Abstract: A probe for an electrooptic sampling oscilloscope in which an electric field generated by a measured field is coupled with an electrooptic crystal. A beam is incident on this electrooptic crystal, and by the polarization state of the incident beam, the form of the measured signal is measured. The electrooptic element is supported form the end terminal side of the probe body by a probe head member that serves as the end terminal of the probe body. An insertion hole is formed from the outside up to the reflecting film on the probe head member. One end thereof is in contact with a reflecting film, the other end thereof is inserted so as to protrude from the probe head member, and at the same time, the external radial diameter of the insertion hole is formed so as to be large compared to the radial dimension of the reflected film.

Abstract: A testboard provides an interface between an IC tester and a device (16) being tested has a base unit (21) and a DUT unit (22). The base unit (21) has a plurality of connectors (24) each on a separate base card (25) which are to engage respective connectors (23) on a pin card (3) of the IC tester and a plurality cable harnesses (27) each having a connector (26) for the wires at one of its ends to be connected to a selected one of the connector (24). The DUT unit (22) has a socket board (14) with an IC socket (15) to accept the IC device (16) being tested and a plurality of connectors (29) engaged by separate second connectors (28) on the other end of the wires of a cable harness (27). A post housing and post connector (26a, 26b) can be provided at the connector of each base card to interchange the electrical connections between the connector at the end of a cable harness and the connector of a base card.

Abstract: A probe card used for testing a plurality of integrated circuits formed on a semiconductor wafer, wherein only a part of proves is changeable, a restoring method of the probe card, and a manufacturing method of the probe card. The probe card (1) used for testing a plurality of semiconductor integrated circuits formed on a semiconductor wafer, comprises: a plurality of probes (4) which can electrically conduct to the semiconductor integrated circuits; and a substrate (2) comprising a plurality of welding portions (3a) having no plating layers, to which the probes are welded.

Abstract: An electro-optic sampling probe used for observing a waveform of a test signal based on the change of the polarization state of a light pulse caused when the light pulse generated based on a timing signal is entered in an electro-optic crystal that is coupled by an electric field generated by the test signal. The electro-optic sampling probe includes an electro-optic crystal having a stopper portion at its upper portion, an electro-optic crystal supporting portion for supporting the electro-optic crystal by the stopper portion so as not to fall and capable of moving the electro-optic crystal vertically and an electro-optic crystal driving portion formed by a base and a board, to which the electro-optic crystal supporting portion is attached which moves on the base, for rectilinearly moving the electro-optic crystal along the direction of an optical axis.

Abstract: An electrooptic probe which can facilitate replacement of a metallic pin. A probe head constituting a tip end portion of a probe body including a head body for retaining an electrooptic element and a tip member detachably provided on the head body for retaining the metallic pin.

Abstract: The present invention provides an external resonator light source which, by removing natural emitted light, is able to send out only light which has an extremely high wavelength purity. As shown in FIG. 1, the present invention's external resonator light source is provided with a light amplifying element 21; a first light reflecting means 22 disposed to the side of one outgoing light edge surface 21a of the light amplifying element 21; a wavelength selecting element 23 disposed to the side of the other outgoing light edge surface 21b of the light amplifying element 21; and a second light reflecting means 24 which reflects and/or transmits outgoing light 31a from the wavelength selecting element 23, and which, together with the first light reflecting means 22, forms a light resonator; wherein outgoing light from the wavelength selecting element 23 is output as transmitted light 32 from the second light reflecting means 24.

Abstract: A peak detecting device which can efficiently detect a peak of an analog signal in a smaller error for a short time without making a sampling frequency higher. The analog signal processing apparatus (1) as the peak detecting device comprises: the frequency-dividing ratio setting device (2) for outputting the frequency-dividing ratio setting signal (2a); the frequency divider (3) for frequency-dividing the frequency of the reference clock signal (1b) by the frequency-dividing ratio which is changed by the frequency-dividing ratio setting signal (2a), to generate the sampling clock signal (3a); the A/D converter (4) for carrying out the sampling of the analog input signal (1a) at the clock timing which is synchronized with the sampling clock signal (3a); the sampling data memory (5) for memorizing the digital data (4a) which are obtained by sampling by the A/D converter (4); and the data processor (6) for reading out the digital data (4a) as the digital data (5a), to determine the peak of the digital data (5a).

Abstract: The electro-optic probe of the present invention comprises a laser diode for emitting a laser beam in accordance with a control signal from a measuring instrument main body, an electro-optic element, provided with a reflection film on the end surface thereof, a separator provided between the laser diode and electro-optic element, which is pervious the laser beam emitted from the laser diode and separates a beam reflected from the reflection film, two photodiodes which transform the beam reflected by the separator, and a glass plate used for protecting the electro-optic element.

Abstract: A protocol analyzer, a protocol analyzing method, a data storage medium, a data signal and a computer program, for exactly analyzing and displaying the OBEX protocol rapidly, according to the single frame analysis. The protocol analyzer (10) comprises: a storage section (1) for storing data for every frame, therein; an extension attribute addition section (2) for reading the data for every frame, to set a notification flag in a state in a predetermined case and to add an extension attribute to the data in a predetermined case; and an analysis section (2) for analyzing and outputting the data for every frame, according to a frame format, in a predetermined case, and for deciding the frame type of the data according to the extension attribute added to the data, to analyze and output the data according to the frame format in a predetermined case.

Abstract: An electro-optic probe having a laser diode for generating a laser beam based on a control signal from an oscilloscope body; a collimator lens for making the laser beam into a parallel beam; an electro-optic element having on an end face thereof a reflective coating, with optical characteristics which are changed by propagating an electrical field via a metal pin provided at the end face on the reflective coating side; an isolator provided between the collimator lens and the electro-optic element, which passes a laser beam generated by the laser diode and isolates a reflected beam which is reflected by the reflective coating; and photodiodes which convert the reflected beam isolated by the isolator into electrical signals. The electro-optic element is integrally affixed to a probe head which is rotatable with respect to a probe body on which the probe head is mounted.

Abstract: The present invention relates to an optical-fiber characteristics measuring apparatus that does not require frequency conversion of pulse light which enters an optical fiber to be measured, and does not restrict the cycle period of the pulse light, thereby ensuring fast measuring of the characteristics of the optical fiber. This apparatus comprises an optical directional coupler, an optical pulse generator, a balanced-light reception circuit, a signal generation section and a mixer. The optical directional coupler branches coherent light into first and second coherent lights. The optical pulse generator converts the first coherent light into pulse light which in turn enters an optical fiber to be measured. Returned light whose frequency is shifted from that of the first coherent light by a predetermined frequency through reflection and scattering in the optical fiber to be measured enters the balanced-light reception circuit.

Abstract: The output light from a light source 10 is incident upon an optical fiber to be measured via an optical directional coupler 11, an optical switch 12, an optical amplifier 13, and an optical directional coupler 14. Light from the optical directional coupler 11 is incident upon a polarization controller 16. The output light from the polarization controller 16 and light returned from the optical fiber 15 are incident into an optical balance circuit 17, and these light are interfered. A fixed frequency, or alternatively a frequency which is varied stepwise, is output from a voltage control oscillator 18, according to a control signal from a DC voltage generation circuit 19 or from a saw tooth wave generation circuit 20. The output of the optical balance circuit 17 and the output of the voltage control oscillator 18 are mixed together by a mixer 26.

Abstract: In the present invention, measuring the one-dimensional or two-dimensional voltage distribution or electrical field distribution in a measured device is made possible, and a reduction in the measuring time can be implemented.

Abstract: A test burn-in board handler for inserting and pulling out ICs under test in and from a test burn-in board, the handler comprising: a test circuit; and a burn-in board checker. The test circuit performs a pretest of the ICs under test by a simplified function test before the ICs under test are burn-in tested. The burn-in board checker tests the test burn-in board. The handler further comprises an electronic switch. The electronic switch is electrically connected with the test burn-in board on which the ICs under test are mounted, and the electronic switch switches between the first test signals of the test circuit and the second test signals of the burn-in board checker. An alignment stage straightens attitudes of the ICs under test transferred from a tray on which the ICs under test are mounted. After the attitudes of the ICs under test are straightened at the alignment stage, the ICs under test are transferred to and mounted on normal IC sockets on the test burn-in board.

Abstract: The object of the invention is to offer a light source device for frequency division multiplexed optical communications having a compact size and reduced cost. Light source units 100-300 output light having optical frequencies which oscillate at mutually different modulation frequencies centered about mutually different optical frequencies. Optical splitters 1-3 split the output light from each light source unit into two parts. An optical multiplexer-splitter 4 multiplexes and splits the output light from the optical splitters. The Fabry-Perot etalon resonator 5 transmits each component of the output light from the optical multiplexer-splitter 4 at a specific transmission rate corresponding to each optical frequency. A light receiving element 6 converts the output light from the Fabry-Perot etalon resonator 5 into an electrical signal, and a light receiving element 7 converts the output light from the optical multiplexer-splitter 4 into an electrical signal.

Abstract: A suction mechanism for an IC, in which a hollow shaft incorporating a suction pad at its lower end part is supported by a holder so as to be vertically slidable, and the suction pad is made into resilient contact with an IC accommodated in a recess on a tray when the holder is lowered. A stopper formed therein with a step part projected downward so as to laterally cover the suction pad is attached to the lower end part of the hollow shaft; the lower end of the step part is located above an IC contact surface of the suction pad, the lower surface of the stopper has at least a width with which the stopper is prevented from sinking into the recess on the tray, and a distance between the lower surface of the stopper to the IC contact surface of the suction pad is shorter than the depth of the recess on the tray.

Abstract: The defective power source detecting apparatus of a power source supply system has: an output voltage monitoring circuit 16-1 to 16-N for monitoring the DC voltage on an output end of the rectifier circuit which is an output end of each power source apparatus, and for outputting a defect detecting signal to show that the defective state occurs, when the output of the rectifier circuit is abnormal; an inverter output monitoring circuit 18-1 to 18-N for monitoring an inverter output of each power supply apparatus, and for outputting a defect detecting signal to show that the defective state occurs, when the output of the inverter is abnormal; and a control circuit 50 for fetching the monitoring outputs of the output voltage monitoring means and the inverter output monitoring means, and for judging the power source apparatus corresponding to the case in which the outputs of the rectifier circuit and the inverter are abnormal, to be defective.

Abstract: A cooling system can cool electronic devices with assurance following the heights of the electronic devices mounted on a printed board. The cooling system is thin and light in weight and can easily inspect and maintain the electronic devices. A cooling pipe is disposed in a U-shape about a plurality of electronic devices mounted on the printed board. The cooling pipe is jointed with the cooling plate by caulking from the opposite side of the printed board. A thermal conduction plate is engaged with the cooling plate from the upper portion thereof and the thermal conduction members each having the notched portion are inserted into the insertion holes of the thermal conduction plate. The thermal conduction members can be slid up and down and turned to the right and left in the insertion holes and they are pressed and biased against the electronic devices by a leaf spring provided on the thermal conduction plate.

Abstract: The present invention relates to an electro-optic sampling oscilloscope which carries out measurement of a measured signal using an optical pulse generated based on a timing signal from a timing generation circuit. The timing generation circuit includes a frequency measurement circuit which generates a gate signal for a gate interval which is a specified multiple N of the cycle of the desired sampling rate, and counts the input trigger signals during the gate interval of the gate signal; a division circuit which divides the count value of said frequency measurement circuit by the specified multiple N, and determines a divider ratio; and a frequency divider which divides the trigger signals by the divider ratio determined by the division circuit, and outputs the result as the timing signal.

Abstract: A testing device performs testing on a multistage multi-branch optical network, which contains optical lines (such as optical fibers) that are connected together at connection points (e.g., optical couplers) in a multistage multi-branch manner. An OTDR measurement device uses software to perform fault determination with respect to the multistage multi-branch optical network. Herein, optical pulses are input to an input end of the multistage multi-branch optical network, wherein they are reflected at certain portions of the optical lines and the connection points while propagating through the optical lines. Then, reflected beams are returned to the input end and are mixed together as response light, which is measured by the OTDR measurement device. The response light is converted to a plurality of digital waveform data representing a measured waveform, which is then divided into multiple ranges on the basis of the Fresnel reflection points and connection points.