Abstract: A method and system are provided for adjusting a write timing in a memory device. For instance, the method can include receiving a data signal, a write clock signal, and a reference signal. The method can also include detecting a phase shift in the reference signal over time. The phase shift of the reference signal can be used to adjust a phase difference between the data signal and the write clock signal, where the memory device recovers data from the data signal based on an adjusted write timing of the data signal and the write clock signal.

Abstract: In a normal, non-loop mode a uOp buffer receives and stores for dispatch the uOps generated by a decode stage based on a received instruction sequence. In response to detecting a loop in the instruction sequence, the uOp buffer is placed into a loop mode whereby, after the uOps associated with the loop have been stored at the uOp buffer, storage of further uOps at the buffer is suspended. To execute the loop, the uOp buffer repeatedly dispatches the uOps associated with the loop's instructions until the end condition of the loop is met and the uOp buffer exits the loop mode.

Abstract: A device receives an indication that a memory bank is to be powered down, and determines, based on receiving the indication, shutdown scores corresponding to powered up memory banks. Each shutdown score is based on a shutdown metric associated with powering down a powered up memory bank. The device may power down a selected memory bank based on the shutdown scores.

Abstract: A device receives an indication that a memory bank is to be powered up, and determines, based on receiving the indication, power scores corresponding to powered down memory banks. Each power score corresponds to a power metric associated with powering up a powered down memory bank. The device powers up a selected memory bank based on the plurality of power scores.

Abstract: A processor includes a physical register file having physical registers and an execution unit to perform an arithmetic operation to generate a result mapped to a physical register, wherein the processor delays a write of the result to the physical register file until the result is qualified as valid. A method includes mapping the same physical register both to store load data of a load-execute operation and to subsequently store a result of an arithmetic operation of the load-execute operation, and writing the load data into the physical register. The method further includes, in a first clock cycle, executing the arithmetic operation to generate the result, and, in a second clock cycle, providing the result as a source operand for a dependent operation. The method includes, in a third clock cycle, enabling a write of the result to the physical register file responsive to the result qualifying as valid.

Abstract: A device may generate a clock signal using spread-spectrum clocking. The spread-spectrum clocking may modulate a frequency of the clock signal to produce a plurality of frequencies for the clock signal during a modulation cycle. The device may receive an instruction to disable the spread-spectrum clocking, and may disable the spread spectrum clocking at the end of the modulation cycle.

Abstract: A tester information tester information processing system provides test equipment for generating test data. A markup language encoder connected to the test equipment encodes the test data for storage in an object-oriented database management system connected to the markup language encoder, and a user interface is operatively connected to the object-oriented database management system for retrieval of the test data.

Abstract: Various semiconductor workpieces and methods of dicing the same are disclosed. In one aspect, a method of manufacturing is provided that includes forming a channel in a metallization structure on a backside of a semiconductor workpiece. The semiconductor workpiece includes a substrate. The channel is in substantial alignment with a dicing street on a front side of the semiconductor chip.

Abstract: Provided herein is a method and system for providing and analyzing unified data signaling that includes setting, or analyzing a state of a single indicator signal, generating or analyzing a data pattern of a plurality of data bits, and signal, or determine, based on the state of the single indicator signal and the pattern of the plurality of data bits, that data bus inversion has been applied to the plurality of data bits or that the plurality of data bits is poisoned.

Abstract: An integrated circuit (IC) generates clock delay control signals based on its operational voltage level. The clock delay control signals are routed to corresponding clock gating logic that controls the synchronous capturing of the outputs of corresponding signal paths. The clock gating logic delays the clock signal used by the corresponding flip-flop in response to an assertion of the corresponding received clock delay control. Thus, the clock signal used to capture the outputs of certain signal paths may be delayed under certain voltage conditions. This selective clock path delay for different signal paths enables the IC to use a higher clock frequency, or more reliably latch the path outputs at a certain clock frequency, even though different signal paths may exhibit different relative path delays under different operating voltage conditions.

Abstract: In a system comprising a first device and a second device coupled via an interconnect, a method includes setting a rate of insertion of clock mismatch compensation symbols for a transmit port of the first device to one of a plurality of rates of insertion responsive to the second device having capability to compensate for a clock frequency mismatch. A device includes an interconnect interface comprising a transmit port and a receive port, and a configuration structure. The configuration structure comprises a capability field to store a value indicating whether the device has a capability to compensate for a clock frequency mismatch, and an enable field. The device further includes a packet control module to configure a rate of insertion of clock mismatch compensation symbols by the transmit port into a data stream responsive to a value stored at the enable field.

Abstract: In one embodiment, a processor comprises a programmable map and a circuit. The programmable map is configured to store data that identifies at least one instruction for which an architectural modification of an instruction set architecture implemented by the processor has been defined, wherein the processor does not implement the modification. The circuitry is configured to detect the instruction or its memory operands and cause a transition to Known Good Code (KGC), wherein the KGC is protected from unauthorized modification and is provided from an authenticated entity. The KGC comprises code that, when executed, emulates the modification. In another embodiment, an integrated circuit comprises at least one processor core; at least one other circuit; and a KGC source configured to supply KGC to the processor core for execution. The KGC comprises interface code for the other circuit whereby an application executing on the processor core interfaces to the other circuit through the KGC.

Abstract: A processor transfers prefetch requests from their targeted cache to another cache in a memory hierarchy based on a fullness of a miss address buffer (MAB) or based on confidence levels of the prefetch requests. Each cache in the memory hierarchy is assigned a number of slots at the MAB. In response to determining the fullness of the slots assigned to a cache is above a threshold when a prefetch request to the cache is received, the processor transfers the prefetch request to the next lower level cache in the memory hierarchy. In response, the data targeted by the access request is prefetched to the next lower level cache in the memory hierarchy, and is therefore available for subsequent provision to the cache. In addition, the processor can transfer a prefetch request to lower level caches based on a confidence level of a prefetch request.

Abstract: A method for validating standard cells stored in a standard cell library and for use in design of an integrated circuit device is described. Each standard cell of the standard cells is iteratively placed adjacent to each side and corner of itself and each other standard cell of the standard cells to produce an interim test layout comprising a first plurality of cell pair permutations. The cell pair permutations are reduced by identifying at least one of: illegal or redundant left-right and top-bottom boundaries, and removing any cell pair permutations using the identified boundaries to generate a final test layout comprising a second plurality of cell pair permutations.

Abstract: The present system enables passing a pointer, associated with accessing data in a memory, to an input/output (I/O) device via an input/output memory management unit (IOMMU). The I/O device accesses the data in the memory via the IOMMU without copying the data into a local I/O device memory. The I/O device can perform an operation on the data in the memory based on the pointer, such that I/O device accesses the memory without expensive copies.

Abstract: A semiconductor device includes a layer of semiconductor material having an active transistor region defined therein, an isolation trench formed in the semiconductor material adjacent the active transistor region, and a trench liner lining the isolation trench, wherein the trench liner is formed from a material that substantially inhibits formation of high-k material thereon, and wherein the isolation trench and the trench liner together form a lined trench. The device has an insulating material in the lined trench, and high-k gate material overlying at least a portion of the insulating material and overlying at least a portion of the active transistor region, such that the trench liner divides and separates the high-k gate material overlying the at least a portion of the insulating material from the high-k gate material overlying the at least a portion of the active transistor region.

Abstract: In one disclosed embodiment, a method for producing a high resolution resist pattern on a semiconductor wafer comprises depositing a blanket layer of material on a semiconductor wafer, forming a resist interaction substrate on the blanket layer of material, forming a resist layer of a pre-determined thickness on the resist interaction substrate, exposing the resist layer to a patterned radiation, and developing the resulting high resolution resist pattern. In one embodiment, patterned radiation is provided by an extreme ultraviolet (EUV) light source. In other embodiments, patterned radiation may be provided by an electron beam, or ion beam, for example. In one embodiment, the resist layer comprises a chemically amplified resist utilizing a photogenerated acid (PGA), and having a sublayer. In other embodiments, the resist layer includes an additive, for example, fullerite. One disclosed embodiment involves use of an ultra-thin resist layer in combination with a gold resist interaction substrate.

Abstract: A semiconductor device fabrication process includes forming insulating mandrels over replacement metal gates on a semiconductor substrate with first gates having sources and drains and at least one second gate being isolated from the first gates. Mandrel spacers are formed around each insulating mandrel. The mandrels and mandrel spacers include the first insulating material. A second insulating layer of the second insulating material is formed over the transistor. One or more first trenches are formed to the sources and drains of the first gates by removing the second insulating material between the insulating mandrels. A second trench is formed to the second gate by removing portions of the first and second insulating materials above the second gate. The first trenches and the second trench are filled with conductive material to form first contacts to the sources and drains of the first gates and a second contact to the second gate.

Abstract: Systems and methods are provided that utilize non-shared page tables to allow an accelerator device to share physical memory of a computer system that is managed by and operates under control of an operating system. The computer system can include a multi-core central processor unit. The accelerator device can be, for example, an isolated core processor device of the multi-core central processor unit that is sequestered for use independently of the operating system, or an external device that is communicatively coupled to the computer system.

Abstract: A method and apparatus for powering up an integrated circuit (IC). An IC includes a plurality of power domains each coupled to receive power from one of a plurality of power sources. Each power domain includes a power-sensing unit. A power-sensing unit in a first one of the plurality of power domains is coupled to receive a first power ok signal from an upstream power domain, and is configured to assert a second power ok signal to be provided to a second power domain. A power-sensing unit in the second power domain is coupled to detect the presence of voltage in the first power domain, and to receive the first power ok signal. When the power-sensing unit in the second power domain has both sensed the presence of power in the first power domain and received the second power ok signal, a third power ok signal is asserted.