With Recording Of Contact Member Position At Each Point On The Article Patents (Class 33/554)
  • Patent number: 6260000
    Abstract: When the user inputs at least four points that designates the path on the surface of a three-dimensional shape represented by three-dimensional shape data, groups of three points in which two points are commonly included in two groups are formed from the input points. Each group of three points defines a plane including the three points. The line of intersection of each plane and the surface of the three-dimensional shape is obtained to calculate lengths of the line of intersection between the adjacent two points of the three points in each of the groups. Two lengths between the two points that are commonly included in two groups along two different lines of intersection are obtained for one length of the path between the two points. As a result, the average of the two lengths is estimated as the length of the path between the two points. The total length of the path is obtained according to the estimated lengths and lengths along lines of intersection.
    Type: Grant
    Filed: November 4, 1998
    Date of Patent: July 10, 2001
    Assignee: Minolta Co., Ltd.
    Inventors: Toshihiko Karasaki, Shigenobu Fukushima
  • Patent number: 6209217
    Abstract: A surface-following type measuring machine is provided, which is capable of setting the measuring force to a proper value in an efficient and accurate manner without imposing a burden on the operator in exchanging at least one of the stylus and stylus holder according to the surface contour of an object to be measured. A main body is disposed for movement relative to an object to be measured. A measuring arm is supported by the main body for displacement relative thereto, and carries at one end thereof a stylus holder and a stylus in a manner permitting replacement of the stylus holder and the stylus. Displacement of the measuring arm is detected by a displacement detecting device. The measuring force acting upon the measuring arm is adjusted by a measuring force adjusting device. A memory stores a measuring force command value table having a plurality of command values of the measuring force corresponding respectively to combinations of plural kinds of the stylus holder and plural kinds of the stylus.
    Type: Grant
    Filed: August 23, 1999
    Date of Patent: April 3, 2001
    Assignee: Mitutoyo Corporation
    Inventors: Atsushi Tsuruta, Shuuzou Ueno
  • Patent number: 6164124
    Abstract: A surface property measuring device comprises a detector having a stylus for measuring surface property and a skid at a leading end thereof, and a driving mechanism for causing the detector to advance and retreat along a surface to be measured. The measuring device further comprises a detector-lifting plate having an engaging portion engaging with a protrusion of a connector housing when the detector retreats to the utmost. The detecting-lifting plate is fixed to a frame of the driving mechanism, for lifting the leading end of the detector to thereby separate the skid and the stylus from the surface to be measured when the detector retreats. This enables the surface to be measured, a nose, the stylus, and the skid which protrude from the detector, to be protected when arranging the measurement and also removing the measuring device after the measurement.
    Type: Grant
    Filed: December 15, 1998
    Date of Patent: December 26, 2000
    Assignee: Mitutoyo Corporation
    Inventors: Nobuyoshi Fujii, Tamenori Shirai
  • Patent number: 6108924
    Abstract: An inspection apparatus for inspecting a funnel assembly of a CRT which includes a glass funnel and a glass neck attached to the vertex of the funnel and an inspection method therefor, are provided. The inspection apparatus includes a frame having a support platform for supporting the funnel assembly with the neck directed upwards, a location setting unit for maintaining the funnel at a predetermined reference location on the support platform, a detection unit which is movably installed in the frame in radial direction with respect to the axis of the neck, including a plurality of probes each for contacting the outer surface of the neck to generate a signal, and a controller for controlling a movement of the probes and estimating a geometrical state of the neck with respect to the funnel based on the signal supplied from each of the probes. Thus, a geometrical state of a neck with respect to a funnel can he accurately estimated.
    Type: Grant
    Filed: June 16, 1998
    Date of Patent: August 29, 2000
    Assignee: Hankuk Electric Glass Co., Ltd.
    Inventors: Byung Wug Jang, Moon Sun Jeong
  • Patent number: 6101700
    Abstract: An apparatus and method for manufacturing laminated parts from a plurality of laminas, in which the laminas for forming the laminated parts are blanked from strip stock material. The laminas and are then cut and stacked to form the laminated part. The apparatus includes a measuring device placed with the die element of the press, for accurately measuring the thickness of successive sections of the strip stock. A controller, such as a computer or a programmable logic controller, receives the thickness value of the strip stock sections from the measuring device. Means are also included which is activated by the controller to provide a compensation adjustment at selected locations upon the strip stock sections to counteract the measured thickness variations, and to control the stack height.
    Type: Grant
    Filed: December 29, 1998
    Date of Patent: August 15, 2000
    Assignee: Oberg Industries, Inc.
    Inventors: John F. Powell, II, William Burdett, Samuel A. Rummel
  • Patent number: 6067720
    Abstract: A method for determining a torsional structure in the surface roughness of a finished shaft journal includes making a plurality of axial scores on a circumferential strip of the shaft journal, with a high axial measurement point density at different but exactly known circumferential positions as well as with exactly known axial positions. The individual local roughness profiles are printed out in a close sequence with respect to one another corresponding to their positions. The measurement charts are raised or elongated in the radial and axial directions and upset in the circumferential direction. Thus, a topography with multidimensional affinity showing the microstructure of the surface in three dimensions in a diagonal view is obtained. An autocorrelation function is formed from this topography, stochastic elements are eliminated, and a surface topography is obtained that essentially contains only the periodic elements.
    Type: Grant
    Filed: September 14, 1998
    Date of Patent: May 30, 2000
    Assignee: DaimlerChrysler AG
    Inventors: Robert Heilbronner, Norbert Rau, Michael Seibold
  • Patent number: 6041512
    Abstract: An apparatus for measuring sidewall thickness of a container includes a support coupled to a first motor for holding the container in stationary position while rotating the container about its axis. A gauge mechanism engages opposed interior and exterior points on the sidewall of the container, and provides an electrical signal as a function of sidewall thickness between such points. A second motor is coupled to the gauge mechanism for moving the gauge mechanism in the direction of the container axis. A controller is coupled to the first and second motors, and is responsive to the electrical signal from the gauge mechanism for obtaining and storing a three-dimensional data map of sidewall thickness at increments of motion of both the first and second motors. Thus, there is provided thickness data related to angular orientation and axial position, which can then be analyzed to identify specific problems associated with container manufacture.
    Type: Grant
    Filed: January 9, 1998
    Date of Patent: March 28, 2000
    Assignee: Owens-Brockway Glass Container Inc.
    Inventor: Robert S. Wacke
  • Patent number: 6032377
    Abstract: A non-spherical surface shape measuring device and method that measures the shapes of object surfaces that have rotationally symmetrical non-spherical surface shapes on the basis of relative deviation values from the shape of a reference surface, the non-spherical surface shape measuring device includes a measuring means for obtaining relative deviation values between a reference surface and an object surface by measuring corresponding sampling points on the surfaces of the reference surface and the object surface and storing predetermined coefficients of variables prior to measurement. A first operating means approximates the partial differential coefficients for the predetermined variables and models the relative displacement, between the object surface and the reference surface and the XY-coordinates of the sampling points, into functional equivalents of the partial differential coefficients.
    Type: Grant
    Filed: January 7, 1998
    Date of Patent: March 7, 2000
    Assignee: Nikon Corporation
    Inventors: Hajime Ichikawa, Takahiro Yamamoto
  • Patent number: 6026583
    Abstract: A shape measuring apparatus includes an object measuring device, a holding base, a reference plane measuring device, and a length measuring unit. The holding base holds an object-to-be-measured on its surface and has a reference plane provided on its back side so that a measured surface of the object and the reference plane can be simultaneously scanned by the object measuring device and the reference plane measuring device, respectively. Therefore, the object and the reference plane can sway integrally with each other, and the accuracy of measurement of the measured surface is not influenced by any moving straightness deviation of the holding base unless any change occurs in relative positions of the reference plane and the measured surface. Therefore, the shape of the measured surface can be measured with the flatness accuracy of the reference plane.
    Type: Grant
    Filed: December 10, 1997
    Date of Patent: February 22, 2000
    Assignee: Matsushita Electric Industrial Co., Ltd.
    Inventors: Keiichi Yoshizumi, Hiroyuki Takeuchi, Keishi Kubo, Yukio Imada, Koji Handa
  • Patent number: 6029077
    Abstract: An apparatus for determining the perimeter of an object being scanned comprises a movable arm adapted to follow the surface of an object being scanned as the arm is orbited around the object; the arm having one end being adapted to maintain contact with the surface as the arm is orbited around the object; and an encoder operably connected to the arm for determining the movement of the lever arm at each angular position around the object. An opaque cup is positioned at one end of the lever arm immediately over a point on said surface at which a laser beam impinges on the surface of the object being scanned such that reflection from the surface is retained within the cup.
    Type: Grant
    Filed: November 6, 1997
    Date of Patent: February 22, 2000
    Assignee: Imaging Diagnostic Systems, Inc.
    Inventors: Robert H. Wake, Richard J. Grable, David P. Rohler
  • Patent number: 5974679
    Abstract: A pad profiler has a three-point mount support the profiler above a polishing pad. A slider assembly is supported on a guide, and a sensor is connected to the slider assembly and positioned over a diametric segment of the polishing pad. The profiler uses a lead screw to drive the slider assembly across the polishing pad. The advantages of the invention include the measurement of the thickness of polishing pad to optimize polishing process parameters or to select a conditioning process. Additional advantages include stable support of the profiler over the pad, and smooth motion of the sensor along a radius of the pad.
    Type: Grant
    Filed: March 1, 1999
    Date of Patent: November 2, 1999
    Assignee: Applied Materials, Inc.
    Inventors: Manoocher Birang, Arnold Aronsen
  • Patent number: 5926781
    Abstract: A roundness measuring machine is described which measures the position of the surface of an object as the object is rotated on a turntable. The machine determines the circle which is the best fit to the measured points and converts the measurements to distances from the best fit circle. An improved algorithm for determining the best fit circle is used in place of the limacon fit. Calculated differences between the measured surface position and the best fit circle are corrected for the effect of measuring the difference in the direction towards the center of rotation of the turntable instead of in the direction towards the center of the circle. Data values are calculated representing points at equal angles around the center of the best fit circle rather than equal angles around the center of rotation of the turntable. The improved accuracy of correction allows the machine to tolerate greater eccentricity of the workplace relative to the turntable, reducing the necessity for accurate centering of the workpiece.
    Type: Grant
    Filed: May 28, 1997
    Date of Patent: July 20, 1999
    Assignee: Taylor Hobson Limited
    Inventor: Paul James Scott
  • Patent number: 5875559
    Abstract: A pad profiler has a three-point mount support the profiler above a polishing pad. A slider assembly is supported on a guide, and a sensor is connected to the slider assembly and positioned over a diametric segment of the polishing pad. The profiler uses a lead screw to drive the slider assembly across the polishing pad. The advantages of the invention include the measurement of the thickness of polishing pad to optimize polishing process parameters or to select a conditioning process. Additional advantages include stable support of the profiler over the pad, and smooth motion of the sensor along a radius of the pad.
    Type: Grant
    Filed: October 27, 1995
    Date of Patent: March 2, 1999
    Assignee: Applied Materials, Inc.
    Inventors: Manoocher Birang, Arnold Aronsen
  • Patent number: 5870833
    Abstract: A container measuring device for measuring minimum and maximum diameters and the ovality of a container finish includes a seat for receiving the container finish and a gauge for measuring the minimum and maximum diameters. The measuring device is balanced on the container with the container finish received in the seat and the measuring device is then rotated to determine the dimensions of the container finish. An adjustable counterweight may be used to balance the measuring device on the container finish. Preferably, the minimum and maximum diameters are recorded by the gauge and transmitted from the gauge to a computer for a determination of whether the container finish dimensions fall within a predetermined tolerance range.
    Type: Grant
    Filed: August 6, 1997
    Date of Patent: February 16, 1999
    Assignee: Clorox Company
    Inventors: Frederick Van Bebber, deceased, John F. Breznock, Terry L. Calhoun, Ronald E. Heiskell, Ezra A. Theys
  • Patent number: 5778551
    Abstract: For roughness measurements, a passive roughness probe 118 having a probe tip 119 is exchanged into the measuring probe head of the coordinate measuring apparatus in lieu of the probe pin having a probe ball which is otherwise used to make coordinate measurements. The generation of the measurement points takes place while using the already available measured value transducers 23 in the probe head of the coordinate measuring apparatus. The desired surface characteristic variables are computed from the stored quasi-analog measured point sequence with the aid of a corresponding software module.
    Type: Grant
    Filed: March 11, 1996
    Date of Patent: July 14, 1998
    Assignee: Carl-Zeiss-Stiftung
    Inventors: Henrik Herklotz, Thomas Arndt, Rainer Ohnheiser, Karl Schepperle
  • Patent number: 5740616
    Abstract: A portable metrological instrument for measuring surface finish parameters has a main housing which sits on a workbench. A slidable arm can be extended or retracted over the bench so as to move a stylus over a workpiece. The stylus is fitted to a gauge mounted to the end of the arm. The mounting includes a vertically movable slider which incorporates a mechanism for lifting the stylus away from the workpiece and lowering it back. The operation of the instrument is controlled by modular software which can be reprogrammed using an external device, and the machine is operated by a control panel on the housing or by an identical control panel on a remote controller. The gauge includes an inductive sensor, and the associated circuit includes automatically adjustable error canceling devices. The control system uses the sensed position of the arm to estimate the speed of the motor which drives the arm, avoiding the need for a shaft encoder on the motor.
    Type: Grant
    Filed: May 12, 1995
    Date of Patent: April 21, 1998
    Assignee: Taylor Hobson Limited
    Inventors: Peter Seddon, Alan John Coleman, Dean Onyon, Trevor Dixey
  • Patent number: 5735055
    Abstract: A method and apparatus are disclosed for measuring the thickness of an article having upper and lower surfaces and substantial length and width dimensions, such as a sheet or plate of aluminum or another metal. A table is provided for supporting the article, and one or more openings across the length and width of the table provide access to the lower surface of the article. The table has a plurality of thickness references, each of which has an upper and a lower surface, and the thickness references are spaced across the width of the table at or near a first end. A plurality of pairs of opposed sensors are mounted at spaced intervals on a carriage that extends across the width of the table and is adapted for movement in the longitudinal direction of the table. A first member of each pair of sensors is disposed above the level of the supporting surface of the table opposite a second member that is disposed therebelow.
    Type: Grant
    Filed: April 23, 1996
    Date of Patent: April 7, 1998
    Assignee: Aluminum Company of America
    Inventors: David E. Hochbein, Craig J. Kerney
  • Patent number: 5691904
    Abstract: The proposal is for a process and device making it possible to determine the condition of one or more machines (3) at several measuring points by means of a measuring head (MK) with measurement transducers (MW) which can be releasably fitted there and to supply to a computer the relevant measurement signal together with the characteristic data therefore obtained at the measuring point concerned. The invention lies in the special nature of the obtaining of the characteristic data.
    Type: Grant
    Filed: February 22, 1995
    Date of Patent: November 25, 1997
    Assignee: Pruftechnik Dieter Busch AG
    Inventor: Heinrich Lysen
  • Patent number: 5535143
    Abstract: A rolling digital surface measurement apparatus which measures and records the second elevation differences between a plurality of sequentially oriented, regularly spaced, co-linear points which lie on the surface, and which then computes the elevations of those points relative to a datum line established relative to any two points in the sequence by assuming that the mean curvatures of the tested surface are equal to zero in order to remove the inevitable effects of error compounding.
    Type: Grant
    Filed: December 15, 1993
    Date of Patent: July 9, 1996
    Inventor: Allen Face
  • Patent number: 5465496
    Abstract: A measuring system for measuring dimensions of an article such as a bottle has two opposed measuring heads each having a measuring probe, a contact identifying trigger operated by the probe, a base upon which the article to be measured stands, and first and second stepper motor assemblies. The stepper motor assemblies move the measuring heads horizontally and vertically. The base is angularly movable about an axis normal to the plane of the base so as to rotate an article standing on the base so that the different parts of the article are brought into a measuring plane defined as the plane in which the measuring heads move. The measuring probes then measure that part of the article lying in the measuring plane.
    Type: Grant
    Filed: February 10, 1994
    Date of Patent: November 14, 1995
    Assignee: System E. Controls Limited
    Inventor: Allan Axon
  • Patent number: 5309646
    Abstract: The invention provides a system, method, and computer program for automatically evaluating the linear displacement and inclination of the centerline of a piece of hardware to be machined on a computer numerically controlled (CNC) machine relative to an axis of rotation of the machine about which the hardware will be rotated. The invention also provides a compensation for correcting for any hardware axis misalignment.
    Type: Grant
    Filed: March 29, 1993
    Date of Patent: May 10, 1994
    Assignee: General Electric Company
    Inventors: James E. Randolph, Jr., R. David Hemmerle
  • Patent number: 5276974
    Abstract: A unit for measuring shape defects of a part includes an installation plane (1), a presentation unit (2) receiving part to be measured, a measuring machine (10) mobile along three axes (X,Y,Z) and equipped with a sensor (17), and a computer (20). The sensor continuously follows the shape of the part, the variations recorded by the sensor determining a fourth axis (W). Shape deviations are displayed based upon the instantaneous acquisition of the four measuring displacements.
    Type: Grant
    Filed: May 30, 1991
    Date of Patent: January 11, 1994
    Assignee: Regie Nationale des Usines Renault, Societe Anonyme
    Inventors: Antoine Chanoni, Alain Hourdel, Gerard Villette
  • Patent number: 5245864
    Abstract: A mechanism for scanning the contour of a tri-dimensional body including control circuitry for processing and storing the pattern data obtained. The contour pattern is measured by using contour follower members that radially slide between the two arms of a scan rotor assembly that is driven by a reference step motor. Coaxially aligned phase disks are rotably and slidably mounted over outer slots on the outer periphery of the arms and a linkage mechanism is pivotally mounted on one end to a predetermined point in the phase disk and the other end to the contour follower member. The phase disks are slowed down by frictional force applied to the phase disks and this slowing down force is overcome by the contour follower once it comes in contact with the reference body. The phase angle difference between the phase disks and the referenced step motor rotation is measured, processed and stored for subsequent pattern matching with the use of a microprocessor.
    Type: Grant
    Filed: July 3, 1991
    Date of Patent: September 21, 1993
    Inventor: Luis R. Sanchez
  • Patent number: 5189806
    Abstract: A method of scanning a workpiece surface is disclosed in which a machine carrying a scanning head is moved along a path, preferably at constant velocity, while a surface contacting device is moved by the scanning head to oscillate transversely to the instantaneous path direction to scan an area of the surface. Transducers on the machine, the head, and where necessary the surface contacting device provide data relating to the positions of the surface contacting device to data gathering device under the control of a computer. Apparatus for carrying out the method is also disclosed and includes a scanning head for moving the surface detecting device which may be a stylus or a probe relative to one axis, and preferably orthogonal axes. The head can include a set-up for inertia balancing the head and mass balancing the surface detection device. Also the head may include air bearings on which the stylus or probe are supported for oscillation.
    Type: Grant
    Filed: August 17, 1992
    Date of Patent: March 2, 1993
    Assignee: Renishaw plc
    Inventors: David R. McMurtry, Brian C. R. Henning
  • Patent number: 5155694
    Abstract: An apparatus for measuring groove positions of a workpiece includes a sensor for detecting grooves formed on the workpiece and a position sensor for detecting angular position of the workpiece with respect to a predetermined standard position, a measuring cycle memory means for storing several predetermined measuring cycles, a data input means for imputting and storing groove data indicating groove shape, a measuring control means for selecting a specific measurement cycle from the measurement cycle memory means based on the groove data to execute selected measurement cycle, a calculation processing means for executing calculation processing for determining the center positions of grooves, and a data output means for outputting and displaying the results of the calculations in order to inform an operator of the center positions of the grooves.
    Type: Grant
    Filed: October 30, 1990
    Date of Patent: October 13, 1992
    Assignee: Toyoda Koki Kabushiki Kaisha
    Inventors: Takao Yoneda, Norio Ohta, Hiroshi Nakano, Hisashi Nakamura, Yasuyuki Sato
  • Patent number: 5151870
    Abstract: An object is positioned in fixed relation to a measuring axis without regard to centering the object on the axis and at least one series of data samples correlated to the distance between the measuring axis and a series of points located at angularly spaced intervals on at least one surface feature of the object are generated and stored. To determine the center of a first surface feature, the corresponding series of samples is analyzed to identify samples therein corresponding to points lying on a maximum inscribed circle whose center corresponds to that of the surface feature. To measure a second surface feature of an object with reference to the center of a first surface feature thereof, a first signal and a second signal correlated to the distance between the measuring axis and points on the first surface feature and second surface feature, respectively are generated.
    Type: Grant
    Filed: November 17, 1989
    Date of Patent: September 29, 1992
    Assignee: Illinois Tool Works Inc.
    Inventors: James C. Beebe, Barry D. Cargould, David W. Lees, Sr.
  • Patent number: 5121550
    Abstract: A device for tracing a surface such as one defining the lens opening of an eyeglass frame includes a tracer element moved automatically about a rotational axis surrounded by the traced surface and arranged perpendicularly to the area enclosed by the surface. As this rotation occurs a carrier for the tracer element is moved along a second axis extending perpendicularly to the rotational axis in response to a position error signal developed by the tracer element to maintain the position error signal at a substantially zero value through the use of feedback circuitry. The positions of the carrier about the rotational axis and along the second axis are repeatedly captured during the tracing movement to provide point data defining the shape of the traced surface. Results are a smooth steady movement of the tracer element along the surface with a minimum amount of force being exerted on the traced surface by the tracer element.
    Type: Grant
    Filed: December 3, 1990
    Date of Patent: June 16, 1992
    Assignee: Gerber Optial, Inc.
    Inventors: Kenneth O. Wood, Jeffrey Murray, Robert J. Pavone
  • Patent number: 5095638
    Abstract: A portable measuring system for making a series of thickness measurements of a material such as an aircraft skin and for determining therefrom the sizes and quantities of standard size fasteners required for fastening the material. For each measurement, a fixed probe is inserted through a hole in the material so as to engage an inner surface of the material, and a slidable probe engages an outer surface of the material to measure the material's thickness. Each measurement is compared to a table stored in associated data processing equipment to relate the measured thickness to the applicable standard fastener size. The sizes and numbers of standard fasteners required are accumulated over the series of measurements and displayed to the user.
    Type: Grant
    Filed: October 5, 1990
    Date of Patent: March 17, 1992
    Assignee: Northrop Corporation
    Inventors: Donald W. David, Stephen A. Montero
  • Patent number: 5047966
    Abstract: A coordinate measuring machine is used to extract data points from an airfoil surface. The machine is controlled to move a probe to desired points by a generic program applicable to any airfoil and a nominal data file specific to the type of airfoil being measured containing coordinates of desired data points, surface normal vectors and optional machine control instructions arranged in the order of usage. The program reads the data file and predicts the location of corresponding data points on the surface from the file data and deviation information available from already-sampled data points on the blade. An analysis program accepts the data points, mathematically reconstructs portions of the airfoil and measures dimensions from those portions. The dimensions are compared to tolerances read from another file specific to the airfoil type.
    Type: Grant
    Filed: May 22, 1989
    Date of Patent: September 10, 1991
    Assignee: Airfoil Textron Inc.
    Inventors: Kevin H. Crow, Melvin L. Morris, William F. Derouchie, Dan W. Prevost
  • Patent number: 4989338
    Abstract: A method of inspecting V-shaped grooves carried out in the following steps. Coordinates of points more than 20 per groove on a substrate formed with V-shaped grooves are measured with a stylus moving in directions perpendicular to longitudinal directions of the grooves. Measured data within distances at least 10 .mu.m from edges and groove bottoms of the grooves are removed from all data to find effective measuring segments. Shapes formed by straight lines are then calculated on the basis of the remaining data on effective measuring segments having a length of more than 40 .mu.m. A method of working V-shaped grooves is effected in the following steps. A circle having a diameter substantially equal to that of fibers to be supported in the groove is so drawn that the circle is inscribed in an interior of a V-shaped groove calculated by the above method.
    Type: Grant
    Filed: September 28, 1989
    Date of Patent: February 5, 1991
    Assignee: NGK Insulators, Ltd.
    Inventors: Hiroyuki Tsuji, Susumu Nomoto, Takashi Ota
  • Patent number: 4914828
    Abstract: A method and apparatus for measuring surface irregularities on articles such as curved automotive glass are provided wherein two contact points on a sensor head establish a chord at a segment of the surface and a probe measures the distance of the surface from the chord between the contact points, thereby permitting calculation of the local radius of curvature as the surface is scanned.
    Type: Grant
    Filed: August 9, 1988
    Date of Patent: April 10, 1990
    Assignee: PPG Industries, Inc.
    Inventors: Robert J. Fiedor, Aloysius W. Farabaugh
  • Patent number: 4914827
    Abstract: A plurality of adjustable feelers are mounted to a gage head in front of relatively delicate sensing fingers. The feelers will contact the part before the sensing fingers in the event of part abnormality or improper positioning of the part within the gaging apparatus. In such manner, further movement of the gage head relative to the part can be stopped before the sensing fingers crash into the part thereby preventing damage to them.
    Type: Grant
    Filed: December 28, 1988
    Date of Patent: April 10, 1990
    Assignee: GTE Valenite Corporation
    Inventor: Kenneth J. Cook
  • Patent number: 4706360
    Abstract: A thread gage for use with a threading machine for automatically and quickly gaging a thread after it is formed. A stylus support is mounted on the machine turret for placement of the stylus in position for movement axially of the thread to follow the thread contour. The stylus is connected to a transducer. The machine computer control may be programmed to receive signals from the transducer indicative of radial position of the stylus tip and signals relative to axial position of the turret indicative of axial position of the stylus tip to form a digital model of the thread which may then be compared to a standard thread and/or used to make adaptive threading machine offsets.
    Type: Grant
    Filed: May 13, 1986
    Date of Patent: November 17, 1987
    Assignee: Morton Thiokol, Inc.
    Inventors: E. Eugene Callens, Jr., Leslie L. Crowson, Jr., Robert P. Kobs, Herbert G. Tull, III, Joseph F. Tahtouh