Abstract: Described is a radar filling level measuring device for non-contact measurement of a filling level of a filling matter in a vessel. A radar filling level measuring device including an electronics unit for generating transmission signals and for evaluating receiving signals reflected for a filling matter, an antenna unit connected to the electronics unit and adapted to radiate the transmission signals generated by the electronics unit in the direction of the filling matter and to receive the receiving signals reflected from the filling matter surface and to pass them on to the electronics unit, and a housing forming a cavity which is at least tight with respect to the atmosphere within the vessel and in which the electronics unit and antenna unit are acommodated. By this structure both the antenna unit and the electronics unit are protected in a technically simple and cheap way against aggressive ambient conditions and against chemical and mechanically abrasive aggression.
Type:
Grant
Filed:
April 9, 2003
Date of Patent:
July 11, 2006
Assignee:
Vega Grieshaber KG
Inventors:
Josef Fehrenbach, Juergen Motzer, Daniel Schultheiss, Karl Griessbaum
Abstract: The present invention relates to a radar filling level measuring device capable of generating and receiving an elliptically polarized wave and, as a special case, a circularly polarized wave, using a directional coupler which, according to a particular embodiment, may be configured as a 3 dB coupler. By simultaneously using a 3 dB coupler the necessary separation into transmitting and receiving functions can be achieved. Moreover, the present invention relates to a use of a directional coupler for generating an elliptically polarized wave and, as a special case, a circularly polarized wave, as well as to a method for generating and receiving an elliptically polarized wave.
Abstract: A method for inferring information about the conductivity of a medium from ground penetrating radar (GPR) data using a calculated effective penetration limit of the GPR system, including various methods for calculating the effective penetration limit.
Abstract: An apparatus for measuring the electrical characteristic of a chip-shaped electronic component having first and second external terminal electrodes at first and second opposing ends thereof includes a holder that holds an electronic component with the first and second external terminal electrodes pointing toward first and second open ends of a receiving cavity. The holder is provided with a shield layer extending between first and second measuring terminals, and the shield layer is electrically connected to a measurement reference potential. The shield layer reduces the stray parasitic capacitance adjacent to the electronic component, and reduces measurement errors resulting from size variations of the electronic component.
Abstract: The invention is a device for inspecting an assembly including a surface coating containing magnetic radar-absorbing materials on a conductive surface. In detail, the device includes a first system for transmitting an electromagnetic signal to the assembly, which includes a first waveguide made of a conductive material coupled in series to a second waveguide made of a dielectric material. A second system is provided for receiving the portion of the electromagnetic signal reflected from the assembly, which includes a third waveguide made of a conductive material coupled in series to a fourth waveguide made of a dielectric material. Thus the electromagnetic signal is transmitted from the first waveguide to the second waveguide on to the assembly and the portion of the electromagnetic signal reflected off the assembly is received by the fourth-waveguide and transmitted to the third, waveguide.
Abstract: A test apparatus comprises an input for receiving a test signal from a test signal source, wherein a signal line with a predefined characteristic wave impedance can be connected to the input. The test apparatus further comprises branching means with a first and a plurality of second terminals, the first terminal being connected to the input. The test apparatus further comprises a plurality of distribution lines, wherein each distribution line is connected to one of the plurality of second terminals of branching means, wherein one of the devices under test can be connected to each distribution line at the output side, each distribution line having a characteristic wave impedance, which is substantially equal to the product of the predefined characteristic wave impedance of the signal line and the number of distribution lines. Thus, a signal matching is given at the branching point, so that no amplitude or signal rise time distortions of the excitation signals occur at the inputs of the devices under test.
Abstract: A monitoring system for high-frequency circuits which minimizes the insertion loss of additional monitoring circuits while requiring only a small space. An input coupler is placed at the input of a high-frequency circuit whose frequency response is to be monitored. The input coupler has a space where a given high-frequency probing signal can propagate, and it combines this propagating signal with a given electrical input signal. The combined signal is processed by the high-frequency circuit, and the resulting signal is supplied to an output coupler. The output coupler has a space for propagation of a high-frequency probing signal component contained in the received combined signal. The output coupler extracts this propagating signal component for the purpose of monitoring.
Type:
Application
Filed:
July 24, 2003
Publication date:
June 24, 2004
Applicant:
FUJITSU LIMITED
Inventors:
Kazunori Yamanaka, Isao Nakazawa, Masafumi Shigaki, Manabu Kai
Abstract: A probe for examining a sample (5), the probe comprising an emitter (1) for emitting radiation, a detector (1) for detecting radiation and a dielectric member (3) configured to direct radiation from the emitter (1) to the sample (5) and to direct radiation reflected by the sample (5) to the detector (1), wherein in use, the dielectric member (3) occupies at least half of the radiation path length from the emitter (1) to the sample (5) to the detector (1).
Abstract: A tunable ferroelectric component and a narrowband resonant circuit for measuring the loss of the ferroelectric component. The ferroelectric component may be a capacitor integrated in the resonant circuit. The testing method eliminates other sources of loss to isolate the loss due to the ferroelectric material and to demonstrate that this loss is low.
Abstract: An acid concentration continuous measuring apparatus is equipped with the combination of a body having a flow path through which pickling solution contained in a pickling tank is made to continuously pass in a single direction, a density sensor, a temperature sensor, and a conductivity sensor which are installed on the body and substantially continuously measure the pickling solution flowing along the flow path, and a calculating apparatus which calculates the acid concentration of the pickling solution based on the measured results. Feedback control of the hydrochloric acid concentration in a final pickling tank of a plurality of pickling tanks forming a continuous pickling line is performed using the acid concentration continuous measuring apparatus.
Type:
Grant
Filed:
May 16, 2002
Date of Patent:
November 18, 2003
Assignees:
Sumitomo Metal Industries, Ltd., Kabushiki Kaisha Toshiba
Abstract: A probe for non-destructive determination of complex permittivity of a material and for near field optical microscopy is based on a balanced multi-conductor transmission line structure created on a dielectric substrate member which confines the probing field within a sharply defined sampling volume in the material under study. A method for manufacturing dielectric support member based probes includes anisotropically depositing a 50-100 Å thick underlayer of Cr, Ni, W or Ta onto the dielectric support member, anisotropically depositing conductive material onto the Cr, Ni, W or Ta underlayer, and removing the unwanted conductive material at the sides of the dielectric support member to electrically isolate the created conductive strips.
Type:
Application
Filed:
March 21, 2003
Publication date:
August 21, 2003
Inventors:
Robert L. Moreland, Hans M. Christen, Vladimir V. Talanov, Andrew R. Schwartz
Abstract: A method of uniquely extracting both intrinsic and parasitic components from a single set of measured S-parameters is useful for extracting a single set of measured S-parameters for the development of non-linear Field Effect Transistor (FET) models. Competitive extraction where multiple trial solutions are attempted spanning a region or space of feedback impedances is used. Extraction is followed by optimization that reduces the extracted values to a model that better fits measured S-parameters. Optimization can be achieved by further evaluating the speed of convergence in an error metric.
Abstract: Systems, methods, and probe devices for electronic monitoring and characterization using single-ended coupling of a load-pulled oscillator to a system under test.
Abstract: A method and system for measuring at least one of a plasma density and an electron density (e.g., in a range of 1010 to 1012 electrons/cm−3) using plasma induced changes in the frequency of a microwave oscillator. Measurement of at least one of the plasma density and the electron density enables plasma-assisted processes, such as depositions or etches, to be controlled using a feedback control. Both the measurement method and system generate a control voltage that in turn controls a plasma generator to maintain at least one of the plasma density and the electron density at a pre-selected value.
Type:
Grant
Filed:
April 9, 2002
Date of Patent:
June 3, 2003
Assignee:
Tokyo Electron Limited
Inventors:
Joseph T. Verdeyen, Wayne L. Johnson, Murray D. Sirkis
Abstract: A microwave sensor (3) for measuring the relative proportions of fluids is provided. The sensor (3) includes a tube (4) having a length (9) for accommodating the fluids flowing through said tube. The length (9) of the tube (4) makes up a part of the sensor (3). Also included are probes (6, 7) for transmitting electromagnetic energy into the sensor (3) and receiving electromagnetic energy from the sensor (3). The sensor (3) uses resonance at a resonant frequency (fm) below the cut-off frequency (fm) of the tube (4). The tube (4) includes at least one radially extending, conducting, internal fin (5) extending along the axis (10) of the tube (4). The fin (5) may be of regular or irregular shape and may be fixedly or detachedly arranged, e.g., through a slot (13).
Abstract: Methods for driving a lossy transmission media with an energy wave defined by a an exponential waveform function. The propagation delay and attenuation of the wave is a function of an exponential coefficient, and its propagation velocity is essentially constant and independent of displacement. Utilizing relationships between the propagation velocity, exponential coefficient, attenuation, and transmission line parameters, one may effectively model various transmission media. One may also determine unknown transmission line parameters, waveform exponential coefficients, attenuation, and/or propagation velocities by utilizing those relationships. By modulating the exponential coefficient, information may be encoded onto a waveform.
Type:
Grant
Filed:
March 7, 2000
Date of Patent:
August 27, 2002
Assignee:
Board of Regents, The University of Texas System
Abstract: An acid concentration continuous measuring apparatus is equipped with the combination of a body having a flow path through which pickling solution contained in a pickling tank is made to continuously pass in a single direction, a density sensor, a temperature sensor, and a conductivity sensor which are installed on the body and substantially continuously measure the pickling solution flowing along the flow path, and a calculating apparatus which calculates the acid concentration of the pickling solution based on the measured results. Feedback control of the hydrochloric acid concentration in a final pickling tank of a plurality of pickling tanks forming a continuous pickling line is performed using the acid concentration continuous measuring apparatus.
Type:
Grant
Filed:
May 4, 2000
Date of Patent:
May 28, 2002
Assignees:
Sumitomo Metal Industries, Ltd., Kabushiki Kaisha Toshiba
Abstract: A balanced charge pump sensor circuit (switched capacitor) for measuring the capacitance of a sensor element includes a switching circuit having a charging state during which the sensing element is connected to a relatively fixed upper reference voltage source. The switching circuit has a discharging state during which the sensing element is connected to a summing node, typically at some different voltage between the upper and lower reference voltages. As a result of this switching action, a packet of charge is transferred from the higher voltage connection to the lower voltage connection, the quantity of charge depending on the voltage difference between these two connections and the capacitance of the sensing element at the time the connections are changed. The circuit includes a current source, a differential amplifier having a non-inverting input terminal and an inverting input terminal, a voltage divider, and a charge integrating capacitor.
Abstract: A superconducting cable includes a core material, conductor layers formed by means of helically winding superconducting wires around the core material, electrically insulating layers, and magnetic shielding layers formed by means of helically winding superconducting wires around each of the electrically shielding layers. The superconducting wire is wound at the shortest pitch on the outermost conductor layer and is wound at the longest pitch on the outermost magnetic shielding layer.
Abstract: The circuit and the method are for measuring a capacitance of a capacitive sensor. According to the method, a charging circuit charges the capacitive sensor with a voltage and a discharging circuit discharges the capacitive sensor. A trigger circuit triggers the charging circuit and the discharging circuit in alternation into play as a potential of the capacitive sensor drops and rises to predetermined lower and upper levels respectively. An output circuit provides a signal having a low level during operation of one of the charging and discharging circuit and a high level during operation of the other one of the charging and discharging circuit. The signal has a period defined by a same level repetition which is indicative of the capacitance of the capacitive sensor.
Abstract: The present invention discloses a harmonic rejection load pull tuner. The tuner of the invention has a large-band tuner having an input and an output, and a transmission line having a longitudinal axis. The transmission line has an input connected to the output of a DUT and an output connected to the input of the large-band tuner. In parallel with the transmission line is at least one stub, the at least one stub having a length adapted to reflect out an nth order harmonic of a base frequency, where n is an integer greater than 1. The tuner of the present invention can be used to perform input or output characterisation (or both) of a DUT, by selectively reflecting out at least one harmonic frequency of the base frequency. Consequently, the characterisation of the DUT is improved, since the effects of the harmonics are considerably reduced. The present invention also concerns a method for performing input or output characterisation.
Abstract: An apparatus and method for determining a transducers principle operating parameters which utilizes two transfer functions; 1) the transfer function from the pressure response (50) to the voltage drop across the transducer (60); and 2) the transfer function from the pressure response (50) to the current flow through the transducer(70). The parameters of simple filter equations are fitted to these measured response curves. The transducers operating parameters are then calculated directly from the fitted parameters of the filter equations. Several methods for measuring the pressure and determining the appropriate filter equations are shown.
Abstract: A test pattern for use in measuring thickness of insulating layer comprising a wiring pattern provided in an insulating layer and a dummy pattern provided in the insulating layer. The wiring pattern has a electrical resistant value depending on the thickness of the insulating layer. The dummy pattern is provided so as to be adjacent to the wiring layer. The dummy pattern allows the thickness of the insulating layer thereon to be directly measured. By using the test pattern, characteristic chart showing a relationship between the electrical resistance value and the thickness of the insulating layer.
Abstract: A system for synchronizing circuit operation within an integrated circuit having a high frequency clock is disclosed. The system includes an oscillator for providing a clock signal, and a clock signal complement. A two conductor transmission line is utilized to distribute the clock signal. The two conductor transmission line has a first conductor coupled to the clock signal and a second conductor coupled to the clock signal complement provides sub-circuits within the integrated circuit with a differential clock signal. Negative impedance transmission line terminations are then attached in parallel with the transmission line. The terminations boost the clock signal transition times and the clock signal complement transition times to provide high frequency circuit synchronization within the integrated circuit.
Type:
Grant
Filed:
January 23, 1998
Date of Patent:
March 27, 2001
Assignee:
International Business Machines Corporation
Abstract: A method and apparatus for processing a time domain reflectometry (TDR) signal having a plurality of reflection pulses to generate a valid output result corresponding to a process variable for a material in a vessel. The method includes the steps of determining an initial reference signal along a probe, storing the initial reference signal as an active reference signal, periodically detecting a TDR signal along the probe in the vessel, and computing the output result using the TDR signal and the active reference signal. The method also includes the steps of determining an appropriate time for updating the active reference signal, automatically computing an updated reference signal at the appropriate time, and overwriting the active reference signal with the updated reference signal for use in subsequent computations of the output result.
Type:
Grant
Filed:
December 23, 1998
Date of Patent:
June 20, 2000
Assignee:
Endress + Hauser GmbH + Co.
Inventors:
Kenneth L. Perdue, William Patrick McCarthy, Donald D. Cummings, Gerd Wartmann
Abstract: Apparatus and methods are disclosed which provide increased sensitivity, selectivity and dynamic range for non-contact measurement of actual physical and/or kinematic properties of conducting and magnetic materials. The apparatus and methods are based upon various methods for increasing sensitivity, selectivity and dynamic range through proper construction of a magnetometer sensor and for proper selection of operating point parameters for the application. A measurement apparatus for measuring one or more MUT properties includes an electromagnetic winding structure which, when driven by an electric signal, imposes a magnetic field in the MUT and senses an electromagnetic response. An analyzer is provided for applying the electric signal to the winding structure. A property estimator is coupled to the winding structure and translates sensed electromagnetic responses into estimates of one or more preselected properties of the material.
Type:
Grant
Filed:
May 9, 1997
Date of Patent:
November 23, 1999
Assignee:
Massachusetts Institute of Technology
Inventors:
Neil J. Goldfine, James R. Melcher, deceased
Abstract: The present invention relates to the variable wave impedance generator (VWIF) which is used for the electric field intensity measuring instructor calibration, the magnetic field intensity measuring instructor calibration, the antenna calibration, and the unnecessary electronic wave interference and tolerance (EMI/EMS) measurement of the electric and electronic equipment using the features to generate the low impedance electronic wave (or, magnetic field) at the point meeting in phase, and the high impedance electronic wave (or electric wave) at the point meeting out of phase, when the power transmits in the coupled transmission line inside in the opposite direction from each other.
Type:
Grant
Filed:
December 7, 1995
Date of Patent:
June 8, 1999
Assignee:
Electronics and Telecommunications Research Institute
Abstract: A method of measuring a cryogenic fluid level utilizing a high temperature ceramic superconductor material driven above its level of critical current density. A high temperature ceramic superconductor is placed in cryogenic fluid and a voltage is applied between two points on the superconductor. The voltage drop is then measured at a third point on the superconductor. This voltage drop corresponds to the change in cryogenic fluid level, and thus can be used to measure the fluid level. Sensitivity of the measurement is increased by driving the high temperature ceramic superconductor above its level of critical current density.
Type:
Grant
Filed:
November 8, 1994
Date of Patent:
April 28, 1998
Assignee:
Illinois Superconductor Corporation
Inventors:
James D. Hodge, Lori J. Klemptner, Justin Whitney
Abstract: A process for determining the intrinsic magnetic permeability of elongated ferromagnetic elements and the electromagnetic properties of composites using such elements are disclosed. According to the process, an annular core or torus is produced, which torus is wound with ferromagnetic elements. The core is placed in a coaxial line, the properties of the torus are measured, and permeability of the elements and the properties of an equivalent composite for a given polarization are deduced from such measurement. Particular utility is found in the area of study of composite charges for use at microwave frequencies.
Type:
Grant
Filed:
July 31, 1995
Date of Patent:
November 25, 1997
Assignee:
Commissariat a L'Energie Atomique
Inventors:
Olivier Acher, Pierre Marie Jacquart, Alfred Schaal
Abstract: A map or globe is provided with a transparent thin covering capable of conducting electricity. The transparent thin covering envelopes the globe or overlies the map. An electrical resistance measuring means would be employed to determine a measure of electrical resistance between any two points on the map or globe. The electrical resistance measuring means would include a first probe and a second probe. The first probe would be placed on a first location on the map or globe and the second probe would be placed on a second location on the map or globe. A measure of electrical resistance will be generated by the electrical resistance measuring means reflecting the resistance of the conductive thin covering between the first location and the second location. This electrical resistance is proportionally related to the distance separating the two points on the map or globe.
Abstract: An apparatus for sensing the proximity of a moving target is provided which includes a sensor for sensing a range of distances between a reference point and a moving target. The sensor preferably has a detector for detecting a distance signal representative of a range of distances between a reference point and a moving target and a maximum and minimum generator responsive to the detector for generating a maximum distance range DC voltage signal representative of a maximum distance range value between a reference point and a moving target and for generating a minimum distance range DC voltage signal representative of a minimum distance range value between a reference point and a moving target.
Type:
Grant
Filed:
May 31, 1995
Date of Patent:
May 27, 1997
Inventors:
George D. Wolff, Marshall E. Smith, Jr., George T. Ruck
Abstract: A method and apparatus for sensing proximity of an object using near-field effects. Modulated radio frequency energy is fed to an antenna. The antenna radiates this modulated radio frequency energy to charge the surface of an object. When the position of the object changes, the impedance of the antenna due to near-field effects changes. This impedance change is detected to provide an indication of the object's movement. The sensing device may be packaged to be inserted into a wall to provide a sensor having a leak-free seal.
Type:
Grant
Filed:
May 22, 1991
Date of Patent:
October 17, 1995
Assignee:
Wolff Controls Corp.
Inventors:
George D. Wolff, Marshall E. Smith, Jr., George T. Ruck
Abstract: A method for non-intrusively measuring the shielding effectiveness of coaxial wiring by employing an inductive current probe which causes current to flow on the shield of the wiring. A second inductive current probe senses the current on the shield circuit and outputs a voltage which is a function of the shield current. The method employs loop self-impedance in contrast to transfer impedance.
Abstract: An acoustic microscope assembly for atomic level inspection of a target object includes a cantilever arm with a sharp tip on its lower surface and a zinc oxide piezoelectric thin film on its upper surface. High frequency excitation signals, having a frequency of at least 50 Megahertz, are applied to the piezoelectric thin film so as to generate high frequency acoustic signals that are transmitted through the sharp tip so as to impact on a target object. The assembly can either receive acoustic signals reflected by the target object, or it can receive acoustic signals that have propagated through the target object. One method of using this assembly is to apply a continuous wave signal to the piezoelectric thin film while scanning the target object, and measuring characteristics of the target object at various positions thereof by measuring the resonant frequency of the transmitted high frequency acoustic signals.
Type:
Grant
Filed:
June 20, 1991
Date of Patent:
June 14, 1994
Assignee:
The Board of Trustees of the Leland Stanford Junior University
Inventors:
Calvin F. Quate, Butrus T. Khuri-Yakub, Shinya Akamine, Babur B. Hadimioglu
Abstract: In order to measure the electromagnetic characteristics of a moving filiform material without cutting the latter and without any risk of a liquid and/or solid pollution introduced by the material disturbing the measurements, an ultra-high frequency cavity (10) is proposed, whose wall (12) is traversed by two facing orifices, in which are placed the two open parts of a dismantlable tubular protective device (26). The slot (24) makes it possible to introduce the filiform material (F) in to the cavity. The device (26) isolates the filiform material from the latter and its production in two parts enables it to be put into place without cutting the material. The protective device (26) is replaced without stopping the measurements and without any pollution being able to enter the cavity.
Type:
Grant
Filed:
April 18, 1991
Date of Patent:
April 7, 1992
Assignee:
Aerospatiale Societe Nationale Industrielle
Abstract: A test adapter is disclosed for connection to a measuring instrument using a 4-conductor measuring technique. It has four coaxial connectors whose characteristic impedance is adapted to that of the measuring instrument. The supply lines are designed as a stripline whose characteristic impedance is equal or approximately equal to that of the coaxial connectors.
Type:
Grant
Filed:
October 29, 1990
Date of Patent:
March 24, 1992
Assignee:
Standard Elektrik Lorenz Aktiengesellschaft
Abstract: A non-contacting method of measuring the electrical resistance per unit length of a filament, such as a carbon-coated optical fibre, makes the filament the inner conductor of a co-axial transmission line and measures a propagation characteristic of that line. The transmission line may be divided into seven sections, with a signal injected on the second section, and a comparison of the resulting signals appearing on the fourth and sixth sections being used in a feedback loop to control the injected signal frequency in such a way as to hold constant either the relative amplitudes or the relative phases of the signals appearing at the fourth and sixth sections.
Abstract: A test fixture for inverted microcircuits having spaced shelf assemblies h parallel shelves for respectively supporting a substrate for a microcircuit and a substrate for a ground plane in such a manner that the distance between them can be varied while test signals are coupled to the microcircuit via a coaxial cable coupled to a fitting on one shelf assembly and signals are coupled from the microcircuit via a coaxial cable coupled to a fitting on the other shelf assembly to test apparatus for determining the performance of the circuit.
Type:
Grant
Filed:
November 19, 1990
Date of Patent:
December 24, 1991
Assignee:
The United States of America as represented by the Secretary of the Army
Inventors:
Richard W. Babbitt, Thomas E. Koscica, Adam Rachlin
Abstract: Weak links in superconductors are detected by observing the effect of magnetic field modulation on the microwave resistance of superconductors. The phase detected response to the magnetic modulation can show a peak at T.sub.c. The presence of peak(s) at temperatures below T.sub.c indicates the presence of weak links in the superconductor.
Type:
Grant
Filed:
December 28, 1989
Date of Patent:
October 22, 1991
Assignee:
The Johns Hopkins University
Inventors:
Joseph Bohandy, Boris F. Kim, Terry E. Phillips, Frank J. Adrian, Kishin Moorjani
Abstract: A method and apparatus for determining the impedance of the discharge in a plasma reactor system comprising a tuning box having variable capacitors is described. The impedance of the discharge is determined in dependence on a pre-established relationship between the operational positions of the variable capacitors on the one hand and the impedance of the discharge on the other. The ionic current relative to the discharge in the reactor also may be determined by taking into account the high frequency voltage of the reactor.
Type:
Grant
Filed:
June 23, 1989
Date of Patent:
February 5, 1991
Assignee:
Commissariat a l'Energie Atomique
Inventors:
Bernard Bouyer, Bernard Andries, Guillaume Ravel, Louise Peccoud
Abstract: Particles are subjected to incident microwave radiation which induces a certain phase shift in the transmitted or reflected radiation. The transmitted or reflected radiation is detected and a measure of the phase shift is obtained from such detection. The particles are then sorted according to the phase shift which they induce in the incident radiation.