive method can be used in conjunction with an IC manufacturing process that includes providing semiconductor wafers, fabricating the IC's on each of the wafers, causing each of the IC's to store its ID code, separating each of the IC's from its wafer to form IC dice, assembling the IC dice into IC devices, and testing the IC devices.Type: GrantFiled: August 13, 1998Date of Patent: August 8, 2000Assignee: Micron Technology, Inc.Inventor: Raymond J. Beffa
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Patent number: 6089985Abstract: A fastener sorting apparatus is configured to mount on a fastener forming machine and to shunt bent workpieces through a wastegate of the fastener forming machine when the bent workpieces contact a detection ring. The detection ring is electrically-conductive and is coaxially aligned with a part gripper of the forming machine. The ring has an inner diameter slightly larger than an outer diameter of a series of workpieces to be sorted. Either the ring or the gripper are moved so that a workpiece held in the gripper passes through the ring. If the workpiece is bent beyond acceptable limits it will contact the ring, closing an electrical circuit. Closing of the circuit causes a workpiece diverter to shunt the workpieces through the wastegate.Type: GrantFiled: September 1, 1999Date of Patent: July 18, 2000Assignee: L & M Machining and Manufacturing, Inc.Inventors: Lawrence A. Morath, Jan A. Linthorst, Ronald W. Marchionni, Dennis F. Custer
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Patent number: 6055463Abstract: A test control system for controlling overall test procedures which processes test data generated from the final test process and analyzes bin category results. The control system uses testers for testing electrical characteristics of IC devices, a host computer for processing data transmitted from the testers and for creating a number of database structures, and distributed computers for monitoring the test progress and analyzing the test results using the database structures stored in the host computer. A control method using the control system includes the steps of: performing a final test as a lot; monitoring the status of the final test progress while storing test data during the final test; determining if the final test is completed; performing a lot decision after the final test is completed based on bin category limits; and displaying the lot decision result and storing the test data.Type: GrantFiled: May 18, 1998Date of Patent: April 25, 2000Assignee: Samsung Electronics Co. Ltd.Inventors: Kwang Yung Cheong, Ann Seong Lee, Jae Young Kim
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Patent number: 6043443Abstract: Disclosed is a method for fabricating devices so that several devices at a time can be tested and sorted. The devices are placed in a carrier so that each device occupies a discrete position. The carrier includes an identification marker, and each device is identified by its position in the carrier. The carrier is sent to multiple assembly and/or testing stations, and data for each device is collected and stored in a central data base according to its position in the carrier. Each device may then be sorted according to the collected data and its position in the carrier.Type: GrantFiled: January 23, 1998Date of Patent: March 28, 2000Assignee: Lucent Technologies Inc.Inventors: Patrick J. Doran, James F. Dormer, Patrick J. Drummond, Daniel Kern
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Patent number: 6043442Abstract: A test method for testing an integrated circuit (IC) device, including a step of checking the handler contacts with IC devices to be tested after a test apparatus and a handler are completely set up and before actual testing operations commence. The handler contact check device includes a handler contact check board mounted to the handler, which is provided with a plurality of pins directly contacting outer terminals of the IC devices, and wiring circuits for transferring contact check electrical signals from a test apparatus to the contacts between the plurality of pins and the outer terminals, and for transferring output electrical signals from the contacts to the test apparatus, and a contact check package device having the same shape and outer terminals as the IC devices to be tested.Type: GrantFiled: February 27, 1997Date of Patent: March 28, 2000Assignee: Samsung Electronics Co., Ltd.Inventors: Won Sik Park, Weon Seob Shim, Chan Ho Choi, Yong Su Kwon
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Patent number: 5998751Abstract: Disclosed is a sorting system configured to sort a plurality of components, such as computer chips. The handler comprises a component handler configured to sort a plurality of components into groups; a plurality of receptacles on the component handler, each of the receptacles adapted to receive one of the sorted groups of components; at least one indicator associated with at least one of the receptacles, the at least one indicator being activated when the associated receptacle is filled to a selected amount with components; a plurality of bins, each of the bins being associated with one of the receptacles on the component handler; and at least one indicator on at least one of the bins, wherein the at least one indicator on the bin is activated when the receptacle associated with that bin is filled to a selected amount.Type: GrantFiled: February 20, 1998Date of Patent: December 7, 1999Assignee: Micron Electronics, Inc.Inventor: Steve Brunelle
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Patent number: 5996996Abstract: Disclosed is a method of sorting and transferring components, such as computer chips. The method comprises sorting a plurality of components into a plurality of separate groups, wherein each component in a common group has a common property, and depositing each of the groups of components into separate receptacles. The receptacles are then marked and one a plurality of bins for receiving components transferred from the marked receptacle is also marked. The group of components from the marked receptacle is then transferred to the marked bin.Type: GrantFiled: February 20, 1998Date of Patent: December 7, 1999Assignee: Micron Electronics, Inc.Inventor: Steve Brunelle
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Patent number: 5973285Abstract: A connector alignment assembly is provided for aligning memory modules in a test position relative to a memory module tester. An automatic feeder receives, stages and then dispenses the electronic memory modules onto a conveyor, one at a time. The conveyor moves the electronic memory modules from the feeder to a test station. A contact plunger is used to push tester contacts against surface contacts of the electronic memory module to electrically connect the electronic memory module to test circuitry. The connector alignment assembly includes two alignment pins which are mounted to the contact plunger, such that when the contact plunger is moved to press the test contacts against the surface contacts, the alignment pins are moved into two alignment holes of the electronic memory module.Type: GrantFiled: November 26, 1997Date of Patent: October 26, 1999Assignee: Computer Service Technology, Inc.Inventors: Arnold Siegfried Dietrich, Erwin Heinrich
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Patent number: 5954205Abstract: A circuit board handling and testing apparatus comprising a housing which defines a top surface. Attached to the housing is a magazine assembly which accommodates a plurality of circuit boards and is adapted to dispense the circuit boards onto the top surface of the housing one at a time. Each of the circuit boards stored within the magazine assembly defines a longitudinal axis. Also attached to the housing is a testing assembly for receiving the circuit board dispensed onto the top surface and performing a testing protocol thereon. A reciprocal transport assembly attached to the housing pushes the circuit board dispensed onto the top surface laterally relative to its longitudinal axis into the testing assembly. A sorting assembly which is also attached to the housing selectively directs the tested circuit board into a particular containment vessel based upon the outcome of the testing protocol.Type: GrantFiled: January 13, 1997Date of Patent: September 21, 1999Inventor: Paul E. Smith
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Patent number: 5927512Abstract: An inventive method for sorting integrated circuit (IC) devices of the type having a substantially unique identification (ID) code, such as a fuse ID, includes automatically reading the ID code of each of the IC devices, and sorting the IC devices in accordance with their automatically read ID codes. The inventive method can be used in conjunction with an IC manufacturing process that includes providing semiconductor wafers, fabricating the IC's on each of the wafers, causing each of the IC's to store its ID code, separating each of the IC's from its wafer to form IC dice, assembling the IC dice into IC devices, and testing the IC devices.Type: GrantFiled: January 17, 1997Date of Patent: July 27, 1999Assignee: Micron Technology, Inc.Inventor: Raymond J. Beffa
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Patent number: 5899341Abstract: Method and apparatus for transporting a lead frame which can be shared for directly-stacked lead frames and for frames--which are stacked while inter leaves are sandwiched, respectively, between them--and which allows two lead frames sticking to each other to be efficiently recovered without deactivating the lead frame transport apparatus. An apparatus for transporting a lead frame to a transport path from a stack of lead frames stored in a magazine through use of a transport head are provided with a recovery head, two-sheet pick-up sensors, and a recovery section for recovering an inter leaf which doubles as a recovery section for recovering two lead frames sticking to each other. In a case where the lead frames are stacked while the inter leaves are sandwiched, respectively, between them, the recovery head transports the inter leaf to the recovery section, where the inter leaf is recovered.Type: GrantFiled: February 25, 1998Date of Patent: May 4, 1999Assignee: Matsushita Electric Industrial Co., Ltd.Inventor: Ryouichi Irita
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Patent number: 5895443Abstract: The present invention provides test flow assurance using memory imprinting. The device being tested includes a nonvolatile memory portion for storing an information imprint in a present test status field. The imprint indicates the bin category to which the device is to be directed according to the results of a test sequence. During the start of a test in the test flow, the present test status field is read to determine whether the device has already passed through the present test. If so, the device is not retested according to that test step, and it is binned out according to the imprinted information. If the imprint indicates that the device has not already passed through the present test, then the present test sequence is performed, the device programmed with its imprint, and binned out accordingly.Type: GrantFiled: July 19, 1996Date of Patent: April 20, 1999Assignee: Intel CorporationInventors: William Gross, Jr., Gregory D. Sabin
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Patent number: 5881888Abstract: In a method for detecting and picking up dies from a wafer, when a defective die is detected inside a predetermined reversing range defined on the wafer, the die detection and pick-up movement is shifted one pitch to the next row of dies so as to detect the first die of the next row. If the first die of the next row is not a defective die, the die detection and pick-up movement proceeds toward the edge of the wafer in the X direction and successively detects and picks up dies on that row. Then, when a defective die is detected on that row, the direction of the die detection and pick-up movement is reversed without picking up the defective die, so that the die located immediately at the inner side of the first die of that row is detected and picked up, and non-defective dies on that row are successively detected and picked up.Type: GrantFiled: October 23, 1996Date of Patent: March 16, 1999Assignee: Kabushiki Kaisha ShinkawaInventors: Masaki Ohkawara, Nobuyuki Aoyagi
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Patent number: 5865319Abstract: An automatic test handler system for automatically supplying IC devices to be tested to an IC tester and sorting the tested IC devices based on the test results. The system includes a testing machine for testing the IC devices by contacting the IC devices with test contactors. Test signals are provided from the IC tester and the resulting signals from the IC devices are received. The testing machine is installed in a test room in which dust, temperature and humidity are controlled in a high degree. A sorting machine is installed outside of the test room for sorting the IC devices that have been tested based on the test results. The sorting machine has a plurality of sort stations for receiving the IC devices based on categories defined in the test results. Tray cassettes hold a plurality of IC trays containing the IC devices, and both the tray cassettes and IC trays are provided with identification numbers.Type: GrantFiled: June 27, 1996Date of Patent: February 2, 1999Assignee: Advantest Corp.Inventors: Hiroshi Okuda, Shin Nemoto, Hisao Hayama, Katsumi Kojima
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Patent number: 5848705Abstract: A method is described for automatic loading and unloading of printed circuit boards on machines for electrical testing, consisting of feeding the circuits to be tested into a pick-up area (16), detecting the position of the single circuits and comparing the position detected with a correct reference position, transferring the circuits from the pick-up area (16) to a loading area (4) on the test machine, taking into account during transfer any deviation of the actual position of the circuit board from the reference position, so that the circuit is always picked up in the same way, to be set down in the pre-established region of the loading area (4), and unloading the tested circuits from the area (4) of the machine onto a discharge line (7) for good circuits and a magazine (17) for faulty circuits, depending upon the test result.Type: GrantFiled: December 1, 1995Date of Patent: December 15, 1998Assignee: Circuit Line SPAInventors: Antonello Gianpaolo, Marchi Giovanni, Martini Riccardo
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Patent number: 5829600Abstract: The invention is concerned with a method for identifying different, elongated metallic objects according to position and/or shape and/or type. In this method, by means of a conveyor, an object lying singly in a predetermined or a random position on conveyor is guided in terms of its conveyor direction evenly and at a constant speed over at least one inductive scanner, the induction voltage which varies temporally while object is passed over inductive scanner, is measured.Type: GrantFiled: May 16, 1996Date of Patent: November 3, 1998Assignee: Premark FEG L.L.C.Inventors: Helmut Jordan, Peter Buck, Rainer Anthonj
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Patent number: 5813541Abstract: A screening apparatus including a testing chamber and a control console for environmental screening and vibrational testing of manufactured products placed inside the testing chamber. The control console is used to control and monitor the operation of the screening apparatus. The control console is supported on an articulated arm so that the control console can be optimally positioned. The articulated arm also protects the control console from the thermal and vibrational stimuli applied to the product being tested. The system wiring between the testing chamber and the control console can be enclosed in or attached to the articulated arm so that the wires do not impede the mobility of the articulated arm and do not pose a hazard to people working near the screening apparatus. Optional rigid bars can be placed with the walls of the testing chamber to increase the resonance frequency of the testing chamber to further protect the control console from the vibrational stimuli applied to the product being tested.Type: GrantFiled: April 7, 1997Date of Patent: September 29, 1998Assignee: QualMark CorporationInventor: Norman J. Mottram
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Patent number: 5772040Abstract: Workpieces in which, for example, wire bonding has been performed are inspected to determine if they are defective or not by an inspection device. Workpieces which have been found to be defective are conveyed to one workpiece magazine and workpieces which have been found to be defect-free are conveyed to another workpiece magazine, thus defective and non-defective workpieces are separated immediately after inspection.Type: GrantFiled: September 26, 1995Date of Patent: June 30, 1998Assignee: Kabushiki Kaisha ShinkawaInventors: Hiromi Tomiyama, Yoshiyuki Ogata, Satoshi Enokido, Takeyuki Nakagawa
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Patent number: 5771003Abstract: A user-friendly process and fail safe system instantaneously identifies, locates, and help retrieve products and their contents in drawers, shelves, rooms, offices, stores, warehouses, etc. The efficient process and economical system is particularly useful to quickly and accurately identify, locate and help retrieve: computer discs, compact discs, software diskettes, video tapes, audio tapes, and their cases; books; files; boxes, cartons, storage bins, and other containers. In the reliable process and low power system, an electrically conductive label is placed on each product. Each label is easily coded to uniquely specify the product or its contents and storage location. Light emitting diodes (LEDs) or other visual, audible or mechanical signaling devices are positioned in proximity to the stored products and are in electrical contact with the labels on the products, as well as with a central processing unit (CPU) or other equipment used to specify and select the product.Type: GrantFiled: September 24, 1996Date of Patent: June 23, 1998Assignee: Elenco Electronics, Inc.Inventor: Arthur F. Seymour
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Patent number: 5750938Abstract: A drug weighing method presenting the steps of feeding an orderly succession of drugs to a capacitive sensor; determining the weight of each drug by means of the capacitive sensor;periodically weighing a number of drugs in the succession by means of a precision scale;and periodically calibrating the capacitive sensoron the basis of the directly determined drug weights.Type: GrantFiled: October 21, 1994Date of Patent: May 12, 1998Assignee: MG2 S.p.A.Inventors: Sandro De Caris, Angelo Ansaloni
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Patent number: 5680936Abstract: The present invention contemplates the use of a conveyor transporting circuit boards through a production line. At a point or stage in the production line where testing is to occur, the invention is employed to remove circuit boards from an input conveyor and transport them to a off line test assembly. Subsequent to testing, the invention is intended to selectively place the circuit boards on output conveyors in accordance with the results of testing, use an intelligent system, including a pick and place apparatus controlled to selectively retrieve boards from the input line and move them transversely to the line to a test site. The test site may include a staging conveyor for positioning the circuit boards received thereon on a bed-of-nails test station. Preferably, the pick and place apparatus will be able to move the boards to more than one test station, such that it may return to the input line and move another board while each board is being tested.Type: GrantFiled: March 14, 1995Date of Patent: October 28, 1997Assignee: Automated Technologies Industries, Inc.Inventor: Gregory C. Beers
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Patent number: 5643796Abstract: A droplet flow cytometer system which includes a system to optimize the droplet formation time delay based on conditions actually experienced includes an automatic droplet sampler which rapidly moves a plurality of containers stepwise through the droplet stream while simultaneously adjusting the droplet time delay. Through the system sampling of an actual substance to be processed can be used to minimize the effect of the substances variations or the determination of which time delay is optimal. Analysis such as cell counting and the like may be conducted manually or automatically and input to a time delay adjustment which may then act with analysis equipment to revise the time delay estimate actually applied during processing. The automatic sampler can be controlled through a microprocessor and appropriate programming to bracket an initial droplet formation time delay estimate.Type: GrantFiled: October 14, 1994Date of Patent: July 1, 1997Assignee: University of WashingtonInventors: Ger Van den Engh, Richard J. Esposito
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Patent number: 5617957Abstract: It is an object to provide a method of sorting semiconductor lasers, capable of appropriately removing semiconductor lasers which can cause a so-called sudden death in use. After a first current within a range of 50 to 150% the maximum rated current is supplied to the semiconductor lasers for a predetermined period of time, a second current is supplied within a range of 120 to 250% the maximum rated current for a short period of time. Semiconductor lasers which are destroyed or degraded in output characteristics are removed as defective devices.Type: GrantFiled: May 15, 1995Date of Patent: April 8, 1997Assignee: Sumitomo Electric Industries, Ltd.Inventors: Ichiro Yoshida, Tsukuru Katsuyama, Jun-ichi Hashimoto
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Patent number: 5603412Abstract: The present invention provides test flow assurance using memory imprinting. The device being tested includes a nonvolatile memory portion for storing an information imprint in a present test status field. The imprint indicates the bin category to which the device is to be directed according to the results of a test sequence. During the start of a test in the test flow, the present test status field is read to determine whether the device has already passed through the present test. If so, the device is not retested according to that test step, and it is binned out according to the imprinted information. If the imprint indicates that the device has not already passed through the present test, then the present test sequence is performed, the device programmed with its imprint, and binned out accordingly.Type: GrantFiled: February 2, 1996Date of Patent: February 18, 1997Assignee: INTEL CorporationInventors: William Gross, Jr., Gregory D. Sabin
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Patent number: 5602485Abstract: A device for checking the weights of individual capsules in a stream of capsules by passing the stream of capsules past a capacitance sensor which measures the capacitance of each capsule as representative of the capsule weight, and passing the stream of capsules past a velocity sensor which measures the velocity of each capsule as representative of the capsule weight. The measured capacitance and measured velocity values are each compared against preset ranges of values, and a capsule is mechanically deflected from the moving stream if the comparison shows either measured value to be outside the respective preset range of values.Type: GrantFiled: January 16, 1996Date of Patent: February 11, 1997Assignee: Modern Controls, Inc.Inventors: William N. Mayer, Daniel W. Mayer, Roger C. Oestreich
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Patent number: 5584395Abstract: A sorting apparatus has a rotatable drum member having sorting through-holes selectively open and closed by associated shutter plates, and semiconductor devices examined by a testing system are sequentially stored in the sorting through-holes: when one of the sorting through-holes is aligned with a storage box for the decided grade, the shutter plate is opened, and the semiconductor device is thrown into the storage box.Type: GrantFiled: March 21, 1995Date of Patent: December 17, 1996Assignee: NEC CorporationInventor: Yasuaki Homma
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Patent number: 5538141Abstract: The present invention provides test flow assurance using memory imprinting. The device being tested includes a nonvolatile memory portion for storing an information imprint in a present test status field. The imprint indicates the bin category to which the device is to be directed according to the results of a test sequence. During the start of a test in the test flow, the present test status field is read to determine whether the device has already passed through the present test. If so, the device is not retested according to that test step, and it is binned out according to the imprinted information. If the imprint indicates that the device has not already passed through the present test, then the present test sequence is performed, the device programmed with its imprint, and binned out accordingly.Type: GrantFiled: September 27, 1994Date of Patent: July 23, 1996Assignee: INTEL CorporationInventors: William Gross, Jr., Gregory D. Sabin
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Patent number: 5524771Abstract: A method of enhancing the strength and of reducing strength variations of multi-layer wood, plywood or similar by measuring the density of the veneer sheets used in the production and by grading the veneer sheets accordingly. The density of the veneer sheets is measured in a manner known per se by using a high-frequency electromagnetic resonator (2). To build up layers of multi-layer wood, plywood or similar (12), veneer sheets confirmed to have a higher density are graded as surface sheets (13) and/or local density variations of central sheets (14) are reduced by mixing veneer sheets with various densities.Type: GrantFiled: March 2, 1994Date of Patent: June 11, 1996Assignee: Finnforest OyInventors: Matti Kairi, Pertti Helminen
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Patent number: 5518123Abstract: An apparatus for automatically magnetizing pieces cut to have an optional shape and size and sorting magnets magnetized in terms of quality. For the sorting, the apparatus includes a testing station for applying an external magnetic field in the form of pulses or the like to each magnet, sensing a variation in characteristic of the magnet caused by the applied magnetic field, and performing a measurement, an analysis and an evaluation for the characteristic of the magnet. The apparatus also includes a feeding station for separating one from magnets stacked in a supplying station and feeding it to the testing station, and a sorting station for sorting the tested magnet as a good one or as a bad one, based on the test result obtained in the testing station and putting it in a container.Type: GrantFiled: June 7, 1994Date of Patent: May 21, 1996Assignee: Lucky Metals CorporationInventors: Kyung S. Jin, Eun D. Lee, Ihn S. Min, Bae K. Kim
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Patent number: 5489506Abstract: A method and apparatus for continuously sorting living cells from a mixture of many unlike cells to obtain separate populations of like cells. The invention comprises cell and fluid intake ports, a cell deflection chamber, and a series of output vacuum pumps attached to a like number of collection reservoirs. The cell intake section is a two-stage system that first mixes the incoming cells with a deionized, buffered, processing medium then sheathes the output stream with a centering carrier fluid. An expansion chamber contains one or more electrodes connected to one or more RF generators that act upon the passing cells so that they are fanned out within the expansion chamber according to their size, physical construction, chemical composition and electronic properties. Vacuum pumps draw the fluids through the system and deposit the sorted cells in separate reservoirs.Type: GrantFiled: February 16, 1995Date of Patent: February 6, 1996Assignee: Biolife Systems, Inc.Inventor: Stuart Crane
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Patent number: 5456392Abstract: An adapter working in concert with a parent or host machine to divert socks of different styles or quality into separate collection containers, including a logic controller, a diverter assembly, at least two discharge conduits, and a manifold. The diverter assembly is pneumatically connected in series with the sock discharge outlet of the host machine. Depending upon a selection entered into the logic controller by an operator, a sock on a rotating turret on the host machine may be designated, at predetermined turret positions, to be of a particular style, or to be of second quality. The entry is entered into the logic controller, where it is remembered until the sock is ready to be everted and discharged. A index detection device is provided to indicate indexing of the turret to the logic controller.Type: GrantFiled: June 1, 1994Date of Patent: October 10, 1995Inventor: James W. Majors
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Patent number: 5337902Abstract: An apparatus for measuring the capacitance of tablets of varying shapes and sizes by conveying the tablets along a curved path which includes a zone of travel between the plates of a capacitive sensing device. The tablets are conveyed in a relatively fixed orientation by constructing a guide channel including a fixedly-positioned curved guide spaced away from a rotatable disk, and wherein a resilient clamp is provided above the guide channel so as to compress the tablet against the rotatable disk during its path of travel.Type: GrantFiled: August 13, 1993Date of Patent: August 16, 1994Assignee: Modern Controls, Inc.Inventors: Mark D. Evans, Roger C. Oestreich
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Patent number: 5319353Abstract: An alarm display system for automatic test handling of electric devices such as integrated circuits ("ICs"), semiconductor chips and the like, is capable of notifying and displaying an occurrence of an error or other inadequacies in the automatic test handler, a generic position and a specific position of the error in the test handler. The test handler wherein the alarm display system of the present invention is to be included has improved IC transfer, test sequence and sorting capabilities in order to provide enhanced productivity and reliability for the testing of integrated circuits. The alarm display system is capable of showing an error and its position, and at the same time, when there is no error, controlling and displaying a general procedure of the test handler.Type: GrantFiled: October 14, 1992Date of Patent: June 7, 1994Assignee: Advantest CorporationInventors: Takeshi Ohnishi, Diane D. Kakihara
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Patent number: 5299693Abstract: An apparatus for removing recyclable or other selected items from a load of mixed trash. An identifier generating a non-visual identifying signal is secured to the item and is used in conjunction with sensor devices to locate the position of the item anywhere within the load of mixed trash, to control the movement of the load along a conveyor to an extracting device, to control the movement of the extracting device and the operation of the extracting device so as to remove the selected item from the load without human intervention and under automated control.Type: GrantFiled: August 11, 1992Date of Patent: April 5, 1994Inventors: Richard A. Ubaldi, Garrett A. Smith, Mark W. Hrehovcik, Douglas P. Rauen
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Patent number: 5292007Abstract: Method of and apparatus for continuous non-destructive testing of bar-shaped specimens formed of iron-containing material of specific quality characteristics, where the bar-shaped specimens, such as pipes, move on a roll table (2) along an elongated path through two testing blocks (8, 9) spaced apart along the path. The testing blocks (8, 9) are mechanically decoupled from one another and are logically linked to an electronic testing installation (10). As a specimen moves through a first testing block (8) a signal is developed indicating the presence or absence of flaws and their location in the specimen. The location is referred to the length of the specimens. The testing blocks (8, 9) are located between a supply station (1) and a sorting station (3) with the roll table (2) extending between the two stations. Based on the signals generated, the specimens are sorted in the sorting station between an accepted tray (4) and a number of rejected trays (5, 6, 7) for reworkable or scrap specimens.Type: GrantFiled: March 11, 1991Date of Patent: March 8, 1994Assignee: Benteler AktiengesellschaftInventors: Gerhard Beer, Georg Kellersohn
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Patent number: 5263651Abstract: An apparatus for processing wood chips for use in the preparation of pulp in a papermaking operation including a conduit for accommodating a flow stream of wood chips, a rotary valve in the conduit, shunt branch conduits with a first shunt leading to a chip dumping bin and a second shunt leading to a chip processing device; dampers in the branches with the damper for the first shunt branch being in normally closed position and a damper in the other shunt branch being in a normally open position; and a metal detection device upstream of the branches operative to move the first damper to open position and the second damper to closed position for a predetermined time and to stop the rotary valve and to reactivate the dampers and rotary valve after a predetermined time.Type: GrantFiled: April 1, 1992Date of Patent: November 23, 1993Assignee: Beloit Technologies, Inc.Inventor: Ravindran Nadarajah
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Patent number: 5251765Abstract: Apparatus and method for segregating elongate cylindrical rods of undesirable alloy composition from rods having a desired alloy composition is disclosed. The apparatus includes a rod segregation table having an upper rod transport side for individually moving rods transversely in substantially parallel spaced relation across the table. A thermoelectric tester is positioned at an intermediate rod test position under the upper rod transport side of the table and includes two spaced electrodes maintained at different temperatures and being adapted and arranged to engage a rod as it is moved into the rod test position. A signal representative of the thermoelectrically induced voltage in the rod between the electrodes is generated and compared to a predetermined value. An offset drive signal is generated when the signal representative of the induced thermoelectric voltage is different from the predetermined value.Type: GrantFiled: November 13, 1990Date of Patent: October 12, 1993Assignee: Westinghouse Electric Corp.Inventors: Stanley S. Patrick, Robert E. Shannon
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Patent number: 5217120Abstract: An apparatus for automatically loading and unloading sleeves for an IC tester and then selectively reloading the sleeves after testing, which is controlled by a conventional microprocessor using sensor input and which automatically transports the IC chip containing sleeves randomly contained in a hopper to a sorter section in a correct posture by means of a timing belt having sleeve holders, to feed the chips in the sorter section, to the tester by a first transfer block, and then automatically transfer empty sleeves from an ejector section having a cam plate and an ejector through a dropping section having a pair of guide rails to an unloader section having a second transfer block, a sleeve holder, a sensor and a pushing plate, thereby permitting the sleeves to be refilled with the tester and sorted IC chips and stored in a storage box.Type: GrantFiled: April 13, 1992Date of Patent: June 8, 1993Assignee: Goldstar Co., Ltd.Inventors: Soo P. Lee, Sub I. Kim, Duk H. Lee, Yol Kim, Dong C. Ahn
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Patent number: 5205019Abstract: An apparatus for separating foreign bodies from a stream of fiber material includes a vertical chute having an upper inlet and a lower outlet; a mechanism for introducing the fiber material into the chute inlet; and a detector positioned in the chute for emitting a sensor signal upon passage of a foreign body. The fiber material is propelled from the detector towards the chute outlet substantially solely by gravity. The apparatus further has a waste discharge opening provided in the chute between the detector and the chute outlet; a deflecting mechanism arranged in the chute and having first and second positions. In the first position the deflecting mechanism causes the stream of fiber material to proceed in the chute to and through the chute outlet and in the second position the deflecting mechanism causes the stream of fiber material to proceed through the waste discharge opening.Type: GrantFiled: September 17, 1991Date of Patent: April 27, 1993Assignee: Trutzschler GmbH & Co. KGInventors: Stefan Schnlichter, Ferdinand Leifeld
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Patent number: 5135113Abstract: A device for sorting tablets by capacitive measurement, including a disk rotating between capacitor plates, a tablet fielding device for sequentially metering a series of tablets onto the disk, an arcuate guide assembly for guiding the tablets along a guide path as the disk rotates, and a deflector assembly for deflecting the tablets along one of the possible paths, as a consequence of the capacitance measurement.Type: GrantFiled: April 1, 1991Date of Patent: August 4, 1992Assignee: Modern Controls, Inc.Inventors: Daniel W. Mayer, Steven W. Broders
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Patent number: 5131803Abstract: Method for stacking substantially flat products such as meat patties. Rows of patties are conveyed under a metal detector and then to a sigmoidal slide. Patties contaminated with metal trigger the metal detector to send a signal to the slide. Upon receipt of a signal from the metal detector, the slide pivots in a manner to dispose of metal contaminated patties. Uncontaminated patties are conveyed down the slide without flipping over and onto a second lower conveyor having a plurality of vertical blades mounted thereto, between which patties are received in stacks. An optical counter is mounted to count patties conveyed down the slide. The counter is in communication with the second indexed conveyor and signals such conveyor to move forward after a predetermined number of patties have been stacked between two adjacent vertical blades on the indexed conveyor.Type: GrantFiled: November 6, 1990Date of Patent: July 21, 1992Assignee: Monfort, Inc.Inventor: Todd M. Banek
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Patent number: 5067616Abstract: Methods of discriminating between contaminated and uncontaminated containers prior to washing is disclosed characterized by the testing of the residue of the container to determine if the residue is residue of the original product packed in the container. If the residue is not sufficiently similar to the original product, the container is rejected as contaminated.Type: GrantFiled: May 15, 1989Date of Patent: November 26, 1991Assignee: The Coca-Cola CompanyInventors: George Plester, Warren E. Leddon, David E. Dalsis
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Patent number: 4951799Abstract: A method of correcting coin data and an apparatus for inspecting coins in which determination data is formed on the basis of data read out from a permanent memory, and authenticity and determination of coins are determined on the basis of the readout data. At the same time, maximum and minimum values corresponding to physical characteristics of coins are obtained. When the number of stored coins reaches a predetermined number or an operating time reaches a predetermined duration, the maximum and minimum values are updated. When such updating is performed a predetermined number of times, a standard deviation is also updated.Type: GrantFiled: January 31, 1989Date of Patent: August 28, 1990Assignee: Tamura Electric Works, Ltd.Inventor: Osamu Kai
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Patent number: 4907700Abstract: An apparatus is provided for non-destructively testing for a predetermined minimum release torque of container caps on containers at a torque testing station. The apparatus includes a device for clamping the containers at the torque testing station; a device for grasping the caps of the containers at the torque testing station; a device connected to the cap grasping device for applying a release torque to the container caps; and, a device including a strain gage coupled to the release torque applying device for sensing the level of release torque applied to the caps and providing a signal indicative of such level. The apparatus also includes selectively operable controls for destructively testing selected capped containers, on a sampling basis, to determine the actual release torque of the container caps on such containers.Type: GrantFiled: October 27, 1988Date of Patent: March 13, 1990Assignee: New England Machinery, Inc.Inventors: Geza E. Bankuty, LeRoy F. Byron, Joseph J. Cianciullo
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Patent number: 4905843Abstract: A veneer stacking system providing the feature of consistent air suction above the multiple veneer stacks enabling reliable separation of the veneer sheets from an overhead conveyor. This consistent air suction is provided by independent air chambers for each stack. It also includes aligning belts for aligning the sheets on the overhead conveyor. An aligning belt replaces a section of one or both of the conveyor belts and is independently driven to speed up or slow down one side of the sheet to achieve the desired alignment. It also includes improved knock-off shoes activated byh cylinders connected to master cylinders in a master cylinder housing activated by a common mover piston for simultaneous knock off of veneer sheets onto the stacks.Type: GrantFiled: April 7, 1988Date of Patent: March 6, 1990Assignee: U.S. Natural Resources, Inc.Inventor: John C. Holbert
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Patent number: 4901862Abstract: An inspection apparatus for flanged or curled part of can having a cylindrical body and an open end comprising a feeding means, a holding means, an inspecting means, a locating means, a discriminating means and a discharging means, wherein the inspection is carried out continuously. According to the present invention, visual inspection falls into disuse, and inspection efficiency is improved.Type: GrantFiled: September 7, 1988Date of Patent: February 20, 1990Assignee: Takeuchi Press Industries Co., Ltd.Inventors: Shigeru Tachibana, Minoru Takegoshi, Takashi Danzuka