Abstract: The invention is directed to a method of differential interference contrast in which the object is illuminated by natural light and the light coming from the object is first polarized after passing through the objective. The observation is carried out with a shearing interferometer which is known per se.

Abstract: A method for determining a surface quality of a substrate sample using a differential interference contrast microscope is described. The microscope includes an eyepiece, an eyepiece focus adjustment, a microscope focus adjustment, a light source, at least one of an aperture or reticule, a camera view, a prism and an eyepiece. The method includes calibrating the focus of the eyepiece with the focus of the camera and determining a peak response ratio for the microscope through adjustment of phase between differential beams of the microscope. The substrate sample is placed under the microscope, illuminated with the light source, and brought into focus with the microscope focus. Phase between differential beams is adjusted, at least one image of the substrate sample is captured and processed to determine a level of surface structure on the substrate sample.

Abstract: A time-resolved fluorescence microscope having high spatial and time resolution. Fluorescence from a sample 26 mounted on a confocal inverted optical microscope 19 and excitation laser light are simultaneously incident on a non-linear optical element 32 to produce sum-frequency light 34. Time-resolved fluorescence from the sample is measured by varying the amount of delay in an optical delay line 33.

Abstract: An illumination system for microscopy includes a light source, a first spectral element dispersing light from the light source, a reflecting member selectively reflecting light dispersed by the first spectral element, a second spectral element combining light reflected by the reflecting member, a dichroic mirror, an objective lens, and an image sensor. The first spectral element is placed at the front focal point of a first lens, the reflecting member is placed at a position where the back focal point of the first lens coincides with the front focal point of a second lens, and the second spectral element is placed at the back focal point of the second lens.

Abstract: The suede-like fabric according to the invention is produced by the process which comprises the steps of supplying aqueous chemical composed of acrylic resin, emulsifying agent and water to treating rollers through chemical coating means; passing the raw fabric cloths between the treating rollers having the chemical supplied and supporting rollers to produce a uniform chemical coating of 70˜200 g/m2, the rollers pressing and fixing the passing raw fabric cloths; de-watering and drying the raw fabric cloths having the chemical coating fixed under pressing in a thermal chamber maintained at a temperature between 80 and 200° C.; and heating and pressing the dried raw fabric cloths by means of heating rollers at a temperature between 130 and 150° C. to finish the acrylic coating through this ironing step; and a further step of rubbing-off the coated surfaces of the raw fabric cloths for abrasion by rotating a striker drum made of wood for a predetermined period.

Abstract: A microscope includes an interference contrast transmitted-light device having an analyzer disposed in the microscope imaging beam path, the analyzer causing a beam deflection. A fluorescence device is provided, the fluorescence device and the interference contrast transmitted-light device being selectably and alternatively insertable into the imaging beam path. A pair of glass wedge plates are arranged behind the analyzer in the imaging direction so as to compensate to zero for the beam deflection caused by the analyzer.

Abstract: The present invention broadly comprises a device, such as a slider, for performing phase contrast microscopy, the device containing a plurality of at least three phase contrast annuli. The slider is received into a microscope condenser mounted under a microscope stage and that is adapted to receive the device and align the device such that a phase contrast annulus is aligned with an appropriate microscope objective phase ring. The invention also comprises printed or engraved indicators or other markings indicating whether the bright field aperture or a particular phase contrast annulus is in position in the illumination path of the microscope. The invention further comprises a device for preventing the removal of the device from the condenser.

Abstract: The invention concerns an apparatus for implementing phase-contrast or modulation-contrast observation on microscopes with the aid of a modulator (7) arranged in each pupil plane in the observation beam path and containing at least one layer modifying the phase or amplitude, and of a stop (3) arranged in the illumination beam path. For stepless adaptation of the phase shift, the modulator (7) is mounted tiltably. The invention further concerns a method for implementing a defined phase shift.

Abstract: A reset driving scheme for addressing a switching mirror display enables current to flow in two directions through the switching elements. The display is forced into a predefined state and drives the display into the other optical states by using an addressable TFT providing a continous current.

Abstract: An illumination device for a DUV microscope has an illumination beam path, proceeding from a DUV light source in which are arranged a condenser and a reflection filter system which generates a DUV wavelength band and comprises four reflection filters. At these, the illumination beam is reflected in each case at the same reflection angle &agr;, the illumination beam path extending coaxially in front of and behind the reflection filter system. According to the present invention, the reflection angle &agr;=30° and the DUV wavelength band &lgr;DUV+&Dgr;&lgr; has a half-value width of max. 20 nm and a peak with a maximum value S of more than 90% of the incoming light intensity. The resulting very narrow half-value width of the DUV wavelength band makes it possible for the DUV objectives of the DUV microscope to be very well-corrected.

Abstract: A plate (130) with a convex edge (137) which is inserted within the optical path (190) of a microscope (100) produces a chromatic region (230). Refractive specimens (240) illuminated by this chromatic region (230) have enhanced contrast and an improved three-dimensional shadowcast effect. The plate (130) is small enough to only block a minority of light passing through the optical path (190), and is centrally located within the optical path (190) to minimize astigmatic error. The plate (130) may be manufactured simply and durably, and is readily applied to existing microscopes as an add-on tool for viewing specimens. Additional methods are disclosed for making and using the plate (130) which offer further advantage and benefit.

Abstract: The invention is directed to A microscope is disclosed in which a specimen is arranged between two objectives and can be observed with reflected light as well as with transmitted light. In a microscope with field transmission, two objectives have substantially identical optical characteristics and at least one of the two objectives is followed by a mirror which reflects the light transmitted through the specimen back into itself exactly. In this way, there is twofold transmission through the specimen with optimum illumination of the solid angle. In a laser scanning microscope, there are likewise two objectives with identical optical characteristics and at least one of the objectives is followed by a phase-conjugating or adaptive mirror.

Abstract: A method is disclosed for measuring the dose and energy level of ion implants forming a shallow junction in a semiconductor sample. In the method, two independent measurements of the sample are made. The first measurement monitors the response of the sample to periodic excitation. In the illustrated embodiment, the modulated optical reflectivity of a reflected probe beam is monitored to provide information related to the generation of thermal and/or plasma waves in the sample. A second spectroscopic measurement is also performed. This measurement could be either a spectroscopic reflectometry measurement or a spectroscopic ellipsometry measurement. The data from the two measurements are combined in a manner to yield information about both the dose (concentration) of the dopants as well as the energy used to inject the dopants in the semiconductor lattice. The method will useful in controlling the formation of shallow junctions.

Abstract: A method and an arrangement for beam control in a scanning microscope are disclosed. The scanning microscope comprises means for acquiring and displaying (3) a preview image (7) and a microscope optical system (51). Means for marking (5) at least one region of interest (27, 29) in the preview image (7) are provided. A first beam deflection device (43, 67, 68) displaces the scan field (31, 33) onto the region of interest (27, 29); and a second beam deflection device (49, 72, 94) serves for meander-shaped scanning within the scan field (31, 33).

Abstract: A scanning microscope with a light source for illumination of a specimen, a means for spatial spectral division of the detection light, and a detector is disclosed. The scanning microscope has means for selecting a lower limit wavelength that defines a lower exclusion region, and means for selecting an upper limit wavelength that defines an upper exclusion region, as well as a first and a second adjustable stop that block light components of the lower and the upper exclusion region of the detection light. A bandpass filter and a method for scanning microscopy are also disclosed.

Abstract: A method for generating a multicolor image of a specimen with a microscope is disclosed. The method comprises the step of determining the spacing of the focal planes of a first illuminating light beam that has a first wavelength and of a second illuminating light beam that has a second wavelength; the step of scanning the specimen with the first illuminating light beam and generating a first partial image; the step of performing a relative displacement, by an amount equal to the spacing, between the specimen and the focal plane of the illuminating light beam of the second wavelength; the step of scanning the specimen with the second illuminating light beam and generating a second partial image; and the step of superimposing the first and second partial images to yield the multicolor image. Further more a microscope and a confocal scanning microscope are disclosed.

Abstract: An endoscope ocular portion fitted with a microscope gripping mechanism 9 is adopted where a microscope gripping mechanism 10 has; a microscope gripping portion 12 for gripping a microscope ocular portion 11a of a medical microscope 11, an endoscope securing portion 14 secured to an endoscope ocular portion 13a, and a linkage portion 16 linking the microscope gripping portion 12 and endoscope securing portion 14, and positioning and securing the endoscope ocular portion 13a and the microscope ocular portion 11a on the same virtual plane 15 and at approximately the same spacing W as the pupil distance of an observer. According to this endoscope ocular portion fitted with a microscope gripping mechanism 9, observation of both the medical microscope and the endoscope at the same time without the observer significantly moving their head or body, is possible at low cost.

Abstract: The invention concerns a microscope having an image sensor (5) for recording the microscope images. The specimen (3) to be examined can be scanned by means of a stop (2) in the beam path of the illumination unit and a positioning unit which moves the specimen (3) or the stop (2). Opening the stop (2) or removing it from the beam path permits the entire image to be scanned with the image sensor (5).

Abstract: An epi-illumination interference attachment according to Mirau that can be mounted onto the objective (1) of a microscope as a two-ray interference attachment module (12). The attachment has a reference mirror (6) and several beam splitters (8a-8d) which are affixed on a carrier such as turret plate (7). The beam splitters (8a-8d) show specific reflection/transmission characteristics (R/T values), especially 20/80, 35/65, 43/57, and 50/50. The reference mirror (6) shows, for instance a reflection value of 85 percent. With the installation according to this invention, objects (4) with very different reflection values can be observed and measured without any contrast problems.

Abstract: The optical microscope apparatus comprises illuminating means for emitting as illumination light a convergent beam converging at a point in a space; a sample mounting table for mounting a sample in front of the converging point of illumination light; and an objective lens disposed such that the illumination light is incident thereon after light transmitted through or reflected by the sample is once converged at the converging point. The texture and state of orientation of the sample can easily be analyzed by use of the optical microscope apparatus in accordance with the present invention.

Abstract: An infrared microscope includes a light source emitting infrared light, an objective optical system forming an image of a specimen, and a path switching member switching an optical path from a visual observation optical path in which an infrared-light blocking member is placed, to another optical path to introduce light from the objective optical system thereinto. The infrared microscope is constructed so that an image which is free of aberration due to infrared light and has no unnatural hue due to a large amount of light with long wavelengths can be obtained without moving an element for blocking the infrared light.

Abstract: A microscope, in particular for confocal scanning microscopy, having a light source (1) for illuminating an object (6) to be investigated. An optical device (9, 12) is provided for splitting transmitted light (15) passing through the object (6) and fluorescent light (10, 13) produced in the object (6). A segmenting device (17) acting on the transmitted light (15) is configured with regard to a detection-light path which is as short as possible in such a way that the segmenting device (17) is arranged between the object (6) and the light-splitting device (9, 12).

Abstract: An illuminating light modulating device modulates at least one of wavelength, phase, intensity, polarization, and coherency of the light emitted to an object by an illuminating device. A pupil modulating device is disposed near a pupil plane of an objective lens, and modulates at least one of phase, intensity and direction of polarization of the luminous flux including the information of the object. An image pickup device is disposed on a plane on which the image of the object is formed by the objective lens and an imaging lens, and picks up the image of the object. An image analysis device analyzes the image of the object picked up by the image pickup device. A parameter decision device adjusts the modulation amounts of the illuminating light modulating device and the pupil modulating device by using the image information of the object analyzed by the image analysis device.

Abstract: An improved confocal microscope system is provided which images sections of tissue utilizing heterodyne detection. The system has a synthesized light source for producing a single beam of light of multiple, different wavelengths using multiple laser sources. The beam from the synthesized light source is split into an imaging beam and a reference beam. The phase of the reference beam is then modulated, while confocal optics scan and focus the imaging beam below the surface of the tissue and collect from the tissue returned light of the imaging beam. The returned light of the imaging beam and the modulated reference beam are combined into a return beam, such that they spatially overlap and interact to produce heterodyne components. The return beam is detected by a photodetector which converts the amplitude of the return beam into electrical signals in accordance with the heterodyne components. The signals are demodulated and processed to produce an image of the tissue section on a display.

Abstract: An optical device and microscope of simple construction and which is capable of readily attaining super resolution with good focusing performance, includes a light source that generates light of multiple different wavelengths, a focusing optical device that focuses lights of these multiple wavelengths on an object, and an emitted light detector that detects light emitted from the object. Among the multiple lights of different wavelengths generated from the light source, at least one light forms a condensed light pattern of multiple spatial modes. These multiple lights are condensed upon the object such that part of the region of the condensed light pattern of the multiple spatial modes is made to spatially overlap with the condensed light pattern of the other light.

Abstract: A dual field of view optical system and a single, lower cost detector are utilized, rather than using a large CCD camera or multiple CCD cameras, to view a sample that has two or more small areas that need to be measured, which are too far apart to fall on the detector but are within the field of view of the objective, or to measure a long, narrow strip that is too long for the detector, but whose total area is less than the detector area. The dual field of view optical system is employed in a microscope which comprises: (1) an illuminator arm with an illumination source and a field stop, (2) a beam splitter, (3) an objective, (4) a sample plane for location of a sample to be observed, and (5) a detector arm, with the illuminator arm configured to illuminate the sample plane through the beam splitter and the objective and with the detector arm configured to receive an image of the sample and including the dual field of view optical system.

Abstract: A near-field, interferometric optical microscopy system includes: a beam splitter positioned to separate an input beam into a measurement beam and a reference beam; a mask positioned to receive the measurement beam, the mask comprising at least one aperture having a dimension smaller than the wavelength of the input beam, wherein the mask aperture is configured to couple at least a portion of the measurement beam to a sample to define a near-field probe beam, the sample interacting with the near-field probe beam to define a near-field signal beam; a detector having an element responsive to optical energy; and optics positioned to direct at least a portion of the reference beam and at least a portion of the near-field signal beam to interfere at the detector element.

Abstract: The present invention concerns a double confocal scanning microscope having an illuminating beam path (1) of a light source (2) and a detection beam path (3) of a detector (4), and in order to eliminate at their cause the problems of reconstruction methods. To do so, at least one optical component (24, 25) acting on the illuminating and/or detection beam path (1, 3) is provided, and is configured in such a way that it influences the amplitude and/or phase and/or polarization of the light; and the characteristics of the double confocal illumination and/or detection are thereby modifiable.

Abstract: The present invention concerns an interference microscope and a method for operating an interference microscope, in particular a 4&pgr; microscope, standing wave field microscope, or I2M, I3M, or I5M microscope, at least one specimen support unit associated with the specimen being provided. For determination of the phase position of the interfering light in the specimen region, on the basis of which the interference microscope can be aligned, the interference microscope is characterized in that for determination of the illumination state in the specimen region of the interference microscope, at least one planar area of the specimen support unit is configured to be detectable by light microscopy.

Abstract: The quality of image produced by confocal microscopy, and especially scanning laser confocal microscopy, is enhanced especially for images obtained in turbid mediums such as many biological tissues specimens, by reducing speckle from scatterers that exist outside (above and below) the section which is being imaged by utilizing reduced coherence illumination, such as provided by a multi-mode laser. The laser beam is focused to provide its intensity in lobes forming offset spots in opposite (180°) amplitude phase relationship. The lobes are combined in the return light from the section and detected after passing through the confocal aperture of the confocal microscope. Images can be formed from the detected return light. Light from scatterers outside the section of interest, which are illuminated by both of the lobes beams overlap outside the section and interfere, thereby reducing speckle due to such scatterers, and particularly scatters which are adjacent to the section being imaged.

Abstract: A differential interference optical system includes an illumination source, a first polarizing element for converting a ray of light emitted from the illumination source into linearly polarized light, a first polarizing member for separating the linearly polarized light converted by the first polarizing element into two linearly polarized components which vibrate perpendicular to each other and travel at a slight separation angle, a lens system for illuminating and observing an object to be observed, a second polarizing member for combining the two linearly polarized components on the same path after passing through the lens system, and a second polarizing element for converting a ray of light combined by the second polarizing member into linearly polarized light.

Abstract: A phase contrast observation device for observing a phase object (O), and phase apertures for same. The device comprises, in order along an optical axis (AX), a light source (LS) capable of providing light (L), an illumination optical system (G2 and G3) for condensing the light and illuminating the object, an aperture stop (AP) having an aperture (AO) therein, arranged in the illumination optical system, an objective lens system (G2 and G3) for converging light from the illuminated object and forming an image of the object. The device also includes one of a number of novel phase apertures (Ph1-Ph4) arranged at a position inside said objective lens conjugate to the aperture stop. The phase apertures of the present invention allow for high-contrast and low-contrast imaging regardless of the phase content of the object.

Abstract: The quality of image produced by confocal microscopy, and especially scanning laser confocal microscopy, is enhanced especially for images obtained in turbid mediums such as many biological tissues specimens, by reducing speckle from scatterers that exist outside (above and below) the section which is being imaged by utilizing reduced coherence illumination, such as provided by a multi-mode laser. The laser beam is focused to provide its intensity in lobes forming offset spots in opposite (180°) amplitude phase relationship. The lobes are combined in the return light from the section and detected after passing through the confocal aperture of the confocal microscope. Images can be formed from the detected return light. Light from scatterers outside the section of interest, which are illuminated by both of the lobes beams overlap outside the section and interfere, thereby reducing speckle due to such scatterers, and particularly scatters which are adjacent to the section being imaged.

Abstract: An inverted microscope is provided that reflects an observation light passing through an image-formation optical system upward using at least one reflection optical system and that leads the observation light to an observation path. The inverted microscope includes a confocal scanner arranged at an image surface position of the image-formation optical system, a light source for applying light onto a sample through the confocal scanner and the image-formation optical system, and a confocal image formation optical system that leads the light passing through the confocal scanner to the sample through the image-formation optical system, returns a return light from the sample to the confocal scanner along a route opposite to that for leading the light to the sample, and obtains a confocal image. A confocal observation optical system is also provided for leading the return light from the sample passing through the optical scanner to the observation optical path.

Abstract: A microscope, in particular for confocal scanning microscopy, having a light source (1) for illuminating an object (6) to be investigated. An optical device (9, 12) is provided for splitting transmitted light (15) passing through the object (6) and fluorescent light (10, 13) produced in the object (6). A segmenting device (17) acting on the transmitted light (15) is configured with regard to a detection-light path which is as short as possible in such a way that the segmenting device (17) is arranged between the object (6) and the light-splitting device (9, 12).

Abstract: A microscope assemblage, in particular for confocal scanning microscopy, having a light source (1) for illuminating a specimen (6) to be examined and at least one fluorescent-light detector (11, 14) for the detection of fluorescent light (10, 13) generated in the specimen (6) and at least one transmitted-light detector (16) for the detection of transmitted light (15) passing through the specimen (6), is configured and developed, with a view toward reliably performing a wide variety of experiments with a high level of detection in each case, such that the fluorescent-light and transmitted-light detectors (11, 14; 16) are arranged in such a way as to make possible simultaneous detection of fluorescent and transmitted light (10, 13; 15).

Abstract: The invention concerns a microscope comprising an optical part for generating interference figures between a reference light wave and a light wave diffracted by the observed object, sensors for digitising these interference figures, actuators for operating the optical system, and a computer for receiving the digitised interference figures, controlling the actuators, and provided with a memory and computing means for computing the three dimensional images from the interference figures, based on a principle analogous to holography. The optical part enables the recording on a sensing surface (116) interference figures generated by a reference beam (Fr) and a beam (Fe) passing through a sample (109). The interference figures can differ from one another by the reference wave phase controlled by the piezoelectric actuator (120) or the spatial distribution of the illuminating beam controlled by the positioning device (106). This microscope can be used in biology or metrology.

Abstract: A description is given of an illuminating device for a microscope (1), having a light source (2), an illuminating optical system (3) and an LCD (5) arranged in the illuminating beam path (4). The illuminating light is directed onto the object (6) from the light source (2) via the LCD (5), a transparent/opaque pattern being generated on the LCD (5) by means of a control and calculating device (7). The LCD (5) is arranged in a plane (AP′) which is conjugate with respect to the field diaphragm plane or aperture diaphragm plane (AP) and has a planar matrix composed of individual pixels arranged next to one another and of the same dimensions, the pixels each being constructed such that they can be driven individually to generate an arbitrary transparent/opaque pattern. The control and calculating device (7) is constructed as a computer with a graphics card.

Abstract: A probe for a surface-enhanced Raman scattering spectrometer is provided for injection into a cell in order to detect trace amounts of a compound within that cell. The probe has a spherical shape with a diameter less than one micrometer and preferably in the 10-500 nanometer range. The nanoprobes can have a receptor coating related to the specific compound to be detected by the probe. A process for producing, injecting and utilizing the nanoprobes are described.

Abstract: A stereoscopic microscope includes a binocular eyepiece arrangement, a binocular magnification changer, and a monocular lens arrangement. A reversal lens system can be inserted into beam paths in front of or behind the magnification changer, whereby it exchanges the two beam paths against one another and at the same time causes an image reversal. Thus, the microscope enables quick and simple changing between two focusings of the microscope without limiting the operation of the magnification changer. A supplementary lens can be inserted on the input side of the lens arrangement into the beam paths and an optic system can be inserted into the beam path between the supplementary lens and the eye for wide-angle viewing of the retina. The supplementary lens is a convex lens, the focal length of which is chosen in such a manner that the retina can be viewed with the microscope through the inserted supplementary lens and the optic system, while the lens arrangement of the microscope is focused on the cornea.

Abstract: The invention relates to a phase annulus consisting of a phase shifting thin-film system, which, in the case of a cemented system, has the following structure: (first) substrate-Ag-nH-cement-(second) substrate, or a structure: (first) substrate-n1-Ag-n2-cement-(second) substrate. In the case of an uncemented structure, the thin-film system has the following structure: substrate-Ag-nH-air, wherein nH, n1 or n2 represent the respective refractive index of a dielectric film. Phase shifting of the positive phase contrast can be regulated in a targeted manner.

Abstract: Illumination light emanated from a laser illumination light source is reflected by a semi-transparent mirror arranged between first and second objective lenses, and illuminates an object through the first objective lens. Reflected light from the object is incident to the photoelectric conversion device through the first objective lens, the semi-transparent mirror, and the second objective lens, and forms an image of the object. The image is captured by a image-taking plane of the photoelectric conversion device tilted relative to the image plane. The second objective lens is telecentric at the image side. The image-taking plane of the photoelectric conversion device is tilted relative to the image plane. Therefore, almost all diffracted light rays from on-axis and off-axis portion of the image-taking plane among all incident light to the image-taking plane are reflected not to enter the second objective lens.

Abstract: For observing transparent phase objects and the like, an optical microscope is provided with an aperture element 13 and an optical modulation element 14 that creates an image having the detecting sensitivity of the phase contrast imaging technique while simultaneously realizing an image having the three-dimensional sense provided by the modulation contrast imaging technique. In the present invention, the aperture is shaped as an angular segment of a circular ring that is centered on the optical axis and the corresponding optical modulation element includes either a light attenuating phase plate in the shape of a circular ring, or a light attenuating region in the shape of a circular ring with all other regions of the optical modulation element adding a phase retardation to the light passing therethrough.

Abstract: An apparatus for observing an object comprises an illumination optical system for illuminating an object to be observed with visible light, an observing optical system for observing the object positioned within a visual field illuminated by the illumination optical system, an index projecting optical system for projecting index for focus, the optical system having projecting luminous flux of wavelength at least a part of which is common with the wavelength of illumination luminous flux of the illuminating optical system, device for restricting luminous flux of index by intermittently projecting index light from the index projecting optical system, each projecting time being set so that no photogene occur in an examiner's eye, device for restricting luminous flux of illumination by intermittently conducting illumination by the illuminating optical system when index projection is not conducted, and by restricting the time of not conducting illumination to a time not recognized by the examiner, and device for de

Abstract: A device is provided for optical measurement of an object, in particular for path and/or vibration measurements, using a laser interferometer, wherein a measuring beam is input into the beam path of a microscope. The device has a mechanism for shifting the measuring beam in an approximately parallel manner. The input of the measuring beam is accomplished via a camera connection of the microscope. The shifting device causes a shift of the impact point of the measuring beam on the measurement object, and the measuring beam reflected back or scattered from the measurement object is decoupled via the camera connection from the beam path of the microscope.

Abstract: For focusing an operation microscope within a defined focusing range, a main objective and parts of an illuminating device are arranged in a focusing module that is separate from the microscope body. The focusing module is movable along the optical axis in a defined manner by means of manual or motor drives, so that focusing on a desired object detail is possible. Desired fine focusing can thus take place, in addition to coarse focusing by spatial positioning of the operation microscope by means of a stand. The advantages are a compact design, prevention of reflections through the main objective, and widely varied possibilities for filling of additional accessories.

Abstract: An incident-light fluorescence microscope including: (i) a transmission illuminating optical system which has a first optical member for receiving light emitted from a light source and extracting transmitted light and which irradiates the transmitted light onto a sample, and (ii) an observation optical system which has an objective lens and a second optical member and which is positioned closer to the objective lens than the sample. An incident-light fluorescence illuminating optical system is provided in the observation optical system, wherein the first optical member has a peak of transmittance at a wavelength longer than the fluorescent wavelength, and the second optical member selectively modulates only a wavelength transmitted through the first optical member.

Abstract: The invention relates to a grazing angle microscope for spectroscopic applications. A novel light path having two shifting planar mirrors permits spectroscopic investigation of a sample area off the optical microscope axis at grazing angles as well as visual viewing at steeper angles of incidence of the light.

Abstract: A microscope apparatus that has an electronic image pickup device arranged on an image surface of an imaging optical system, a component for separating light from a light source into two portions, a device for changing a phase difference between the two portions of light, a device for storing information on the images picked up by the image pickup device, and information processor for processing the information of images. The images are picked up by the electronic image pickup device as the phase difference is changed, and the information on the images is multiplied by a periodic function, as a weight function, which is given the phase difference as variable, and a resultant product is integrated so that a differential interference microscope apparatus capable of accurately obtaining a phase distribution of the object or a phase-contrast microscope apparatus capable of effectively enhancing a resolving power without lowering an image contrast is obtained.

Abstract: A method and apparatus for three dimensional optical microscopy is disclosed which employs dual opposing objective lenses about a sample and extended incoherent illumination to provide enhanced depth or Z-direction resolution. In a first embodiment, observed light from both objective lenses are brought into coincidence on an image detector and caused to interfere thereon by optical path length adjustment. In a second embodiment, illuminating light from an extended incoherent light source is detected to the sample through both objective lenses and caused to interfere with a section of the sample by adjusting optical path lengths. Observed light from one objective lens is then recorded. In a third embodiment, which combines the first two embodiments, illuminating light from an extended incoherent light source is directed to the sample through both objective lenses and caused to interfere within a section of the sample by adjusting optical path lengths.