Abstract: A power supply system includes multiple power converter phases. A controller (e.g., a processor device) monitors energy delivery for each of multiple power converter phases that supply energy to a load. The controller analyzes the energy delivery associated with each of the multiple power converter phases to identify an imbalance of energy delivered by the multiple power converter phases to the load. Based on the analyzing and detection of an imbalance condition, the controller modifies a future order of activating the multiple power converter phases for powering the load. Accordingly, a single phase of a multiphase switching power converter may be prevented from becoming overloaded while delivering energy to power the load.

Abstract: A III-nitride heterojunction power semiconductor device that includes a passivation body with a gate well having a top mouth that is wider than the bottom mouth thereof, and a method of fabrication for the same.

Abstract: According to one disclosed embodiment, an enhancement mode high electron mobility transistor (HEMT) comprises a heterojunction including a group III-V barrier layer situated over a group III-V semiconductor body, and a gate structure formed over the group III-V barrier layer and including a P type group III-V gate layer. The P type group III-V gate layer prevents a two dimensional electron gas (2DEG) from being formed under the gate structure. One embodiment of a method for fabricating such an enhancement mode HEMT comprises providing a substrate, forming a group III-V semiconductor body over the substrate, forming a group III-V barrier layer over the group III-V semiconductor body, and forming a gate structure including the P type group III-V gate layer over the group III-V barrier layer.

Abstract: According to an exemplary embodiment, a power semiconductor package includes a power module having a plurality of power devices. Each of the plurality of power devices can be a power switch. The power semiconductor package also includes a double-sided heat sink with a top side in contact with a plurality of power device top surfaces and a bottom side in contact with a bottom surface of the power module. The power semiconductor package can include at least one fastening clamp pressing the top side and the bottom side of the double-sided heat sink into the power module. The double-sided heat sink can also include a water-cooling element.

Abstract: According to one configuration, a monitor circuit monitors a delivery of power supplied by one or more switch devices to a dynamic load. Based on an amount of power delivered to the load as measured by the monitor circuit, a control circuit produces a voltage control signal. A gate bias voltage generator circuit utilizes the voltage control signal to generate a switch activation voltage or bias voltage. A switch drive circuit uses the switch activation voltage as generated by the bias voltage generator to activate each of the one or more switch devices during a portion of a switching cycle when a respective switch device is in an ON state, and the respective switch device conducts current from a voltage source through the switch device to the load. The control circuit adjusts the voltage control signal to modify a level of the switch activation voltage depending on the dynamic load.

Abstract: A level shift circuit in accordance with the present application seeks to meet the need of high voltage level shift signaling with minimum delay and power dissipation by using parasitic emulation, blocking of signaling during times of common mode noise, and mismatch filtering to enhance operation robustness to circuit mismatch and delay. A dv/dt sensing circuit is provided to detect any slew in offset between negative supply voltages and ground in a circuit. This detection is used to control a noise canceling circuit to ensure that noise that results from that offset is not propagated to the output of the level shift circuit. A parasitic emulator is preferably used to provide dv/dt sensing. The output of the parasitic emulator is used to activate a noise canceling circuit to prevent noise from reaching the output terminal of the level shift circuit.

Abstract: A method and apparatus for equalizing phase currents in multiphase switching power converters is described in which pairs of stored digital values that directly or indirectly control the values of the currents in the conversion phases are altered in equal and opposite increments. In one embodiment the digital values being controlled are the relative on-times of the power switches in pairs of conversion phase. The method is stepwise and repetitive in the sense that, instead of calculating or inferring offset values that seek to bring all of the currents in the phases toward equality, pairs of phase currents are altered repetitively and iteratively, using equal and opposite steps in the values of their respective control variables, until the phases are all sufficiently close in value. The steps may be of fixed size or the step size may be selectively modified to optimize the convergence time of the algorithm.

Abstract: According to one embodiment, a semiconductor wafer comprises a plurality of solder bumps for providing device contacts formed over a functional region of the semiconductor wafer, and one or more support rings surrounding the functional region. The one or more support rings and the plurality of solder bumps are formed so as to have substantially matching heights. The presence of the one or more support rings causes the semiconductor wafer to have a substantially uniform thickness in the functional region after a thinning process is performed on the semiconductor wafer. A method for fabricating the semiconductor wafer comprises forming the plurality of solder bumps over the functional region, and forming the one or more support rings surrounding the functional region before performing the thinning process on the semiconductor wafer.

Abstract: Some exemplary embodiments of a direct contact leadless package and related structure and method, especially suitable for packaging high current semiconductor devices, have been disclosed. One exemplary structure comprises a first contact lead frame portion, a paddle portion, and an extended contact lead frame portion held together by a mold compound. A first semiconductor device is attached to a top side of the paddle portion and is enclosed by said mold compound, while a second semiconductor device is attached to a bottom side of said paddle portion and is in electrical contact with said the first semiconductor device. The extended contact lead frame portion is in direct electrical contact with the second semiconductor device without using a bond wire. Alternative exemplary embodiments may include additional extended lead frame portions, paddle portions, and semiconductor devices in various configurations.

Abstract: One exemplary disclosed embodiment comprises a semiconductor package including multiple transistors having a common drain coupled to an exposed conductive clip. A driver integrated circuit (IC) may control the transistors for various power applications. By exposing a top surface of the exposed conductive clip outside of a mold compound of the package, enhanced thermal performance is provided. Additionally, the conductive clip provides a short distance, high current carrying route between transistors of the package, providing higher electrical performance and reduced form factor compared to conventional designs with individually packaged transistors.

Abstract: One exemplary disclosed embodiment comprises a semiconductor package including an inside pad, a transistor, and a conductive clip coupled to the inside pad and a terminal of the transistor. A top surface of the conductive clip is substantially exposed at the top of the package, and a side surface of the conductive clip is exposed at a side of the package. By supporting the semiconductor package on an outside pad during the fabrication process and by removing the outside pad during singulation, the conductive clip may be kept substantially parallel and in alignment with the package substrate while optimizing the package form factor compared to conventional packages. The exposed top surface of the conductive clip may be further attached to a heat sink for enhanced thermal dissipation.

Abstract: One exemplary disclosed embodiment comprises a semiconductor package including multiple transistors coupled to an exposed conductive clip. A driver integrated circuit (IC) may control the transistors to implement a buck converter. By exposing a top surface of the exposed conductive clip outside of a mold compound of the package, enhanced thermal performance is provided. Additionally, the conductive clip provides a short distance, high current carrying route between transistors of the package, providing higher electrical performance and reduced form factor compared to conventional designs with individually packaged transistors.

Abstract: A semiconductor device is formed in a thin float zone wafer. Junctions are diffused into the top surface of the wafer and the wafer is then reduced in thickness by removal of material from its bottom surface. A weak collector is then formed in the bottom surface by diffusion of boron (for a P type collector). The weak collector is then formed or activated only over spaced or intermittent areas. This is done by implant of the collector impurity through a screening mask; or by activating only intermittent areas by a laser beam anneal in which the beam is directed to anneal only preselected areas. The resulting device has an effective very low implant dose, producing a reduced switching energy and increased switching speed, as compared to prior art weak collector/anodes and life time killing technologies.

Abstract: Some exemplary embodiments of high voltage cascoded III-nitride semiconductor package with a stamped leadframe have been disclosed. One exemplary embodiment comprises a III-nitride transistor having an anode of a diode stacked atop a source of the III-nitride transistor, and a stamped leadframe comprising a first bent lead coupled to a gate of the III-nitride transistor and the anode of the diode, and a second bent lead coupled to a drain of the III-nitride transistor. The bent leads expose respective flat portions that are surface mountable. In this manner, reduced package footprint, improved surge current capability, and higher performance may be achieved compared to conventional wire bonded packages. Furthermore, since multiple packages may be assembled at a time, high integration and cost savings may be achieved compared to conventional methods requiring individual package processing and externally sourced parts.

Abstract: Some exemplary embodiments of high voltage cascaded III-nitride semiconductor package with an etched leadframe have been disclosed. One exemplary embodiment comprises a III-nitride transistor having an anode of a diode stacked over a source of the III-nitride transistor, and a leadframe that is etched to form a first leadframe paddle portion coupled to a gate of the III-nitride transistor and the anode of the diode, and a second leadframe paddle portion coupled to a drain of the III-nitride transistor. The leadframe paddle portions enable the package to be surface mountable. In this manner, reduced package footprint, improved surge current capability, and higher performance may be achieved compared to conventional wire bonded packages. Furthermore, since multiple packages may be assembled at a time, high integration and cost savings may be achieved compared to conventional methods requiring individual package processing and externally sourced parts.

Abstract: Some exemplary embodiments of high voltage cascoded III-nitride semiconductor package utilizing clips on a package support surface have been disclosed. One exemplary embodiment comprises a III-nitride transistor attached to a package support surface and having an anode of a diode stacked over a source of the III-nitride transistor, a first conductive clip coupled to a gate of the III-nitride transistor and the anode of the diode, and a second conductive clip coupled to a drain of the III-nitride transistor. The conductive clips are connected to the package support surface and expose respective flat portions that are surface mountable. In this manner, reduced package footprint, improved surge current capability, and higher performance may be achieved compared to conventional wire bonded packages. Furthermore, since a low cost printed circuit board (PCB) may be utilized for the package support surface, expensive leadless fabrication processes may be avoided for cost effective manufacturing.

Abstract: In one implementation, an integrated power stage includes a common die situated over a load stage, the common die includes a driver stage and power switches. The power switches include a control transistor and a sync transistor. A drain of the control transistor receives an input voltage of the common die on one side (e.g., on a top surface) of the common die. A source of the control transistor is coupled to a drain of the sync transistor and provides an output voltage of the common die on an opposite side (e.g., on a bottom surface) of the common die. An interposer may be included under the power stage and includes an output inductor and optionally an output capacitor coupled to the output voltage of the common die on the opposite side of the common die.

Abstract: According to an exemplary embodiment, a bondwireless power module residing on a top surface of a substrate includes at least one input power pad providing power to the module and at least one output current pad providing output current from the module. At least one press-fit input power clamp engages a top side of the at least one input power pad, and engages a bottom surface of the substrate. Also, at least one press-fit output current clamp engages a top side of the at least one output current pad, and engages the bottom surface of the substrate. The at least one press-fit input power clamp can include at least one top prong and at least one bottom prong. Furthermore, the at least one bottom prong can press the input power pad into the at least one top prong.

Abstract: A vertically arranged laterally diffused metal-oxide-semiconductor (LDMOS) device comprises a trench extending into a semiconductor body toward a semiconductor substrate. The trench includes sidewalls, a bottom portion connecting the sidewalls, a dielectric material lining the trench and a diffusion agent layer lining the dielectric material. A lightly doped drain region adjoins the trench and extends laterally around the sidewalls from the diffusion agent layer into the semiconductor body. In one embodiment, a method for fabricating a vertically arranged LDMOS device comprises forming a trench extending into a semiconductor body toward a semiconductor substrate, the trench including sidewalls, a bottom portion connecting the sidewalls, a dielectric material lining the trench and a diffusion agent layer lining the dielectric material.

Abstract: A power semiconductor device which includes a gate contact on one surface thereof connected to a gate bus on another opposing surface thereof using a conductive body extending through a via between the two surfaces of the device.