With Calibration Device Or Gauge For Nuclear Reactor Element Patents (Class 33/502)
  • Patent number: 9207076
    Abstract: In a method for determining ricochet vectors of a probe of a coordinate measuring machine (CMM) using a computing device, the computing device sets an approach distance between the probe and a manufactured object. Coordinates of a center of the probe and an initial vector of the probe for each measurement point of the manufactured object are obtained when the probe is manually operated to measure the manufactured object. A measurement element of the manufactured object is fit according to all measurement points of the manufactured object. For each measurement point, an approach point of the manufactured object is calculated, a position relation between the approach point and the measurement element of the manufactured object is determined, and a ricochet vector of the probe is calculated according to the position relation.
    Type: Grant
    Filed: December 11, 2012
    Date of Patent: December 8, 2015
    Assignees: HONG FU JIN PRECISION INDUSTRY (ShenZhen) CO., LTD., HON HAI PRECISION INDUSTRY CO., LTD.
    Inventors: Chih-Kuang Chang, Zhong-Kui Yuan, Zheng-Cai She, Yu-Hua Xu, Xiao-Guang Xue
  • Patent number: 9110457
    Abstract: Disclosed are systems and apparatus adapted to aid in calibration of an offset position—between a position sensor and an end effector in a processing system. The system includes a robotic component having an end effector and a position sensor coupled thereto, a teach target having a first geometrical feature, and an offset tool adapted to be engaged by the end effector, the offset tool including a first docking feature. The system further includes a moveable offset target having a second docking feature adapted to be engaged by the first docking feature and a second geometrical feature adapted to be sensed by the position sensor. The end effector moves the offset tool to the offset target and docks them. A position of the teach target and the offset target may then be sensed with the position sensor to determine an actual offset of the end effector with respect to the position sensor. Methods of operating the system are provided, as are other aspects.
    Type: Grant
    Filed: June 21, 2011
    Date of Patent: August 18, 2015
    Assignee: Siemens Healthcare Diagnostics Inc.
    Inventors: Glenn Friedman, Thomas Creazzo, Chris Beliveau
  • Patent number: 9038434
    Abstract: In a method for calibrating a star probe of an image measuring machine, the star probe includes one or more probe heads. Probe configuration information for the star probe is configured when there is no probe configuration file of the star probe stored in a storage device of the image measuring machine, and one of the probe heads to be calibrated is selected from the star probe. The method calibrates a radius value of the selected probe head, and calibrates the deviation between the center point of the selected probe head and the focus of the camera lens. The method further generates a star probe model of the star probe according to the probe configuration information and the probe calibration information, and displays the star probe model of the star probe on a display device of the image measuring machine.
    Type: Grant
    Filed: July 23, 2012
    Date of Patent: May 26, 2015
    Assignees: HONG FU JIN PRECISION INDUSTRY (ShenZhen) CO., LTD., HON HAI PRECISION INDUSTRY CO., LTD.
    Inventors: Chih-Kuang Chang, Zheng-Cai She, Zhong-Kui Yuan, Zhi-Jun Zou, Dong-Hai Li
  • Patent number: 9003670
    Abstract: A method for inspecting a surface geometry of a workpiece includes mounting the workpiece to a measurement artifact that includes a plurality of parametric datum features. The parametric datum features may be utilized by a first inspection device and a second inspection device to establish a measurement coordinate system. The surface geometry is measured relative to the measurement coordinate system with the first inspection device to provide first measurement data. The surface geometry is also measured relative to the measurement coordinate system with the second inspection device to provide second measurement data.
    Type: Grant
    Filed: March 8, 2012
    Date of Patent: April 14, 2015
    Assignee: United Technologies Corporation
    Inventor: James Romanelli
  • Patent number: 8973279
    Abstract: A coordinate measuring machine has 1) an anchor beam with a top end and a bottom end, 2) at least one support beam having a top end and a bottom end, and 3) a cross-beam supported on the top ends of both the anchor beam and the at least one support beam. In addition, the coordinate measuring machine also has 4) a base supporting the bottom ends of the anchor beam and the at least one support beam. At least one of the at least one support beams has a first spring and a second spring. In preferred embodiments, the first spring is adapted to allow movement and is spaced from the second spring in a direction that is generally parallel with the longitudinal axis of the cross-beam.
    Type: Grant
    Filed: March 1, 2013
    Date of Patent: March 10, 2015
    Assignee: Hexagon Metrology, Inc.
    Inventors: Gurpreet Singh, John Langlais, Jie Zheng
  • Patent number: 8950078
    Abstract: An apparatus for inspecting a measurement object, comprising a workpiece support for supporting the measurement object and a measuring head carrying an optical sensor. The measuring head and the workpiece support are movable relative to one another. The optical sensor has an objective and a camera designed to capture an image of the measurement object. The objective has a light entrance opening and a light exit opening, and comprises a multitude of lens-element groups arranged in the objective between the light entrance opening and the light exit opening one behind another along a longitudinal axis of the objective. Furthermore, the apparatus has a reflection element and a calibration arrangement. The reflection element can selectively be introduced into a beam path running from the measurement object through the objective to the camera. The calibration arrangement is coupled into the beam path to the camera by means of the reflection element.
    Type: Grant
    Filed: August 6, 2013
    Date of Patent: February 10, 2015
    Assignee: Carl Zeiss Industrielle Messtechnik GmbH
    Inventor: Thomas Engel
  • Patent number: 8949071
    Abstract: According to the present invention, a center deviation amount, which is an amount of deviation (distance) between the center line of a reference measurement target and the detection point is calculated using the reference measurement target having a known diameter, and a measurement value of a diameter of an arbitrary measurement target is corrected using the center deviation amount. Therefore, an accurate diameter value can be calculated even in the case of a measurement target having a diameter value different from the diameter value of the reference measurement target.
    Type: Grant
    Filed: January 12, 2012
    Date of Patent: February 3, 2015
    Assignee: Tokyo Seimitsu Co., Ltd.
    Inventor: Ryo Takanashi
  • Patent number: 8942940
    Abstract: Implementing a portable articulated arm coordinate measuring machine includes receiving a first request to perform a function. The portable AACMM includes a manually positionable articulated arm portion having opposed first and second ends, the arm portion including a plurality of connected arm segments, each arm segment including at least one position transducer for producing a position signal, a measurement device attached to a first end of the AACMM, and an electronic circuit which receives the position signals from the transducers and provides data corresponding to a position of the measurement device.
    Type: Grant
    Filed: January 14, 2011
    Date of Patent: January 27, 2015
    Assignee: Faro Technologies, Inc.
    Inventor: Frederick John York
  • Patent number: 8898918
    Abstract: The invention relates, in particular, to an instrument for measuring length, comprising an inductive sensor comprising an elongate body and a tip that is movable along a longitudinal axis. The body contains windings and defines a first cavity receiving a magnetic core. The instrument further comprises a casing which extends the body along the longitudinal axis, and which defines, together with the body, a second sealed cavity containing the tip. The capacity of the casing to resiliently deform along the longitudinal axis is greater than the capacity of said casing to resiliently deform along axes that are orthogonal to said longitudinal axis.
    Type: Grant
    Filed: August 1, 2012
    Date of Patent: December 2, 2014
    Assignee: Comissariat a l'Energie Atomique et Aux Energies Alternatives
    Inventor: Frédéric Rodiac
  • Patent number: 8832952
    Abstract: Provided is an apparatus for measuring outer diameters of fuel rods of a nuclear fuel assembly, in which the fuel rods are standing upright and are used in a light water reactor. The apparatus includes a support unit fixed to a floor at a lower portion thereof so as to be kept insulated from vibrations caused by external forces, a measuring unit mounted on the support unit and moving up and down to measure the outer diameters of the fuel rods, and a transducer cooperating with the measuring unit, converting the measured outer diameters of the fuel rods into electrical signals, and sending the converted signals to the outside. Thus, the apparatus moves up and down to measure the outer diameters of the fuel rods, so that it can accurately check abnormalities in the outer diameters of the fuel rods.
    Type: Grant
    Filed: December 22, 2011
    Date of Patent: September 16, 2014
    Assignee: Kepco Nuclear Co., Ltd.
    Inventors: Jung Cheol Shin, Soon Ki Kim, Jin Man Joo, Dae Hee Kang
  • Patent number: 8707571
    Abstract: Provided is an apparatus for measuring dimensions of a spacer grid for nuclear fuel assemblies. The apparatus includes a fixing unit fixed to a measuring table placed on a floor and kept insulated from vibrations caused by external force, a measuring unit mounted on the fixing unit and configured so that measuring members are installed on both sides of a rectangular spacer grid and move in forward and backward directions by cylinders while grasping the both sides of the spacer grid, and measure abnormalities in the both sides of the spacer grid, and a displacement measuring unit mounted on one side of the measuring unit and sending the measured abnormalities in the both sides of the spacer grid to the outside.
    Type: Grant
    Filed: December 22, 2011
    Date of Patent: April 29, 2014
    Assignee: Kepco Nuclear Co., Ltd.
    Inventors: Jung Cheol Shin, Yong Gu Han, Eun Hye Kim, Jung Yoon Han
  • Publication number: 20140109419
    Abstract: A profile measuring instrument usable to perform a rotary scanning measurement and a linear scanning measurement on a workpiece in the form of a revolution solid, includes: a turntable on which the workpiece is mounted, the turntable being rotatable around a predetermined rotation axis; a rotary scanning measurement unit being adapted to measure a displacement of a surface of the workpiece mounted on the turntable; a linear scanning measurement unit being adapted to measure a profile of the surface of the workpiece mounted on the turntable along a predetermined measurement axis; and an aligning mechanism being adapted to relatively move the linear scanning measurement unit and the turntable in a direction intersecting with the measurement axis. The linear scanning measurement unit and the turntable are adjusted to relative positions at which the measurement axis passes through the rotation axis.
    Type: Application
    Filed: October 16, 2013
    Publication date: April 24, 2014
    Applicant: MITUTOYO CORPORATION
    Inventors: Hideki Shindo, Yoshiyuki Omori
  • Publication number: 20140109420
    Abstract: A double cone stylus includes a shank and a double cone-shaped tip attached to the tip end of the shank, the double cone-shaped tip being a rotationally symmetric body obtained by rotating a triangle having a base extending along the shank around the shank as the symmetric rotation axis. The double cone stylus allows the shape of an inner wall surface of a measurement object with the inner wall surface retracted from an upper reference plane to be measured from above.
    Type: Application
    Filed: October 17, 2013
    Publication date: April 24, 2014
    Applicant: MITUTOYO CORPORATION
    Inventors: Masaki KURIHARA, Yasuhiro TAKAHAMA, Masanori ARAI, Tomoyuki MIYAZAKI
  • Publication number: 20140096405
    Abstract: A measurement apparatus and corresponding method can be used to measure an absolute diameter of a part in a shop floor environment. A tracker such as a laser tracker monitors a position of a probe end of a measurement arm of the apparatus. The position measured by the laser tracker can be used directly account for errors in the apparatus such as, for example, positioning errors of the measurement arm. The position monitoring of the tracking device eliminates complex apparatus calibrations and calculations used for previous devices.
    Type: Application
    Filed: November 18, 2013
    Publication date: April 10, 2014
    Applicant: Axiam, Inc.
    Inventors: Robert M. Lee, Robert E. Parsons
  • Publication number: 20140059872
    Abstract: A shape measuring machine includes a slider that supports a scanning probe. A scale unit detects a displacement of the slider. A tip sphere displacement detection unit detects a displacement of the tip sphere. A calculation unit includes a correction filter including a first and second filters and an adder, and calculates a measurement value from the displacements of the slider and the tip sphere. The first filter corrects the displacement of the slider based on a frequency transfer characteristic from the scale unit to the tip of the slider. The second filter outputs a value that is obtained by correcting a value corrected by the first filter based on a frequency transfer characteristic from the tip of the slider to the tip sphere as the correction value. The adder outputs a measurement value obtained by adding the correction value and the displacement of the tip sphere.
    Type: Application
    Filed: August 20, 2013
    Publication date: March 6, 2014
    Applicant: MITUTOYO CORPORATION
    Inventors: Hideyuki NAKAGAWA, Nobuhiro ISHIKAWA
  • Patent number: 8661700
    Abstract: The present system, method, article of manufacture, software, and apparatus is an “intelligent” probe system and components thereof and may openly encompass, in at least an embodiment, an embedded IC chip located in an interchangeable probe(s) which offers repeatable, fast, easy, and error free probe swapping on a CMM.
    Type: Grant
    Filed: January 10, 2013
    Date of Patent: March 4, 2014
    Assignee: Faro Technologies, Inc.
    Inventors: Clark H. Briggs, Keith George Macfarlane, Frederick John York, Marc Barber
  • Publication number: 20140041242
    Abstract: An apparatus for inspecting a measurement object, comprising a workpiece support for supporting the measurement object and a measuring head carrying an optical sensor. The measuring head and the workpiece support are movable relative to one another. The optical sensor has an objective and a camera designed to capture an image of the measurement object. The objective has a light entrance opening and a light exit opening, and comprises a multitude of lens-element groups arranged in the objective between the light entrance opening and the light exit opening one behind another along a longitudinal axis of the objective. Furthermore, the apparatus has a reflection element and a calibration arrangement. The reflection element can selectively be introduced into a beam path running from the measurement object through the objective to the camera. The calibration arrangement is coupled into the beam path to the camera by means of the reflection element.
    Type: Application
    Filed: August 6, 2013
    Publication date: February 13, 2014
    Applicant: Carl Zeiss Industrielle Messtechnik GmbH
    Inventor: Thomas ENGEL
  • Patent number: 8635783
    Abstract: A method of determining a correction parameter for use in effecting alignment of a component of a metrological apparatus in at least one direction is described which includes: positioning an artefact on a support surface of a turntable of the metrological apparatus so that a measurement surface of the artefact is asymmetric with respect to a rotation axis of the turntable in the at least one direction; using a measurement probe of the measurement instrument to make a first measurement of the measurement surface; rotating the turntable; using the measurement probe of the measurement instrument to make a second measurement of the measurement surface after rotation of the turntable; and determining a correction parameter from the first and second measurements.
    Type: Grant
    Filed: October 15, 2009
    Date of Patent: January 28, 2014
    Assignee: Taylor Hobson Limited
    Inventors: Ivor McDonnell, Paul James Scott, Daniel Ian Mansfield
  • Publication number: 20130298414
    Abstract: A depth testing device for testing depth of a screw drive includes a supporting assembly which is for supporting the screw, a calibrating assembly, and a testing assembly. The calibrating assembly includes a calibrating element which presses on the top end of the screw. The testing assembly includes a testing device and a testing probe, the testing device includes a testing member and a testing pole stretching relative to the testing member. One end of the testing probe is received in the testing pole. The reading of the testing member is reset to zero first, then the other end of the testing probe is moved and is inserted into the drive of the screw, recording the reading of the testing member. The depth of the drive of the screw is calculated by the test reading subtracted by the thickness of the calibrating element.
    Type: Application
    Filed: March 27, 2013
    Publication date: November 14, 2013
    Applicants: HON HAI PRECISION INDUSTRY CO., LTD., HONG FU JIN PRECISION INDUSTRY (Shenzhen) CO., LTD.
    Inventor: BING-JUN ZHANG
  • Publication number: 20130239421
    Abstract: A calibration frame for calibrating a reference system for vehicle measurement has setting elements, which enable a precise spatial orientation of the calibration frame, and multiple defined points of support, which are designed to accommodate a reference system carrier. In one specific embodiment, the points of support are designed in such a way that the reference system carrier is situatable on the points of support in at least two different orientations. In a second specific embodiment, a leveling element is provided which indicates the spatial orientation of the calibration frame in relation to the earth's gravitation field.
    Type: Application
    Filed: July 20, 2011
    Publication date: September 19, 2013
    Inventors: Darko Pucnik, Christian Wagmann, Jochen Backes, Sven Hodissen, Volker Uffenkamp
  • Publication number: 20130227850
    Abstract: A coordinate measuring machine has 1) an anchor beam with a top end and a bottom end, 2) at least one support beam having a top end and a bottom end, and 3) a cross-beam supported on the top ends of both the anchor beam and the at least one support beam. In addition, the coordinate measuring machine also has 4) a base supporting the bottom ends of the anchor beam and the at least one support beam. At least one of the at least one support beams has a first spring and a second spring. In preferred embodiments, the first spring is adapted to allow movement and is spaced from the second spring in a direction that is generally parallel with the longitudinal axis of the cross-beam.
    Type: Application
    Filed: March 1, 2013
    Publication date: September 5, 2013
    Applicant: HEXAGON METROLOGY, INC.
    Inventors: Gurpreet Singh, John Langlais, Jie Zheng
  • Patent number: 8516709
    Abstract: An apparatus for testing the accuracy of machine tools and measuring devices has a support and at least one reference element formed as a sleeve, wherein the reference element is glued on top of the support.
    Type: Grant
    Filed: October 7, 2010
    Date of Patent: August 27, 2013
    Assignee: Dreier Lasermesstechnik GmbH
    Inventor: Horst Dreier
  • Patent number: 8474147
    Abstract: A method for measuring surface profile of a sample, wherein jumping of a probe can be constrained without applying strong force to the sample, and an apparatus employing such a method. Control operation consists of detection of displacement in a probe in the vertical direction on the top surface of a sample being measured by means of a sensor, calculation of velocity and acceleration of the probe in accordance with detection of the displacement in the probe, detection of jumping of the probe through real-time monitoring of at least either velocity or acceleration of the probe, and a control of the current delivered to a stylus pressure generator for the probe. Such a control operation is performed in a small amount of time, and a stylus pressure applied to the probe is increased only while the probe is in the air, while the stylus pressure applied to the probe is returned to an original pressure before the probe touches the sample again.
    Type: Grant
    Filed: July 11, 2008
    Date of Patent: July 2, 2013
    Assignee: ULVAC, Inc.
    Inventor: Naoki Mizutani
  • Patent number: 8468869
    Abstract: A method of calibrating a group of parameters of an articulated coordinate measuring apparatus includes the use of primary and secondary standard units. These standard units each include one or more calibration reference portions, and the group of parameters include primary and secondary calibration parameters. Space coordinates of each reference portion of the primary standard unit is measured at a plurality of arm positions of the apparatus, and calibration is performed for the primary calibration parameters based on the measurements. Space coordinates of the reference portions of secondary standard unit is then measured and parameter calibration is performed for the secondary calibration parameters based on these measurements.
    Type: Grant
    Filed: May 26, 2008
    Date of Patent: June 25, 2013
    Assignee: Kosaka Laboratory Ltd.
    Inventor: Fumikazu Ebara
  • Patent number: 8448343
    Abstract: An eyeglass lens processing apparatus includes lens chuck shafts, processing tools for processing a lens and processing tool rotating shafts to which the processing tools are attached. A calibration sensor unit for calibrating the eyeglass lens processing apparatus includes: an attachment portion attached to the lens chuck shafts; a contact member contacting the processing tools; a support mechanism configured to movably support the contact member and has an urging member that urges the contact member in a direction separating from the attachment portion; and a sensor that detects the contact of the contact member with the processing tools. The urging member has an urging force by which the processing tool rotating shafts and the lens chuck shafts are not bent to a predetermined tolerance or more when the contact member contacts the processing tools and is moved toward the attachment portion.
    Type: Grant
    Filed: September 29, 2010
    Date of Patent: May 28, 2013
    Assignee: Nidek Co., Ltd.
    Inventor: Yuya Nakako
  • Patent number: 8438745
    Abstract: A tape measure calibrator includes a base with a slot with a pull reference surface and a push reference surface, the slot being configured to receive an end hook of a tape measure. The base also includes a pull calibration band on the base with a centerline of the pull calibration band indicating a first distance from the pull reference surface. The base also includes a push calibration band on the base, a centerline of the push calibration band indicating a second distance from the push reference surface, n which the first distance and the second distance are substantially equal.
    Type: Grant
    Filed: August 18, 2011
    Date of Patent: May 14, 2013
    Inventor: Douglas J. Christiansen
  • Patent number: 8397395
    Abstract: The invention relates to an optical sensor with collision protection for a measurement machine, in particular for a coordinate measurement machine. The optical sensor comprises a sensor-side coupling part for mechanically and optically connecting to the measurement machine, and a sensor element. According to the invention, the sensor comprises a sensor protective coupling as collision protection, said protective coupling comprising a coupling part on the measurement machine side and a coupling part on the sensor element side, wherein a fiber optic cable is routed between the coupling parts of the sensor protective coupling and wherein a fiber optic cable protection element surrounds the fiber optic cable, wherein the ends of the fiber optic cable protection element are fastened to the associated coupling part of the sensor protective coupling.
    Type: Grant
    Filed: August 28, 2009
    Date of Patent: March 19, 2013
    Assignee: Leica Geosystems AG
    Inventors: Thomas Jensen, Frank Saupe, Benjamin Vullioud
  • Publication number: 20130042491
    Abstract: A tape measure calibrator includes a base with a slot with a pull reference surface and a push reference surface, the slot being configured to receive an end hook of a tape measure. The base also includes a pull calibration band on the base with a centerline of the pull calibration band indicating a first distance from the pull reference surface. The base also includes a push calibration band on the base, a centerline of the push calibration band indicating a second distance from the push reference surface, n which the first distance and the second distance are substantially equal.
    Type: Application
    Filed: August 18, 2011
    Publication date: February 21, 2013
    Inventor: DOUGLAS J. CHRISTIANSEN
  • Publication number: 20130008040
    Abstract: Provided is an apparatus for measuring dimensions of a spacer grid for nuclear fuel assemblies. The apparatus includes a fixing unit fixed to a measuring table placed on a floor and kept insulated from vibrations caused by external force, a measuring unit mounted on the fixing unit and configured so that measuring members are installed on both sides of a rectangular spacer grid and move in forward and backward directions by cylinders while grasping the both sides of the spacer grid, and measure abnormalities in the both sides of the spacer grid, and a displacement measuring unit mounted on one side of the measuring unit and sending the measured abnormalities in the both sides of the spacer grid to the outside.
    Type: Application
    Filed: December 22, 2011
    Publication date: January 10, 2013
    Inventors: Jung Cheol Shin, Yong Gu Han, Eun Hye Kim, Jung Yoon Han
  • Publication number: 20130008041
    Abstract: Provided is an apparatus for measuring outer diameters of fuel rods of a nuclear fuel assembly, in which the fuel rods are standing upright and are used in a light water reactor. The apparatus includes a support unit fixed to a floor at a lower portion thereof so as to be kept insulated from vibrations caused by external forces, a measuring unit mounted on the support unit and moving up and down to measure the outer diameters of the fuel rods, and a transducer cooperating with the measuring unit, converting the measured outer diameters of the fuel rods into electrical signals, and sending the converted signals to the outside. Thus, the apparatus moves up and down to measure the outer diameters of the fuel rods, so that it can accurately check abnormalities in the outer diameters of the fuel rods.
    Type: Application
    Filed: December 22, 2011
    Publication date: January 10, 2013
    Inventors: Jung Cheol Shin, Soon Ki Kim, Jin Man Joo, Dae Hee Kang
  • Patent number: 8336219
    Abstract: A method of calibrating a measurement scale in a motorized scanning head using a reference artefact is described. The method comprises the step of rotating a surface sensing device, such as a scanning probe, mounted on the scanning head about at least one axis of the scanning head to move the surface sensing device into a plurality of different angular orientations relative to the reference artefact. A step is then performed of measuring, with the surface sensing device, at least one property of the reference artefact at each of the different angular orientations. An error map or function is then created for at least one measurement scale of the scanning head using the properties of the reference artefact measured and optionally known or calibrated properties of that reference artefact. The method may comprise use of co-ordinate positioning apparatus, such as a co-ordinate measuring machine, to move the scanning head. The reference artefact may comprise a single feature or an array of features.
    Type: Grant
    Filed: June 18, 2008
    Date of Patent: December 25, 2012
    Assignee: Renishaw PLC
    Inventors: Jean-Louis Grzesiak, James Arash Shabani
  • Publication number: 20120246953
    Abstract: The present invention relates to a coordinate measuring machine having a sensor for measuring an object, and having a housing structure for holding and positioning the sensor, wherein a position change sensor is provided in order to detect a change in position of the sensor and of the housing structure. Further, the invention relates to a method for collision detection of a coordinate measuring machine. Last, the invention relates to a method for correcting data of a sensor, measuring in a contactless fashion, in particular an optical sensor, of a coordinate measuring machine. The method according to the second and the third aspects can be executed on a coordinate measuring machine according to the first aspect.
    Type: Application
    Filed: March 29, 2012
    Publication date: October 4, 2012
    Inventor: Thomas ENGEL
  • Patent number: 8266810
    Abstract: A system and method for quick and accurate tramming are disclosed. The system includes an apparatus comprising a plurality of indicators spaced apart in a plane perpendicular to a body shank and connected thereto, the body shank configured to be received into the spindle. The system also includes a calibration device configured to temporarily remain fixed in place on the mill table to provide a single point of calibration for each indicator received in the apparatus. The method includes calibrating the indicators one at a time by positioning an indicator shank tip atop the calibration device and adjusting the indicator to read a calibration value common to all the indicators. The spindle is moved toward the mill table until at least one indicator tip touches the mill table and the mill head is adjusted until all indicator tips touch the mill table and all indicators read the same value.
    Type: Grant
    Filed: November 30, 2010
    Date of Patent: September 18, 2012
    Inventor: Sean Edward Gordon
  • Patent number: 8256126
    Abstract: The present invention relates to a tool holder for adapting a tool to be measured in a measuring arrangement. Such tool holder can, for example, include a spindle or an adapter of a tool presetter to be inserted in such spindle. Furthermore, this invention refers to a measuring arrangement for measuring of tools as well as a method for calibration of such measuring arrangement to a zero-point of the tool.
    Type: Grant
    Filed: October 7, 2010
    Date of Patent: September 4, 2012
    Assignee: NT Tool Corporation
    Inventors: Shuichi Esaka, Shinji Kubo, Katsutoshi Fukagawa
  • Patent number: 8219353
    Abstract: A measurement apparatus calibrated to measure an absolute diameter of a part in a shop floor environment. The measurement apparatus includes a calibration that includes compensation factors for thermal expansion, shifting of measurement parts (arm, support tower, and related laser), and variances of these parts. The resulting measurements report an absolute diameter of a part to a higher degree of accuracy than previously possible. Also, the calculated compensation factor eliminate the need for an isolated, climate-controlled measurement room.
    Type: Grant
    Filed: January 28, 2010
    Date of Patent: July 10, 2012
    Assignee: Axiam, Inc.
    Inventors: Robert M. Lee, Robert E. Parsons
  • Patent number: 8214080
    Abstract: A method to compensate geometrical errors in processing machines, in which a workpiece holder (8) is arranged such that it can be adjusted on the basis of measurement signals that have been received by being able to be rotated relative to a fixture (9) in the processing machine to which the workpiece holder is attached. A method for the alignment of a workpiece in processing machines, and an arrangement for the realization of the method are disclosed. The arrangement includes a workpiece holder (8), the angle of which relative to a fixture (9) in the processing machine to which the workpiece holder (8) is connected can be adjusted.
    Type: Grant
    Filed: November 16, 2007
    Date of Patent: July 3, 2012
    Assignee: Hexagon Metrology AB
    Inventor: Bo Petterson
  • Publication number: 20120066922
    Abstract: An apparatus for testing the accuracy of machine tools and measuring devices has a support and at least one reference element formed as a sleeve, wherein the reference element is glued on top of the support.
    Type: Application
    Filed: October 7, 2010
    Publication date: March 22, 2012
    Applicant: Dreier Lasermesstechnik GmbH
    Inventor: Horst DREIER
  • Publication number: 20120066923
    Abstract: A method of operating an articulated arm CMM is provided. Instructions for the CMM can be inputted to the CMM arm by an action chosen from the group consisting of placing the arm in a predefined position and moving the arm in a predefined manner.
    Type: Application
    Filed: November 28, 2011
    Publication date: March 22, 2012
    Applicant: HEXAGON METROLOGY AB
    Inventors: Laurent Desforges, Jean-Paul Delemos
  • Patent number: 8132335
    Abstract: An apparatus for checking the accuracy of a circular path of a work spindle or a machine table, in particular an NC-controlled machine tool, includes a clamping element coaxial with the work spindle, a first rotary bearing disposed on the clamping element and coaxial with the rotation axis of the work spindle, a measurement arm with a first pivot bearing having a first pivot axis orthogonal to the rotation axis of the clamping element, a length measurement system disposed in measurement arm with a glass rod with a marking and a reading device, an adjusting device receiving the measurement arm and having a second pivot bearing with a pivot axis aligned parallel to the first pivot axis, a second rotary bearing having a second rotation axis aligned parallel to the rotation axis of the work spindle, and a stator supporting the second rotary bearing.
    Type: Grant
    Filed: October 12, 2010
    Date of Patent: March 13, 2012
    Assignee: Dreier Lasermesstechnik GmbH
    Inventor: Horst Dreier
  • Patent number: 8122610
    Abstract: Apparatus, systems and methods for an improved probe for a coordinate measurement machine (PCMM) is disclosed herein. The probe comprises a machine readable unique serial number, which the PCMM can read from the probe to identify the probe and obtain information relating to calibration of the probe by matching the unique serial number with unique serial number stored with the information relating calibration. The coordinate information device further comprises modules configured to store and provide the machine readable unique serial number, and also information relating to calibrating the probe.
    Type: Grant
    Filed: March 28, 2008
    Date of Patent: February 28, 2012
    Assignee: Hexagon Metrology, Inc.
    Inventors: Hogar Tait, Brian Frohlich
  • Patent number: 8065810
    Abstract: Elongation measurement apparatuses and systems comprise at least two Linear Variable Differential Transformers (LVDTs) with a push rod coupled to each of the at least two LVDTs at one longitudinal end thereof. At least one push rod extends to a base and is coupled thereto at an opposing longitudinal end, and at least one other push rod extends to a location spaced apart from the base and is configured to receive a sample between an opposing longitudinal end of the at least one other push rod and the base. Nuclear reactors comprising such apparatuses and systems and methods of measuring elongation of a material are also disclosed.
    Type: Grant
    Filed: April 7, 2009
    Date of Patent: November 29, 2011
    Assignee: Battelle Energy Alliance, LLC
    Inventors: Joy L. Rempe, Darrell L. Knudson, Joshua E. Daw, Keith G. Condie, Carl M. Stoots
  • Patent number: 8061052
    Abstract: The present invention relates to an “S” shaped detection test piece for comprehensively detecting the precision of the numerical control milling machine and the detection method thereof. The detection test piece consists of an “S” shaped equal thickness edge strip (1) and a rectangular base (2), respectively forming two “S” shaped curves in two different planes and the projections of which in the base plane (3) cross each other and have open and close angle (?) states formed at the intersection.
    Type: Grant
    Filed: January 11, 2008
    Date of Patent: November 22, 2011
    Assignee: Chengdu Aircraft Industrial (Group) Co., Ltd.
    Inventors: Zhiyong Song, Yawen Cui
  • Patent number: 8051575
    Abstract: A scale-bar artifact can include a base, a structural component, at least two nests disposed on the structural component and configured to receive a spherically shaped object having a center, and at least three mounting assemblies, each mounting assembly including a first portion and a second portion. The second portion of each mounting assembly is coupled to the base. The first portion of each mounting assembly is coupled to the structural component. The first portion and second portion of each mounting assembly are in mutual contact. Each mounting assembly has a center of rotation. The centers of rotation of the three mounting assemblies share a common plane with the centers of the spherically shaped objects.
    Type: Grant
    Filed: October 19, 2010
    Date of Patent: November 8, 2011
    Assignee: Faro Technologies, Inc.
    Inventors: Robert E. Bridges, Richard D. Lort, III
  • Publication number: 20110258867
    Abstract: A method of determining a correction parameter for use in effecting alignment of a component of a metrological apparatus in at least one direction is described which includes: positioning an artefact on a support surface of a turntable of the metrological apparatus so that a measurement surface of the artefact is asymmetric with respect to a rotation axis of the turntable in the at least one direction; using a measurement probe of the measurement instrument to make a first measurement of the measurement surface; rotating the turntable; using the measurement probe of the measurement instrument to make a second measurement of the measurement surface after rotation of the turntable; and determining a correction parameter from the first and second measurements.
    Type: Application
    Filed: October 15, 2009
    Publication date: October 27, 2011
    Applicant: Taylor Hobson Limited
    Inventors: Ivor McDonnell, Paul James Scott, Daniel Ian Mansfield
  • Publication number: 20110253499
    Abstract: A sintered coupling ring (1) is described, comprising a ring of coupling teeth (2) which comprise relieved flanks (4) extending from wedge-shaped end faces (3) and, on the side opposite the wedge-shaped end faces (3), a stop (5) that protrudes radially beyond the tooth tip (6). In order to provide advantageous constructional conditions it is proposed that the stops (5) have a greater density than the remaining tooth tip (6).
    Type: Application
    Filed: October 6, 2010
    Publication date: October 20, 2011
    Applicant: Miba Sinter Austria GmbH
    Inventors: Christian Kronberger, Horst Roessler, Christian Sandner
  • Patent number: 8024867
    Abstract: A tape measure calibrator includes a base with a first reference surface and a second reference surface. A pull calibration mark is made on the base which indicates a first distance from the first reference surface. A push calibration mark is also made on the base which indicates a second distance from the second reference surface, in which the first distance and the second distance are substantially equal.
    Type: Grant
    Filed: July 17, 2009
    Date of Patent: September 27, 2011
    Inventor: Douglas J. Christiansen
  • Publication number: 20110178755
    Abstract: Implementing a portable articulated arm coordinate measuring machine includes receiving a first request to perform a function. The portable AACMM includes a manually positionable articulated arm portion having opposed first and second ends, the arm portion including a plurality of connected arm segments, each arm segment including at least one position transducer for producing a position signal, a measurement device attached to a first end of the AACMM, and an electronic circuit which receives the position signals from the transducers and provides data corresponding to a position of the measurement device.
    Type: Application
    Filed: January 14, 2011
    Publication date: July 21, 2011
    Applicant: FARO TECHNOLOGIES, INC.
    Inventor: Frederick John York
  • Patent number: 7971364
    Abstract: The invention relates to a monitoring device (20) of the position of an assembly containing nuclear fuel (4) in a housing of a storage basket (2). According to the invention, it comprises at least one mobile stop device (24, 26, 28) and a position indicator (30) suitable for being held at a stop by the mobile stop device in a first position indicating that the assembly occupies a first position, said mobile stop device being arranged so as to be able to be placed, by means of contact with the assembly located in a second position in its housing, in a position enabling it to release the position indicator devised to move automatically from the first position to a second position indicating that the assembly occupies the second position.
    Type: Grant
    Filed: June 29, 2006
    Date of Patent: July 5, 2011
    Assignee: TN International
    Inventor: Roger Lahille
  • Publication number: 20110107611
    Abstract: A method of operating an articulated arm CMM is provided. Instructions for the CMM can be inputted to the CMM arm by an action chosen from the group consisting of placing the arm in a predefined position and moving the arm in a predefined manner.
    Type: Application
    Filed: March 26, 2010
    Publication date: May 12, 2011
    Applicant: HEXAGON METROLOGY AB
    Inventors: Laurent Desforges, Jean-Paul Delemos
  • Publication number: 20110088271
    Abstract: A scale-bar artifact can include a base, a structural component, at least two nests disposed on the structural component and configured to receive a spherically shaped object having a center, and at least three mounting assemblies, each mounting assembly including a first portion and a second portion. The second portion of each mounting assembly is coupled to the base. The first portion of each mounting assembly is coupled to the structural component. The first portion and second portion of each mounting assembly are in mutual contact. Each mounting assembly has a center of rotation. The centers of rotation of the three mounting assemblies share a common plane with the centers of the spherically shaped objects.
    Type: Application
    Filed: October 19, 2010
    Publication date: April 21, 2011
    Applicant: FARO TECHNOLOGIES, INC.
    Inventor: Robert E. Bridges