Abstract: A semiconductor device is formed in a semiconductor substrate comprising a first main surface and includes a control gate disposed in a lower portion of a first trench formed in the first main surface, a floating gate disposed in the first trench above the control gate and insulated from the control gate, a source region of a first conductivity type, a body region of a second conductivity type, and a drain region of the first conductivity type.
Abstract: An electronic device is disclosed. In one embodiment, the electronic device includes a substrate, a plurality of conducting lines formed on a first conducting material that is disposed on the substrate, and a layer of a second conducting material disposed on the plurality of conducting lines. The conducting lines include a top face and a side face. The layer of the second conducting material includes a first thickness disposed on each of the top faces and a second thickness disposed on each of the side faces. To this end, the first thickness is greater than the second thickness.
Abstract: An electronic component includes a semiconductor substrate defined by a generally planar first face, a generally planar second face and side faces extending between the generally planar second face and the generally planar first face. The semiconductor substrate has a curved contour between the generally planar second face and the side faces.
Abstract: In a method for producing an electronic component, a substrate is doped by introducing doping atoms. In the doped substrate, at least one connection region of the electronic component is formed by doping with doping atoms. Furthermore, at least one additional doped region is formed at least below the at least one connection region by doping with doping atoms. Furthermore, at least one well region is formed in the substrate by doping with doping atoms in such a way that the well region doping is blocked at least below the at least one additional doped region.
Type:
Grant
Filed:
June 16, 2006
Date of Patent:
April 29, 2014
Assignee:
Infineon Technologies AG
Inventors:
Philipp Riess, Henning Feick, Martin Wendel
Abstract: A manufacturing method provides a semiconductor device with a substrate layer and an epitaxial layer adjoining the substrate layer. The epitaxial layer includes first columns and second columns of different conductivity types. The first and second columns extend along a main crystal direction along which channeling of implanted ions occurs from a first surface into the epitaxial layer. A vertical dopant profile of one of the first and second columns includes first portions separated by second portions. In the first portions a dopant concentration varies by at most 30%. In the second portions the dopant concentration is lower than in the first portions. The ratio of a total length of the first portions to the total length of the first and second portions is at least 50%. The uniform dopant profiles improve device characteristics.
Type:
Grant
Filed:
July 18, 2012
Date of Patent:
April 29, 2014
Assignee:
Infineon Technologies AG
Inventors:
Hans-Joachim Schulze, Johannes Laven, Dieter Fuchs, Werner Schustereder, Roman Knoefler
Abstract: According to an embodiment, a semiconductor device includes a semiconductor substrate and an amorphous semi-insulating layer on the semiconductor substrate.
Abstract: A device and method of making a device is disclosed. One embodiment provides a substrate. A semiconductor chip is provided having a first surface with a roughness of at least 100 nm. A diffusion soldering process is performed to join the first surface of the semiconductor chip to the substrate.
Type:
Grant
Filed:
July 3, 2012
Date of Patent:
April 29, 2014
Assignee:
Infineon Technologies AG
Inventors:
Paul Ganitzer, Francisco Javier Santos Rodriguez, Martin Sporn, Daniel Kraft
Abstract: In accordance with an embodiment, a method of operating a gate driving circuit includes receiving a reference timing pulse, measuring the received timing pulse according to a local clock generator of the gate driving circuit, and generating a switching control signal based on the measured received timing pulse.
Type:
Grant
Filed:
August 29, 2012
Date of Patent:
April 29, 2014
Assignee:
Infineon Technologies Austria AG
Inventors:
Jens Barrenscheen, Laurent Beaurenaut, Marco Bachhuber, Tommaso Bacigalupo, Marcus Nuebling
Abstract: In one embodiment, a method of forming a semiconductor device includes forming a first inductor coil within and/or over a substrate. The first inductor coil is formed adjacent a top side of the substrate. First trenches are formed within the substrate adjacent the first inductor coil. The first trenches are filled at least partially with a magnetic fill material. At least a first portion of the substrate underlying the first inductor coil is thinned. A backside magnetic layer is formed under the first portion of the substrate. The backside magnetic layer and the magnetic fill material form at least a part of a magnetic core region of the first inductor coil.
Type:
Grant
Filed:
May 28, 2013
Date of Patent:
April 29, 2014
Assignee:
Infineon Technologies AG
Inventors:
Renate Hofmann, Carsten Ahrens, Wolfgang Klein, Alexander Glas
Abstract: The present invention relates to a circuit arrangement having the following features: a load transistor having a control connection and a first and second load connection; a drive connection coupled to the control connection of the load transistor and serving for the application of a drive signal; a voltage limiting circuit connected between one of the load connections and the drive connection of the transistor; and a deactivation circuit connected to the voltage limiting circuit and serving for the deactivation of the voltage limiting circuit in a manner dependent on a deactivation signal, which is dependent on a load current through the load transistor and/or on a drive voltage of the load transistor.
Type:
Grant
Filed:
March 16, 2012
Date of Patent:
April 29, 2014
Assignee:
Infineon Technologies AG
Inventors:
Christian Arndt, Veli Kartal, Rainald Sander
Abstract: A receiver for receiving messages from a transmitter includes a controller and a driver stage for providing a supply voltage to the transmitter based on a control signal. The controller is configured to provide the control signal to compensate for changes of the supply voltage caused by a modulation of the current consumption of the transmitter, such that the supply voltage remains in a predefined range. Furthermore, the controller is configured to evaluate a series of succeeding values of the control signal to derive a message generated by the transmitter by modulating its current consumption.
Abstract: In various embodiments, a method for manufacturing a semiconductor device is provided. The method for manufacturing a semiconductor device may include forming a first source/drain region, forming a second source/drain region, forming an active region electrically coupled between the first source/drain region and the second source/drain region, forming a trench disposed between the second source/drain region and at least a portion of the active region, forming a first isolation layer disposed over the bottom and the sidewalls of the trench, forming electrically conductive material disposed over the isolation layer in the trench, forming a second isolation layer disposed over the active region, and forming a gate region disposed over the second isolation layer. The electrically conductive material may be coupled to an electrical contact.
Type:
Application
Filed:
December 24, 2013
Publication date:
April 24, 2014
Applicant:
Infineon Technologies AG
Inventors:
Mayank Shrivastava, Harald Gossner, Ramgopal Rao, Maryam Shojaei Baghini
Abstract: A module includes a semiconductor chip having at least a first terminal contact surface and a second terminal contact surface. A first bond element made of a material on the basis of Cu is attached to the first terminal contact surface, and a second bond element is attached to the second terminal contact surface. The second bond element is made of a material different from the material of the first bond element or is made of a type of bond element different from the type of the first bond element.
Abstract: In one embodiment of the present invention, a semiconductor package includes a substrate having a first major surface and an opposite second major surface. A chip is disposed in the substrate. The chip includes a plurality of contact pads at the first major surface. A first antenna structure is disposed at the first major surface. A reflector is disposed at the second major surface.
Type:
Application
Filed:
January 8, 2013
Publication date:
April 24, 2014
Applicant:
Infineon Technologies AG
Inventors:
Maciej Wojnowski, Walter Hartner, Ottmar Geitner, Gottfried Beer, Klaus Pressel, Mehran Pour Mousavi
Abstract: Representative implementations of devices and techniques provide improved electrical performance of components, such as chip dice, for example, disposed on different layers of a multi-layer printed circuit board (PCB). In an example, the components may be embedded within layers of the PCB. An insulating layer located between two component layers or sets of layers includes a conductive portion that may be strategically located to provide electrical connectivity between the components. The conductive portion may also be arranged to improve thermal conductivity between points of the PCB.
Abstract: Representative implementations of devices and techniques provide improved electrical access to components, such as chip dice, for example, disposed within layers of a multi-layer printed circuit board (PCB). One or more insulating layers may be located on either side of a spacer layer containing the components. The insulating layers may have apertures strategically located to provide electrical connectivity between the components and conductive layers of the PCB.
Abstract: In various embodiments, a die is provided. The die may include a physical unclonable function circuit configured to provide an output signal, wherein the output signal is dependent on at least one physical characteristic specific to the die; and a self-test circuit integrated with the physical unclonable function circuit on the die, wherein the self-test circuit is configured to provide at least one test input signal to the physical unclonable function circuit and to determine as to whether the output signal provided in response to the at least one test input signal fulfills a predefined criterion.
Abstract: An apparatus has a support and a plurality of bendable and conductive microstructures extending from the support. Two adjacent microstructures of the plurality of microstructures define a detectable first state if they are not bent such that end portions thereof, which are distal with respect to the support, do not touch each other, and the two adjacent microstructures of the plurality of microstructures define a detectable second state if they are bent such that the end portions thereof, which are distal with respect to the support, touch each other and are fixed to each other.
Abstract: A backing plate for a sputter target includes a target receiving part for receiving a target to be sputtered, and a structure for exposing the target receiving part through the backing plate.
Type:
Application
Filed:
October 19, 2012
Publication date:
April 24, 2014
Applicant:
INFINEON TECHNOLOGIES AG
Inventors:
Markus Fischer, Wolfram Karcher, Barbara Jeansannetas