Patents Assigned to Inficon, Inc.
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Patent number: 11569079Abstract: A gas analyzer and a method for performing mass spectrometry analysis includes a membrane configured to receive an input flow of carrier gas. The membrane defines a variable thickness region between first and second positions along an input face of the membrane and separates the analyte sample into an output flow of analyte molecules. A mass spectrometer is disposed downstream of the membrane and includes an input orifice for receiving the output flow. The mass spectrometer is configured to perform a response profile analysis of the analyte molecules in the sample analyte.Type: GrantFiled: April 13, 2021Date of Patent: January 31, 2023Assignee: INFICON, Inc.Inventor: Shawn M. Briglin
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Publication number: 20220285184Abstract: A monitoring device for monitoring a fabrication process in a fabrication system. The monitored fabrication system includes a process chamber and a plurality of flow components. A quartz crystal microbalance (QCM) sensor monitors one flow component of the plurality of flow components of the fabrication system and is configured for exposure to a process chemistry in the one flow component during the fabrication process. A controller measures resonance frequency shifts of the QCM sensor due to interactions between the QCM sensor and the process chemistry in the one flow component during the fabrication process. The controller determines a parameter of the fabrication process in the process chamber as a function of the measured resonance frequency shifts of the QCM sensor within the one flow component.Type: ApplicationFiled: May 16, 2022Publication date: September 8, 2022Applicant: INFICON, Inc.Inventors: Mohamed Buhary Rinzan, Chunhua Song, Steve James Lakeman
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Publication number: 20220165559Abstract: An ion source assembly for use in a mass spectrometer comprises a first anode defining a first ionization volume and a first electron source positioned proximate the first anode and configured to generate electrons that pass through the first anode and into the first ionization volume. The ions source assembly further includes a second anode defining a second ionization volume and a second electron source positioned proximate to the second anode and configured to generate to generate electrons that pass through the second anode and into the second ionization volume. At least one optical element is positioned proximate the first ionization volume and defines an aperture. The first and second anodes and the first and second ionization volumes are positioned along an ion optical axis of the mass spectrometer, and the first anode is positioned between the second anode and the aperture.Type: ApplicationFiled: June 24, 2021Publication date: May 26, 2022Applicant: INFICON, Inc.Inventor: Michael F. Vollero
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Patent number: 11335575Abstract: A monitoring device for monitoring a fabrication process in a fabrication system. The monitored fabrication system includes a process chamber and a plurality of flow components. A quartz crystal microbalance (QCM) sensor monitors one flow component of the plurality of flow components of the fabrication system and is configured for exposure to a process chemistry in the one flow component during the fabrication process. A controller measures resonance frequency shifts of the QCM sensor due to interactions between the QCM sensor and the process chemistry in the one flow component during the fabrication process. The controller determines a parameter of the fabrication process in the process chamber as a function of the measured resonance frequency shifts of the QCM sensor within the one flow component.Type: GrantFiled: August 24, 2018Date of Patent: May 17, 2022Assignee: INFICON, Inc.Inventors: Mohamed Buhary Rinzan, Chunhua Song, Steve James Lakeman
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Patent number: 11282687Abstract: Methods and systems for chemical analysis. For instance, a device for chemical analysis of a sample includes a housing, an inlet, a pump, multiple membranes and at least one detector. The housing contains an interior chamber of the device. The inlet on the housing introduces the sample into the interior chamber. The pump is connected to the housing to form a partial vacuum in the interior chamber. The multiple membranes have different response times to different constituents of the sample. The multiple membranes include at least a first membrane and a second membrane. The multiple membranes have different response times to different constituents of the sample. The detector is for detecting the different constituents of the sample after interaction with the multiple membranes. In addition, a method for chemical analysis of a sample. A first step includes introducing a sample to multiple membranes having different response times to different constituents of the sample.Type: GrantFiled: August 21, 2020Date of Patent: March 22, 2022Assignee: INFICON, Inc.Inventors: Kenneth C. Wright, Jaime L. Winfield, Peter Santariello
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Patent number: 11175323Abstract: Devices, systems and methods for process monitoring are presented. For instance, the device includes a crystal and a reactance sensor. The crystal is connected to a frequency measurement circuit. The reactance sensor is connected to the crystal. The reactance sensor is configured to detect a change in a process parameter. The frequency measurement circuit detects the change in the process parameter as a change in the frequency of the crystal. In another example, the system includes a reactance sensor and a measurement device. The reactance sensor is disposed in a process chamber, and has a variable reactance responsive to a change in a process parameter. The measurement device is disposed outside the process chamber and has a frequency measurement circuit. The frequency measurement circuit includes a crystal and is connected to the reactance sensor, and detects the change in the process parameter as a change in the frequency of the crystal.Type: GrantFiled: March 17, 2017Date of Patent: November 16, 2021Assignee: INFICON, INC.Inventor: Mohamed Buhary Rinzan
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Publication number: 20210319992Abstract: A gas analyzer and a method for performing mass spectrometry analysis includes a membrane configured to receive an input flow of carrier gas. The membrane defines a variable thickness region between first and second positions along an input face of the membrane and separates the analyte sample into an output flow of analyte molecules. A mass spectrometer is disposed downstream of the membrane and includes an input orifice for receiving the output flow. The mass spectrometer is configured to perform a response profile analysis of the analyte molecules in the sample analyte.Type: ApplicationFiled: April 13, 2021Publication date: October 14, 2021Applicant: INFICON, Inc.Inventor: Shawn M. Briglin
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Patent number: 10985000Abstract: A system for analyzing an analyte is described herein. The system includes a chamber having an inlet and a semi-permeable membrane arranged to seal the inlet. The semi-permeable membrane includes a cross-linked mixture of a first compound and a second compound. The system can also include a radiation source arranged in the vacuum chamber, the radiation source spaced apart from the semi-permeable membrane and adapted to irradiate the semi-permeable membrane with electromagnetic radiation at a frequency at least partially absorbed by the semi-permeable membrane.Type: GrantFiled: January 29, 2018Date of Patent: April 20, 2021Assignee: INFICON, Inc.Inventors: Kenneth Charles Wright, Guido F. Verbeck, IV
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Publication number: 20200381234Abstract: Methods and systems for chemical analysis. For instance, a device for chemical analysis of a sample includes a housing, an inlet, a pump, multiple membranes and at least one detector. The housing contains an interior chamber of the device. The inlet on the housing introduces the sample into the interior chamber. The pump is connected to the housing to form a partial vacuum in the interior chamber. The multiple membranes have different response times to different constituents of the sample. The multiple membranes include at least a first membrane and a second membrane. The multiple membranes have different response times to different constituents of the sample. The detector is for detecting the different constituents of the sample after interaction with the multiple membranes. In addition, a method for chemical analysis of a sample. A first step includes introducing a sample to multiple membranes having different response times to different constituents of the sample.Type: ApplicationFiled: August 21, 2020Publication date: December 3, 2020Applicant: INFICON, Inc.Inventors: Kenneth C. Wright, Jaime L. Winfield, Peter Santariello
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Publication number: 20200325580Abstract: A system for monitoring thin film deposition is described. The system includes a quartz crystal and a synthesizer to generate a modulated signal. The modulated signal is to be grounded through the quartz crystal. The system also includes a phase detector to determine a phase of the modulated signal from the quartz crystal in order to monitor thin film deposition. A modulation index can be selected so that, at resonance, high frequency of the signal matches the crystal frequency.Type: ApplicationFiled: June 25, 2020Publication date: October 15, 2020Applicant: INFICON, Inc.Inventor: Mohamed B. Rinzan
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Patent number: 10755909Abstract: Methods and systems for chemical analysis. For instance, a device for chemical analysis of a sample includes a housing, an inlet, a pump, multiple membranes and at least one detector. The housing contains an interior chamber of the device. The inlet on the housing introduces the sample into the interior chamber. The pump is connected to the housing to form a partial vacuum in the interior chamber. The multiple membranes have different response times to different constituents of the sample. The multiple membranes include at least a first membrane and a second membrane. At least one of the first membrane and the second membrane comprises a tubular portion. The multiple membranes have different response times to different constituents of the sample. The detector is for detecting the different constituents of the sample after interaction with the multiple membranes. In addition, a method for chemical analysis of a sample.Type: GrantFiled: May 8, 2019Date of Patent: August 25, 2020Assignee: INFICON, Inc.Inventors: Kenneth C. Wright, Jaime L. Winfield, Peter Santariello
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Patent number: 10704150Abstract: A system for monitoring thin film deposition is described. The system includes a quartz crystal and a synthesizer to generate a modulated signal. The modulated signal is to be grounded through the quartz crystal. The system also includes a phase detector to determine a phase of the modulated signal from the quartz crystal in order to monitor thin film deposition. A modulation index can be selected so that, at resonance, high frequency of the signal matches the crystal frequency.Type: GrantFiled: October 3, 2014Date of Patent: July 7, 2020Assignee: INFICON, Inc.Inventor: Mohamed Buhary Rinzan
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Publication number: 20200176291Abstract: A monitoring device for monitoring a fabrication process in a fabrication system. The monitored fabrication system includes a process chamber and a plurality of flow components. A quartz crystal microbalance (QCM) sensor monitors one flow component of the plurality of flow components of the fabrication system and is configured for exposure to a process chemistry in the one flow component during the fabrication process. A controller measures resonance frequency shifts of the QCM sensor due to interactions between the QCM sensor and the process chemistry in the one flow component during the fabrication process. The controller determines a parameter of the fabrication process in the process chamber as a function of the measured resonance frequency shifts of the QCM sensor within the one flow component.Type: ApplicationFiled: August 24, 2018Publication date: June 4, 2020Applicant: INFICON. Inc.Inventors: Mohamed Buhary Rinzan, Chunhua Song, Steve James Lakeman
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Patent number: 10502651Abstract: Systems and methods for in-situ leak detection and endpoint detection of wafer dry etch or chamber clean in chambers, e.g., vacuum chambers used in semiconductor processing. A mini environment is created and a sensor, such as an SPOES sensor, can be used in the mini-environment to perform leak detection.Type: GrantFiled: October 5, 2016Date of Patent: December 10, 2019Assignee: INFICON, INC.Inventor: Chenglong Yang
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Publication number: 20190348267Abstract: Methods and systems for chemical analysis. For instance, a device for chemical analysis of a sample includes a housing, an inlet, a pump, multiple membranes and at least one detector. The housing contains an interior chamber of the device. The inlet on the housing introduces the sample into the interior chamber. The pump is connected to the housing to form a partial vacuum in the interior chamber. The multiple membranes have different response times to different constituents of the sample. The multiple membranes include at least a first membrane and a second membrane. At least one of the first membrane and the second membrane comprises a tubular portion. The multiple membranes have different response times to different constituents of the sample. The detector is for detecting the different constituents of the sample after interaction with the multiple membranes. In addition, a method for chemical analysis of a sample.Type: ApplicationFiled: May 8, 2019Publication date: November 14, 2019Applicant: INFICON, Inc.Inventors: Kenneth C. Wright, Jaime L. Winfield, Peter Santafiello
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Patent number: 10175198Abstract: A system and method for chemical analysis are described herein. The system includes a probe, a sample collection cartridge, and a chemical analyzer. The probe is configured to collect the optimal amount of sample for a future analysis and to store this chemical sample in the sample collection cartridge. The probe also collects sample data. The chemical analyzer is configured to determine the optimal analysis settings based on the sample data and analyze the chemical sample stored in the sample collection cartridge based on the optimal analysis settings.Type: GrantFiled: February 16, 2017Date of Patent: January 8, 2019Assignee: Inficon, Inc.Inventors: Shawn Michael Briglin, Katherine Abigail Bartholomew
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Patent number: 10047437Abstract: Systems for a managing a chemical process and photoionization detectors for analyzing a process gas are presented. In one aspect, the system includes a process gas source in fluid communication with the process chamber and a photoionization detector. The photoionization detector is configured to analyze the process gas. The photoionization detector includes a heat resistant coupling for connection to the system, a gas sample chamber with the radiation window soldered or brazed to a wall of the gas sample chamber, and a radiation source configured to emit radiation through the radiation window and into the gas sample chamber to analyze the process gas. In another aspect, the photoionization detector includes a removable coupling, a gas sample chamber, and a radiation source. The removable coupling is for connection to the process gas handling system and includes a metal gasket and metal flanges.Type: GrantFiled: June 14, 2016Date of Patent: August 14, 2018Assignee: INFICON, INC.Inventors: Michael F. Vollero, Shawn M. Briglin
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Patent number: 9645125Abstract: A method of measuring an atmosphere in a guest vacuum chamber of a vacuum tool includes measuring a first composition of the atmosphere in the host vacuum chamber using a residual gas analyzer (RGA). The host and guest vacuum chambers are not coupled during the measuring of the first composition. The host vacuum chamber is coupled to the guest vacuum chamber, so the atmospheres in each can mix in the host vacuum chamber. A second composition of the atmosphere in the host vacuum chamber is measured using the RGA after the chambers are coupled. Using a processor, a composition of the guest atmosphere is automatically determined using the measured first and second compositions. A vacuum tool can include the host and guest chambers, the valve, the RGA, and a processor configured to control the valve to carry out this or other methods.Type: GrantFiled: December 4, 2013Date of Patent: May 9, 2017Assignee: INFICON, INC.Inventor: Chenglong Yang
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Patent number: 9506895Abstract: A combination retainer and electrical contact mechanism for a deposition monitor sensor includes a sensor body and a removable flexible electrical contact spanning between a fixed electrical (contact) element in the sensor's body and one face of an associated monitor crystal. A retainer insulates or insures electrical isolation of the spanning electrical contact from unwanted contact to electrically grounded components in which at least one of the retainer and crystal holder include features that maintain the electrical contact with the retainer in order to provide a single mechanism.Type: GrantFiled: May 17, 2013Date of Patent: November 29, 2016Assignee: INFICON, INC.Inventor: Carl A. Gogol, Jr.
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Patent number: 9217663Abstract: A sound velocity sensor is defined by a hermetic multi-chambered enclosure for containing flowing gases and mixtures of gases. The contained flowing gases are acoustically excited and the acoustic energy is measured over a fixed distance between a first sending end of the enclosure and a receiving end. The speed of sound of the gases are determined by comparing the energy transmitted through the flowing gases at various frequencies so as to precisely determine the resonant frequency of the gases flowing through the enclosure. In accordance with the present design, the chambers of the enclosure include internal transition shapes therebetween for optimizing the transmission of acoustic energy through the flowing gases and also enhancing one or more additional resonant modes at higher useful frequencies. The transition shapes used in connection with the sensor can be at least one of parabolic, hyperbolic, linear and exponential in nature.Type: GrantFiled: November 21, 2012Date of Patent: December 22, 2015Assignee: Inficon, Inc.Inventor: Abdul Wajid