Patents Assigned to Hitachi High-Technologies Corporation
  • Patent number: 10068745
    Abstract: The purpose of the present invention is to provide a charged particle beam device and a sample holder for the charged particle beam device by which it is possible to form various environments, and perform in-situ observation and analysis without removing a sample from the charged particle beam device. In the present invention, inserting a detachable reverse side entry portion from a side facing a sample holding means, said portion being provided with a function for changing the state of a sample attached to the sample holding means, makes it possible to observe/analyze changes in the sample by a different process without removing the sample from the charged particle beam device by combining a reverse side entry portion having a different function with the sample holding means. The reverse side entry portion comprises two parts, and a tip thereof, which is one of the parts, is removable.
    Type: Grant
    Filed: September 5, 2014
    Date of Patent: September 4, 2018
    Assignee: Hitachi High-Technologies Corporation
    Inventors: Toshie Yaguchi, Yasuhira Nagakubo, Toshiyuki Iwahori
  • Patent number: 10067152
    Abstract: An automatic analyzer has a washing tank providing water for washing a reagent or sample probe is. The washing water from a washing nozzle spreads from a throttle portion and is divided into right and left flows after colliding with a vent plate provided in an overflow portion of the washing tank. The washing water flows between the vent plate and the inner wall of the overflow portion, and the flows join behind the vent plate. After joining, the washing water flows downward along the vent plate and the inner wall of the overflow portion and then is drained. Because a space is created between the washing water which has collided with the vent plate and the washing water joined behind the vent plate, the washing water is prevented from completely covering the overflow portion, and the airflow can be secured during the drainage.
    Type: Grant
    Filed: January 13, 2015
    Date of Patent: September 4, 2018
    Assignee: Hitachi High-Technologies Corporation
    Inventors: Masaru Miyazaki, Takamichi Mori, Kazuhiro Nakamura, Isao Yamazaki
  • Publication number: 20180238829
    Abstract: The separation between an ion concentration measuring time period and an information read/write time period is not considered in existing devices. Therefore, in the present invention, the time period for retrieving information from a semiconductor memory mounted in a cartridge and the time period for measuring the concentration of ions are controlled so as not to overlap each other.
    Type: Application
    Filed: July 1, 2016
    Publication date: August 23, 2018
    Applicant: Hitachi High-Technologies Corporation
    Inventors: Yoshito WATANABE, Satoshi OZAWA, Tetsuyoshi ONO, Masafumi MIYAKE
  • Patent number: 10056226
    Abstract: There is proposed a column supporting structure that includes a viscoelastic sheet, a supporting plate which holds the viscoelastic sheet, and a fixation portion which connects the supporting plate to each lens barrel. The viscoelastic sheet is disposed to extend in a plane perpendicular to one lens barrel or the other lens barrel.
    Type: Grant
    Filed: February 23, 2017
    Date of Patent: August 21, 2018
    Assignee: HITACHI HIGH-TECHNOLOGIES CORPORATION
    Inventors: Motohiro Takahashi, Yoshimasa Fukushima, Katsunori Onuki, Tetsuya Niibori
  • Patent number: 10056236
    Abstract: A plasma processing method for plasma-etching a sample in a metallic processing chamber includes etching the sample with a plasma; plasma-cleaning the processing chamber with a fluorine-containing gas after etching the sample; and plasma-processing the processing chamber with a gas containing sulfur and oxygen after plasma cleaning the processing chamber.
    Type: Grant
    Filed: February 27, 2017
    Date of Patent: August 21, 2018
    Assignee: HITACHI HIGH-TECHNOLOGIES CORPORATION
    Inventors: Hayato Watanabe, Masahito Mori, Takao Arase, Taku Iwase
  • Publication number: 20180220944
    Abstract: A blood collecting device collects blood in a short time after puncture without scattering the blood into the open air other than a container for collecting the blood. One of representative blood collecting devices has a container unit that includes a screw portion, a holder that holds the container unit serving as a system whose one end is closed, a puncture unit that can be attached to the container or the holder, a through-hole of the puncture unit, and a puncture unit protection member that protects the puncture unit and the container unit.
    Type: Application
    Filed: April 27, 2016
    Publication date: August 9, 2018
    Applicant: Hitachi High- Technologies Corporation
    Inventors: Ayano OTSUBO, Yoshihiro NAGAOKA, Taku SAKAZUME, Kenko UCHIDA, Shigenori TOGASHI
  • Patent number: 10041964
    Abstract: In the field of automatic analyzers, as items to be analyzed are increase, various reagents differing in such properties as liquid viscosity and contact angle are being used more frequently, and this trend is expected to continue. Also, reagents now take various forms (e.g., a concentrated reagent to be diluted by the water of an automatic analyzer), and so does dilution water. Such being the case, the invention provides an automatic analyzer capable of sufficient stirring regardless of items to be analyzed. To sufficiently stir a substance to which a reagent has been added, the automatic analyzer is designed to alter stirring conditions after a given amount of time has passed since the addition of that reagent.
    Type: Grant
    Filed: March 29, 2016
    Date of Patent: August 7, 2018
    Assignee: Hitachi High-Technologies Corporation
    Inventors: Chie Yabutani, Shigeki Matsubara
  • Patent number: 10040068
    Abstract: A reagent vessel holder for an analytical instrument is disclosed. The reagent vessel holder comprises at least one reagent vessel compartment for receiving a reagent vessel, wherein the reagent vessel compartment comprises a base and at least two lateral guiding elements, and at least one hollow needle for piercing the reagent vessel. The hollow needle is disposed on a front end of the reagent vessel compartment near the base and extends in a direction substantially parallel to the base. The lateral guiding elements are disposed so as to be adapted to slidably guide the reagent vessel in a direction substantially parallel to the direction, in which the hollow needle extends. The lateral guiding elements are adapted to receive the reagent vessel therebetween and are biased towards one another. Further, a reagent supply system for an analytical instrument and an analytical instrument comprising such a reagent vessel holder are disclosed.
    Type: Grant
    Filed: May 24, 2016
    Date of Patent: August 7, 2018
    Assignees: Roche Diagnostics Operations, Inc., Hitachi High-Technologies Corporation
    Inventors: Stephan Sattler, Reinhold Kraemer, Hidenobu Komatsu, Toshio Suzuki
  • Patent number: 10041963
    Abstract: Various mechanisms of an automatic analysis device are adjusted to suppress the occurrence of a difference in adjustment quality between an experienced person and an inexperienced person. An adjustment system includes a current position information acquiring unit for acquiring information indicating a current position of an adjustment object, a predetermined position information storage unit preliminarily storing information indicating a predetermined position where the adjustment object should be located and an adjustment value calculation unit which, by comparing the information indicating the current position of the adjustment object acquired by the current position information acquiring unites with information indicating the predetermined position of the adjustment object that has been stored in the predetermined position information storage unit, calculates an adjustment value that is required for adjusting the position of the adjustment object from the current position to the predetermined position.
    Type: Grant
    Filed: February 8, 2013
    Date of Patent: August 7, 2018
    Assignee: Hitachi High-Technologies Corporation
    Inventor: Chikook Ha
  • Patent number: 10041884
    Abstract: Provided is a nucleic acid analyzer, which does not require manual processes by a highly trained operator such as a researcher and is easy to use, small-sized, capable of accepting multiple samples, and performs speedy analysis, and a nucleic acid analysis method using the analyzer. The analyzer and method perform detection in a plurality of exposure times, provide a program for determining a threshold for signal detection, and determine whether a faint signal peak is a false signal peak.
    Type: Grant
    Filed: May 9, 2014
    Date of Patent: August 7, 2018
    Assignee: Hitachi High-Technologies Corporation
    Inventors: Michiru Fujioka, Motohiro Yamazaki, Toru Yokoyama
  • Patent number: 10037868
    Abstract: The plasma processing apparatus includes: a processing chamber disposed inside a vacuum vessel; a first high-frequency power supply outputting a first high-frequency power for supplying an electric field to generate a plasma for use in processing a sample to be processed inside the processing chamber; a sample stage disposed inside the processing chamber with the sample placed on an upper surface thereof; a second high-frequency power supply intermittently outputting a second high-frequency power for generating a bias potential to an electrode disposed inside the sample stage and capable of variably adjusting the output time; and a function to adjust operation of the plasma processing apparatus using a result of detection of a temporal change in waveform of current or voltage in a transient state of the second high-frequency power in synchronism with start of the intermittent output of the second high-frequency power.
    Type: Grant
    Filed: February 20, 2015
    Date of Patent: July 31, 2018
    Assignee: HITACHI HIGH-TECHNOLOGIES CORPORATION
    Inventors: Koji Toyota, Koichi Yamamoto, Naoki Yasui
  • Patent number: 10037866
    Abstract: A charged particle beam apparatus with improved depth of focus and maintained/improved resolution has a charged particle source, an off-axis illumination aperture, a lens, a computer, and a memory unit. The apparatus acquires an image by detecting a signal generated by irradiating a sample with a charged particle beam caused from the charged particle source via the off-axis illumination aperture. The computer has a beam-computing-process unit to estimate a beam profile of the charged particle beam and an image-sharpening-process unit to sharpen the image using the estimated beam profile.
    Type: Grant
    Filed: July 22, 2016
    Date of Patent: July 31, 2018
    Assignee: HITACHI HIGH-TECHNOLOGIES CORPORATION
    Inventors: Momoyo Enyama, Muneyuki Fukuda, Hideyuki Kazumi, Koichi Hamada, Sayaka Tanimoto
  • Patent number: 10037909
    Abstract: In a plasma processing apparatus, a connector section with the film-like electrode of a sintered plate of a sample stage to which high-frequency power is supplied includes a conductor section disposed inside a through hole, an upper part of which is bonded to the film-like electrode and a lower part of which is connected to an end of a power supply path of the high-frequency power, and a boss disposed between the conductor section and a substrate surrounding an outer periphery of the conductor section inside the through hole and made of an insulating material. Upper ends of a rod-like member at the center of the conductor section and a socket surrounding the rod-like member are disposed at a position higher than the boss, and an adhesive is prevented from entering between the socket and the rod-like member in the upper end of the socket.
    Type: Grant
    Filed: February 19, 2015
    Date of Patent: July 31, 2018
    Assignee: HITACHI HIGH-TECHNOLOGIES CORPORATION
    Inventors: Tooru Aramaki, Michikazu Morimoto, Kenetsu Yokogawa
  • Patent number: 10036737
    Abstract: An analysis system is provided with: a storage unit that stores first information associating mass spectrometry result information with an analysis condition concerning ion mobility separation; and a control unit that determines, as a first analysis condition for an ion to be measured, the analysis condition associated with the mass spectrometry result information of the first information corresponding to the mass spectrometry result information of the ion to be measured.
    Type: Grant
    Filed: April 10, 2014
    Date of Patent: July 31, 2018
    Assignee: Hitachi High-Technologies Corporation
    Inventors: Hiroyuki Satake, Yuichiro Hashimoto, Masao Suga, Hideki Hasegawa
  • Patent number: 10031147
    Abstract: Provided are an automatic analysis device and a maintenance support system which prevent a failure that occurs between regular inspection periods to thereby reduce the downtime of the automatic analysis device. A maintenance support system acquires, from each of a plurality of automatic analysis devices (100), pulse information transmitted from the automatic analysis device (100) provided with a mechanism which is driven by a pulse motor, and a transmission means which transmits pulse information including tow among a driving pulse value for driving the pulse motor, a consumed pulse amount that is a pulse amount consumed when the pulse motor has actually been driven, and a remaining pulse amount obtained by subtracting the consumed pulse amount from the driving pulse value, and stores at least the consumed pulse amount.
    Type: Grant
    Filed: July 23, 2013
    Date of Patent: July 24, 2018
    Assignee: Hitachi High-Technologies Corporation
    Inventor: Atsushi Nakajima
  • Patent number: 10031083
    Abstract: The purpose of the present invention is to control, with a simple structure and high accuracy, irradiation of excitation light to a multi-nanopore substrate without interrupting a measurement. Irradiation of excitation light is performed concurrently to at least one nanopore and at least one reference object on a substrate mounted in an observation container 103. A position irradiated with the excitation light in a measurement sample is calculated on the basis of a signal generated from the reference object detected by a detector 109, and the measurement and a fixed position control is performed concurrently by performing measurement of the measurement object while a drive control part 115 controlling the position of the irradiation of the excitation light to the measurement sample on the basis of the calculation result, whereby an analysis of the measurement sample can be performed in a short time.
    Type: Grant
    Filed: October 16, 2014
    Date of Patent: July 24, 2018
    Assignee: HITACHI HIGH-TECHNOLOGIES CORPORATION
    Inventors: Michiru Fujioka, Tsuyoshi Sonehara, Naoshi Itabashi
  • Patent number: 10031152
    Abstract: A pressure sensor detects the inner pressure of a probe at the time of suction of a specimen and a memory stores therein a plurality of clogging detection parameters in accordance with pressure in the vacuum blood collection tube. The clogging detection parameter stored in the memory is selected in accordance with the pressure in the vacuum blood collection tube, and a determination of the clogging of the probe is performed based on the selected clogging detection parameter and the inner pressure at the time of suction of the specimen detected in the pressure sensor.
    Type: Grant
    Filed: January 9, 2015
    Date of Patent: July 24, 2018
    Assignee: Hitachi High-Technologies Corporation
    Inventors: Yoshiki Muramatsu, Takamichi Mori, Kazuhiro Nakamura
  • Patent number: 10024828
    Abstract: An adsorbent which enables solid phase extraction of water-soluble molecules with high efficiency and excellent selectivity and an analysis system using the adsorbent, the adsorbent containing a structure represented by the formula I wherein R is a carrier component, the moiety other than R is a side-chain functional group, R and the benzene ring in the side-chain functional group are bonded directly or bonded through one or more atoms, R? is selected from the group consisting of hydroxy group, alkoxy group, amino group, alkylamino group, thiol group and alkyl sulfide group, R? is independently selected from the group consisting of hydroxy group, alkoxy group, alkyl group, amino group, alkylamino group, dialkylamino group, trialkylamino group, thiol group, alkyl sulfide group and hydrogen atom, x is an integer of zero or more and three or less, and n is the number of the side-chain functional groups contained in the carrier component.
    Type: Grant
    Filed: May 7, 2014
    Date of Patent: July 17, 2018
    Assignee: Hitachi High-Technologies Corporation
    Inventors: Jun Nunoshige, Shinya Ito, Hiroshi Nakano
  • Patent number: D827150
    Type: Grant
    Filed: February 23, 2017
    Date of Patent: August 28, 2018
    Assignee: Hitachi High-Technologies Corporation
    Inventors: Hiroaki Nakagawa, Kengo Muramatsu
  • Patent number: D827151
    Type: Grant
    Filed: February 23, 2017
    Date of Patent: August 28, 2018
    Assignee: Hitachi High-Technologies Corporation
    Inventors: Hiroaki Nakagawa, Kengo Muramatsu