Abstract: An inspection system for inspecting an interior surface of a pipeline has a frame adapted to travel in the pipeline and an imaging means for imaging a selected portion of the interior surface of the pipeline. The imaging means has a field of view and is mounted in a rotatable manner on the frame. The inspection system has with a two-dimensional pattern generator for generating a two-dimensional pattern projection. The generator is mounted with the imaging means to project the two-dimensional pattern projection in the field of view thereof. The imaging means provide images of the selected portion of the internal surface comprising the two-dimensional pattern projection for monitoring a perpendicularity of the optical axis of the imaging means with respect to the selected portion of the interior surface of the pipeline thanks to a shape of the two-dimensional pattern projection prior to inspection of the internal surface.

Abstract: A medicine packet inspecting apparatus is disclosed. The medicine packet inspecting apparatus includes a transfer conveyer installed on the upper surface of a main body to transfer medicine packets to one side of the main body, a tablet spreading unit installed on the upper surface of the transfer conveyer to uniformly spread tablets within the medicine packets, an image reading unit to capture the upper surfaces of the medicine packets with a camera and to judge whether or not the tablets are defective through comparison of the captured images with information regarding a prescription and the tablets stored in a data storage unit, and a making unit to mark a defective sign on medicine packets if the tablets within the medicine packets are judged to be defective.

Abstract: An apparatus for detecting a leak in one or more blister pockets of one or more blister packs. The apparatus includes a plate for receiving the pack(s), a pressure reducer able to change the pressure around the pack(s) so as to seek to cause deflection of at least one side of the or each blister pocket between at least a first pressure and a second pressure, and an illumination source able to provide a lattice illumination on the or each blister pocket at at least the first pressure and the second pressure. The apparatus also includes an image capture device is which is able to take latticed pictures of each blister pocket at least the first pressure and the second pressure, and processor able to compare the latticed pictures to detect deflection of the blister pocket(s) at the different pressures.

Abstract: An inspection apparatus and method comprising a unit for acquiring an optical image of an object to be inspected by irradiating the object with light, wherein the unit includes a line sensor comprising a plurality of sensors linearly arranged in a row, a generating unit for generating a reference image from design data of the object to be inspected, a comparing unit for comparing the optical image with the reference image, a unit for storing data of three lines acquired by the line sensor, and calculating differences between a gradation value of a pixel on a center line and each gradation value of the eight pixels adjacent to the pixel determining if the pixel is a defect if all of the eight differences of the adjacent pixels are more than a predetermined threshold.

Abstract: Devices, systems, and methods for imaging and measuring deflections in structures such as railroad rail are disclosed. An example vision system comprises a high-speed, visible-light imaging camera and an evaluation unit configured for analyzing images from the camera to detect geometric variations in the structure. In analyzing structures such as railroad track rail, the imaging camera can be coupled to a moving rail vehicle and configured for generating images of the rail as the vehicle moves along the track.

Abstract: An apparatus and method are provided for measuring the end surface of a disk-shaped semiconductor wafer based on its projection image, without the influence of contaminants on the end surface. A rotation supporting mechanism supports a wafer between a first supporting position rotated by +?relative to a predetermined reference position and a second supporting position rotated by ??degrees at two or more supporting positions. An image sensor picks up a projection image of the wafer's end surface. An index value for the end surface is calculated for each of a plurality of obtained projection images. One representative value of the calculated index values or an aggregate value is obtained, and a shape measurement of the wafer's end surface corresponding to the reference supporting position is derived. When the wafer's radius and a chamfer width are set as r and k, ??cos?1 ((r-k)/r) is satisfied.

Abstract: A method and a device for monitoring a train set include at least one lateral camera and at least two upper cameras. The cameras are fixedly disposed on a track section laterally and above the train set. A region of the contact wire having a carrier device and at least one current collector can be detected by the at least one lateral camera and flanks of the train set can be detected by the at least two upper cameras. An evaluation unit is provided for determining the state of the at least one current collector, at least one clearance dimension of the train set and at least one actual position of the contact wire, or a combination thereof. Detected deviations from standards are indicated and allocated to individual cars.

Abstract: An apparatus for the inspection a vehicle component to detect the presence of a part defect and a method for performing the inspection. According to one embodiment, the apparatus for inspecting the vehicle component comprises: a camera having a lens; a borescope having a first end and a second end, the first end operatively disposed adjacent the camera and the second end having a mirror disposed therein; and a light source for supplying light to the borescope whereby the mirror is operative to reflect an image of an area of the vehicle component to be inspected to the camera.

Abstract: Disclosed is a method for determining the absence or presence of one or more instances of a predetermined pattern in an image, and for determining the location of each found instance within a multidimensional space. A model represents the pattern to be found, the model including a plurality of probes. Each probe represents a relative position at which a test is performed in an image at a given pose, each such test contributing evidence that the pattern exists at the pose. The method further includes a comparison of the model with a run-time image at each of a plurality of poses. A match score is computed at each pose to provide a match score surface. Then, the match score is compared with an accept threshold, and used to provide the location any instances of the pattern in the image.

Abstract: A system, apparatus, method, and computer program product for evaluating an object disposed on an upper surface of an object holder. At least one first frame representing a captured portion of the object is acquired, while the object holder is positioned at each of multiple locations. At least one second frame representing a captured portion of at least one other surface of the object holder is acquired, while the object holder is positioned at each of the locations. At least one spatial characteristic associated with the captured portion of the object is determined based on at least one of the acquired frames. Values of multiple optical markers captured in each second frame are determined, where at least two of the optical markers have different characteristics. At least one of coordinates associated with the values and an orientation of the captured portion of the at least one other surface are determined.

Abstract: A pattern inspection apparatus is used for inspecting a fine pattern, such as a semiconductor integrated circuit (LSI), a liquid crystal panel, and a photomask (reticle) for the semiconductor or the liquid crystal panel, which are fabricated based on data for fabricating the fine pattern such as design data. The pattern inspection apparatus includes a reference pattern generation device configured to generate a reference pattern represented by one or more lines, comprising one of a line segment and a curve, from the data, an image generation device configured to generate the image of the pattern to-be-inspected, a detecting device configured to detect an edge of the image of the pattern to-be-inspected, and an inspection device configured to inspect the pattern to-be-inspected by comparing the edge of the image of the pattern to-be-inspected with the one or more lines of the reference pattern.

Abstract: A light-emitting device inspecting apparatus for inspecting characteristics of a light-emitting device including one or more light-emission cells that emit light, the light-emitting device inspecting apparatus including a probing unit having a table on which the light-emitting device is mounted and probes that supply a current to the light-emitting device; an image obtaining unit for obtaining an image of the light-emitting device; and a determination unit for determining open/short defects of the light-emitting device by detecting light-emission of the one or more light-emission cells from brightness information of the image.

Abstract: An inspection apparatus includes: a camera for acquiring an image of the whole area of an end face of the tubular product; a first light source for illuminating an outer peripheral edge of the end face side of the tubular product over the entire circumference thereof, a second light source for illuminating an inner peripheral edge of the end face side of the tubular product over the entire circumference thereof; and a third light source for illuminating an inner peripheral surface of the end face side of the tubular product over the entire circumference thereof. The apparatus uses the image of the tubular product using the first and second light sources to calculate an outer diameter and a wall thickness of the tubular product and illumination from the third light source for detecting a surface defect on the inner peripheral surface of the tubular product.

Abstract: An inspection arrangement (1) for a photovoltaic or solar-thermal solar installation, in which a thermal image of the solar installation is captured using a thermal imaging camera (2) and a measurement value of a physical measurement variable characterizing the light or solar irradiation is measured on or near the solar installation or the exposure of the solar installation by a radiation sensor (7, 8) and the thermal image and the measurement value are assigned to one another in an evaluation unit (5) of the thermal imaging camera (2).

Abstract: A camera module includes a sensor chip having a backside surface and a main surface including a sensor forming region and a sensor peripheral region surrounding the sensor forming region, in which a light receiving portion is disposed in the sensor forming region; a lens chip having a non-lens forming surface and a lens forming surface including a lens forming region and a lens peripheral region surrounding the lens forming region, in which a lens portion disposed in the lens forming region; a spacer portion for bonding the sensor peripheral region to the lens peripheral region with a specific space in between so that the light receiving portion faces the lens portion; and a cover including an opening portion for passing light from outside toward the lens portion and the light receiving portion.

Abstract: A wire guider includes a guiding unit having an inner path extending along the running direction of the wire to guide the running of the wire and an air supply unit for supplying air into the inner path to form a spiral air flow having a current rate faster than a running rate of the wire between an outer surface of the wire and an inner surface of the inner path. Wire Vibration resulting from a thrust force of mill rolls can be damped to more stably carry out one-direction running of the wire and minimize contact between the wire and a guide path. This reduces surface defects of the wire and abrasion of the guide system and protects a sensor unit from damage.

Abstract: Disclosed is a method for determining the absence or presence of one or more instances of a predetermined pattern in an image, and for determining the location of each found instance within a multidimensional space. A model represents the pattern to be found, the model including a plurality of probes. Each probe represents a relative position at which a test is performed in an image at a given pose, each such test contributing evidence that the pattern exists at the pose. The method further includes a comparison of the model with a run-time image at each of a plurality of poses. A match score is computed at each pose to provide a match score surface. Then, the match score is compared with an accept threshold, and used to provide the location any instances of the pattern in the image.

Abstract: A system and a method for monitoring painting quality of components, for example of motor-vehicle bodies, comprises a robot which moves a monitoring head to follow the components to be monitored while they move along a production line. The monitoring head moves with respect to the surface to be monitored and comprises both a source of light and a camera which receives the light emitted by the source of light which is reflected by the monitored surface. An electronic processing unit receives the signals coming from the camera and processes them according to different processing algorithms for detecting various categories of defects, specifically small defects, medium defects, and large defects.

Abstract: A device for monitoring objects, in particular for monitoring industrial environments, such as paper mills and manufacturing and/or finishing processes of a paper, board or other fibrous web being carried out therein, includes a monitoring camera, the camera with its objective being arranged in a rotationally symmetrical protective housing rotating about an axis of rotation, and a protective housing to be mounted at its one end on a rigid hollow shaft and, at its coaxially opposite other end, to have a co-rotating blower pipe or merge into the latter, and for compressed air to be applied to the protective housing, including the blower pipe.

Abstract: A defect inspection apparatus includes an imaging apparatus configured to include a lens array configure to include plural lenses arranged in a form of an array, and an imaging device configured to image a compound-eye image that is a collection of ommatidium images of an object approximately formed by the respective plural lenses of the lens array; and a processing apparatus configured to process the compound-eye image obtained from imaging the object by the imaging apparatus, and determine whether there is a defect of the object.

Abstract: The present invention provides a defect detection apparatus for detecting a defect even on a uniformly continuous background pattern, a method used in the apparatus, and a computer program for making a computer execute processing in the method. A defect size is set and stored, and an instruction to a first direction in which a background pattern is uniformly continuous is accepted. A reduced image reduced in the first direction using an image reduction ratio according to the defect size is generated. A filter processing is executed in the first direction for removing a defect, and the reduced image that is subjected to the filter processing is enlarged in the first direction with an image enlargement ratio corresponding to the reciprocal of the reduction ratio to generate a first enlarged image. A difference image is generated by calculating a difference between the multi-valued image and the first enlarged image.

Abstract: This invention is directed to easily set the image sensing conditions of an image sensing apparatus. The image sensing apparatus includes a first control means for controlling to change the image sensing conditions, an image sensing means to sense an image sensing target at every first time interval, and to calculate the evaluation value of the sensed image, and a second control means for controlling to change the image sensing conditions within the range where the evaluation value obtained by the first control means changes from increase to decrease, the image sensing means to sense the image sensing target at every second time interval smaller than the first time interval, and to calculate the evaluation value of the sensed image.

Abstract: A device for inspection of print products (36) produced by a printing machine (10) is provided with a first camera (48) being directed to an inspection field to be checked. At least one further camera (50) is provided being directed at least partially (58) to the same inspection field (54) being checked already by the first camera (48).

Abstract: A tester and a method that evaluate the condition of a bundle of plurality of tubes are disclosed. Embodiments of the tester obtains an image of a tube-sheet of the bundle; obtaining one or more parameters related to the tube-sheet image. Next one or more feature-detecting methods can be implemented on the tube-sheet image to define tube endings on a grid of the tube-sheet. Further, optimization methods can be implemented on the results and a map with the result can be presented to a user of the tester. Feedback from the user can be utilized to improve the map of the tube sheet.

Abstract: A method for automatically identifying defects in turbine engine blades is provided. The method comprises acquiring one or more radiographic images corresponding to one or more turbine engine blades and identifying one or more regions of interest from the one or more radiographic images. The method then comprises extracting one or more geometric features based on the one or more regions of interest and analyzing the one or more geometric features to identify one or more defects in the turbine engine blades.

Abstract: A defect detected by a wafer inspection tool is reliably captured by a defect review tool. A defect review condition in the defect review tool is varied depending on defect attributes provided by the wafer inspection tool so as to optimize the review process. For example, review magnification is varied depending on the size of the defect, or the frame addition number is varied depending on the maximum gray level difference.

Abstract: A method of assessing the quality of metal parts, for example through detection of defects in a metal part induced by processing the metal part, comprises acquiring a thermal image of the metal part after processing the metal part, determining a difference image by comparing the thermal image to a reference image, the difference image being related to temperature differences between temperature data represented by the thermal image and by the reference image, and determining a gradient image using the difference image, the gradient image representing temperature difference gradients within the difference image. An example apparatus comprises a camera, such as a thermal camera, an image processor, and an output device such as a display.

Abstract: A method of inspecting a heatable glazing is disclosed. A heatable glazing comprises a heater array having at least one heater wire. The method comprises the steps of (i) illuminating the heatable glazing with a light source to produce a shadowgraph image of the heatable glazing; (ii) passing a sufficiently high electrical current through the heater array such that the heater wire is observable in the shadowgraph image of the heatable glazing, such a shadowgraph image of the heatable glazing being referred to as an active shadowgraph image of the heatable glazing; and (iii) capturing the active shadowgraph image of the heatable glazing with an imaging sensor. Apparatus for carrying out the method is also disclosed.

Abstract: A method for identifying defects in a web of material is provided. The method may include monitoring one or more characteristics of a web translating along a travel path. The one or more characteristics may include one of position, speed of travel, and direction of travel. The method may include identifying a candidate for a defect by detecting one or more deviations in the web at a first time frame. The method may include monitoring one or more characteristics of the candidate for a defect at one or more subsequent time frames. The method may include determining whether the candidate is a defect by comparing the one or more characteristics of the candidate at one or more subsequent time frames to the one or more characteristics of the web. A related system is also provided.

Abstract: The invention relates to a method for inspecting a surface of a wafer with regions of different detection sensitivity. For this purpose, an image of the selected surface of the wafer is acquired using a detector. At least one region handled with a different detection sensitivity than the rest of the wafer may be defined on the surface of the wafer by means of an input unit. The detection sensitivity set for the regions is a percentage less than the detection sensitivity for the surface of the wafer without the regions with the different detection sensitivity.

Abstract: The invention relates to a device for detecting flaws in a plastic woven fabric made of monoaxially drawn polymer ribbons, in particular polyolefin ribbons, preferably polypropylene ribbons, wherein in order to monitor irregularities, which are characteristic of flawed sections of the plastic woven fabric, an inspection camera is provided for taking images of the plastic woven fabric, and an analysis unit, which detects irregularities in the weaving pattern of the plastic woven fabric on the basis of the images taken by the inspection camera and which, when detecting irregularities in the weaving pattern indicating a flawed section of the plastic woven fabric, triggers an error signal, which actuates, for example, a flashing light or a horn, or which can be fed to a higher-level machine controller.

Abstract: Device for inspecting containers or the like, in particular bottles of glass or plastics, with an inspection module mounted at a conveying path, where, be able to adapt the device more flexibly to corresponding customer demands and to reduce assembly and adjustment works, the device is formed as a modular inspection unit with a support with location places for a plurality of inspection modules.

Abstract: A method of automatically calibrating a video conference environment is disclosed. In an embodiment, the method includes initiating a calibration sequence in the video conferencing system, routing a test signal through the audio and video components of the video conferencing system, measuring a time delay associated with the test signal and utilizing the time delay to calibrate subsequent audio and video signal transmissions by the video conferencing system.

Abstract: An apparatus and a method for detecting a defect of a separated low rigidity transparent or translucent body, wherein an image acquiring device includes: a first conveyer and a second conveyer to convey a separated low rigidity transparent or translucent body; a transparent bridge disposed between a first conveyer and a second conveyer along a transport path of the separated low rigidity transparent or translucent body, the transparent bridge having a top surface; an illuminating unit disposed on one side of the transparent bridge and configured to project diffusive light onto the top surface of the transparent bridge by transmitting through the transparent bridge; and an image pickup unit disposed on the other side of the transparent bridge and configured to receive light projected from the illuminating unit and transmitting through the separated low rigidity transparent or translucent body to form an image when the separated low rigidity transparent or translucent body enters the top surface of the transpar

Abstract: An apparatus and associated method for measuring both transmitted optical distortion and other minimal visible defects in the surface of a glass sheet. The disclosed apparatus includes a glass stand which receives a glass sheet for mounting between a background screen which includes a pre-defined contrasting pattern, and a digital camera which captures an image of the pattern transmitted through the glass sheet. The digital image is downloaded to a computer that is suitably programmed to analyze the image data to determine (1) optical distortion indicia, including the magnification and lens power, in the observed image of the pattern transmitted through the glass sheet, and (2) small visible optical or obstructive defects on the glass sheet.

Abstract: A device for visually recording two-dimensional or three-dimensional objects, which comprises a camera for recording images of the two-dimensional or three-dimensional object and which is provided with, can be connected to or is connected to at least one evaluation unit for evaluating the recorded images. A single camera and at least one adjustable or pivotal mirror element are provided. According to the method for visually recording two-dimensional or three-dimensional objects while using a device of the aforementioned type, a camera and at least one adjustable mirror element are arranged relative to one another so that the objects to be recorded are situated in the coverage area of the at least one mirror element. The adjustable mirror element for recording the objects to be recorded is displaced or pivoted about one or two axes with an adjustable velocity.

Abstract: A light path restricting structure is provided, which is applicable in an optical inspection equipment including a light source module for providing a linear light source, a linear camera, a light-splitting unit for refracting light of the linear light source to an object to be inspected and the linear camera, a conveying mechanism for driving the object to be inspected to move, and a case for accommodating the elements. The light path restricting structure is disposed on a transmission path of the linear light source. The light path restricting structure includes a body, which includes a first surface facing the linear light source of the light source module and a second surface facing the linear camera. A plurality of light channels is disposed in the body, and each light channel includes a light inlet and a light outlet disposed on the first surface and the second surface of the body.

Abstract: A system and method for determining the characteristics of a device coupled to a client device are disclosed. A method, according to one embodiment, includes driving a display device with a first video output signal formatted according to a first video interface specification; responsive to driving the display device, soliciting user input based on information included in the first video output signal; determining a characteristic of the display device based on the user input; and driving the display device according to the determined characteristic.

Abstract: A system and method for detecting defects on a reticle is disclosed. The method may comprise determining a best focus setting for imaging the reticle; obtaining a first image of the reticle, the first image obtained at the best focus setting plus a predetermined offset; obtaining a second image of the reticle, the second image obtained at the best focus setting minus the predetermined offset; generating a differential image, the differential image representing a difference between the first image and the second image; and identifying a defect on the reticle based on the differential image. The method in accordance with the present disclosure may also be utilized for detecting defects on at least a portion of the reticle.

Abstract: An appearance inspection device, which inspects an appearance of test objects, includes a first and second conveying means 21 and 22a conveying the test objects, a back/front reversal means 23 turning over the front and back surfaces of the test objects being conveyed by the first conveying means 21 and supplying the test objects to the second conveying means 22a, and a plurality of image-pickup means 30b and 30c capturing images of each test object from upper oblique directions while the test objects are conveyed by the first and second conveying means 21 and 22a. The appearance inspection device also includes a defect detection means detecting the presence of defects in the test objects based on image data captured by the image-pickup means 30b and 30c. This appearance inspection device makes it possible to reliably and readily inspect an entire appearance of the test objects.

Abstract: The present invention relates to a method for non-destructive judgment of pearl quality by measuring the ultraviolet-visible reflectance spectrum and/or ultraviolet-visible fluorescence spectrum of a pearl or pearl shell to be inspected and comparing the values obtained with those preliminarily measured for a normal pearl or pearl shell. The present invention also relates to a non-destructive inspection apparatus of pearl quality. According to the present invention, the quality of the aimed pearl or pearl shell can be easily and rapidly judged under a non-destructive condition.

Abstract: An electric wire testing apparatus tests the condition of an end portion of an electric wire including a plurality of core wires and a sheath for covering the core wires. The electric wire testing apparatus includes an imaging device arranged to photograph an end surface of the core wires that have been exposed by stripping off the sheath, a counting unit arranged to count the number of the core wires from an image photographed by the imaging device, and a determining unit arranged to determine pass/fail of the condition of the end portion of the electric wire based on whether or not the number of the core wires counted by the counting unit matches a predetermined number.

Abstract: In a method of detecting defects in patterns and an apparatus for performing the method, a first image of a detection region on a semiconductor substrate may be acquired. A second image may be acquired from the first image by performing a Fourier transform and performing a low pass filtering. The second image may be compared with a reference image so that the defects of the detection region are detected. Existence of the defect of the second image is determined using a relation value between a grey level of each of pixels of the second image and the reference image, respectively. When a defect exists, the horizontal and the vertical positions of the pixel where the relation value is minimum are combined to determine the position of the defect.

Abstract: An information processing apparatus includes: a reception unit that receives multiple captured images that are captured with a capture device in parallel from an external apparatus to which the capture device that captures an object is connected; a detection unit that detects a priority image that is included in the multiple captured images being received by the reception unit and is assigned priority information that specifies the priority image to be preferentially displayed on a display device; and a controller that controls the reception unit to stop receiving other captured images which are not detected by the detection unit and to receive the priority image detected by the detection unit and controls the display device to display the priority image on the display device when the priority image is detected by the detection unit.

Abstract: A system, apparatus, method, and computer program product for evaluating an object disposed on an upper surface of an object holder. At least one first frame representing a captured portion of the object is acquired, while the object holder is positioned at each of a plurality of locations. At least one second frame representing a captured portion of at least one other surface of the object holder besides the upper surface is acquired, while the object holder is positioned at each of the plurality of locations. At least one spatial characteristic associated with the captured portion of the object is determined, based on at least one of the acquired frames. A three-dimensional representation of the object can be formed based on the first frames and at least one spatial characteristic.

Abstract: A method of capturing data for gemstone analysis is provided. The method includes capturing images of the gemstone under differing lighting conditions, and comparing the captured images.

Abstract: There is provided an image processing controller capable of faithfully recreating a process of a series of image processing based upon a control program, which includes: a history buffer for extracting a result of the measurement in each processing unit, executed by the program executing section, as history information in each measurement cycle and holding the extracted result in association with the processing unit and the measurement cycle; a history buffer for extracting a camera image acquired from a camera by the program executing section during execution of a control program, as history information in each the measurement cycle and holding the extracted image in association with the measurement cycle; and a history information transferring section for transferring history information, held in the history buffers, to the PC.

Abstract: A display panel test apparatus includes: an image pickup part which picks up an image from a target display panel; a jig including a receiving part which receives the target display panel, a fixing part which fixes the image pickup part, and an adjusting part which adjusts an image pickup angle of the image pickup part; a pattern generating part which provides the target display panel with a test pattern; a defect extracting part which analyzes test image data provided from the image pickup part using a defect extracting algorithm and extracts display defect information, where the defect extracting algorithm includes different settings corresponding to different types of display defects; and a control part which generates evaluated data corresponding to a viewing angle of the target display panel using the image pickup angle of the image pickup part and the display defect information.

Abstract: Featured are a device (20) and method for the detection of counterfeit pharmaceuticals and/or packaging therefore. Counterfeit pharmaceuticals are detected by visual inspection upon exposing a suspected counterfeit pharmaceutical to one or more light sources having different wavelengths, and observing the differences in color and/or brightness between the suspected counterfeit and a genuine pharmaceutical/packaging. In further embodiments, a image acquisition device acquires an image showing color and/or other visual effect (s) brightness of the suspect counterfeit and this image is compared to an image of a authentic pharmaceutical/packaging.

Abstract: Apparatus for monitoring a print result in a rotary printing press, includes a web monitoring system including a matrix camera (20) that is movable in transverse direction over a web printed in the printing press, the matrix camera being adapted to capture an excerpt of the printed image in synchronism with a repeat of the printed image during a print run, an inspection system for a complete inspection of the printed image, the inspection system including a line camera that extends over the entire widths of the web, and an integrated control desk for the web monitoring system and the inspection system.