Abstract: A system implementing an MBIST device is disclosed. The system includes an ECC-protected memory and the MBIST device for self-test of the memory. The MBIST device includes a first access port communicatively connected to the memory via a first path, the first path excluding the ECC logic associated with the embedded memory, and a second access port communicatively connected to the memory via a second path, the second path including the ECC logic associated with the memory. The device is configured to test the memory, in a first mode of operation, via the first path and, in a second mode of operation, via the second path. One advantage of such system includes re-using, with little additional die area, of MBIST logic already required for manufacturing test of the product (first mode of operation) for system or application level tests that may be carried out by customers (second mode of operation).

Abstract: Apparatus and methods for analog-to-digital conversion of quadrature receive signals are provided herein. In certain implementations, a transceiver system includes at least a first pair of analog-to-digital converters (ADCs) associated with a first quadrature receiver channel and a second pair of ADCs associated with a second quadrature receiver channel. The first and second pairs of ADCs can provide analog-to-digital conversion of the same receive signal, but can have different noise profiles relative to one another, such as a low pass noise profile and a band pass noise profile. The transceiver system can further include a reconstruction filter for combining the outputs of at least the first and second pairs of ADCs to generate output signals associated with a lower overall noise profile relative to that of either pair of ADCs alone.

Abstract: A digital to analog converter (DAC) maps a digital word to an analog output. The DAC bits may have amplitude and timing errors. These errors (or sometimes referred herein as “non-idealities”) result in distortion and degradation of the dynamic range in DACs. To reduce these negative effects, delta-sigma patterns can be provided to two bit cells, a reference bit cell and a bit cell under calibration, to perform, e.g., amplitude calibration and timing skew calibration. Delta-sigma patterns are particularly advantageous over square wave signals, which cannot be scaled to perform amplitude calibration between bit cells having different bit weights and are limited in frequency to integer fractions of the sampling clock.

Abstract: An exemplary level shifter includes a clock level shifter configured to generate a level shifted clock signal from an input clock signal; and a switched capacitor logic controller coupled to the clock level shifter. The switched capacitor logic controller is configured to steer the level shifted clock signal based on a data signal and the input clock signal, providing a level shifted version of the data signal.

Abstract: An analog-to-digital converter (ADC) circuit comprises a digital-to-analog (DAC) circuit including at least N+n weighted circuit components, wherein N and n are positive integers greater than zero, and n is a number of repeat bits of the least significant bit (LSB) of the ADC circuit; a sampling circuit configured to sample an input voltage at an input to the ADC circuit and apply a sampled voltage to the weighted circuit components; a comparator circuit configured to compare an output voltage of the DAC to a specified threshold voltage during a bit trial; and logic circuitry configured to perform bit trials for the at least N+n weighted circuit components and adjust one or more parameters for one or more of N bit trials according to values of the n LSB repeat bits.

Abstract: Disclosed systems include a clock-multiplying phase locked loop (PLL) generating a clock signal for a DAC comprising a plurality of DAC cells, the systems configured to control that a phase of the DAC output has a predefined relation to a phase of a PLL input reference clock. An exemplary system incorporates an auxiliary DAC cell implemented as a replica of one of the DAC cells of the DAC and operation of the DAC and the auxiliary DAC cell is timed with the same clock signal generated by the PLL, so that outputs of the auxiliary cell and the DAC are phase synchronized by design. The system is configured to ensure that a phase of the auxiliary DAC cell output is related to the phase of the PLL reference clock, which results in a phase of the DAC output also being related to the phase of the PLL reference clock.

Abstract: In an aspect, in general, a programmable computation device performs computations of an inference task specified by a plurality of variables and a plurality of factors, each factor being associated with a subset of the variables. The device includes one or more processing elements. Each processing element includes a first storage for a definition of a factor, a second storage for data associated with the inputs and/or outputs of at least some of the computations, and one or more computation units coupled to the first storage and the second storage for performing a succession of parts of the at least some of the computations that are associated with a factor, the succession of parts defined by data in the storage for the definition of the factor.

Abstract: A signal processing device has a first discrete time analog signal processing section, which has an input, an output, a plurality of charge storage elements, and plurality of switch elements coupling the charge storage elements. The device has a controller coupled to the first signal processing section configured to couple different subsets of the charge elements of the first signal processing section in successive operating phases to apply a signal processing function to an analog signal presented at the input of the first signal processing section and provide a result of the applying of the signal processing function as an analog signal to the output of first signal processing section. The signal processing function of the first signal processing section comprises a combination of a filtering function operating at a first sampling rate and one or more modulation functions operating at corresponding modulation rates lower than the first sampling rate.

Abstract: In one example implementation, the present disclosure provides a modular approach to reducing flicker noise in metal-oxide semiconductor field-effect transistors (MOSFETs) in a device. First, a circuit designer may select one or more surface channel MOSFETs in a device. Then, the one or more surface channel MOSFETs are converted to one or more buried channel MOSFETs to reduce flicker noise. One or more masks may be applied to the channel(s) of the one or more surface channel MOSFETs. The technique maybe used at the input(s) of operational amplifiers, and more particularly, rail-to-rail operational amplifiers, as well as other analog and digital circuits such a mixers, ring oscillators, current mirrors, etc.

Abstract: One or more stopper features (e.g., bump structures) are formed in a standard ASIC wafer top passivation layer for preventing MEMS device stiction vertically in integrated devices having a MEMS device capped directly by an ASIC wafer. A TiN coating may be used on the stopper feature(s) for anti-stiction. An electrical potential may be applied to the TiN anti-stiction coating of one or more stopper features.

Abstract: Provided herein are apparatus and methods for a variable gain passive attenuator with multiple layer attenuation devices. In certain configurations, at least two rows of stacked FETs are layered in blocks, namely H (horizontal) blocks in a hierarchical schematic representation of the variable gain passive attenuator. Each stack of FETs receives a control signal, and by delaying a second control signal with respect to a first control signal, performance and linearity can be enhanced while insertion loss is reduced.

Abstract: In an example, a successive approximation register analog-to-digital converter includes a switched capacitor digital-to-analog converter (DAC) first array to sample an input signal and to convert a sample of the input signal to a digital value represented by a plurality of bits, the first array including a first group of capacitors representing at least some of the plurality of bits, a switched capacitor DAC second array including a second group of capacitors representing at least some of the plurality of bits, wherein at least one bit of the plurality of bits represented by the second group of capacitors is represented by at least two capacitors, and wherein each of the two capacitors is configured to be selectively connected to a selected one of at least two reference potentials such that the at least one bit represented by the second group of capacitors is switchable between at least three states.

Abstract: The disclosed apparatus and methods include a reconfigurable sampling accelerator and a method of using the reconfigurable sampling accelerator, respectively. The reconfigurable sampling accelerator can be adapted to a variety of target applications. The reconfigurable sampling accelerator can include a sampling module, a memory system, and a controller that is configured to coordinate operations in the sampling module and the memory system. The sampling module can include a plurality of sampling units, and the plurality of sampling units can be configured to generate samples in parallel. The sampling module can leverage inherent characteristics of a probabilistic model to generate samples in parallel.

Abstract: Apparatus and method for an output stage of an amplifier are disclosed. A current source circuit provides current to a transistor connected to the amplifier output node to produce output voltage, and the current source circuit has two current mirror paths, one of which replicates the output voltage at the output node. As the output voltage approaches rail, more current is steered to the current mirror path not replicating the output voltage and provides additional current or voltage necessary to keep the current source circuit operational.

Abstract: A pipeline analog-to-digital converter (ADC) converts an analog input signal over several stages, where a stage generates a residue for the subsequent stage to digitize. The residue is generated by coarsely quantizing the analog input signal to generate a digital code, which is used to reconstruct the analog input signal, and the residue is the difference between the analog input signal and the reconstructed version of the analog input signal. The coarse quantization can have errors which are attributed to comparator offsets and bandwidth mismatch. To estimate the comparator offsets while being insensitive to bandwidth mismatch, peak and trough detectors are used to track maximum and minimum values of the residue or the output of the ADC over time, and an expected value estimating the comparator offset can be computed based on the maximum and minimum values. The expected value advantageously “averages” out the bandwidth mismatch contribution to the offset.

Abstract: In some converter architectures, unary digital-to-analog (DAC) converter elements generate an analog output which represents the digital input signal. Thermometer codes trigger an appropriate number of DAC elements to generate the analog output. The DAC elements are not all perfectly weighted, and mismatch shaping is often used to dynamically equalize the usage of each DAC element during data conversion to average out the mismatches. Unfortunately, mismatch shaping adds additional switching and can worsen the effect of switching errors. Switching errors which are non-linearly dependent on the input causes a second order distortion if the sum of the switching errors corresponding to a set of DAC elements is not zero. Prior to data conversion, calibration can select a subset of DAC elements having a lesser sum of switching errors for data conversion. Other (redundant) DAC elements are not used at all or shut off permanently.

Abstract: Provided herein are apparatus and methods for single phase spot circuits. In certain implementations, a single phase spot circuit propagates a spot from input to output in response to a clock edge of a single phase clock signal. The single phase spot circuit holds the spot for about one clock cycle, thereby providing higher maximum operating frequency relative to multiphase spot circuits that hold a spot for about half of a clock cycle. Two or more single phase spot circuits can be electrically connected in a ring to operate as a spot divider. The single phase spot circuits can be used to advance a spot, represented using either a one or a zero, from one spot circuit to the next in response to a clock edge. In certain implementations, as the spot advances, a single phase spot circuit clears the spot from its input via a feedback element.

Abstract: An integrated circuit implements at least part of a phase locked loop (PLL). The integrated circuit includes a sampled analog loop filter for the PLL. The loop filter includes a first input for receiving a signal representative of a phase difference between a reference clock signal and a first clock signal, a first output for providing a frequency control signal for controlling a frequency of an oscillator, a clock input for accepting a loop timing clock signal for controlling timing of operation of the loop filter, and a digital control input for configuring a response of the loop filter according to a plurality of control values. In some examples, the loop filter includes charge storage elements coupled by controllable switches, and control circuitry for transferring charge among the charge storage elements to yield the configured response of the loop filter.

Abstract: Microelectromechanical systems (MEMS) resonators and related methods and apparatus are provided. A MEMS resonator may include a first portion and a second portion. The first portion may be configured to resonate, and the second portion may be configured to operate based on an energy trapping principle to prevent energy from traveling therethrough from the first portion. The MEMS resonator may be a Lamb wave resonator. The MEMS resonator may be anchorless. The MEMS resonator may have a side contacted by the anchor, wherein the anchor contacts greater than approximately 50% of the side.

Abstract: Various low stress compact device packages are disclosed herein. An integrated device package can include a first integrated device die and a second integrated device die. An interposer can be disposed between the first integrated device die and the second integrated device die such that the first integrated device die is mounted to and electrically coupled to a first side of the interposer and the second integrated device die is mounted to and electrically coupled to a second side of the interposer. The first side can be opposite the second side. The interposer can comprise a hole through at least the second side of the interposer. A portion of the second integrated device die can extend into the hole.