Abstract: In an inspection assistance method, a processor accepts inspection portion information related to an inspection portion. In the inspection assistance method, the processor acquires a result of an inspection of the inspection portion corresponding to the inspection portion information from a storage media: In the inspection assistance method, the processor displays inspection assistance information on a display. The inspection assistance information notifies a user of information related to an abnormality of the inspection portion detected in a previous inspection. In the inspection assistance method, the processor displays an image of the inspection portion on the display.

Abstract: An immersion objective includes a first lens group including a meniscus lens, a second lens group including a cemented lens and having a positive power, and a third lens group having a negative power. The third lens group is formed of a front group having a concave surface on a most image side and a back group having a concave surface on the most object side. Even when any of a plurality of immersion liquids used together with the immersion microscope objective is used, an amount of chromatic aberration at each of wavelengths in a range from 435.18 nm to 656.13 nm, which has an e-line as a reference, is smaller than a magnitude of depth of focus of the immersion microscope objective at the wavelength. The immersion microscope objective satisfies a following conditional expression. 0.64?NA×WD?3.

Abstract: A data management system includes: an input control unit (110) that adds measurement data uploaded by designating a theme that is a unit of access control and acquired by a measurement system, to a dataset classified based on metadata included in the measurement data, within the theme; a management control unit (120) that associates the dataset with a chapter that is a unit of status management and is provided within the theme; and a display control unit (130) that displays information managed by the data management system.

Abstract: A microscope system includes an eyepiece, an objective, a tube lens that is disposed between the eyepiece and the objective, a projection apparatus that projects a projection image onto an image plane on which an optical image is formed by the tube lens, and a processor that performs processes. The processes include performing for digital image data of the sample at least one analysis process selected from a plurality of analysis processes, and generating projection image data representing the projection image on the basis of the analysis result and the at least one analysis process. The projection image data indicates the analysis result in a display format including an image color corresponding to the at least one analysis process. The generating the projection image data includes determining a color for the projection image in accordance with the at least one analysis process selected from the plurality of analysis processes.

Abstract: A microscope system includes a microscope that acquires a microscopic image and circuitry. The circuitry causes the microscope to perform a series of image-shooting operations for acquiring a plurality of microscopic images and outputs an access code generated in response to the start of the series of image-shooting operations, the access code being used to access image-shooting information pertaining to the series of image-shooting operations.

Abstract: An insertion assistance system includes a processor. The processor is configured to set a first position and a second position in shape information. The processor is configured to estimate a first state of a distal end of an insertion unit at the first position. The processor is configured to calculate a path through which the distal end passes. The processor is configured to determine a second state of the distal end at the second position. The processor is configured to output, to an information-reporting device, insertion assistance information required for an insertion operation for causing the distal end to reach the first position from the second position through the path and causing a state of the distal end to change from the second state to the first state.

Abstract: A fabrication support apparatus of a layered cell sheet in which a plurality of cell sheets are layered on one another includes circuitry. The circuitry is configured to acquire optical information that is information regarding optical properties of the layered cell sheet; to calculate a thickness distribution of the layered cell sheet based on the acquired optical information; to determine a layering position of a cell sheet to be newly layered on the layered cell sheet based on the calculated thickness distribution; and to output information of the determined layering position.

Abstract: An internal prediction method includes acquiring an image of a cell aggregate, calculating a feature amount related to a shape of the cell aggregate on the basis of the image, and outputting structure information related to an internal structure of the cell aggregate on the basis of the feature amount.

Abstract: A microscope system is provided with a microscope that acquires images at least at a first magnification and a second magnification higher than the first magnification, and a processor. The processor is configured to specify a type of a container in which a specimen is placed, and when starting observation of the specimen placed in the container at the second magnification, the processor is configured to specify an observation start position by performing object detection according to the type of container on a first image that includes the container acquired by the microscope at the first magnification, and control a relative position of the microscope with respect to the specimen such that the observation start position is contained in a field of view at the second magnification of the microscope.

Abstract: An inspection analysis method includes an analysis step, a prediction step, and an output step. A processor analyzes inspection information related to an operation in an inspection and generates first operation data and second operation data indicating a content of the operation in the analysis step. The first operation data indicate a content of the operation in a first inspection. The second operation data indicate a content of the operation in a second inspection performed after the first inspection is completed. The processor compares the first operation data and the second operation data with each other and predicts a state of an inspection target in the prediction step. The processor outputs state information indicating the state to a reporting device in the output step.

Abstract: An insertion assisting instrument has an outer diameter dimension set to satisfy a relationship of xb?<xc? assuming that an insertion assisting instrument is projected on X-Y coordinates such that a point on a circumference where the insertion assisting instrument has a largest outer diameter (that is, a point on an outer periphery of a proximal-end-side tapered surface at a distal end) is set as an origin and the proximal-end-side tapered surface is brought into contact with an X axis, coordinates of a second point B, which is most distal from the X axis on the circumference where the insertion assisting instrument has the largest outer diameter are (xb?, yb?), and coordinates of a third point C, which is most proximal from the X axis on a circumference at the proximal end of the insertion assisting instrument, are (xc?, yc?).

Abstract: A microscope simulation device includes a processor. The processor is configured to acquire a plurality of pieces of component information each indicating a technical specification of a corresponding microscope component, simulate an assembly of a microscope system based on the acquired plurality of pieces of component information, and output a generated simulation result to a display device.

Abstract: An observation apparatus includes a display apparatus that displays a display pattern, a display projection optical system that projects a light beam from the display apparatus, and forms an image of the display pattern, a combining optical element that combines a light beam from a sample and a light beam from the display apparatus, and an eyepiece optical system that enables an observer to simultaneously observe an image of the sample and an image of the display pattern, in which a numerical aperture (NA) of a light beam from the display apparatus is smaller than a maximum value of an NA of a light beam from the sample, and is larger than a minimum value of an NA of a light beam from the sample, at a position of an image on an optical path that is formed after light beams are combined by the combining optical element.

Abstract: A surface estimation method includes a region-setting step and an estimation step. In the region-setting step, a reference region that is one of a three-dimensional region and a two-dimensional region is set. The three-dimensional region includes three or more points and is set in a three-dimensional space. The three-dimensional space includes three-dimensional coordinates of three or more points on a subject calculated on the basis of a two-dimensional image of the subject. The three-dimensional coordinates of the three or more points are included in three-dimensional image data. The two-dimensional region includes three or more points and is set in the two-dimensional image. In the estimation step, a reference surface that approximates a surface of the subject is estimated on the basis of three or more points of the three-dimensional image data corresponding to the three or more points included in the reference region.

Abstract: A control method for displaying inspection images causes a processor to display an image of a model of an inspection object including a plurality of inspection sites, in a first display region and display first inspection information relevant to at least one inspection site, in a second display region, where the at least one inspection site is selected from the plurality of inspection sites in the image of the model displayed in the first display region. The control method further causes the processor to display inspection information prior to the first inspection information, as second inspection information relevant to the model, in a third display region, concurrently with one or more of the first display region and the second display region.

Abstract: An observation device includes: a macro observation system; and a micro observation system. The macro observation system and the micro observation system are arranged so as to satisfy a first condition. The first condition is that a distance from a macro optical axis to a micro optical axis is equal to or less than a square root of a sum of squares of a first distance and a second distance. The first distance is a distance between the macro optical axis and a central axis of an outer diameter of the nosepiece. The second distance is a distance in a first direction between the central axis of the outer diameter and a side surface of the nosepiece. The first direction is a direction orthogonal to the macro optical axis and orthogonal to a line segment connecting the macro optical axis and the central axis of the outer diameter.

Abstract: An illumination optical system for endoscope includes a rod lens as an optical element. The optical element includes a proximal end surface through which light enters and a distal end surface configured to emit the light. The distal end surface includes a diffusion region configured to diffuse emitted light. The diffusion region includes a plurality of concave portions and a plurality of peripheral regions surrounding the concave portions. Each concave portion includes a plurality of inclined surfaces as total reflection surfaces that are inclined with respect to the distal end surface. Each peripheral region includes a transmission surface configured to emit light totally reflected by the total reflection surfaces after passing through the proximal end surface and light not totally reflected by the total reflection surfaces.

Abstract: In a three-dimensional image display method, a processor acquires first three-dimensional data and second three-dimensional data of a subject from a recording medium. The processor converts a first three-dimensional coordinate system of the first three-dimensional data and a second three-dimensional coordinate system of the second three-dimensional data into a three-dimensional common coordinate system on the basis of structure information related to a geometric structure of the subject. The processor displays an image of the first three-dimensional data in the common coordinate system and an image of the second three-dimensional data in the common coordinate system on a display.

Abstract: An image-processing method includes a measurement step, an index calculation step, a comparison step, and a selection step. A processor measures a distance at each of two or more points in one or more images of a subject in the measurement step. The processor calculates a first index or a second index on the basis of the distance in the index calculation step. The processor compares the first index or the second index with a threshold value in the comparison step. The processor selects at least one image included in the one or more images in the selection step when the first index is greater than the threshold value or the second index is less than the threshold value.

Abstract: An endoscope apparatus includes an identification unit provided in each of a plurality of optical adaptors, an MMA connected in parallel to the identification unit, an MMA drive circuit that is provided in a main body portion and applies a drive signal for driving the MMA through a pair of conductive wires, a sine-wave generation circuit that is provided in the main body portion and applies an alternating signal to the identification unit through a pair of conductive wires in a state where any one of the plurality of optical adaptors is mounted at a distal end portion, and CPU that is provided in the main body portion and measures an input impedance of the pair of conductive wires at a frequency of the alternating current signal to perform individual identification of the optical adaptor mounted at the distal end portion based on a measurement result.