Abstract: A method of calculating optical frequency spectrum for use in an optical-spectrum measuring apparatus for measuring optical spectrum characteristics of a light source. In the method, a bandwidth storage section stores a characteristic of a bandwidth of passed wavelengths with respect to a measuring wavelength of a spectrometer. A CPU obtains a bandwidth of wavelengths with respect to each measuring point in accordance with the stored bandwidth of wavelengths. Then, measured intensities of light at the measuring points are used to add measured values across the measured value in a required range of bandwidth of optical frequencies. Moreover, correction is performed in accordance with a ratio of the bandwidth of wavelengths at each of the measuring points and the intervals of wavelength at the measuring points. Thus, an intensity of light at each of the measuring points is obtained.

Abstract: An automatic instrumentation system is presented that enables to eliminate or significantly reduce the effort required in preparing instrument control programs. The system includes at least one instrument, a controller for controlling the instrument and a communication line linking the instrument with the controller. The activities of each instrument are controlled by a control programs, describing the detailed steps to be taken, dedicated to each instrument, and in the present system, a dedicated control programs for an instrument is pre-installed within the instrument. Instrument control is performed by the controller which acquires the control program from the instrument memory and executing the control program, through the communication line. If the present concept is applied to a network-based system of automatic instrumentation, it is possible to construct a system that is least affected by such problems as delays caused by line congestion and line cutoff.

Abstract: Disclosed herein is an electro-optic sampling probe in which the quantity of light incident on the electro-optic sampling system module can be adjusted. The probe includes an electro-optic element that has a reflective face, an optical system for transmitting a laser beam received from an external source and an electro-optic sampling optical system module as well as unit for attenuating the quantity of light of the laser beam that is received by the optical system.

Abstract: The present invention relates to an electrooptic probe that couples an electrical field generated by a measured signal and an electrooptic crystal, makes light incident on this electrooptic crystal, and measures the waveform of the measured signal by the state of the polarization of the incident light. Here, in the probe body 22, the probe head 23 and the supporting member 44 positioned between the end terminal 22a and the part that encloses the laser diode 25 and the photodiodes 38 and 39 are formed by an insulating body (polyacetal resin). Furthermore, the photodiodes 38 and 39 and the laser diode 25 are covered by electromagnetic shield members 41 and 42 that are separated from each other.

Abstract: A semiconductor laser light source tunable in wavelength comprising: a semiconductor laser which has one facet having an antireflection coating; a tunable bandpass filter for transmitting a light having a specific wavelength from wavelength components of output light out of the one facet having the antireflection coating of the semiconductor laser; and a fiber grating member for receiving the transmitted light from the tunable band pass filter and for reflecting a light of the specific wavelength. Preferably, as the fiber grating member, a compound fiber bragg grating which comprises a plurality of fiber gratings connected in series, each of which receives transmitted light from the tunable band pass filter and reflects only an individual wavelength different from one another, is used.

Abstract: An electro-optic probe is provided which is capable of maintaining the contact pressure of the metal pin on the test object at a constant and capable of protecting the safety of the electro-optic element during measurement. The electro-optic probe has a probe head which is attached to the probe body such that a relative position of the probe head in the direction of the optical path can be elastically regulated by a spring disposed between the probe head and the probe body.

Abstract: The present invention relates to an electro-optic sampling oscilloscope. This electro-optic sampling oscilloscope carries out measurement of measured signal by using an optical pulse generated based on a timing signal generated from a timing generation circuit synchronous with a trigger signal, providing: a timing generation circuit comprising a fast ramp circuit that outputs a ramp waveform using said trigger signal as a trigger, a slow ramp circuit that increases stepwise and sequentially the output value according to said timing signal; a comparator circuit that compares the output of said fast ramp circuit and the output of said slow ramp circuit and outputs the results of this comparison; and a gate circuit that limits the output of said comparator circuit by closing a gate only when the output of said comparator circuit is unstable based on the input trigger signal and timing signal.

Abstract: A wavelength-variable light source apparatus having a wavelength measurement function for measuring the wavelength characteristic of an object to be measured. In the apparatus, a CPU outputs control signals for controlling components of a light power meter section via a bus for controlling a light detection operation. When the CPU obtains light detection level data detected by the light power meter section from light passing through an object to be measured, the CPU stores the light detection level data for each wavelength in the object to be measured in an RAM and causes a display control section to display the light detection level on a display section.

Abstract: A bit error measurement circuit of the present invention which can measure for a bit error precisely. The bit error measurement circuit comprises: a memory circuit for memorizing one period data of a signal to be measured as a reference signal, an error detection circuit for detecting erroneous bits of the signal to be measured, an error counter for counting the erroneous bits detected by the error detection circuit, and a plurality of terminals for inputting a control signal to control the memory circuit from outside of the bit error measurement circuit; wherein the reference signal memorized in the memory circuit is inspected outside the bit error measurement circuit, and the erroneous bits are corrected on the basis of the control signal fed from the outside of bit error measurement circuit, when there are erroneous bits.

Abstract: The present invention has the objective of offering an apparatus which comprehensively monitors networks which include small-scale computers and small-scale management protocols which are to be installed. In order to achieve the above objective, with respect to a system formed by a computer 22 and an analyzing apparatus 32 which are connected to a network 12, the present invention has the computer 22 connected to a network 52, and the computer 22 transmits a bit array received via the network 52 to the analyzing apparatus 32 as data. And the analyzing apparatus 32 analyzes the bit array, transmits the analysis result to the computer 22, and aides in the communication of the computer 22.

Abstract: A power-current measuring circuit 200 is structured such that two types of power supply circuits are selectively turned on in accordance with the number of chips which are formed on a wafer 60 and which must be measured. A power-current measuring circuit and a power-current detection device corresponding to the output are provided so that resolution accuracy required to perform measurement of the power current is maintained. A current-measuring-circuit selection circuit 56 enables outputs of the two types of the current measuring circuits to selectively be input to one conversion circuit. Therefore, a necessity for connecting the conversion circuit and its peripheral circuits to each of the current measuring circuit can be eliminated. As a result, the size of the circuit can be reduced.

Abstract: A semiconductor testing apparatus capable of simultaneously testing a plurality of devices 3 to be tested to which a plurality of testing circuit blocks are allotted, respectively, comprising an arithmetic circuit 6 for receiving all outputs from the plurality of testing circuit blocks to compute the decision results from the plurality of devices.

Abstract: A method of lining up micro-balls on an arraying jig includes removing an excess of the micro-balls located thereat with ease. The micro-balls are supplied onto the arraying jig having a plurality of array holes formed therein. A cylindrical body is disposed above the arraying jig, and the micro-balls are maintained at the array holes by an air vacuum through the array holes of the arraying jig. A standing wave having nodes formed concentrically is generated inside the cylindrical body by subjecting the cylindrical body to ultrasonic vibration, so that the micro-balls are concentrated at the nodes of the standing wave. By moving the cylindrical body horizontally over the arraying jig while maintaining the ultrasonic vibration, the micro-balls are distributed into the respective array holes.

Abstract: An IC testing system is provided with comparator circuits for comparing at two types of voltage levels, with respect to an output signal of a device to be measured, a memory for storing the state of window strobe of each test cycle, based on test control signals for strobe decisions, control signal generating circuits for generating control signals related to the generation of window strobes, based on the state stored in the aforementioned memory, and a signal decision circuit generating strobe signals which have been timing-corrected, in response to the voltage levels for window strobe decisions for producing window strobes, based on the control signals from the aforementioned control signal generating circuit and the aforementioned test control signals, and window strobes for performing window strobe decisions with respect to signals from the aforementioned comparator circuits.

Abstract: The present invention relates to an electro-optic sampling oscilloscope in which an electric field generated by a signal to be measured is coupled with an electro-optic crystal, and an optical pulse outputted from an optical pulse output circuit is caused to enter the electro-optic crystal, and the waveform of the signal to be measured is observed using the polarization state of the optical pulse. The optical pulse output circuit has as the input light thereof a sample optical pulse amplified by an optical amplifier circuit, and outputs, as an optical pulse, the output from an optical filter which blocks the propagation of the spontaneously emitted light of the optical amplifier circuit.

Abstract: In a temperature stabilizing circuit, a reference temperature detecting means 11 converts the highest value of the junction temperature of and LSI 1 into a reference pulse number, and stores it. An operating temperature detecting means 12 converts the junction temperature of the LSI at the time of operation into an operating pulse number, and stores it. A current control means 13 subjects the operating pulse number and the reference pulse number to comparison, and increases or decreases an operating current flowing to a T. G. 10 so that the operation pulse number be equal to the reference pulse number, thereby to control the junction temperature. As a result, the jitter value of the timing generator made up of a CMOS gate array is greatly decreased.

Abstract: A tester detects an abnormality in a quiescent power supply current of a device under test. In the tester, a programmable voltage generation source controls a power supply unit, providing a device under test with power. A test pattern generator applies test patterns repeatedly to the device under test. Power supply current to the device under test is converted into voltage values by a detection resistor. A spectrum analyzer unit finds a differential between voltage values occurring between opposite ends of the detection resistor, and voltage values proportional to power supply current values of a device known to perform properly, as measured beforehand. The spectrum analyzer ouputs a power of a fundamental wave of a frequency spectrum obtained by applying the EFT method to the differential.

Abstract: An offset correction circuit containing an integrator is provided between an output of a first DC amplifier and an input of a second DC amplifier, and the integrator corrects not only an offset error caused by an input signal in the first DC amplifier, but also an offset error caused by an input signal in the second DC amplifier. Thus, the effect of the offset error proportional to the integral value of the input signal strength, occurring depending on the temperature stability or power supply voltage variation rate resulting from the input signal in the two DC amplifiers can be canceled.

Abstract: An electro-optic sampling oscilloscope (or EOS oscilloscope) is designed to perform measurement such that an electro-optic sampling probe (i.e., EOS probe) is brought into contact with a measured circuit. Optical pulses are input to the EOS probe, wherein they are varied in polarization states in response to the measured circuit. Then, an electric signal output from the EOS probe is amplified to produce a receiving light signal. The receiving light signal is subjected to sampling operations using a first pulse signal to produce detection data, while it is also subjected to sampling operations using a second pulse signal to produce noise data. Herein, the first pulse signal consists of pulses which emerge in synchronization with the optical pulses respectively, while the second pulse signal delays from the first pulse signal by a prescribed delay time. Then, measurement data are produced by subtracting the noise data from the detection data.

Abstract: The address generation circuit 10 generates the address in which the fail data is stored. The logical circuit 15 comprises: when the address is inputted, a circuit to delay the address by a predetermined constant time; a circuit to output the selection signal which is the binary level signal; and a circuit to output the signal inputted from the address generation circuit 10 or the signal inputted from the pipe line circuit, corresponding to the value of the selection signal. When the address is inputted, the memory array 16 outputs the fail data stored in the address of the memory units A -D, or writes the inputted fail data in address of the memory units A -D. The OR circuit 70 OR-operates a plurality of inputted fail data, and outputs to the memory array 16.