Abstract: A corrective device to be worn on a human foot having a misalignment and positioned inside of footwear. The device having an inner shell having a first material composition and flexibility, and shaped to accommodate receiving therein and supportingly couple with the foot, and an outer shell having a second material composition and flexibility, the second material composition and flexibility being substantially the same as the first flexibility, the outer shell shaped to accommodate receiving therein the inner shell, supportingly couple with the inner shell and allow positioning into the footwear. At least a sufficient portion of a pressure is distributed by the outer shell and the inner shell over a desired area of the foot to provide an amount of correction to the misalignment while allowing the human to wear the inner shell inside of the outer shell inside of the footwear.
Abstract: A probe station for probing a test device has a chuck element for supporting the test device. An electrically conductive outer shield enclosure at least partially encloses such chuck element to provide EMI shielding therefor. An electrically conductive inner shield enclosure is interposed between and insulated from the outer shield enclosure and the chuck element, and at least partially encloses the chuck element.
Type:
Grant
Filed:
June 9, 2006
Date of Patent:
July 31, 2007
Assignee:
Cascade Microtech, Inc.
Inventors:
Ron A. Peters, Leonard A. Hayden, Jeffrey A. Hawkins, R. Mark Dougherty
Abstract: A probe assembly suitable for making test measurements using test signals having high currents. The disclosed probe assembly provides for a test signal exhibiting relatively low inductance when compared to existing probe assemblies by preferably reducing the electrical path distance between the test instrumentation and the electrical device being tested.
Abstract: An integrated casing spacer and joint restraint unit is attached to each of a pair of pipe sections adjacent to an end-to-end connection of the pipe sections by means of first and second spacer/retainer ring members. Disposed on the outer periphery of each ring member in a spaced manner are plural risers each having a respective runner disposed on its outer end for engaging an inner surface of an outer casing and maintaining fixed spacing between the inner pipe sections and the outer casing. Plural paired risers, with one riser disposed on each ring member, are aligned with one another along the axis of the connected pipe sections and are each adapted for secure connection to a respective connecting rod for securely coupling the two ring members together and restraining relative movement between the two pipe sections.
Abstract: A probe assembly having a switch that selectively electrically connects, for example, either a Kelvin connection or a suspended guard element with the probe assembly.
Abstract: A system for low-current testing of a test device includes a probing device for probing a probing site on the test device. The probing device includes a dielectric substrate having first and second sides, an elongate conductive path on the first side of the substrate, an elongate probing element connected to the elongate conductive path so as to extend in a cantilevered manner beyond the substrate, and a conductive area on the second side of the substrate. The probe housing is matingly detachably engageable with the probing device.
Abstract: A direct current and a modulation signal are simultaneously applied to contact pads on a device under test, such as a laser diode, with a probe that reduces signal distortion and power dissipation by transmitting a modulated signal through an impedance matching resistor and transmitting of a direct current over a second signal path that avoids the impedance matching resistor.
Type:
Grant
Filed:
May 25, 2006
Date of Patent:
April 17, 2007
Assignee:
Cascade Microtech, Inc.
Inventors:
Leonard Hayden, Scott Rumbaugh, Mike Andrews
Abstract: A probe station for probing a test device has a chuck element for supporting the test device. An electrically conductive outer shield enclosure at least partially encloses such chuck element to provide EMI shielding therefor. An electrically conductive inner shield enclosure is interposed between and insulated from the outer shield enclosure and the chuck element, and at least partially encloses the chuck element.
Type:
Grant
Filed:
November 3, 2004
Date of Patent:
March 13, 2007
Assignee:
Cascade Microtech, Inc.
Inventors:
Ron A. Peters, Leonard A. Hayden, Jeffrey A. Hawkins, R. Mark Dougherty
Abstract: Described is a removable assembly for use on a fixed surface. The assembly includes a post having a base (42) and an attachment assembly (8). The attachment assembly includes a base plate (10) and a magnet assembly (12), both capable of carrying a magnetic current. The magnet assembly includes a housing (20) and a magnet (22) disposed within the housing. To use, the magnet assembly is placed adjacent the base plate, the magnetic forces attracting and holding them together. The magnet is positioned apart from the base plate while the housing contacts the base plate to form the magnet circuit. An attachment plate (30) is connected to the housing upper wall adjacent its outer surface. The attachment plate includes one or more outwardly projecting attachment bolts (26). As assembled, the bolts engage corresponding openings (48) in the post base (42).
Abstract: A method for constructing a membrane probe that includes providing a substrate, and creating a depression within the substrate. Conductive material is located within the depression and a conductive trace is connected to the conductive material. A membrane is applied to support the conductive material and the substrate is removed from the conductive material.
Type:
Grant
Filed:
April 16, 2003
Date of Patent:
February 20, 2007
Assignee:
Cascade Microtech, Inc.
Inventors:
Reed Gleason, Michael A. Bayne, Kenneth Smith
Abstract: An accessible optical path to a lower surface of a heatable device under test is provided by a thermal optical chuck comprising a transparent resistor deposited on transparent plate arranged to supporting the device in a probe station.
Abstract: An interconnect assembly for evaluating a probe measurement network includes a base, respective inner and outer probing areas in mutually coplanar relationship on the upper face of the base, a reference junction, and a high-frequency transmission structure connecting the probing areas and the reference junction so that high-frequency signals can be uniformly transferred therebetween. A preferred method for evaluating the signal channels of the network includes connecting a reference unit to the reference junction and successively positioning each device-probing end that corresponds to a signal channel of interest on the inner probing area.
Type:
Grant
Filed:
December 9, 2005
Date of Patent:
January 16, 2007
Assignee:
Cascade Microtech, Inc.
Inventors:
Eric W. Strid, Jerry B. Schappacher, Dale E. Carlton, K. Reed Gleason