Abstract: An electrical filter structure includes a first filter core structure and a second filter core structure. The first filter core structure includes a plurality of shunt impedance elements. Similarly, the second filter core structure includes a plurality of shunt impedance elements. Shunt impedance elements of the first filter core structure are arranged in different conducting layers of a multi-layer structure, and shunt impedance elements of the second filter core structure are arranged in different layers of the multi-layer structure. Transmission lines used to implement the shunt impedance elements are interleaved.

Abstract: An apparatus for testing electronic devices is disclosed. The apparatus includes a plurality of probes attached to a substrate; wherein each probe is capable of elastic deformation when the probe tip comes in contact with the electronic devices; each probe comprising a plurality of isolated electrical vertical interconnect accesses (vias) connecting each probe tip to the substrate, such that each probe tip of the plurality is capable of conducting an electrical current from the device under test to the substrate. The plurality of probes may form a probe comb. Also disclosed is a probe comb holder that has at least one slot where the probe comb may be disposed. A method for assembling and disassembling the probe comb and probe comb holder is also disclosed which allows for geometric alignment of individual probes.

Abstract: A first A/D converter converts an analog observed value, which corresponds to a power supply signal supplied to a power supply terminal of a DUT, into a digital observed value. By means of digital calculation processing, a digital signal processing circuit generates a control value that is adjusted such that the digital observed value matches a predetermined reference value. A first D/A converter supplies, via a power supply line to the power supply terminal of the DUT, an analog power supply signal obtained by performing digital/analog conversion of the control value. A load estimating unit applies a test signal containing a predetermined frequency component via the power supply line to a node via which the power supply terminal is to be connected, and generates a control parameter for the digital signal processing circuit according to the test signal and the observed signal.

Abstract: A pulse light source includes: a master laser that outputs a master laser light pulse whose repetition frequency is controlled to a predetermined value; a slave laser that outputs a slave laser light pulse; a phase comparator that detects a phase difference between an electric signal having a frequency of the predetermined value, and an electric signal based on a light intensity of the slave laser light pulse; a loop filter; an adder that adds a repetition frequency control signal having a certain repetition cycle, to an output from the loop filter; and a phase comparator that measures a pulse phase difference which is a phase difference between the master laser light pulse and the slave laser light pulse. A magnitude of the repetition frequency control signal is controlled such that the measured pulse phase difference matches with a target value of the pulse phase difference.

Abstract: A method of determining a density of a roller compacted ribbon is disclosed. The method comprises compacting dry pharmaceutical powder between press rollers of a roller compactor to produce a compact ribbon. The method also comprises determining a thickness at a point on the compact ribbon in a non-invasive manner after it has rolled out from in between the press rollers. Further, the method comprises passing the compact ribbon through a gap in between the terahertz emitter and the terahertz detector. Next, the method comprises determining a refractive index at the point on the compact ribbon using a measurement value from the terahertz emitter and the terahertz detector and a measured value for the thickness at the point. Finally, the method comprises computing a density of the compact ribbon at the point using a value of the refractive index.

Abstract: There is provided a semiconductor switch apparatus that can handle a wide range of input voltages. The switch apparatus includes a main switch that is provided between a first terminal and a second terminal, and a switch controller that, to turn on the main switch, supplies the same gate-source voltage to the main switch irrespective of a direction of a current flowing through the main switch. To turn on the main switch, the switch controller supplies the gate-source voltage that is determined based on at least one of a voltage of the first terminal and a voltage of the second terminal to a gate of the main switch.

Abstract: According to the present invention, an electromagnetic wave measurement device includes an electromagnetic wave output device, an electromagnetic wave detector and a measurement unit. The electromagnetic wave output device outputs an electromagnetic wave having a frequency equal to or more than 0.01 [THz] and equal to or less than 100 [THz] toward a device under test including at least two layers, and the electromagnetic wave detector detects reflected electromagnetic waves which are the electromagnetic waves reflected by the respective at least two layers. The measurement unit measures the device under test based on one or both of extreme values of electric fields of the respective reflected electromagnetic waves and a time difference between timings in which the electric fields of the respective reflected electromagnetic waves take the extreme values.

Abstract: An electromagnetic wave measurement device includes an electromagnetic wave outputter that outputs an electromagnetic wave having a frequency equal to or more than 0.01 THz and equal to or less than 100 THz toward a device under test. An electromagnetic wave detector detects the electromagnetic wave which has transmitted through the device under test. A relative position changer changes a relative position of an intersection of an optical path of the electromagnetic wave transmitting through the device under test and the device under test, with respect to the device under test, so that the intersection is at a predetermined relative position due to the refraction of the electromagnetic wave by the device under test. A characteristic value deriver derives a characteristic value of the electromagnetic wave based on a detection result of the electromagnetic wave detector, the characteristic value being associated with the predetermined relative position.

Abstract: A probe apparatus providing an electrical connection between a device under test and a test apparatus body, comprising a device-side terminal unit including a flexible sheet and device-side connection terminals passing through the sheet and connected to the device under test; an intermediate substrate provided on the test apparatus body side of the device-side terminal unit and including device-side intermediate electrodes electrically connected to the device-side connection terminals and tester-side intermediate electrodes electrically connected to the test apparatus body; a tester-side substrate that is provided on the test apparatus body side of the intermediate substrate and includes, on the intermediate substrate side thereof, tester-side electrodes electrically connected to the test apparatus body; and a contact section provided between the intermediate substrate and the tester-side substrate and including first pins connected to the tester-side intermediate electrodes and second pins connected to the t

Abstract: A fatty tissue image display device includes a light source, an ultrasonic wave transmission/reception mechanism, an analysis unit which calculates a velocity change of ultrasonic waves after irradiation with a heating beam as compared to before irradiation with light, a display control unit which displays the distribution of the calculated velocity change of the ultrasonic waves, a designation unit which waits for the designation of a region of interest, a histogram calculation unit which, based on luminance information or color information within the designated region of interest, calculates the histograms of a fatty region showing a negative velocity change of the ultrasonic waves and a normal region showing a positive velocity change of the ultrasonic waves, and an index calculation unit which, from the calculated histograms of the fatty and normal regions, calculates a fatty change index that is an index of a proportion of fatty tissue.

Abstract: In a cable assembly, when auxiliary ground conductor is provided so as to face the lower surface of supporting insulating member, elastically-deformed piece in an elastically deformed status comes in contact with the tip of ground terminal protruding from the lower surface of supporting insulating member.

Abstract: An apparatus for determining a number of successive equal bits preceding an edge within a bit stream including a repetitive bit sequence includes an edge number determiner, an edge selector, a time stamper and an equal bits determiner. The edge number determiner determines a preset number of edges. The preset number of edges is coprime to a number of edges of the repetitive bit sequence or coprime to a maximal number of edges of the repetitive bit sequence. The edge selector selects edges of the bit stream spaced apart from each other by the preset number of edges. Further, the time stamper determines a time stamp for each selected edge of the bit stream and the equal bits determiner determines the number of successive equal bits preceding the edge based on determined time stamps of selected edges.

Abstract: According to the present invention, an electromagnetic wave measurement device includes: an electromagnetic wave detector, a frequency component acquisition unit, and a thickness indication quantity deriving unit. An object to be measured is disposed on a substrate and includes at least two layers, and the electromagnetic wave detector detects a substrate-surface-reflected electromagnetic wave which has been made incident to the object, has been reflected by the substrate, and has passed through the object. The frequency component acquisition unit acquires an amplitude of a frequency component of the substrate-surface-reflected electromagnetic wave. The thickness indication quantity deriving unit derives a thickness indication quantity based on the amplitude of the frequency component of the substrate-surface-reflected electromagnetic wave and a relationship between the thickness indication quantity and the amplitude of the frequency component of the substrate-surface-reflected electromagnetic wave.

Abstract: A test apparatus for testing a device under test, includes a low-speed comparator, a high-speed comparator that is operable faster than the low-speed comparator, and a switching section that switches, according to a signal output from the device under test, which one of the low-speed comparator and the high-speed comparator is used to measure a signal under measurement output from the device under test. The test apparatus may further include a termination resistance that is arranged in parallel with the high-speed comparator.

Abstract: Provided is a measurement circuit that measures a signal under measurement input thereto, comprising a level comparing section that outputs a logic value according to a comparison result between a signal level of the signal under measurement and a set threshold level; a logic comparing section that acquires the logic value output by the level comparing section at a comparison timing input thereto; and a timing adjusting section that adjusts relative phases of a signal output by the level comparing section and the comparison timing, based on the expected value pattern of the signal under measurement and the threshold level.

Abstract: Provided is a handler apparatus that conveys a device under test to a test socket, including: a socket for adjustment which, prior to fitting of a device holder holding the device under test to the test socket, fits the device holder; a socket-for-adjustment position detecting section that detects a relative position of the device under test with respect to the socket for adjustment, in a state in which the device holder fits the socket for adjustment; an actuator that adjusts a position of the device under test on the device holder, based on the detected relative position of the device under test; and a conveyer that conveys the device holder, in which a position of the device under test has been adjusted, to fit the test socket.

Abstract: A test apparatus that tests a device under test, comprising first and second test substrates facing each other; test circuits provided respectively on a first substrate surface of the first test substrate facing the second test substrate and a second substrate surface of the second test substrate facing the first test substrate; a first cooling section provided on the first substrate surface of the first test substrate to house the test circuit and to have a cooling medium introduced therein; and a second cooling section provided on the second substrate surface of the second test substrate to house the test circuit and to have a cooling medium introduced therein. The first and second cooling sections include respective contact portions in contact with each other, and each contact portion has a connection opening that connects inside of the first cooling section and inside of the second cooling section to each other.

Abstract: In accordance with one embodiment of the invention, a method and apparatus are provided for testing a wafer while the wafer is disposed in a wafer carrier. The test results can be utilized to adjust the manufacturing process and thereby increase processing yield.

Abstract: A bit sequence generator for generating a bit sequence defined by a generating function and an initial state of the generating function comprising a plurality of state machines and a multiplexer. Each state machine of the plurality of state machines generates a time-interleaved bit sequence, wherein a state machine generates a bit of the time-interleaved bit sequence for a current time step based on at least one bit generated by the state machine for a preceding time step, the generating function of the bit sequence to be generated, and the initial state of the generating function and independent from a time-interleaved bit sequence generated by another state machine of the plurality of state machines. Further, a multiplexer selects successively one bit from each generated time-interleaved bit sequence in a repetitive manner to obtain the bit sequence defined by the generating function and the initial state of the generating function.

Abstract: Systems and methods for measuring a phase noise of a test signal. A test system includes a recursive delayer, a combiner and a phase noise determinator. The recursive delayer is configured to provide a recursively delayed signal on the basis of the test signal. The combiner is configured to combine a first signal with a second signal to provide a combiner output signal. The first signal is generated based on the test signal and the second signal is generated based on the recursively delayed signal. The phase noise determinator is used to determine phase noise information based on the combiner output signal.