Abstract: The group delay of a DUT is measured by modulating test and reference portions of a local oscillator signal at different frequencies to create modulation sidebands, applying the modulated test portion of the local oscillator signal to the DUT, and then optically mixing the two modulated signals. Optically mixing the two modulated signals translates the optical frequencies down to electrical frequencies. Phase changes that are caused by the DUT are determined by measuring the phase differences between modulation sidebands of the test portion of the local oscillator signal. Frequency translation can be achieved by electrical mixing instead of optical mixing.

Abstract: The problem of sequentially “squeezing” small fields of data in a larger data path in and out of a memory device can be solved in an algorithmically driven memory tester by defining sub-vectors to represent data in the small field, where a sequence of sub-vectors represents the data that would be represented by a full sized vector if such a full sized vector could be applied to the DUT. A programming construct in the programming language of the algorithmically driven memory tester allows sub-vectors to be defined, as well as an arbitrary mapping that each is to have. The arbitrary mapping is not static, but changes dynamically as different sub-vectors are encountered. Arbitrary dynamic mappings change as sub-vectors are processed, and may include the notion that, during the activity for a sub-vector, this (or these) bit(s) of a vector do not (presently) map to any pin at all of the DUT.

Abstract: A light modulator having a waveguide and a resonator is disclosed. The waveguide routes light of wavelength ? past the resonator. The resonator is coupled to the waveguide such that a portion of the light is input to the resonator, the resonator having a resonance at ?. The resonator includes a gain region in which light of wavelength ? is amplified and an absorption region in which light of wavelength ? is absorbed, the absorption region having first and second states, the first state absorbing less light of wavelength ? than the second state, the state of the absorption region is determined by an electrical signal coupled to the absorption region. The gain region provides a gain that compensates for the light absorption in the first state. In one embodiment, the waveguide and resonator are critically coupled when the absorption region is in the second state.

Abstract: In one embodiment, a switch includes first and second mated substrates defining therebetween a number of cavities. A plurality of wettable elements are exposed within one or more of the cavities. A switching fluid is held within one or more of the cavities. The switching fluid serves to connect and disconnect at least a pair of the plurality of wettable elements in response to forces that are applied to the switching fluid. A gas is also held within one or more of the cavities. The gas is provided to react with oxides on or in the cavities. An actuating fluid is held within one or more of the cavities and applies the forces to the switching fluid. Methods of making such a switch are also disclosed.

Abstract: A software product tests and monitors an Internet server system. Advantageously, the software product communicates with a web browser without the need for other client software to configure transactions. The user of the web browser is guided through web pages to record, edit, and playback transactions. Recording may occur over a secure connection. The software product performs automated tests using the transactions in addition to measuring both system performance data and business performance data. The software product generates alarms when thresholds are exceeded. The test data, performance data, and alarms are correlated in time and presented graphically to the user.

Abstract: The invention provides an apparatus adapted for supplying a plurality of clock signals. The apparatus comprises a set of clock signal circuits for generating m clock signals of at least two different signal periods, with m being a natural number, and a superperiod signal-generating unit adapted for deriving, from a dedicated clock signal of said set of clock signals, a first superperiod signal. The signal period of said first superperiod signal is a common multiple of the clock signals' signal periods.

Abstract: A real time DSO is equipped with a Digital Trigger Filter that performs high frequency rejection, low frequency rejection, AC and DC triggering. The Digital Trigger Filter includes first and second digitally implemented IIR (Infinite Input Response) Filters. A digitized Conditioned Input Signal is applied to the first IIR Filter. It has taps that provide the Trigger Signal outputs needed for high and low frequency rejection. The high frequency rejection output of the first ER Filter is essentially a low pass output (3 dB down at 50 KHz) and is also used as the digital input to the second IIR Filter, whose output is a much more aggressive suppression of high frequencies (3 dB down at 50 Hz). The AC Trigger Signal output is produced by subtracting the output of the second IIR filter from the original input to the entire Digital Trigger Filter, and the DC Trigger Signal output is simply the same as that original input. A MUX selects which Trigger Signal is applied to a Digital Trigger Comparator.

Abstract: Methods, systems and computer readable media for imposing monotonic consistency among results of multiple platforms measuring the same specific property for the same/equivalent series of samples, to provide viable comparisons of sensitivity and precision among the platforms as well as provide useful conversion formulas among the platforms to ensure equivalent quantitation.

Abstract: A universal fixture for testing a device, such as a bare printed circuit board, includes a plurality of addressable contact points. Each of the contact points includes a switch connected to a conductor capable of creating an electrical connection to the device. To obtain a measurement of a target on the device, two of the contact points on the universal fixture are selected based on the position of the target on the device relative to the contact points.

Abstract: In a method for forming one or more features in a thick-film ink deposited on a substrate, a photoimagable material is used to define a negative of the one or more features on the substrate. A thick-film ink is then deposited on at least part of the substrate, abutting at least some of the photoimagable material. The thick-film ink is cured, and the photoimagable material is removed. One embodiment of the method is used to produce a channel plate. Another embodiment of the method is used to produce a switch.

Abstract: A method, a system and/or a computer readable medium for accessing design data including an electronic image of an integrated circuit to be tested; determining whether a pin of the integrated circuit has been assigned to a port in a multi-port automated test environment; enabling a displayable pin indicator based in part upon the determination of whether a pin is assigned to a port; and displaying the electronic image and the displayable pin indicator.

Abstract: Methods and devices for detecting deposition unit misalignment, e.g., printhead misalignment, of an in situ polymeric, e.g., a nucleic acid, array synthesis device are provided. In accordance with the subject methods, at least one test probe feature is synthesized on a substrate using an in situ polymeric array, e.g., nucleic acid array or protein array, synthesis device. The at least one test probe feature is then contacted with at least two different distinguishably labeled targets, e.g., target nucleic acids. The binding of the targets to the at least one test probe feature is then evaluated to detect any misalignment, e.g., deposition unit or pulse jet misalignments, of the synthesis device. Also provided are substrates having at least one test probe feature and at least one polymeric array, as well as methods of using the substrates in array assays. Also included are kits for use in practicing the subject methods.

Abstract: A method of measuring a DUT provides a vector network analyzer with at least two measurement ports and measures characteristics of thru, reflect, and line calibration standards at the measurement ports. Error coefficients are calculated as well as a shifted electrical length attributable to the measured calibration standards. S-parameters of the DUT are measured and corrected based upon the error coefficients. A reference plane is shifted for each element of the corrected S-parameter matrix to a measurement reference plane, and ? SA_portn ? LA_portm = S 21 ? _thru ? _nm ? S 12 ? _thru ? _nm wherein S21—thru—nm is equal to S12—thru—mn and an argument of both solutions for S21—thru—nm is fit to a straight line, the solution having a y-intercept closest to zero being a correct solution and a resulting argument of the correct solution being the electrical delay.

Abstract: Automated methods and systems for determining an in-focus-distance for a position on the surface of a molecular array substrate using a molecular array scanner are provided. A signal from a first position of an array substrate is detected and noise is filtered out of the detected signal using a symmetrical filter to produce an in-focus-distance. In one embodiment, the in-focus-distance is utilized as an estimated in-focus-distance at a second position of the array substrate. The method finds use in maintaining the focus of a light source while scanning the array by the scanner. Also provided are methods of assaying a sample using the methods and systems of the invention, and kits for performing the invention. The subject invention finds use in a variety of different applications, including both genomics and proteomics applications.

Abstract: A connection apparatus includes a switch; a control signal connector that transmits a switching signal, sent from a controller, to the switching means; a first plurality of connectors that are connected to the switch and that are to be connected to a plurality of measurement connectors included in first measuring apparatus for measuring a first electrical characteristic of the device under test; and a second plurality of connectors that are connected to the switch and that are to be connected to a plurality of measurement connectors included in second measuring apparatus for measuring a second electrical characteristic of the device under test. In accordance with the switching signal sent from the controller via the control-signal connector, the switch performs switching so that either the first plurality of connectors or the second plurality of connectors are electrically connected to the device under test.

Abstract: A semiconductor-device characteristic measurement apparatus includes first measuring unit for measuring a first electrical characteristic of a device under test, second measuring unit, switch for switching between the first measuring unit and the second measuring means such that one of the measuring unit is connected to the device under test, and controller for controlling the switching means. The switch includes switches that switch between a first wiring configuration for electrically connecting the first measuring unit to the device under test and a second wiring configuration for electrically connecting the second measuring unit to the device under test. The switch is electrically connected to the device under test at a position closer to the device under test than the first measuring unit and the second measuring unit.

Abstract: An optical measuring device for providing a measurement of an optical device under test -DUT- comprises a measuring unit for providing an optical stimulus signal for the DUT and/or receiving a response signal of the DUT, and a visual fault localization unit for visually localizing faults within the DUT or a connection thereto. The measuring unit and the visual fault localization unit are preferably coupled to a signal direction unit, and the signal direction unit is further coupled to a connector representing an interface of the optical measuring device for coupling the DUT thereto.

Abstract: A slave test unit is used in conjunction with a remote test unit to test voice signal quality parameters, such as clarity, delay and echo. A remote master test unit, or a remote slave test unit, controls the slave test unit via commands sent by the remote test unit over a phone connection established by the remote test unit. Such a system of test units eliminates the need for a human test operator to be present at the location of the slave test unit. The inclusion of a “dialback” capability in the slave test unit allows a remote test unit to instruct the slave test unit to call back the remote test unit, thus allowing voice quality tests to be performed over a phone connection that has been initiated by the slave test unit. This capability is advantageous in voice quality testing over phone connections involving a digital data network, since the path of the connection through a data network is typically determined by the location of the origination of the call.

Abstract: A phase-diverse coherent optical spectrum analyzer is presented. An optical receiver receives a first input signal and a second input signal, and produces at least a first output signal, a second output signal, and a third output signal based on mixing the first input signal and the second input signal. A processing unit isolates heterodyne components from the first output signal, the second output signal and the third output signal, wherein the heterodyne components comprise a first signal and a second signal that represent the phase-diverse nature of the optical mixing process. Phase diversity of the heterodyning between the first input signal and the second input signal is achieved by the coherent optical spectrum analyzer.

Abstract: A signal-analyzing unit has a sampling path and a reference path both receiving a digital test signal. The sampling path has a first comparator for comparing the test signal against a first threshold value and providing a first comparison signal, and a first sampling device receiving as input the first comparison signal and a first timing signal. The reference path has a second comparator for comparing the test signal against a second threshold value and providing a second comparison signal, and a second sampling device for receiving as input the second comparison signal and a second timing signal. An analysis unit receives and analyzes the output of the sampling and reference paths.