Abstract: Designing operation efficiency is improved by automatically transmitting and receiving circuit-related information and layout-related information required for designing each printed board between printed boards, for designing a plurality of printed boards at the same time. In an electric information processing method in a CAD system, the printed boards are designed at the same time by transmitting and receiving the circuit design information relating to the printed boards and the layout design information relating to the printed boards between the circuits and layouts relating to the printed boards.

Abstract: A circuit design system includes a schematic design tool configured to generate schematic information and pre-coloring information for a circuit. The circuit design system also includes a netlist file configured to store the schematic information and the pre-coloring information on a non-transitory computer readable medium and an extraction tool configured to extract the pre-coloring information from the netlist file. A layout design tool, included in the circuit design system, is configured to design at least one mask based on the schematic information and the pre-coloring information. The circuit design system further includes a layout versus schematic comparison tool configured to compare the at least one mask to the schematic information and the pre-coloring information.

Abstract: Roughly described, a method for synthesizing a circuit design from a logic design includes developing candidate solutions for a particular signal path, a first candidate solution identifying a first library cells followed immediately downstream thereof by a first set of zero or more buffers, and a second candidate solution identifying a second library cell followed immediately downstream thereof by a second set of zero or more buffers, the first library cell and first set of buffers in combination being different from the second library cell and second set of buffers in combination. The computer system selects among the candidate solutions at least in part in dependence upon sensitivity of the solution to load capacitance in the particular path, and stores the selected solution in the storage for subsequent use in further developing and fabricating an integrated circuit device.

Abstract: A method comprises tracing a first and second terminal of a junction through a circuit layout to associated power supplies to determine their respective defined bias values. The method further comprises comparing the defined bias values of each terminal in order to determine, based on the comparison, whether the junction is forward biased.

Abstract: An apparatus calculates a delay time of nets within a circuit included in design data by a processing unit. The processing unit performs a process that includes selecting a first calculation to calculate the delay time of a net when the net satisfies a first condition, when the first calculation is not selected by the selecting, selecting the first or second calculation to calculate the delay time of the net, depending on whether the net satisfies a second condition, and calculating the delay time of the net by the first or second calculation selected by the selecting.

Abstract: Various techniques for use in connection with automated circuit design and simulations are disclosed. In some embodiments, a method includes receiving initial condition signals from circuitry in a chip, and correlating values of at least some of the initial condition signals with objects in a hardware description language (HDL) used in simulation, wherein the HDL was used in describing at least some of the circuitry in the chip. Still other embodiments involve memory substitutions. Replicated circuitry may be in the same chip(s) are the design circuitry or a different chip(s). Still other embodiments are described.

Abstract: A method for inserting characteristic extractor is provided. The method includes parsing a transaction level model (TLM) of an electronic device of a target system to find out at least one target point of an operation status of the electronic device; and inserting at least one characteristic extractor into the at least one target point.

Abstract: A system, a computer program product, and a computer-implemented method are provided for automatically generating a LVS rule file, and/or for automatically generating a regression test data suite.

Abstract: In one embodiment, creating a layout for a Printed Circuit Board (PCB) by creating n boundary lines at n locations, respectively, on the PCB and placing n sets of electronic components on the n boundary lines, respectively; and iteratively adjusting and evaluating the layout of the PCB until a set of layout requirements for the PCB has been satisfied.

Abstract: A method of resistor matching in analog integrated circuit layout is disclosed. Shapes of mismatching resistor blocks are analyzed to obtain geometrical information for deforming the mismatching resistor blocks. The mismatching resistor blocks are deformed into centrosymmetrical blocks according to the obtained geometrical information, each mismatching resistor block being decomposed to a plurality of unit-resistors. The unit-resistors are placed into matching resistor blocks to return a resulting layout with improved matching quality by reducing centroid offset between a centroid of the unit-resistors and a centroid of the matching resistor block.

Abstract: A plurality of diagnosis methods are provided for enabling hardware debugging. A first diagnosis method enables hardware debugging by means of time abstraction. A second diagnosis method enables hardware debugging by means of abstraction and refinement. A third diagnosis method enables hardware debugging by means of QBF-formulation for replicated functions. A fourth diagnosis method enables hardware debugging by means of a max-sat debugging formulation. A system and computer program for implementing the diagnosis methods is also provide.

Abstract: A method of generating a set of defect candidates for a wafer includes generating a filtration area according to a graph operation of one or more of a plurality of layout areas. The wafer includes at least one die manufactured according to a mask, and the mask is prepared by combining the plurality of layout areas. The method further includes generating the set of defect candidates by omitting a subset of initial defect candidates having positions within the filtration area.

Abstract: A method includes creating a technology file including data for an integrated circuit including at least one die including at least one metal layer to be formed using at least one of a single patterning process or a multi-patterning process, creating a netlist including data approximating at least one of capacitive or inductive couplings between conductors in the metal layer of at least one die based on the technology file, simulating a performance of the integrated circuit based on the netlist, adjusting the routing between the at least one die and the interposer based on the simulation to reduce the at least one of the capacitive or the inductive couplings, and repeating the simulating and adjusting to optimize the at least one of the capacitive or inductive couplings.

Abstract: In one embodiment of the invention, a method includes reading an automatically generated timing budgeting file, including timing budget information for a plurality of partitions of an integrated circuit design; graphically displaying a time budgeting debug window on a display device; and graphically displaying a timing budget analyzer window on the display device in response to selection of a selected signal path in a path list window pane. The timing budget analyzer window graphically displays timing budgets and timing delays of a selected path for visual comparison. The time budgeting debug window includes a button with a path category menu to display one or more signal paths meeting a selected path category, and a path list window pane to display a list of one or more signal paths through one or more ports of the plurality of partitions in response to the selected path category in the path category menu.

Abstract: A design method of on-board wiring for a designed circuit includes determining a severity as a crosstalk prevention index for a pair of wires based on a generated noise level of a damaging side wire and a permissible noise level of a damaged side wire. The pair of wires is then assigned a severity class (SC) based on the severity determined. The SC is a pre-defined value range(s) for severity classification. Based on a preset SC specific permissible value list, one or more by-design permissible values belonging to the SC is generated for a design element of the pair of wires. A layout of the pair of wires on a board is constructed based on the by-design permissible value.

Abstract: A method for determining relevance values representing a relevance of a combination of an input node of a first number of input nodes with a measurement node of a second number of measurement nodes for a detection of a fault on a chip applies a third number of tests at the first number of input nodes, measures for each test of the third plurality of tests a signal at each of the second number of measurement nodes to obtain for each measurement node of the second number of measurement nodes a third number of measurement values, and determines the relevance values, wherein each relevance value is calculated based on a correlation between the third number of test input choices defined for the input node of the respective combination and the third number of measurement values associated to the measurement node of the respective combination.

Abstract: One embodiment of the present invention provides a system that attempts to satisfy routing rules during routing of an integrated circuit (IC) chip design. During operation, the system receives a routing solution for the IC chip design and a set of routing rules to be satisfied by the routing solution. The system then assigns weights to the set of routing rules, wherein a higher weight for a routing rule indicates a higher importance of the routing rule. The system additionally assigns effort levels to the set of routing rules, wherein a higher effort level for a routing rule indicates that a higher amount of resources are available to satisfy the routing rule. The system then modifies the routing solution to satisfy the routing rules based at least on the weights and the effort levels associated with the routing rules.

Abstract: A system for simulating operation of a VLSI interconnect structure having capacitive and inductive coupling between nodes thereof, including a processor, and a memory, the processor configured to perform obtaining a matrix X and a matrix Y containing different combinations of passive circuit element values for the interconnect structure, the element values for each matrix including inductance L and inverse capacitance P, obtaining an adjacency matrix A associated with the interconnect structure, storing the matrices X, Y, and A in the memory, and performing numerical integration to solve first and second equations.

Abstract: A method of designing a cross-point non-volatile memory device including memory elements arranged in (N×M) matrix, each of the memory elements including a variable resistance element and a bidirectional current steering element connected in series with the variable resistance element, the method comprises the step of: when an absolute value of a low-resistance state writing voltage is VR and an absolute value of a current flowing through the variable resistance element having changed to a low-resistance state by application of the low-resistance state writing voltage to both ends of the variable resistance element in a high-resistance state is Ion, and a relationship between a voltage V0 applied to both ends of the bidirectional current steering element and a current I flowing through the bidirectional current steering element is approximated as |V0|=a×Log(I)+b, deciding N, M, VR, Ion, a, and b such that b?VR/2>a×[Log {(N?1)×(M?1)}?Log(Ion)] is satisfied (S101).

Abstract: Disclosed are a method, apparatus, and computer program product for performing interactive layout editing to address double patterning approaches to implement lithography of electronic designs. A spatial query is performed around the shape(s) being created during editing with the distance of allowed spacing in a single mask. If a design error is encountered, corrective editing may occur to correct the error. Checking may occur to make sure that the error detection and corrective actions can be performed interactively.

Abstract: A technique for implementing an clock tree distribution network having a clock buffer and a plurality of LC tanks that each take into consideration local capacitance distributions and conductor resistances. An AC-based sizing formulation is applied to the buffer and to the LC tanks so as to reduce the total buffer area. The technique is iterative and can be fully automated while also reducing clock distribution power consumption.

Abstract: Techniques for placement in highly constraint chip architectures are described herein. In an example embodiment, a computer system places a digital portion of an electronic design for a programmable chip. The programmable chip comprises multiple fixed-function blocks and a plurality of pins, where each one of the multiple fixed-function blocks can be coupled only to a respective subset of the plurality of pins. The electronic design comprises a particular fixed-function block (FFB) instance that is connected to a particular input-output (IO) instance. The computer system places (e.g., by using a backtracking search) the particular FFB instance on a particular fixed-function block and the particular IO instance on a particular pin from a particular subset of the plurality of pins, where in the programmable chip the particular fixed-function block can be coupled only to the particular subset of the plurality of pins.

Abstract: A method for designing a system on a target device is disclosed. A first netlist is generated or a first version of the system in a first compilation. Optimizations are performed on the first version of the system during synthesis resulting in a second netlist. A third netlist is generated or a second version of the system in a second compilation. The first version of the system in the first netlist and the second version of the system in the third netlist are differentiated to identify identical regions.

Abstract: A programmable logic device (PLD) includes a non-volatile memory, a configuration memory, and a control circuitry. The control circuitry couples to the non-volatile memory and to the configuration memory. A set of voltages are derived from the outputs of the control circuitry, and are applied to circuitry within the PLD.

Abstract: A method for emulating a circuit design includes receiving, at an emulation interface, signal values associated with probed signals from a verification module of a custom prototype board which can be described by at least one board description file and can comprise at least one field programmable gate array for emulating the circuit design. The method can also include processing, the probed signal values associated with a portion of the circuit design being emulated, the emulation interface being capable of being configured to provide timing and control information to at least the verification module, and can comprise a controller and a memory device, with the controller being capable of being configured to receive the probed signal values. The method can further include storing the processed information and transmitting it to the host workstation.

Abstract: Methods and apparatuses are described for formally verifying a bit-serial division circuit design or a bit-serial square-root circuit design. Some embodiments formally verify a bit-serial division circuit design using a set of properties that can be efficiently proven using a bit-level solver. In some embodiments, the set of properties that are used for verifying a bit-serial division circuit design does not include any terms that multiply a w-bit partial quotient with the divisor. Some embodiments formally verify a bit-serial square-root circuit design using a set of properties that can be efficiently proven using a bit-level solver. In some embodiments, the set of properties that are used for verifying a bit-serial square-root circuit design does not include any terms that compute a square of a w-bit partial square-root.

Abstract: The present disclosure relates to a method and apparatus for accurate RC extraction. A pattern database is configured to store layout patterns and their associated 3D extraction parameters. A pattern-matching tool is configured to partition a design into a plurality of patterns, and to search the pattern database for a respective pattern and associated 3D extraction parameters. If the respective pattern is already stored in the pattern database, then the associated 3D extraction parameters stored in the database are assigned to the respective pattern without the need to extract the respective pattern. If the respective pattern is not stored in the pattern database, then the extraction tool extracts the pattern and stores its associated 3D extraction parameters in the pattern database for future use. In this manner a respective pattern is extracted only once for a given design or plurality of designs.

Abstract: Plasma processing focus ring design arrangements, including: acquiring a surface voltage and a sheath thickness above a surface of the object to be processed, and a surface voltage and a sheath thickness above a surface of the focus ring, by an equivalent circuit analysis; performing 2D plasma and 2D electric field analysis, based on the equivalent circuit analysis; and designing configuration of the focus ring and the processing stage, to achieve a plasma-sheath interface flattening condition by making a sum of a height from a height reference point to a surface of the object and a sheath thickness from the surface of the object to a plasma-sheath interface above the object, equal to a sum of a height from the height reference point to a surface of the focus ring and a sheath thickness from the surface of the focus ring to a plasma-sheath interface above the focus ring.

Abstract: A system for designing a semiconductor package using a computing system, comprising: a virtual stacking module configured to receive a layout parameter for a first chip, a layout parameter for a second chip, and a layout parameter for a package substrate, and in response to the layout parameters of the first chip, the second chip, and the package substrate, generate a plurality of virtual layouts in which the first and second chips are stacked, on the package substrate; a modeling module configured to model operating parameters for the first and second chips and the package substrate in response to the virtual layouts; and a characteristic analyzing module configured to analyze operating characteristics of the virtual layouts in response to the modeled operating parameters.

Abstract: A floorplanning method for an analog integrated circuit layout is disclosed. A first-type block is defined as a movable and deformable block with rectangle constraint, and a second-type block is defined as a fixed-size block without rectangle constraint. Each block in the floorplan is classified to the first-type or the second-type block. In a shape determination stage, a target shape is determined among candidates of the first-type block, the first-type block accordingly being modified to the target shape, resulting in at least one overlap in the floorplan. In an overlap elimination stage, neighboring blocks of each said overlap are analyzed, the overlap being then eliminated by utilizing surrounding space, resulting in unused space in the floorplan. In an enlargement stage, the unused space is utilized for enlarging the first-type block.

Abstract: A system and method are provided for establishing a debugging environment in an Electronic Design Automation work-flow. A user-interface is provided for interfacing with users by displaying a list of debuggable parameters, accepting a selection thereof, and automatically locating both the callback function which sets the selected parameter, and the source code file which contains the callback function. Additionally, it is determined whether the callback function sets solely the selected parameter, or several different parameters, and an automatic breakpoint is set accordingly to break only responsive to the selected parameter. On execution of the modified callback function, execution will be arrested by the automatically-set intelligent breakpoint and a debugging user-interface will be generated for the user to display the relevant source code, callback function, parameter names and values, system state, and the like. Upon completion of the debugging process, the automatically-set breakpoint will be removed.

Abstract: A utility includes a design-for-manufacturing (DFM) checker configured to check layout patterns of an integrated circuit, and a layout change instruction generator configured to generate a layout change instruction based on a result generated by the DFM checker. The DFM checker and the layout change instruction generator are embodied on a non-transitory storage media. The layout change instruction specifies an identifier of a layout pattern among the layout patterns, and a respective layout change to be performed on the layout pattern.

Abstract: A method for generating legal colorable multiple patterning standard cell placement is provided. In this method, a standard cell library including color information can be accessed. For each standard cell, edge labels can be assigned based on colors of objects within a predetermined distance from each edge. A truth table, which indicates legal spacing between pairs of standard cells based on their edge labels, can be accessed. A plurality of standard cells of a design can then be placed based on the truth table.

Abstract: A method is provided for use during static timing analysis of an integrated circuit design to produce an equivalent waveform model, the method comprising: using an analog model of the inner component, to simulate an inner component to produce multiple analog simulation output characterization waveforms as a function of multiple input waveforms used to characterize the design cell; using the analog model of the inner component to simulate the inner component to produce an analog simulation output waveform as a function of the complex waveform; and producing the equivalent waveform model as a function of the multiple analog simulation output characterization waveforms and the analog simulation output waveform.

Abstract: A system and method are provided for establishing an automated debugging environment in an Electronic Design Automation (EDA) work flow for the debugging of parameterized cells (PCELLS/PyCELLS) in a layout. A user may merely select a particular PCELL within a hierarchical PCELL and the system and method will determine dependencies thereof. The source code for the selected PCELL and its dependencies may be located and loaded. At least one breakpoint may be set in the source code of the selected PCELL. The source code for the selected PCELL and its dependencies may be executed to be arrested at the set breakpoints. Upon the arrest of execution, a debugging environment may be established and the located source code of the selected PCELL may be displayed along with values for parametric components thereof and progression control tools.

Abstract: Technology is disclosed herein that provides for modifying a circuit design to reduce the potential occurrence of single event upset errors during operation of a device manufactured from the synthesized design. After a circuit design has been synthesized to a particular abstraction level, a static timing analysis procedure is run on the design. The slack values for paths within the design are determined based upon the static timing analysis procedure. Subsequently, delays are added to selected paths within the design based upon the slack values.

Abstract: Testing of memories is done using an optimized memory built-in-self-test (MBIST) approach, including the generation of compact models for memory. Cost functions are constructed from estimated parameters affecting MBIST, and a user is able to assign relative weights to the parameters. Estimated parameters include MBIST area, wiring congestion, and timing overhead, as well as power consumption and timing. The cost functions are minimized using optimization techniques, resulting in an optimized grouping of memory devices and an optimized schedule for MBIST testing. The estimated parameters may be derived from a compact model constructed from data experimentally-derived from various memory devices. This approach allows a circuit designer to generate and revise groupings and schedules prior to running a full design flow, saving time and cost, while still achieving high-quality results.

Abstract: A technique validates results from a circuit simulation estimation program. The technique determines whether the estimated results satisfy Kirchhoff's current law (KCL), Kirchhoff's voltage laws (KVL), and power conservation for the original circuit. A reporting tool shows the validation results and may be customized by the user. The tool can show in the original circuitry where the estimated results may be inaccurate.

Abstract: Techniques are provided to allow users of Electronic Design Automation (EDA) tools to define constraint template types for efficiently associating constraints with design objects to specify design intent. Processes for creating and validating the constraints are provided by user-defined plug-ins, thereby allowing users to annotate circuit designs with constraints for proprietary layout and fabrication processes without exposing the constraints to tool vendors or competitors. The constraints are re-created from the template types whenever the circuit design is loaded into the EDA tool, so that the constraints are based upon the latest version of the template type. The constraints are also re-created when validation fails. Constraint groups are reusable in different designs, technology nodes, and processes because they automatically expand to provide the specific constraints to achieve a goal.

Abstract: A system, method, and computer program product are provided for testing a circuit representation. A command line input is received at a command line interface. The command line input is translated into one or more test conditions. Additionally, a test environment configured to simulate the circuit representation and verify the one or more test conditions is generated.

Abstract: A computer executes a signal delay evaluation program to determine whether reference levels used to define slew rates of a first circuit block are different from those used for a second circuit block that receives an output signal from the first circuit block. The computer corrects an output slew rate of the output signal supplied from the first circuit block to the second circuit block, based on a difference in the reference levels that is found between the first and second circuit blocks.

Abstract: A data processing system determines current information corresponding to a node included at a device design. Physical layout information corresponding to the node is received, the physical layout information including one or more layout geometries, the one or more layout geometries providing a circuit network. The circuit network may be partitioned into two or more network segments. A current conducted at a network segment is identified based on the current information. Information representative of dimensions and metal layer of a layout geometry included at the network segment is received. The computer determines that the current exceeds a predetermined maximum threshold, the predetermined maximum threshold determined based on the dimensions and metal layer.

Abstract: A parameter correction method includes: obtaining, from a variability-aware simulation, a simulation result value of a predetermined product performance for a reference candidate value set concerning statistics of predetermined product characteristics; calculating a likelihood by substituting the reference candidate value set, the obtained simulation result value, statistics of measurement values of the predetermined product characteristics and a measurement value of the predetermined product performance into a likelihood function that is defined from a probability density function for the statistics of the predetermined product characteristics and a probability density function for the predetermined product performance, and is a function to calculate a combined likelihood of the statistics of the predetermined product characteristics and the predetermined product performance; and searching for a reference candidate value set in case where the calculated likelihood becomes maximum, by carrying out the obtaini

Abstract: A method for efficiently producing a design layout that includes several fills between and around nets of the design layout is described. The method of some embodiments first places a set of fills in the design layout. The method then performs a timing analysis on the design layout to find out the impact of the fills on the timing of the nets. The method identifies a region of the design layout in which to trim a set of fills in order to fix any timing violations of the nets. The method then trims the set of fills in the identified region. In some embodiments, the method employs different trimming strategies for trimming fills around different nets based on the characteristics of the nets.

Abstract: A method of electron-beam lithography is provided, notably for technologies of critical dimension of the order of 22 nm. In such methods applied notably to networks of lines, the methods of the prior art do not offer precise and efficient correction of the shortenings of line ends. The method provided solves this problem by carrying out the insertion of contrast intensification structures of types which are optimized for the structure of the lines to be corrected. The method allows the semi-automatic or automatic calculation of the dimensions and locations of said structures. Advantageously, these calculations may be modeled to produce a target design, derived from libraries of components. They may be supplemented with a joint optimization of the size of the etchings and of the radiated doses, as a function of the process energy latitude.

Abstract: Techniques for use in integrated circuit design systems for extracting noise threshold data for selected cells. For example, a method comprises the following steps. A cell is selected from one or more cells in a given collection of standardized cells. Each of the one or more cells represents one or more functional circuit design blocks that are usable as part of a design of an integrated circuit. A noise signal is generated or selected. The noise signal is applied to an input node of the selected cell. Noise threshold data is identified using a noise analysis module, for a given set of process, voltage and temperature variations, for an output node of the selected cell based on the noise signal applied to the input node of the selected cell.

Abstract: Systems and methods for accommodating correlated parameters in SSTA are provided. The method includes determining a correlation between at least two parameters. The method further includes calculating a new parameter or a new parameter set based on the correlation between the at least two parameters. The method further includes performing the SSTA such that the new parameter or the new parameter set is propagated into the SSTA. The method further includes projecting slack using the correlation between the at least two parameters and using a processor.

Abstract: A system and method are provided for enabling a systematic detection of issues arising during the course of mask generation for a semiconductor device. IC mask layer descriptions are analyzed and information is generated that identifies devices formed by active layers in the masks, along with a description of all layers in proximity to the found devices. The IC mask information is compared to a netlist file generated from the initial as-designed schematic. Determinations can then made, for example, as to whether all intended devices are present, any conflicting layers are in proximity to or interacting with the intended devices, and any unintended devices are present in the mask layers. Steps can then be taken to resolve the issues presented by the problematic devices.

Abstract: A computer implemented method comprises accessing a 3D-IC model stored in a tangible, non-transitory machine readable medium, inputting a power profile in a computer processor, generating a transient temperature profile based on the 3D-IC model, identifying a potential thermal violation at a corresponding operating time interval and a corresponding location of a plurality of points of the 3D-IC design, and outputting data representing the potential thermal violation. The 3D-IC model represents a 3D-IC design comprising a plurality of elements in a stack configuration. The power profile is applied to the plurality of elements of the 3D-IC design as a function of an operating time. The transient temperature profile includes temperatures at a plurality of points of the 3D-IC design as a function of an operating time.

Abstract: An integrated circuit (IC) comprising a shielding mesh in at least one layer of the IC, the shielding mesh having a first plurality of lines which are designed to provide a first reference voltage and having a second plurality of lines which are designed to provide a second reference voltage and wherein the shielding mesh comprises a window in which signal lines are routed with less shielding than signal lines which are routed in the shielding mesh. The IC further comprising power supply lines in at least a first layer of the IC, the first layer being different than the at least one layer which contains the shielding mesh, the power supply lines being coupled to the shielding mesh and being larger in width than the first plurality of lines and the second plurality of lines.