By Focus Detection Patents (Class 356/609)
  • Publication number: 20020167723
    Abstract: A confocal microscope which uses a confocal disk, comprising a light source, a high-NA and low-magnification objective lens which forms an image of said confocal disk obtained by irradiation with a light from the light source on a sample, a first image formation lens system disposed between said confocal disk and said objective lens, first image formation lens driving means for moving said first image formation lens system in a light axis direction and adjusting a focal point position of said objective lens with respect to said sample, and a second image formation lens system which forms a sectioning image formed on said confocal disk into an image in photoelectric conversion means.
    Type: Application
    Filed: May 16, 2002
    Publication date: November 14, 2002
    Applicant: Olympus Optical Co., Ltd.
    Inventors: Yukio Eda, Nahoko Hisata, Terumasa Morita, Yasuhiro Kamihara
  • Publication number: 20020071125
    Abstract: The object of the invention is a method and an apparatus for optical measurement of a surface profile of a specimen, a series of n images of the specimen being acquired with an image acquisition apparatus in different planes in the z direction of a coordinate system (x, y, z). The image contents of all n images of the resulting image stack are compared to each other in the z direction at each coordinate point (x, y) in order to determine a plane therefrom according to predetermined criteria, assign its plane number (N) to that coordinate point (x, y), and store it in a mask image. The mask image contains all the 3D data of the specimen surface. Processing can be performed using 2D image processing procedures. The 3D information can be quickly and easily retrieved from the mask image. The surface profile can be reconstructed and displayed three-dimensionally.
    Type: Application
    Filed: October 11, 2001
    Publication date: June 13, 2002
    Inventor: Frank Sieckmann
  • Publication number: 20020057439
    Abstract: The invention relates to an iris recognition system, and more particularly, to an apparatus for approaching the iris images of the both eyes most adjacent within a range beyond which the iris images overlap each other in an iris recognition system using all of the iris images of the both eyes at the same time. The iris recognition system using all of the iris images of the both eyes at the same time adopts an apparatus for narrowing the distance between the iris images of the both eyes acquired in CCD images when the iris images are obtained through photographing the iris images of the both eyes are photographed. The apparatus of the invention comprises iris image focusing means for converting an incident path, whereby the distance between the iris images of the both eyes is narrowed on an optical path along which eye images of the user are focused to a camera, in which the focusing means can be an angled reflector with one side being inclined at an angle about the center.
    Type: Application
    Filed: November 16, 2001
    Publication date: May 16, 2002
    Applicant: LG Electronics, Inc.
    Inventors: Jang Jin Chae, Seung Gi Min
  • Patent number: 6376818
    Abstract: An object is illuminated by a light source, and a periodic pattern of transparent and non-transparent stripes is superimposed onto the object. At least three images are recorded at different spatial phases of the pattern by means of a microscope of shallow focal depth, and a three-dimensional image containing only in-focus detail is then derived from the recorded images.
    Type: Grant
    Filed: October 1, 1999
    Date of Patent: April 23, 2002
    Assignee: Isis Innovation Limited
    Inventors: Tony Wilson, Mark Andrew Aquilla Neil, Rimvydas Juskaitis
  • Patent number: 6346986
    Abstract: A method to monitor a dimension of a pellicle includes projecting a first light signal against a surface of the pellicle. A second light signal reflected from the surface of the pellicle is detected, with the second light signal being a representation of the first light signal. The method determines if the dimension of the pellicle is within an allowable value based on a characteristic of the detected second light signal. The characteristic of the detected second light signal can include time periods between pulses of the detected second light signal, an intensity of the detected second light signal, or a positional displacement of the detected second light signal.
    Type: Grant
    Filed: March 14, 2000
    Date of Patent: February 12, 2002
    Assignee: Wafertech, Inc.
    Inventor: Phong T. Nguyen
  • Patent number: 6330066
    Abstract: An imaging means, which is provided so as to be movable in a Z direction that is perpendicular to an object, images the object. A moving means moves the imaging means in the Z direction with adjustment. A control means measures a height of the object by causing the imaging means to image the object while causing the moving means to move the imaging means in the Z direction by a very small distance at a time, calculates focus values through image processing based on respective imaged pictures, and detects a focus position from a Z-direction variation of the focus values.
    Type: Grant
    Filed: May 16, 2000
    Date of Patent: December 11, 2001
    Assignee: Sony Corporation
    Inventors: Minoru Tanaka, Kuniyoshi Takeuchi
  • Publication number: 20010024280
    Abstract: A shape measuring apparatus for measuring an outer surface of a measurement object, includes: a photo-sensor unit including two photo-sensors each provided with a number of pixels, first and second signal processing sections which executes combination processing to light reception signals outputted from the photo-sensors. The first signal processing section includes a corrector for correcting errors of light reception signals from one photo-sensor with respect to light reception signals from another photo-sensor in the incident direction or the direction perpendicular to the incident direction based on the relative displacement stored in the displacement memory. The second signal processing section includes a corrector for correcting the relative displacement by delaying the sending of the reception signals from one photo-sensor with respect to the sending of the reception signals from another photo-sensor. The first and second signal processing sections are selectively changed over.
    Type: Application
    Filed: January 18, 2001
    Publication date: September 27, 2001
    Inventors: Masahiro Fukuda, Hitoshi Kamezawa, Kyouichi Hirouchi
  • Patent number: 6266148
    Abstract: The invention relates to a method for measuring surfaces by confocal microscopy using the reflection method, specially to measure the superficial profiles (1) of treated or drilled teeth (2). The invention seeks to eliminate mistakes occurring when very inclined areas are measured. To this end, the method disclosed is characterized by a confocal representation with enhanced dynamics (relative sensitivity) enabling it to project both the retro-reflections and the weak scattered light (3) or fluorescent light of each focal plane (8).
    Type: Grant
    Filed: May 17, 1999
    Date of Patent: July 24, 2001
    Assignee: Leica Microsystems Heidelberg GmbH
    Inventors: Johann Engelhardt, Thomas Zapf