Abstract: A quaternary/ternary modulation selecting method of an audio amplifier includes: generating a ternary signal and a quaternary signal; generating a plurality of pulses with limited duty cycles; and selecting one of the quaternary signal, the ternary signal and the plurality of pulses for an output stage of the audio amplifier.

Abstract: A bandgap reference circuit incorporates first, second, and third current sources, first and second operational amplifiers, first and second bipolar transistors, a feedback device, a voltage divider, and a first resistor. The voltage divider divides a voltage difference between the third current source and the base of the second bipolar transistor to provide a reference voltage whose value is smaller than a silicon bandgap voltage.

Abstract: An aspect of the present invention is to provide a test system for detecting whether a continuity fault condition, e.g., a short or open condition, exists in the path between a tester and chips on a wafer during a wafer level burn-in testing. According to one embodiment of the present invention, the test system comprises a probe card and n chips. The probe card comprises m first signal contacts for receiving m test signals from the tester, n second signal contacts for providing n test results to the tester, and a contact array. The probe card is in contact with the chips on the wafer through a plurality of needles. In this manner, the test system can detect whether the continuity fault condition exists in the path between the tester and the chips on the wafer during the wafer level burn-in testing.

Abstract: Disclosed is a method for enhancing temperature efficiency, used to enhance a temperature efficiency resulted from temperature changes in regard to an oscillating period of an oscillator. The method for enhancing temperature efficiency comprises the steps as follows: generating a PTAT current by using a bandgap circuit; generating a CTAT current by using a bandgap circuit; generating an output current, wherein the output current equals to PTAT current minus CTAT current; and providing the output current to an oscillator for generating an oscillating frequency.

Abstract: A semiconductor memory device having a compression test mode is provided. The semiconductor memory device comprises a memory unit, i test pads, a timing circuit, a compression circuit, and a signal distribution circuit. The memory unit comprises m memory banks divided into n activating groups, wherein each bank comprises a plurality of sensing amplifiers for sensing and amplifying data in bit lines. The timing circuit sequentially generates n control signals each for activating a plurality of sensing amplifiers in one of the n activating groups. The compression circuit compresses data sensed and amplified by the plurality of sensing amplifiers in each bank in a compression test mode. The signal distribution circuit distributes signals output from the compression circuit among the i data pads in rotation. The integer n and the integer i are adjustable.

Abstract: A control circuit applied in an e-fuse system selectively operates in a feeding mode and a reading mode. When the control circuit operates in the feeding mode, the control circuit is arranged to store a program code for indicating whether to connect a fuse of the e-fuse system thereto; and when the control circuit operates in the reading mode, the control circuit is arranged to read a state of the fuse of the e-fuse system coupled to the control circuit.

Abstract: An exemplary embodiment of the present disclosure illustrates a duty cycle correction apparatus for fast adjusting internal clocks to have specific duty cycles. Firstly, a reference clock is adjusted to have one specific duty cycle in response to analog feedback clocks. Then, by using a phase detector, phases of the reference clock and one internal clock are compared to generate a phase detection signal. Next, by using a digital-analog converter, complementary signals are generated according to a phase detection signal received by the counter, and the signals are used to adjust the duty cycles of the internal clocks. When the complementary signals make the duty cycle of the internal clock equals to the specific duty cycle, codes of the complementary signals are recorded.

Abstract: A method for programming memory cells of a selected word line has steps of: providing a first word line programming signal being at plurality of voltage levels in different programming slots of a current programming operation to the memory cells of the selected word line, wherein the first word line programming signal is a ramping voltage signal; and providing a second line programming signal being at plurality of voltage levels in different programming slots of a next programming operation to the memory cells of the selected word line, wherein the second word line programming signal is another one ramping voltage signal; wherein the highest voltage levels of the first and second word line programming signals are identical to each other, and a number of the voltage levels of the first word line programming signal is larger than that of the second word line programming signal.

Abstract: The semiconductor device incorporates a selected sub word line driver and a first voltage switching circuit. The selected sub word line driver has an input node connected to a selected main word line, an output node connected to a selected sub word line, a reference node supplied with a common reference voltage, and a power node. The first voltage switching circuit selectively supplies a first power voltage, a second power voltage, or the common reference voltage to the power node of the selected sub word line driver. In an active mode, the first voltage switching circuit supplies the first power voltage to pull the selected sub word line to a logic high level. In a precharge mode, the first voltage switching circuit supplies the common reference voltage and then supplies the second power voltage, thereby pulling the selected sub word line to a logic low level. A voltage level of the second power supply node is lower than a voltage level of the first power voltage and higher than the common reference voltage.

Abstract: An exemplary embodiment of the present disclosure illustrates a modulation method for a switching modulator. Firstly, a data signal is received. Then, a first output signal at a first output side of the switching modulator and a second output signal at a second output side of the switching modulator are generated according to the data signal received, wherein the first output signal is an addition signal of a first pulse signal and the data signal, the second output signal is a second pulse signal, the first pulse signal and the second pulse signal are aligned to a same pulse width, and the pulse width equals to a minimum resolution of the switching modulator.

Abstract: An oscillation control circuit for a ring oscillator includes a bandgap reference circuit and an oscillation frequency control circuit. The bandgap reference circuit is arranged for generating a bandgap reference signal by mirroring a proportional-to-absolute-temperature current. The oscillation frequency control circuit is coupled to the bandgap reference circuit, and is arranged for biasing the ring oscillator according to the bandgap reference signal. When the ring oscillator has a plurality of stages, the oscillation frequency control circuit includes one current source and a plurality of current mirrors for biasing the plurality of stages of the ring oscillator, respectively.

Abstract: A method of booting a system with a non-volatile memory device includes at least the following steps: when the system is powered on, reading a status flag of at least a memory block of the non-volatile memory device, wherein the status flag indicates whether an erase operation applied to the memory block is successfully completed; selectively performing a leakage calibration process upon the memory block according to the status flag; and booting the system according to a boot code stored in the non-volatile memory device.

Abstract: A triangular wave generating circuit incorporates a capacitor, first, second, third, and fourth constant current sources, first and second switching units, a high/low level limiter, a clock generator, and a phase detecting unit. The first and second constant current sources charge the capacitor and the third and fourth constant current sources discharge the capacitor. The phase detecting unit compares an externally supplied clock signal with an internal clock signal and generates first and second phase signals base on a phase difference between the externally supplied clock signal and the internal clock signal. The second switching unit comprises a third switch and a fourth switch. The third switch couples the second constant current source to the capacitor in response to the first phase signal. The fourth switch couples the fourth constant current source to the capacitor in response to the second phase signal.

Abstract: An exemplary embodiment of the present disclosure provides a programming voltage generator for a nonvolatile memory device. The programming voltage generator comprises a power circuit, a detector, a switching circuit, a control signal generator, and a regulation circuit. The power circuit outputs a programming voltage according to a voltage control signal. The detector detects whether the programming voltage is larger than or equal to a breakdown voltage of the nonvolatile memory device, so as to output an indication signal. The switching circuit temporally drops the programming voltage according to the indication signal. The control signal generator generates a plurality of regulation control signals. The regulation circuit generates the voltage control signal according to the programming voltage and the regulation control signals.

Abstract: An exemplary embodiment of the present disclosure illustrates a memory test system comprising a memory device, a probe card, and a tester. The memory device comprises a memory die with a plurality of memory banks, a plurality of input circuits, and a plurality of output circuits, wherein each of the input circuits has a first input pin and a second pin, the first input pins of the input circuits are used to read a plurality of patches of data stored in memory cells of the memory banks, and the second input pins are used to receive a compressed result. The output circuits receive compressed signals output from the input circuits, and the probe card mixes the compressed output signals output from the output circuits to output a mixed compressed output signal to the tester.

Abstract: A method for programming memory cells of a selected word line has steps of: providing a first word line programming signal being at plurality of voltage levels in different programming slots of a current programming operation to the memory cells of the selected word line, wherein the first word line programming signal is a ramping voltage signal; and providing a second line programming signal being at plurality of voltage levels in different programming slots of a next programming operation to the memory cells of the selected word line, wherein the second word line programming signal is another one ramping voltage signal; wherein the highest voltage levels of the first and second word line programming signals are identical to each other, and a number of the voltage levels of the first word line programming signal is larger than that of the second word line programming signal.

Abstract: A voltage regulator including an over-drive circuit and a control circuit is illustrated. The over-drive circuit receives a first voltage signal output from a sensing amplifier in a DRAM circuit, and regulates the first voltage signal according to an over-drive signal. The a control circuit electrically connected to the over-drive circuit receives a sense signal, and outputs the over-drive signal according to the sense signal, wherein the sense signal is asserted when a bit line in the DRAM circuit is sensed that an restoring and operation is performed. The over-drive signal goes down to a level of a second voltage signal from a current level thereof dependent on an external power merely when the sense signal is asserted but has not been asserted for a delay time, or otherwise, the over-drive signal is equal to the external power.

Abstract: An exemplary embodiment of the present disclosure provides a programming voltage generator for a nonvolatile memory device. The programming voltage generator comprises a power circuit, a detector, a switching circuit, a control signal generator, and a regulation circuit. The power circuit outputs a programming voltage according to a voltage control signal. The detector detects whether the programming voltage is larger than or equal to a breakdown voltage of the nonvolatile memory device, so as to output an indication signal. The switching circuit temporally drops the programming voltage according to the indication signal. The control signal generator generates a plurality of regulation control signals. The regulation circuit generates the voltage control signal according to the programming signal and the regulation control signals.

Abstract: A voltage regulator including an over-drive circuit and a control circuit is illustrated. The over-drive circuit receives a first voltage signal output from a sensing amplifier in a DRAM circuit, and regulates the first voltage signal according to an over-drive signal. The a control circuit electrically connected to the over-drive circuit receives a sense signal, and outputs the over-drive signal according to the sense signal, wherein the sense signal is asserted when a bit line in the DRAM circuit is sensed that an restoring and operation is performed. The over-drive signal goes down to a level of a second voltage signal from a current level thereof dependent on an external power merely when the sense signal is asserted but has not been asserted for a delay time, or otherwise, the over-drive signal is equal to the external power.

Abstract: A method for performing an erase operation in a non-volatile memory incorporates the steps of selecting a block on which to perform an erase operation; erasing the selected block using a plurality of erase pulses; receiving erase data of the selected block; determining an over-erase correction verify voltage level based on the erase data; and over-erase correcting the selected block until each cell within the selected block passes the over-erase correction verify voltage level.