Abstract: A device and method for reducing the power consumption of an electronic device using register file with bypass mechanism. The width of a pulse controlling the word write operation may be extended twice as long so that the extended portion substantially overlaps a following word read pulse. The extension of the pulse width of the read operation may enable lowering the Vcc Min value for the electronic device and thus may lower the power consumption of the device.

Abstract: A memory device, system and method for allowing an early read operation after one or more write operations is provided according to an embodiment of the present invention. The memory device comprises an interface for providing a first write address, a first write data, and a read address. A memory core is coupled to the interface and includes a first memory section having a first data path and a first address path and a second memory section having a second data path and a second address path. In an embodiment of the present invention, the first data and first address path is independent of the second data and second address path. The first write data is provided on the first data path responsive to the first write address being provided on the first address path while a read data is provided on the second data path responsive to the read address being provided on the second address path.

Abstract: A storage system according to one embodiment includes logic adapted for determining to move an extent from a source-tier in a storage system to a destination-tier in the storage system, wherein a set of tracks of the extent is presently being accessed; logic adapted for determining whether any track from the set of tracks is presently being written to; logic adapted for designating to a write-stack associated with the source-tier each track that is presently being written to and designating to a read-stack associated with the source-tier remaining tracks from the set of tracks; logic adapted for removing oldest tracks from the read-stack and the write-stack until the read-stack and the write-stack have been depleted of tracks; logic adapted for populating a destination-tier cache with the tracks as they are removed from the read-stack and the write-stack using a predetermined read-to-write ratio when a parameter of the extent exceeds a migration threshold; logic adapted for removing any tracks from a source-t

Abstract: Methods for programming a memory array, memory devices, and memory systems are disclosed. In one such method, the target reliability of the data to be programmed is determined. The relative reliability of different groups of memory cells of the memory array is determined. The data is programmed into the group of memory cells of the array having a relative reliability corresponding to the target reliability.

Abstract: An integrated circuit includes a serial peripheral interface memory device. In an embodiment, the memory device includes a clock signal, a plurality of pins, and a configuration register. In an embodiment, the configuration register includes a wait cycle count. The method includes transmitting a read address to the memory device using a first input/output pin and a second input/output pin concurrently. In an embodiment, the read address includes at least a first address bit and a second address bit, the first address bit being transmitted using the first input/output pin, and the second address bit being transmitted using the second input/output pin. The method includes accessing the memory device for data associated with the address and waiting a predetermined number clock cycles associated with the wait cycle count. The method includes transferring the data from the memory device using the first input/output pin and the second input/output pin concurrently.

Abstract: An object is to provide a semiconductor device with a novel structure in which stored data can be held even when power is not supplied, and the number of times of writing is not limited. The semiconductor device is formed using a wide gap semiconductor and includes a potential change circuit which selectively applies a potential either equal to or different from a potential of a bit line to a source line. Thus, power consumption of the semiconductor device can be sufficiently reduced.

Abstract: A system and method to read and write data at a memory cell that includes multiple non-volatile memories is disclosed. In a particular embodiment, a memory device is disclosed that includes a plurality of memory cells, where at least one of the memory cells comprises a first non-volatile memory including a first resistive memory element and a second multi-port non-volatile memory including a second resistive memory element.

Abstract: A memory system includes a nonvolatile semiconductor memory which includes a first original block composed of n (n being natural number) write unit areas and a first subblock composed of a plurality of write unit areas. A controller writes data having one of first to p-th (p being natural number smaller than n) addresses into the first original block. The controller writes data which has a first write address of one of the first to p-th addresses into the first subblock when the controller receives request to write data having the first write address and data having the first write address exists in the first original block.

Abstract: A controller uses N dedicated ports to receive N signals from N non-volatile memories independent of each other, and uses a bus in a time shared manner to transfer data to and from the N non-volatile memories. The controller receives from a processor, multiple operations to perform data transfers, and stores the operations along with a valid bit set active by the processor. When a signal from a non-volatile memory is active indicating its readiness and when a corresponding operation has a valid bit active, the controller starts performance of the operation. When the readiness signal becomes inactive, the controller internally suspends the operation and starts performing another operation on another non-volatile memory whose readiness signal is active and for which an operation is valid. A suspended operation may be resumed any time after the corresponding readiness signal becomes active and on operation completion the valid bit is set inactive.

Abstract: A data read method for reading data to be accessed by a host system from a plurality of flash memory modules is provided. The data read method includes receiving command queuing information related to a plurality of host read commands from the host system, each of the host read commands is corresponding to one of a plurality of data input/output buses coupled to the flash memory modules. The data read method also includes re-arranging the host read commands and generating a command giving sequence according to the data input/output buses corresponding to the host read commands. The data read method further includes sequentially receiving and processing the host read commands from the host system according to the command giving sequence and pre-reading data corresponding to a second host read command. Thereby, the time for executing the host read commands can be effectively shortened.

Abstract: A semiconductor device comprises a plurality of terminals, a plurality of drive units corresponding to the plurality of terminals, and a data control unit. The data control unit outputs parallel data applied to the plurality of terminals to the plurality of drive unit in a normal operation mode, and converts serial data applied to a particular terminal, which is one of the plurality of terminals, to parallel data, and outputs the parallel data to which the serial data applied to the particular terminal is converted to the plurality of drive units in a test mode.

Abstract: Disclosed is a semiconductor device including: a first switch controlling connection between a first data line pair a second data line pair; a first amplifier connected to the first data line pair; a second switch controlling the connection between the second data line pair and a third data line pair; a second amplifier amplifying data on the second data line pair and delivering the amplified data to the third data line pair; a third amplifier connected to the third data line pair; and a switch control circuit controlling the second switch. Based upon a first control signal that controls precharging and equalization of the first data line pair, the switch control circuit renders the second switch conductive when precharging and equalization of the first data line pair is not carried out, and renders the second switch non-conductive when precharging and equalization of the first data line pair is carried out.

Abstract: A data value is read from one port of a dual-port memory cell during a clock cycle. A WRITE assist pulse having a delay from an end-of-read signal is generated. The delay and duration of the WRITE assist pulse are optionally user-selectable. A high voltage (e.g., Vdd) is coupled to the bitlines (e.g., BL-A, BLc-A) of the first port during the WRITE assist pulse, and a low voltage value (e.g., zero) is written to the memory cell through the second port (e.g., BL-B, BLc-B) during the clock cycle.

Abstract: A system and method for performing memory operations in a multi-plane flash memory. Commands and addresses are sequentially provided to the memory for memory operations in memory planes. The memory operations are sequentially initiated and the memory operation for at least one of the memory planes is initiated during the memory operation for another memory plane. In one embodiment, each of a plurality of programming circuits is associated with a respective memory plane and is operable to program data to the respective memory plane in response to programming signals and when it is enabled. Control logic coupled to the plurality of programming circuits generates programming signals in response to the memory receiving program commands and further generates programming enable signals to individually enable each of the programming circuits to respond to the programming signals and stagger programming of data to each of the memory planes.

Abstract: A storage device, enabling elimination of redundant write operations of non-selected data and enabling optimization of arrangement of pages to a state efficient for rewriting, having two flash memories which can be accessed in parallel, a page register for acquiring data in parallel from the flash memories and temporarily storing the same, and a control circuit having a built-in RAM in which is constructed an address conversion table for managing correspondence between logical addresses and physical addresses in units of data stored in parallel in the page register, wherein data is rewritten by updating of the address conversion table and additional writing into a storage medium.

Abstract: Methods and apparatus are disclosed for reducing write-to-read turnaround times using shadow writes in memory controllers and in DRAM. Embodiments of controllers including shadow write control logic may, in response to receiving a write request, issue an external write column address strobe (CAS) to DRAM to latch a valid write CAS address, and assert a set of write data values to be stored in a set of DRAM locations corresponding to the write CAS address. After asserting the write CAS and prior to asserting the complete set of write data values, such memory controllers may, in response to receiving a read request, issue an external read CAS to DRAM to indicate a valid read CAS address. A set of read data values from a second set of DRAM locations corresponding to the read CAS address, are received with reduced turnaround time after asserting the complete set of write data values.

Abstract: A memory system may provide for a successful write of a multi-port memory cell (e.g., dual-port 2WR SRAM cell) when it is simultaneously accessed by more than one port. This multi-port memory cell may include at least two independent accesses to the memory cell, where each access may be controlled by an independent wordline signal. Each port may have an independent pair of bitlines. Multiple write circuitry (e.g., double write circuitry) may enable the write driver to drive the input data to more than one pair of bitlines simultaneously.

Abstract: An integrated circuit may include: access circuits that couple first electrodes of a plurality of programmable metallization cells (PMC) to access paths in parallel, each PMC comprising a solid ion conducting material formed between the first electrode and a second electrode; a plurality of write circuits, each coupled to a different access path, and each coupling the corresponding access path to a first voltage in response to input write data having a first value and to a second voltage in response to the input write data having a second value; and a node setting circuit that maintains second electrodes of the PMCs at a substantially constant third voltage while write circuits couple the access paths to the first or second voltages.

Abstract: A memory device and method are provided incorporating a technique for controlling a write operation within the memory device. The memory device has an array of memory cells, each memory cell supporting writing and simultaneous reading of that memory cell. Write circuitry is arranged, during a write operation, to provide write data to a number of addressed memory cells within the array, whilst word line select circuitry is responsive to the start of the write operation to assert a write word line signal that enables those addressed memory cells to store the write data. Comparing circuitry is arranged, during the write operation, to compare the write data with data currently stored in the addressed memory cells. On detecting that the write data matches the data currently stored in the addressed memory cells, the comparing circuitry asserts a control signal to the word line select circuitry to cause the word line select circuitry to de-assert the write word line signal.

Abstract: Methods of maintaining a state of a memory cell without interrupting access to the memory cell are provided, including applying a back bias to the cell to offset charge leakage out of a floating body of the cell, wherein a charge level of the floating body indicates a state of the memory cell; and accessing the cell.

Abstract: A disturb-free static random access memory cell includes: a latch circuit having a first access terminal and a second access terminal; a first switching circuit having a first bit transferring terminal coupled to the first access terminal, a first control terminal coupled to a first write word line, and a second bit transferring terminal; a second switching circuit having a third bit transferring terminal coupled to the second access terminal, a second control terminal coupled to a second write word line, and a fourth bit transferring terminal coupled to the second bit transferring terminal; a third switching circuit having a fifth bit transferring terminal coupled to the fourth bit transferring terminal, a third control terminal coupled to a word line, and a sixth bit transferring terminal coupled to a bit line; and a sensing amplifier coupled to the bit line, for determining a bit value appearing at the bit line.

Abstract: A method and apparatus for providing bidirectional signaling in a bus topology is provided. The bus topology allows more than two electrical circuits or devices to be coupled together along one or more common electrical conductors. For each device on the bus, a transmit buffer is preferably provided for every other device on the bus with which it will communicate. One or more logic circuits, for example, a scheduler, is provided to coordinate exchange transactions between pairs of devices. Time delays are preferably provided between exchange transactions of different device pairs so as to prevent interference. Coherency checking is preferably implemented to avoid discrepancies introduced by information being held in a buffer pending an exchange transaction.

Abstract: The present invention is directed to provide a semiconductor device having a dual-port memory circuit in which influence of placement of replica cells exerted on enlargement of chip area is reduced. A memory cell array of a dual-port memory circuit has: a first replica cell array used to respond to an instruction of reading operation from one of dual ports; and a second replica cell array used to respond to an instruction of reading operation from the other dual port. Each of the replica cell arrays has: replica bit lines obtained by mutually short-circuiting parallel lines having a length obtained by cutting, in half, an inversion bit line and a non-inversion bit line of complementary bit lines to which data input/output terminals of a memory cell are coupled; and replica cells coupled to the replica bit lines and having transistor placement equivalent to that of the memory cells.

Abstract: A data holding device comprises a loop structure part (LOOP) that holds data by use of logic gates connected in a loop (e.g., inverters INV3 and INV4 of FIG. 1); a nonvolatile storage part (CL1a, CL1b, CL2a, CL2b, Q1a, Q1b, Q2a and Q2b) that utilizes the hysteresis characteristic of a ferroelectric element to store, in a nonvolatile manner, the data held in the loop structure part (LOOP); and a circuit isolating part (MUX1, MUX2, INV6, INV7, SW3 and SW4) that electrically isolates the loop structure part (LOOP) from the nonvolatile storage part.

Abstract: A processor-based system includes a processor coupled to core logic through a processor bus. This includes a dynamic random access memory (“DRAM”) memory buffer controller. The DRAM memory buffer controller is coupled through a memory bus to a plurality of a dynamic random access memory (“DRAM”) modules and a flash memory module, which are at the same hierarchical level from the processor. Each of the DRAM modules includes a memory buffer to the memory bus and to a plurality of dynamic random access memory devices. The flash memory module includes a flash memory buffer coupled to the memory bus and to at least one flash memory device. The flash memory buffer includes a DRAM-to-flash memory converter operable to convert the DRAM memory requests to flash memory requests, which are then applied to the flash memory device.

Abstract: A semiconductor storage device, in which successive reading and successive writing of data having a predetermined length from and to a memory cell specified by a certain address are performed, includes a plurality of memory cells, address input terminals through which the address is input, data output terminals through which read data having the predetermined length is output, and data input terminals through which write data having the predetermine length is input. Part of the address input terminals are also used as the data output terminals. In this way, the operation of successive reading and successive writing performed in succession at the same address can be made faster without increasing the number of terminals.

Abstract: A system, apparatus, and method to read a memory cell of a memory device is described. The method includes biasing a drain select line (DSL), a source select line (SSL), and unaddressed wordlines of a memory block to a pass voltage to set the DSL, SSL, and unselected word lines into a conducting status; applying a source reading voltage to a source node of the source line; biasing a wordline coupled to the memory cell to a reading voltage; and evaluating the voltage of the bit line. The logical status of the addressed memory cell is based on sensing the bit line voltage during a charging phase of the bit line.

Abstract: Asynchronous behavior of a circuit is modeled by modifying latches in a netlist to add an extra port to the latches, e.g., a single-port latch is transformed into a dual-port latch. Each input port has an enable line and a data input. The data input in the added port is a feedback line from the latch output, and the enable line in the added port is the logical NOR of all of the original enable lines. By adding this extra latch port in the higher-level model, it becomes possible to introduce assertion logic to ensure that one and only one latch port for a given latch is ever active during the same simulation cycle. The model can then be tested earlier in the design methodology prior to the availability of the post-synthesis netlist. The model can also be used in both simulation and formal or semi-formal verification.

Abstract: A layout for simultaneously sub-accessible memory modules is disclosed. In one embodiment, a memory module includes a printed circuit board having a plurality of sectors, each sector being electrically isolated from the other sectors and having a multi-layer structure. At least one memory device is attached to each sector, the memory devices being organized into a plurality of memory ranks. A driver is attached to the printed circuit board and is operatively coupled to the memory ranks. The driver is adapted to be coupled to a memory interface of the computer system. Because the sectors are electrically-isolated from adjacent sectors, the memory ranks are either individually or simultaneously, or both individually and simultaneously accessible by the driver so that one or more memory devices on a particular sector may be accessed at one time.

Abstract: A method for a read-before-write functionality for a memory within a programmable logic device (PLD) is provided. The method begins when a read operation and a write operation are initiated through two different ports of a memory simultaneously to access the same address in the memory. In order to prevent the write operation from proceeding prior to the read operation, a read-before-write control logic is provided to the control block of the port that supports the write operation. Thus, the write operation is paused until the control block of the port that supports the write operation receives a signal from a read sense amplifier indicating that the read operation is complete. The read sense amplifier is capable of detecting the completion of a read operation by monitoring the voltage difference of the read bitline. When this voltage difference reaches a threshold value, the read sense amplifier triggers a write wordline signal.

Abstract: A multiple partition memory and architecture for concurrent operations reduces circuit overhead by providing a common read sense amplifier and program path for multiple partitions. Long separate datalines for read and algorithm operations allow concurrent operation and blockout of multiple operations in a single block of the memory.

Abstract: A content addressable memory (CAM) device includes an array of memory cells arranged in rows and columns; compare circuitry configured to indicate match results of search data presented to each row of the array; and compare circuitry configured to indicate match results of search data presented to each column of the array, thereby resulting in a two-dimensional search capability of the array.

Abstract: Some embodiments include first memory cells and a first line used to access the first memory cells, second memory cells and at least one second line used to access the second memory cells. The first and second memory cells have a number of threshold voltage values corresponding to a number of states. The states represent values of information stored in the memory cells. During a read operation to read the first memory cells, a first voltage may be applied to the first line and a second voltage may be applied to the second line. At least one of the first and second voltages may include a value based on a change of at least one of the threshold voltage values changing from a first value to a second value. The first and second values may correspond to a unique state selected from all of the states. Other embodiments including additional apparatus, systems, and methods are disclosed.

Abstract: Techniques for block refreshing a semiconductor memory device are disclosed. In one particular exemplary embodiment, the techniques may be realized as a method for block refreshing a semiconductor memory device. The method may comprise arranging a plurality of memory cells in one or more arrays of rows and columns. Each of the plurality of memory cells may comprise a first region coupled to a source line, a second region, a first body region disposed between the first region and the second region, wherein the body region may be electrically floating and charged to a first predetermined voltage potential, and a first gate coupled to a word line, wherein the first gate may be spaced apart from, and capacitively coupled to, the first body region. The method may also comprise applying voltage potentials to the plurality of memory cells to refresh a plurality of data states stored in the plurality of memory cells.

Abstract: A packaged integrated circuit device includes a primary chip stack and a secondary chip stack. The primary chip stack includes memory chips therein that define a logical package addressable by a memory controller. The secondary chip stack includes fewer memory chips than the primary chip stack. The memory chips of the secondary chip stack are configured to be electrically connected to memory chips of at least one external device package to define an additional logical package addressable by the memory controller. The additional logical package may include a same number of memory chips as the primary chip stack.

Abstract: According to one embodiment, a first node is connected to a gate of a second PMOS and a gate of a second NMOS, a second node is connected to a gate of a first PMOS and a gate of a first NMOS, a gate of the first transistor is connected to a first signal line, a source of a first transistor is connected to the first node, and a drain of the first transistor is connected to the second node, a gate of a second transistor is connected to the second node, a source of the second transistor is connected to a third node, and a drain of the second transistor is connected to a second signal line, and a gate of a third transistor is connected to a third signal line, a source of the third transistor is connected to a fourth signal line, and a drain of the third transistor is connected to the third node.

Abstract: Methods and apparatus for use in a memory system having a non-volatile memory and a controller for limiting the number of non-volatile memory arrays from a plurality of available arrays accessed at one time are useful in the control of concurrent access of memory arrays. One method includes implementing a pipelining sequence for transferring data to and from the non-volatile memory arrays and limiting the number of active arrays operating at one time. The controller is configured to wait for the at least one of the arrays to complete before initiating a transfer to and from a further array.

Abstract: A method and apparatus for protecting non-volatile memory is described. A write command is processed only when an operating voltage is between specified operating limits and when a data pattern stored in the non-volatile memory is repeatedly read successfully.

Abstract: A memory system including a memory array, and a read write/module. The memory includes a plurality of bit lines, a plurality of word lines, and a plurality of memory cells, in which each memory cell is formed at a corresponding intersection of a bit line and a word line in the memory array. The read/write module is configured to control activation of at least two memory cells in the memory array during a read operation or a write operation, wherein the at least two memory cells activated by the read/write module are located on a different word line and a different bit line in the memory array, and wherein each memory cell coupled to a same bit line of the plurality of bit lines is configured to be written to or read from based on selection of the bit line.

Abstract: A non-volatile memory device and a method for programming the same are disclosed. The method for programming the non-volatile memory device includes generating a simultaneous write current based on a program address in such a manner that bit line write cells corresponding to memory cells coupled to the same bit line from among memory cells to be programmed can be simultaneously programmed, and providing the simultaneous write current to the bit line write cells by simultaneously enabling the bit line write cells.

Abstract: In one embodiment of the invention, a memory integrated circuit is provided including an address decoder to selectively access memory cells within a memory array; a mode register with bit storage circuits to store an enable bit and at least one sub-channel select bit; and control logic. The control logic is coupled to a plurality of address signal lines, the address decoder, and the mode register. In response to the enable bit and the at least one sub-channel select bit, the control logic selects one or more of the address signal lines to capture independent address information to support independent sub-channel memory accesses into the memory array. The control logic couples the independent address information into the address decoder.

Abstract: A method of performing a read operation in a flash memory device is disclosed. The flash memory has a memory cell array including at least one block, the block having a plurality of pages. The method comprises receiving a read command to read data from a selected page in the block; determining whether or not the block has any page that has not been programmed; performing a dummy data program operation on at least one page that is determined not to have been programmed; and executing the read command to read the data of the selected page after the dummy data program operation is completed.

Abstract: A method for performing a holding operation to a semiconductor memory array having rows and columns of memory cells, includes: applying an electrical signal to buried regions of the memory cells, wherein each of the memory cells comprises a floating body region defining at least a portion of a surface of the memory cell, the floating body region having a first conductivity type; and wherein the buried region of each memory cell is located within the memory cell and located adjacent to the floating body region, the buried region having a second conductivity type.

Abstract: Apparatus are provided for memory elements and related computing modules. An exemplary memory element includes a first array of one or more memory cells, a second array of one or more memory cells, write selection circuitry associated with the first array, and read selection circuitry associated with the second array. The write selection circuitry and the read selection circuitry are configured to be activated concurrently.

Abstract: A method may comprise executing a read operation to access a memory array by performing a preactive command to include a row-address-write operation and a bitline precharge and column selection operation and performing an activate command including a column-address-write operation and a row-decode-selection operation.

Abstract: Incrementing sequence numbers in the metadata of non-volatile memory is used in the event of a resume from power fail to determine which data in the memory is current and valid, and which data is not. To reduce the amount of metadata space consumed by these sequence numbers, the numbers are permitted to be small enough to wrap around when the maximum value is reached. Two different techniques are disclosed to keep this wrap around condition from causing ambiguity in the relative values of the sequence numbers.

Abstract: A nonvolatile semiconductor storage device includes an identification code generating circuit, a simultaneous write bit count calculation circuit, a write range calculation circuit, and a program pulse generating circuit. The identification code generating circuit generates an identification code to be assigned to every one of bits to be written, and the simultaneous write bit count calculation circuit calculates the number of bits to be written simultaneously, the number being equalized based on the generated identification code, within a range that does not exceed a maximum simultaneously writable bit number. The write range calculation circuit calculates a write range, based on the calculated number of bits to be written simultaneously, and the program pulse generating circuit generates a program pulse based on write data and on the generated identification code and the calculated write range.

Abstract: A data storage system includes a plurality of memory devices for storing data. The plurality of memory devices is classified into a plurality of groups of memory devices. A control circuit is adapted to provide concurrent memory access operations to the plurality of memory devices. Each of a plurality of data channels is configured to provide a data path between the control circuit and one of the groups of memory devices. A plurality of switches is configured to connect and disconnect one of the memory devices in a select one of the groups of memory devices to one of the plurality of data channels and concurrently connect and disconnect another of the memory devices in the select group of memory devices to a different one of the plurality of data channels.

Abstract: A controller/driver is composed of a work memory, a graphic engine, a display memory, and a driver circuit. The graphic engine converts externally received image data into first bitmap data, and stores the first bitmap data in the work memory. The display memory receives and stores second bitmap data developed from the first bitmap data stored in the work memory. The driver circuit drives a display panel in response to the second bitmap data received from the display memory.

Abstract: A memory system includes a master device, such as a graphics controller or processor, and an integrated circuit memory device operable in a dual column addressing mode. The integrated circuit memory device includes an interface and column decoder to access a row of storage cells or a page in a memory bank. During a first mode of operation, a first row of storage cells in a first memory bank is accessible in response to a first column address. During a second mode of operation, a first plurality of storage cells in the first row of storage cells is accessible in response to a second column address during a column cycle time interval. A second plurality of storage cells in the first row of storage cells is accessible in response to a third column address during the column cycle time interval. The first and second pluralities of storage cells are concurrently accessible from the interface.