Abstract: A system includes a memory that stores instructions and receives a circuit netlist, and includes a processing unit that accesses the memory and executes the instructions. The instructions include an EDA application that includes a test-point flop allocation module that is configured to evaluate the circuit netlist to determine compatibility of the test-point nodes in the circuit netlist. The test-point flop allocation module can further allocate each of the test-point flops to a test-point sharing group comprising a plurality of compatible test-point nodes. The EDA application also includes a circuit layout module configured to generate a circuit layout associated with the circuit design, the circuit layout comprising the functional logic and scan-chains comprising the test-point flops allocated to the test-point sharing groups in response to the circuit netlist. The circuit layout is employable to fabricate an integrated circuit (IC) chip.

Abstract: Methods and systems for providing concise data for analyzing checker completeness, in the context of formal verification analysis of circuit designs. The methods and systems concisely report information useful to a human user (e.g., circuit designer or verification engineer) for efficiently determining what manual action should be taken next to resolve holes in verification coverage. The reported information can include lists of signals on which checkers can be written, which lists can be ranked, can be limited to a subset of interest signals, and can include corresponding cover items for each reported interest signal. The present systems and methods thereby improve on reporting provided to the user, permitting the user to more quickly advance a formal verification process toward full coverage of the relevant portions of a circuit design.

Abstract: Embodiments include herein are directed towards a system and method for intelligent intent recognition based electronic design. Embodiments may include receiving, using a processor, a natural language input from a user at an intent recognition model. Embodiments may also include performing intent recognition on the natural language input at the intent recognition model and providing an output from the intent recognition model to a command generator. Embodiments may further include generating a command based upon, at least in part, the output and executing the command at a target tool environment.

Abstract: A current-mode transmitter amplifies a differential input signal to a differential, current-mode output signal. A split-input, current-mode-logic stage produces small, analog signals to limit switching currents and thus power consumption and power-supply noise. These small, analog signals are driven through a source-follower stage to reduce loading and shift the common-mode voltage to a desired level. A switched-current-source H-bridge driver combines differential outputs from the source-follower stage to provide an amplified differential output current. The output swing from the H-bridge driver is controlled by the voltage level from the source follower and derived from a replica-bias structure.

Abstract: Multiple independent point-to-point memory channels are operated, by at least one controller, in parallel to form a wider memory channel. The memory components on these point-to-point channels include the ability to connect to multiple (e.g., 2) instances of these independent memory channels. The controller operates multiple instances of the wider channels with the memory components configured in a clamshell mode. A single memory component is also operated in clamshell mode to provide error correction code information, independently of the other wider channels, to multiple instances of the wider memory channel.

Abstract: Embodiments include receiving fixed size error checking and correction data blocks and metadata at a memory controller. Embodiments may include performing data to symbol mapping based upon the fixed size data blocks and providing an output of the data to symbol mapping to a first encoder without metadata configured for full detection correction of single device error and to a second encoder with metadata configured for partial detection correction of single device error. Embodiments may include receiving data at a memory based upon an output from the first encoder and the second encoder and receiving data from the memory at a first decoder without metadata configured for full detection correction of single device error and at a second decoder with metadata configured for partial detection correction. Embodiments may include re-mapping symbol data from the first decoder and the second decoder to actual data and generating output data blocks and metadata.

Abstract: The present disclosure relates to a method for use with an electronic design. Embodiments may include simulating a processor model and a hardware model, each executed with a corresponding simulator thread on a simulation platform. Embodiments may also include simulating embedded software using the processor model. The simulating may include updating a given register of the processor model that stores a value that changes in response to switching between processes within the embedded software. Embodiments may further include setting a simulator breakpoint and a software breakpoint and enabling debugging of both non-virtual and virtual addresses at the software breakpoint without leaving the software breakpoint.

Abstract: Embodiments of the invention provide a system, media, and method for deep learning applications in physical design verification. Generally, the approach includes maintaining a pattern library for use in training machine learning model(s). The pattern library being generated adaptively and supplemented with new patterns after review of new patterns. In some embodiments, multiple types of information may be included in the pattern library, including validation data, and parameter and anchoring data used to generate the patterns. In some embodiments, the machine learning processes are combined with traditional design rule analysis. The patterns being generated and adapted using a lossless process that encodes the information of a corresponding area of a circuit layout.

Abstract: Methods and systems are disclosed for optimizing compilation efforts for design debug based on formal analyses. The method includes accessing a circuit design, automatically determining a segment as being a design region of interest, identifying a behavior within the segment for performing at least one verification test, compiling the segment without compiling a remainder of the circuit design, and providing performance indicators corresponding to the behavior within the segment based on the segment as compiled.

Abstract: Various embodiments provide for multi-threaded network routing of a circuit design based on partitioning networks of the circuit design, which can enable partitioning routing tasks for the circuit design. More particularly, some embodiments iteratively partition networks of a circuit design into groups of networks, which enable various embodiments to schedule routing tasks for those groups of networks to available threads such that no two networks of the circuit design with overlapping routing regions are routed at the same time, and such that idle time of each thread (e.g., time where thread has no work or is waiting for another thread to finish) can be minimized.

Abstract: Decision feedback equalization (DFE) is used to help reduce inter-symbol interference (ISI) from a data signal received via a band-limited (or otherwise non-ideal) channel. In embodiment, a single-ended receiver trains DFE coefficients and the slicer reference voltage to improve the received eye height. The process for training avoids many whole range sweeps thereby shortening training time. A custom data pattern that includes low-frequency (DC with respect to DFE) and high-frequency (AC with respect to DFE) worst cases is used for training in a closed loop manner. Negative DFE is used to measure the AC height of the data. Positive DFE is used to find the DC height of the data pattern.

Abstract: An emulation processor may be configured to support emulating unknown binary logic based on non-arbitrariness of the unknown binary logic. For example, an unknown binary logic signal may take the finite binary values of 0 and 1. The circuitry in the emulation processor is configured to generate and propagate outputs based on the interactions of known input binary signals with the unknown input binary signals having non-arbitrary states. The emulation processor may support the both combinational and sequential operations associated with the unknown binary logic.

Abstract: An IC test engine generates a plurality of two-cycle delay test patterns that target a first set of multicycle faults and/or defects of a fabricated IC chip based on an IC design. Each two-cycle delay test pattern includes a scan-in shift window operating at a test clock frequency, and a capture window with a launch cycle and a capture cycle operating at a functional clock frequency. The IC test engine fault simulates the plurality of two-cycle delay test patterns against a second set of multicycle faults and/or defects in the IC design utilizing sim-shifting, such that a state of the IC design after at least a last two shift clock cycles of a scan-in shift in window of each two-cycle delay test pattern of the plurality of two-cycle delay test patterns are fault simulated to provide two fault initialization cycles for detection of a multicycle delay fault and/or defect.

Abstract: An integrated circuit (IC) test engine generates N-cycle at-speed test patterns for testing for candidate faults and/or defects of a first set of transition faults and/or defects of an IC design. A diagnostics engine that receives test result data characterizing application of the N-cycle at-speed test patterns to a fabricated IC chip based on the IC design by an ATE, in which the test result data includes a set of miscompare values characterizing a difference between an expected result and a result measured by the ATE for a given N-cycle at-speed test pattern. The diagnostics engine employs a fault simulator to fault-simulate the N-cycle at-speed test patterns against a fault model that includes a first set of transition faults and/or defects and fault-simulate a subset of the N-cycle at-speed test patterns against a fault model that includes multicycle transition faults and/or defects utilizing sim-shifting.

Abstract: Systems and methods of debugging a design under test for metastability issues using formal verification. In one aspect, the method includes determining, by a server, that a functionality of the DUT failed an assertion; generating, by the server, a plurality of first waveforms for a plurality of clock domain crossing (CDC) pairs that are in a cone of influence of the assertion; applying, by the server, a constraint including a condition to the plurality of waveforms; and generating, by the server, one or more second waveforms for a first subset of the plurality of CDC pairs, wherein the first subset of the CDC pairs satisfied the condition.

Abstract: Embodiments include herein are directed towards a method for electronic circuit design. Embodiments may include receiving a selection of an instance associated with an electronic design at an electronic design schematic displayed on a graphical user interface. Embodiments may also include selecting a corresponding instance within an electronic design layout displayed on a graphical user interface. Embodiments may further include receiving a selection of a source topology and routing at the electronic design layout displayed on the graphical user interface, based upon at least in part, the source topology.

Abstract: The present disclosure relates to packing transaction layer (TL) packets at a link layer of a protocol stack. In some examples, channel type data identify a type of message channel for a first TL packet can be generated. A set of slot formats for a slot for packing the first TL packet can be identified based on the channel type data and a slot format database. A respective slot format of the set of slot formats can be selected for the slot based on a message type of the first TL packet, and a message type of a second TL packet. The first TL packet and the second TL packet can be packed into the slot having the selected respective slot format during generation of a link layer packet.

Abstract: An integrated circuit that includes a feedback loop to adapt receiver parameters. The feedback loop includes a receiver to sample a signal and produce a sampled signal sequence. The feedback loop also includes a first pattern counter to detect and count occurrences of a first pattern in the sampled signal sequence, and a second pattern counter to detect and count occurrences of a second pattern in the sampled signal sequence. Control circuitry coupled to the receiver adapts a parameter value of the receiver to minimize a difference between a first ratio and a second ratio. The first ratio is a target ratio. The second ratio is between a first counted number of occurrences of the first pattern in the sampled signal sequence and a second counted number of occurrences of the second pattern in the sample signal sequence.

Abstract: The present disclosure relates to dynamically updating a delay line code. A method for updating the delay line code may include receiving a strobe input at a coarse delay line. The method may further include receiving a coarse delay cell code at the coarse delay line. The method may also include generating a first clock path based upon a first chain of interleaved logic gates included within the coarse delay line. The method may additionally include generating a second clock path based upon a second chain of interleaved logic gates included within the coarse delay line. The method may further include receiving the first clock path, and the second clock path, and a fine delay cell code at a fine delay cell. The method may also include generating a strobe delayed output based upon the first clock path, and the second clock path, and the fine delay code.

Abstract: An equalizer includes a first feed-forward stage that provides a measure of low-frequency ISI and a second feed-forward stage that includes a cascade of stages each making an ISI estimate. The ISI estimate from each stage is further equalized by application of the measures of low-frequency ISI from the first feed-forward stage and fed to the next in the cascade of stages. The ISI estimates from the stages thus become progressively more accurate. The number of stages applied to a given signal can be optimized to achieve a suitably low bit-error rate. Power is saved by disabling stages which are not required to meet that goal.