Abstract: A method and apparatus for using a binary CAM array to implement Classless Interdomain Routing (CIDR) Address processing. A binary CAM array is segmented into a plurality of array groups, each of which includes a number of rows of binary CAM cells, a group global mask circuit, and a mask valid bit indicating whether the group global mask circuit stores a valid group global mask.

Abstract: A test-mode circuit allows the same pad of a semiconductor device to be used as a test pad during test operations and as an I/O pad during normal operations. The test-mode circuit is coupled between the pad and a reference signal (Vbg) of the device, and in response to a control signal (CTRL1) either couples the pad and the reference signal (Vbg) together or isolates the pad and the reference signal (Vbg) from each other. The test-mode circuit includes at least one NMOS transistor (MN1) and a PMOS transistor (MP1) connected in series between the pad and the reference signal (Vbg). During normal operation, the NMOS transistor (MN1) isolates the reference signal (Vbg) from the pad, and the PMOS transistor (MP1) compensates for voltage undershoot conditions at the pad.

Abstract: A bitstream having a plurality of data sets is provided to an integrated circuit device such as an FPGA having test circuitry capable of routing data to the device's internal resources, with each data set including configuration information and a trigger signal. Successive data sets of the bitstream are sequentially processed by the test circuitry in response to the trigger signals to sequentially initialize the device's resources to various states. For some embodiments, each data set includes configuration data to configure one or more configurable elements of the device to implement a desired design and includes soft data for use by a processor embedded within the device. For one embodiment, control logic is provided to selectively wait for a predetermined time period before processing a next data set.

Abstract: A trim unit includes a delay line and one or more individually selectable load elements. The delay line has a first end to receive an input clock signal, and has a second end to generate an output clock signal. Each load element includes a select transistor and a load capacitor coupled in series between the delay line and ground potential, and includes a filter circuit having an input to receive a select signal and having an output coupled to a gate of the select transistor. Upon assertion of each select signal, the filter circuit gradually charges the gate of the select transistor, which in turn causes the load element to gradually increase the phase-delay between the input and output clock signals.

Abstract: A power-on reset circuit for generating a reset signal for an associated IC device includes a pull-up resistor connected between a supply voltage and a tracking node, a pull-down transistor connected between the tracking node and ground potential, and a voltage divider circuit connected between the supply voltage and ground potential. The voltage divider circuit has a first ratioed voltage node coupled to the gate of the pull-down transistor. For some embodiments, the voltage divider circuit includes a first resistor connected between the voltage supply and the first ratioed voltage node, a second resistor connected between the first ratioed voltage node and a second ratioed voltage node, a third resistor connected between the second ratioed voltage node and ground potential, and a shunt transistor connected between the second ratioed voltage node and ground potential has a gate responsive to the reset signal.

Abstract: A bit line control circuit is coupled between a bit line of an associated Content Addressable Memory (CAM) Array and a supply voltage. The bit line control circuit adjusts the charge current for the bit line in response to a bit line control signal. For some embodiments, the bit line control circuit includes a dynamic component and a static component to control the bit line.

Abstract: A flip-flop circuit includes a flip-flop, a first pass gate, a second pass gate, and a third pass gate. The first pass gate has an input to receive an input signal, an output coupled to the flip-flop's data input, and a control terminal to receive a first control signal. The second pass gate has an input coupled to the flip-flop's data input, an output coupled to the circuit's output, and a control terminal to receive a second control signal. The third pass gate has an input coupled to the flip-flop's data output, an output coupled to the circuit's output, and a control terminal to receive a third control signal. The first, second, and third control signals may be generated in response to various logical combinations of a bypass signal and a clock enable signal.

Abstract: A content addressable memory (CAM) device includes a CAM array and a configuration circuit. The CAM array has a plurality of rows of CAM cells, each row segmented into a plurality of row segments, each row segment including a plurality of CAM cells coupled to a corresponding match line segment, and a match line control circuit having an input coupled to the corresponding match line segment, an output coupled to the match line segment in a next row segment, and a control terminal to receive a corresponding enable signal. The configuration circuit has an input to receive configuration information indicative of a width and depth configuration of the CAM array and having outputs to generate the enable signals.

Abstract: A configuration control circuit (400) allows a PLD to be quickly re-configured to implement different functions without requiring any configuration memory cells. The control circuit (400) includes a first input (IN1) connected to a first hardwired configuration bit (HCB1), a second input (IN2) connected to a second hardwired configuration bit (HCB2), an output (OUT) connected to one or more of the PLD's configurable elements (110), and a select circuit (402) to selectively connect either the first input (IN1) or the second input (IN2) to the output (OUT) in response to a select signal (SEL).

Abstract: An input circuit includes a first buffer having a first power terminal coupled to a first supply voltage, a second power terminal coupled to ground potential, an input to receive an input signal, and an output to generate a first output signal, a second buffer having a first terminal coupled to a second supply voltage, a second terminal coupled to a bias node, an input to receive the input signal, and an output to generate a second output signal, and a control circuit configured to selectively connect the bias node either to the second supply voltage or to ground potential in response to an enable signal.

Abstract: A clock selection circuit includes an output multiplexer, control logic, and edge detection logic. The multiplexer includes inputs to receive multiple input clock signals, an output to generate the output clock signal, and a control terminal to receive a synchronized clock select signal. The control logic includes a first input to receive a clock select signal, a second input to receive a first control clock signal, a third input to receive a synchronization signal, and an output to selectively update the synchronized clock select signal with transitions in the clock select signal. The edge detection logic includes first inputs to receive the multiple input clock signals, a second input to receive a second control clock signal, and an output to generate the synchronization signal.

Abstract: A bicycle seat assembly includes a tubular seat post having an upper serrated surface, a threaded aperture formed in the upper serrated surface and aligned with a longitudinal axis of the tubular seat post, a saddle support structure having a lower serrated surface adapted to mate with the upper serrated portion of the tubular seat post, the lower serrated portion including a slot through which a bolt can extend and mate with the threaded aperture, and a saddle adapted to mate with an upper surface of the saddle support, the saddle having a slit formed therein that allows access to the head of the bolt from above the saddle via the slit.

Abstract: A ternary content addressable memory device. The device includes a ternary CAM array segmented into a plurality of array groups, each of which includes a number of rows of ternary CAM cells. Each array group is assigned to a particular priority by storing the priority number for each array group in an associated storage element. Data entries are then stored in array groups according to priority.

Abstract: A CAM device for comparing a search key with a plurality of CAM words stored in a main CAM array includes a pre-compare CAM array and match line control logic. The pre-compare CAM array includes a plurality of rows, each for storing a set of pre-compare bits generated by performing a logical function on a corresponding CAM word. The match line control logic selectively pre-charges match lines in the main CAM array in response to match results from a pre-compare operation between an encoded search key and corresponding sets of pre-compare bits.

Abstract: A content addressable memory (CAM) having a main array including a plurality of columns of CAM cells, a spare column of CAM cells selectable to functionally replace a defective column of CAM cells in the main array, and circuitry to shift data corresponding to the defective column and data corresponding to all subsequent columns to corresponding adjacent non-defective columns.

Abstract: SEU-hardening series resistances loads are formed within the gate structures of cross-coupled inverters of a latch. For some embodiments, the gate contact for the input of each cross-coupled inverter has a sufficiently high resistance to provide the SEU-hardening series resistance. For other embodiments, a conductive trace layer coupled to the input of each cross-coupled inverter includes a high-resistivity portion that provides the SEU-hardening series resistance.

Abstract: A charge pump circuit for generating various pumped voltages includes a first charge pump including a plurality of first charge pump stages responsive to a first set of clock signals and having threshold voltage cancellation circuitry, a second charge pump including a plurality of second charge pump stages responsive to a second set of clock signals different from the first clock signals, and a switching circuit configured to selectively connect the second charge pump in series between the first charge pump and a voltage rail in response to a mode signal (MODE). For some embodiments, a plurality of the charge pump circuits can be selectively connected in parallel in response to corresponding select signals to generate various drive currents.

Abstract: A test cell and method of operation are disclosed. The test cell may be cascaded with other test cells to form a test structure that spans across any number of slices and/or tiles in a programmable logic device. The test structure behaves like a register, and may be used to test direct interconnects and any number their fan-out lines simultaneously.

Abstract: A method and apparatus for using a binary CAM array to implement Classless Interdomain Routing (CIDR) address processing. A binary CAM array is segmented into a plurality of array groups, each of which includes a number of rows of binary CAM cells and an associated group global mask. Each array group may be assigned to a particular prefix length by storing a prefix mask pattern corresponding to the prefix length in the array group's associated group global mask. CIDR address entries are then stored in array groups assigned to corresponding CIDR prefixes so that an array group assigned to a particular prefix stores only CIDR addresses having that prefix.

Abstract: A video encoder/decoder includes a vector pipeline unit and is configured only once by a processor to encode/decode data in accordance with any one of the JPEG, MPEG1, MPEG2 or MPEG4, H.261 or H.263 compression standards. The configuration data is stored in a configuration register of the video encoder/decoder. An optional ROM stores the configuration data for subsequent reading and loading—by the processor—into the configuration register. The vector pipeline unit includes: a run-length decoder, a binary arithmetic logic unit, a binary multiplier/divider, an accumulator, a barrel shifter, a round/modify unit, a saturate logic unit, a status register and a run-length encoder. Each component of the vector pipeline unit is optionally enabled or disabled. By disabling one or more components of the vector pipeline unit the power consumed by the encoder/decoder is reduced.