Abstract: A direct current and a modulation signal are simultaneously applied to contact pads on a device under test, such as a laser diode, with a probe that reduces signal distortion and power dissipation by transmitting a modulated signal through an impedance matching resistor and transmitting of a direct current over a second signal path that avoids the impedance matching resistor.
Type:
Grant
Filed:
October 22, 2007
Date of Patent:
August 26, 2008
Assignee:
Cascade Microtech, Inc.
Inventors:
Leonard Hayden, Scott Rumbaugh, Mike Andrews
Abstract: A method of regenerating tissue in a living organism. The method includes the act of contacting an affected area of the living organism with a solid-fibrin web, the solid-fibrin web comprising platelets that release growth factors about one minute after contact to regenerate the tissue in the living organism.
Abstract: An apparatus and method of forming a solid-fibrin web. The apparatus includes a centrifuge (600) having a housing (604), and actuator (648), a wheel (660), and a flange (664). The housing includes a recessed area (616) and a base (608) supportable on a surface. The wheel is coupled to the actuator and extends into the recessed area and is adapted to contact a first end of a container (620). The flange extends into the recessed area opposite the wheel and defines an adjustable distance between the wheel and the flange. The flange is adapted to contact a second end of the container and the actuator is operable to rotate the container. The container is oriented substantially parallel with respect to the base.
Abstract: A membrane probing assembly includes a probe card with conductors supported thereon, wherein the conductors include at least a signal conductor located between a pair of spaced apart guard conductors. A membrane assembly includes a membrane with contacts thereon, and supporting at least a signal conductor located between a pair of spaced apart guard conductors. The guard conductors of the probe card are electrically interconnected proximate the interconnection between the probe card and the membrane assembly. The guard conductors of the membrane assembly are electrically interconnected proximate the interconnection between the probe card and the membrane assembly.
Type:
Grant
Filed:
August 23, 2006
Date of Patent:
July 22, 2008
Assignee:
Cascade Microtech, Inc.
Inventors:
Paul A. Tervo, Kenneth R. Smith, Clarence E. Cowan, Mike P. Dauphinais, Martin J. Koxxy
Abstract: A test structure including a differential gain cell and a differential signal probe include compensation for the Miller effect reducing the frequency dependent variability of the input impedance of the test structure.
Abstract: A substrate, preferably constructed of a ductile material and a tool having the desired shape of the resulting device for contacting contact pads on a test device is brought into contact with the substrate. The tool is preferably constructed of a material that is harder than the substrate so that a depression can be readily made therein. A dielectric (insulative) layer, that is preferably patterned, is supported by the substrate. A conductive material is located within the depressions and then preferably lapped to remove excess from the top surface of the dielectric layer and to provide a flat overall surface. A trace is patterned on the dielectric layer and the conductive material. A polyimide layer is then preferably patterned over the entire surface. The substrate is then removed by any suitable process.
Type:
Grant
Filed:
February 3, 2004
Date of Patent:
July 15, 2008
Assignee:
Cascade Microtech, Inc.
Inventors:
Reed Gleason, Michael A. Bayne, Kenneth Smith, Timothy Lesher, Martin Koxxy
Abstract: A probe measurement system for measuring the electrical characteristics of integrated circuits or other microelectronic devices at high frequencies.
Type:
Grant
Filed:
August 3, 2007
Date of Patent:
July 1, 2008
Assignee:
Cascade Microtech, Inc.
Inventors:
K. Reed Gleason, Tim Lesher, Mike Andrews, John Martin
Abstract: Described is a removable assembly for use on a fixed surface. The assembly includes a post having a base (42) and an attachment assembly (8). The attachment assembly includes a base plate (10) and a magnet assembly (12), both capable of carrying a magnetic current. The magnet assembly includes a housing (20) and a magnet (22) disposed within the housing. To use, the magnet assembly is placed adjacent the base plate, the magnetic forces attracting and holding them together. The magnet is positioned apart from the base plate while the housing contacts the base plate to form the magnet circuit. An attachment plate (30) is connected to the housing upper wall adjacent its outer surface. The attachment plate includes one or more outwardly projecting attachment bolts (26). As assembled, the bolts engage corresponding openings (48) in the post base (42).
Abstract: A probe station for testing a device under test. A first platen supporting an electrical probe. A chuck supporting the device under test. A second platen supporting an optical probe. The first platen and the second platen positioned above the device under test. A percentage of the top surface of the second platen terminating into free space.
Type:
Grant
Filed:
January 16, 2004
Date of Patent:
May 6, 2008
Assignee:
Cascade Microtech, Inc.
Inventors:
Peter Navratil, Brad Froemke, Craig Stewart, Anthony Lord, Jeff Spencer, Scott Runbaugh, Gavin Fisher, Pete McCann, Rod Jones
Abstract: A probe head including an elastic membrane capable of exerting a restoring force when one of the surfaces of the elastic membrane is distorted. A conductive probe includes a beam having a first end and a second end, with a probe tip proximate the first end for contacting a device under test. A beam contact proximate the second end of the beam. The beam being movable to deform at least one surface of the elastic membrane.
Type:
Grant
Filed:
July 5, 2005
Date of Patent:
May 6, 2008
Assignee:
Cascade Microtech, Inc.
Inventors:
Kenneth Smith, Michael Jolley, Victoria Van Syckel
Abstract: A manually operated tool engages and draws towards one another opposed spaced flanges of a repair clamp disposed about a leaking pipe for moving the clamp into position and securely maintaining the clamp on the pipe over the leak allowing plural nut and bolt combinations on the clamp to be tightened in sealing off the leak. A movable handle has attached thereto first and second pivoting arms adapted for respectively engaging a slot within the clamp's first edge flange and the outer edge of the clamp's second opposed edge flange when the handle is in a first non-use position. Moving the handle to a second use position urges the clamp's edge flanges toward one another drawing the clamp securely about the pipe, allowing the clamp's nut and bolt combinations to be tightened. The tool is adjustable for use with a wide range of clamp sizes and pipe diameters.
Type:
Grant
Filed:
November 4, 2003
Date of Patent:
April 29, 2008
Assignee:
Cascade Waterworks Manufacturing Co., Inc.
Abstract: An RFID-enabled waste/recycling container in which an RFID device is enclosed within the lower grab bar. As disclosed, the lower grab bar is extruded to define a cavity, and the RFID device is located within the cavity. The RFID device can be fixedly secured within the lower grab bar using keying, adhesive, or foam fill. The open ends of the lower grab bar are sealed to further protect the device. Also disclosed is a method of retrofitting a non-RFID-enabled container with the RFID-enabled lower grab bar to provide the container with RFID capabilities.
Abstract: An RFID-enabled waste/recycling cart including a container, a lid, a hinge pin, and an RFID device. The container includes a handle, and the RFID device is located within the handle. The hinge pin connects the lid to the container and also secures the RFID device within the handle. The RFID device may be attached to or separate from the hinge pin. If attached, the RFID device may be molded to the hinge pin or snap-fitted to the hinge pin. At least one of the handle, the RFID device, and the hinge pin may include structure for angularly orienting the RFID device within the handle.
Type:
Application
Filed:
October 23, 2006
Publication date:
April 24, 2008
Applicant:
CASCADE ENGINEERING, INC.
Inventors:
Brian G. Parker, P. Charles Ammond, James R. Kilduff, Joseph A. Bollo, Michael A. Barrett
Abstract: An improved chuck assembly with lift pins. The chuck assembly may have an outer periphery and an upper surface. The lift pins may be positioned within the periphery of the chuck assembly and may be capable of relative vertical movement with respect to the upper surface of the chuck assembly.
Type:
Grant
Filed:
January 19, 2007
Date of Patent:
April 22, 2008
Assignee:
Cascade Microtech, Inc.
Inventors:
Peter Andrews, Brad Froemke, John Dunklee
Abstract: A membrane probing assembly includes a probe card with conductors supported thereon, wherein the conductors include at least a signal conductor located between a pair of spaced apart guard conductors. A membrane assembly includes a membrane with contacts thereon, and supporting at least a signal conductor located between a pair of spaced apart guard conductors. The guard conductors of the probe card are electrically interconnected proximate the interconnection between the probe card and the membrane assembly. The guard conductors of the membrane assembly are electrically interconnected proximate the interconnection between the probe card and the membrane assembly.
Abstract: A wafer probe station is equipped with an integrated environment control enclosure substantially surrounding a supporting surface for holding a test device, such enclosure limiting fluid communication between the interior and exterior of the enclosure and preferably also providing EMI shielding and a dark environment. The limited communication between the interior and exterior of the enclosure is kept substantially constant despite positioning movement of either the supporting surface or probes. The positioning mechanisms for the supporting surface and probes each are located at least partially outside of the enclosure.
Type:
Grant
Filed:
December 22, 2005
Date of Patent:
March 25, 2008
Assignee:
Cascade Microtech, Inc.
Inventors:
Warren K. Harwood, Paul A. Tervo, Martin J. Koxxy
Abstract: Wafers or other structures comprising a plurality of dies or devices are tested at non-ambient temperatures by inducing a first heat flux through a substantial portion of a surface of the structure to modify a temperature of the structure and inducing a second heat flux through a local area of a surface of the structure, proximate the device under test, to modify the temperature the device under test.