Abstract: A D-FF circuit comprises: a master flip-flop and a slave flip-flop which operate in accordance with a plurality of clock signals generated by a clock signal generating circuit; wherein the slave flip-flop comprises: a clocked inverter which is disposed on a first stage of the slave flip-flop and which operates in accordance with at least one of the plurality of clock signals generated by the clock signal generating circuit, and a two-stage inverter which is connected in series with an output terminal of the clocked inverter.

Abstract: A data transfer circuit and a data transfer method are provided that can minimize the time required for transferring identical data to a plurality of data registers. A data transfer circuit for writing parallel data transferred through a data bus into a plurality of data registers is provided with auxiliary registers which respectively correspond to the data registers, a write timing determining section, and an auxiliary register setting section. At a first timing, the auxiliary register setting section makes the auxiliary registers store the respective bit values of parallel data transferred through the data bus. At a second timing, after the first timing, the write timing determining section makes the data registers store another parallel data transferred through the data bus in accordance with the respective bit values stored in the auxiliary registers.

Abstract: An apparatus for inspecting a multi-core optical fiber having a plurality of cores arranged in one plane includes a light source 10 having a plurality of optical output terminals which are connected to the incident ends of the respective cores of the multi-core optical fiber and used for putting optical signals into the respective cores thereof; optical signal taking means (12 and 14) for taking out the optical signal emitted from the emission end of each core of the multi-core optical fiber in a time series mode according to the alignment order of emission-side cores of the multi-core optical fiber; optical signal detecting means (16 and 18) for detecting the optical signal thus taken out by the optical signal taking means; and signal processing means 20 for verifying core numbers of the respective cores of the multi-core optical fiber on the basis of the signal patterns of detection outputs of the optical signal detecting means.

Abstract: A chromatic dispersion distribution measurement apparatus, comprises: a power calculation unit for calculating a power value of an input light to be input into an optical device to be measured, in order to calculate a chromatic dispersion distribution in the optical device to be measured, in accordance with an output light power of an output light from the optical device to be measured as a function of a transmission distance along the optical device to be measured; and a control unit for controlling an input light power of the input light to the optical device to be measured in accordance with the power value of the input light which is calculated by the power calculation unit.

Abstract: The semiconductor test apparatus of the present invention comprises an input data generating part for generating the input measurement data that is applied to the test device based on input measurement conditions, an expected data generating unit for generating the measurement expectation data based on the measurement conditions, a determination unit that compares the measurement result data, which the test device outputs, and the measurement expectation data based on the input measurement data, determines whether the function of the test device is a pass or failure, and outputs the measurement result data as determination data, and a data log system unit that writes in a time sequence into the log memory the associated data which includes the determination result data, the measurement result data, the measurement expectation data, and the measurement input data for a predetermined interval even after the preset writing termination conditions that terminate the writing have been satisfied.

Abstract: A wavelength correction apparatus automatically corrects a deviation of a testing wavelength from a reference spectrum analyzer installed on-site. The apparatus is constructed of a reference light source 62 for outputting a reference light of a specific wavelength; a light input terminal 50 for inputting a testing light whose wavelength is to be measured and compensated; an optical switch 54 for receiving the testing light and the reference light so as to output one either the testing light or the reference light; a control section 60 for controlling the operations of the reference light source 62 and the optical switch 54; and an optical spectrum measuring device 58 for measuring optical spectra output from the optical switch 54 and for operating the control section 60 at a point in time specified by an operator. The in-situ wavelength correction device produce precise compensates for wavelength deviation so that a compact wave correction apparatus can be used on-site of optical communications stations.

Abstract: An electro-optic sampling probe is provided, capable of irradiating a plurality of excitation light beams on a plurality of light receiving portions mounted on an IC wafer which is an object for measurement. The electro-optic sampling probe comprises a plurality of excitation optical system modules which commonly uses an objective lens for condensing the excitation light beams on the IC wafer and a detachable portion for attaching and detaching the excitation optical system module, a second probe body for covering the optical path of a light beam emitted from the excitation optical system module is provided at the rear side of the IC wafer, and at least one of the plurality of excitation optical system modules have an optical axis which differs from those of other modules; thereby at least two excitation light beams can be irradiated on the light receiving portions on the IC wafer surface.

Abstract: A chromatic dispersion distribution measuring apparatus which can determine a sign of a dispersion value, and a measuring method thereof. The chromatic dispersion distribution measuring apparatus comprises: a plurality of light sources for emitting lights having different wavelengths; an intensity measuring section for measuring a light intensity of a four-wave mixed light caused by any two lights, as a function of a transmission distance; a chromatic dispersion calculating section for calculating a chromatic dispersion value of the optical device, in accordance with the light intensity; a time measuring section for measuring a propagation time of a reflected light caused by each light; and a sign determining section for determining a sign of the chromatic dispersion value of the optical device, on the basis of two different chromatic dispersion values and two propagation times of reflected lights of two lights related to the two chromatic dispersion values.

Abstract: An electro-optic sampling probe includes an electro-optic element which is to be positioned to contact wiring on an IC wafer surface which is a measurement target and whose optical characteristics are changed depending on an electric field applied via the wiring and an electro-optic sampling optical system module having a polarized beam splitter, a wave plate, and a photo diode. The module separates light, which is transmitted through the electro-optic element and is reflected by a surface of the electro-optic element from laser light emitted from the outside and converts the separated light into an electric signal, and includes an optical axis adjuster attached to a detachable portion of an optical fiber that emits the laser light for adjusting the optical axis of the laser light and a light receiving surface adjuster attached to the detachable portion of the photo diode for adjusting the position of a light receiving surface of the photo diode.

Abstract: A control processor 1 stores a power supply current acquisition start address in a storage circuit 21 and a power supply current acquisition end address in a storage circuit 22. When a pattern generation address signal input from a pattern generator 2 matches the power supply current acquisition start address, a match detection circuit 23, 24 sets a flip-flop 6; when the pattern generation address signal matches the power supply current acquisition end address, the match detection circuit 23, 24 resets the flip-flop 6. An AND gate 7 outputs a clock signal to an AD converter 8 only while the flip-flop is set, and the AD converter 8 converts a current signal into a digital signal and outputs the digital signal to a storage circuit 9.

Abstract: Light having a predetermined wavelength band as issued from a light-emitting diode is launched into a gas absorption cell which is filled with a gas having a plurality of absorption spectra. The light launched into the cell has a plurality of wavelengths absorbed by the gas. The absorption wavelengths are known and their values are preset in a memory in an optical spectrum analyzing section 58. The light passing through the cell is launched into the optical spectrum analyzing section 58, where it receives arithmetic operations to produce an optical spectrum. The optical spectrum analyzing section 58 has a CPU which compares a plurality of wavelengths having dominant absorption in the obtained optical spectrum with the preset reference wavelengths to compute the errors in wavelength measurement. The calibration value is determined on the basis of the average of these errors and the optical spectrum analyzer is accordingly calibrated in wavelength.

Abstract: A waveform observing jig for observing a waveform of a signal outputted from a predetermined signal terminal, comprises: a contact for a signal, for contacting with a signal terminal of a board to be observed, and a plurality of contacts for a ground, for contacting with a ground pattern of the board to be observed, wherein at least one contact for a ground is in contact with the ground pattern of the board to be observed when the contact for a signal is in contact with a predetermined signal terminal of the board to be observed.

Abstract: In order to realize high-speed and highly efficient pattern data transmission without enlarging the size of circuits, a pattern data transmission device is provided which transmits compressed pattern data for generating a test pattern to be used for the inspection of a semiconductor integrated circuit from an external storage device to a pattern memory of a pattern generating device comprises a decompression section which determines whether decompressed pattern data is the same as decompressed pattern data previously written in a pattern memory according to compressed pattern data when writing the decompressed pattern data inside the compressed pattern data into a pattern memory, and an automatic disposition section which reads out the same decompressed pattern data on the pattern memory according to memory control information inputted from the decompression section and makes a copy of the same decompressed pattern data on the pattern memory.

Abstract: A chromatic dispersion distribution measurement apparatus for calculating a chromatic dispersion distribution in an optical communication path under test, comprises: an intensity ratio calculation unit for calculating an intensity ratio of a first light and a second light that are reflected from an optional position of the optical communication path under test and propagated to an incident end of the optical communication path under test by taking the same propagation time; and a chromatic dispersion value calculation unit for calculating a chromatic dispersion value in the optical communication path under test in accordance with the intensity ratio calculated by the intensity ratio calculation unit.

Abstract: A current clamp circuit which can easily restrict an output current externally in an output current amplifier circuit using a current buffer IC, is provided. The current clamp circuit 10 restricts the output current in the output current amplifier circuit 20 for amplifying the output current by using the operational amplifier 2 and the current buffer IC 1, wherein the resistor 4 is connected to the output terminal of the current buffer IC, and the output current restriction unit for restricting the output current is connected to the current buffer IC 1 and the resistor 4 in parallel.

Abstract: An inverter circuit suitable for use in a highly accurate measuring device such as an LSI tester provides a D flip-flop in addition to unit inverters and switching circuits, each of which contains a pair of a PMOS transistor and an NMOS transistor. The switching circuits are arranged in relation to the unit inverters that are connected together in a cascade connection manner. A clock signal (CLK1) consisting of clock pulses having a variable frequency is input to the unit inverter, while another clock signal (CLK3) having a constant frequency is input to the D flip-flop to produce a prescribed clock signal (CLK2, CLK4), which is continuously supplied to the switching circuits even when no clock pulse is input to the unit inverter. Thus, it is possible to avoid unwanted variations of junction temperature and response time (e.g., jitter).

Abstract: A chromatic dispersion distribution measurement apparatus, comprises: a portion information obtaining unit for obtaining a portion information which specifies a portion of an optical device to be measured; a sign information obtaining unit for obtaining a sign information which indicates a correct sign to be marked on a chromatic dispersion value in the specified portion; and a sign converting unit for converting an initial sign marked on the chromatic dispersion value in the specified portion, into the correct sign in accordance with the sign information obtained by the sign information obtaining unit.

Abstract: A chromatic dispersion distribution measurement apparatus, comprises: a chromatic dispersion value calculation unit for calculating a plurality of actual chromatic dispersion values in an optical device at a plurality of wavelengths; and a chromatic dispersion interpolation unit for interpolating an expected chromatic dispersion value between the actual chromatic dispersion values calculated by the chromatic dispersion value calculation unit, in order to obtain a chromatic dispersion distribution as a function of wavelength.

Abstract: A D-FF circuit for operating a master flip-flop and a slave flip-flop at each predetermined timing in accordance with a plurality of clock signals generated by a clock signal generating circuit, wherein the clock signal generating circuit generates the plurality of clock signals at different timings, the slave flip-flop starts operating in accordance with a clock signal which is generated at an earlier timing than another clock signal generated by the clock signal generating circuit, and the master flip-flop stops operating in accordance with a clock signal which is generated at a later timing than another clock signal generated by the clock signal generating circuit.

Abstract: In order to maintain accuracy of measurement, a temperature-insensitive electro-optic probe has a laser diode provided to emit a laser beam based on a control signal of an oscilloscope body, a collimator lens provided to convert the laser beam into a parallel beam; an electro-optic element having on an end face thereof a reflective coating, with the optical characteristics which are changed by propagating an electrical field via a metal pin provided at the end face on the reflective coating side, an isolator provided between the collimator lens and the electro-optic element, and adapted to transmit the laser beam emitted from the laser diode, in order to separate a light reflected by the reflective coating from the laser beam, a photodiode provided to convert the reflected light separated by the isolator into an electrical signal, a temperature detection section arranged to be in contact with optical components consisting the isolator, and to detect the temperature of the optical components and output the res