Abstract: The present invention relates to an improvement in spectral analysis in spectrometry, particularly in a technique of spectral analysis by spectral classification at high speed. A spectral analysis device 10 comprises: a measurement unit 20 that measures a sample spectrum of a target sample 30; and an analysis unit 40 that analyses the sample spectrum, and analyses a compound contained in the target sample 30, wherein the analysis unit has a library that is processed with an arithmetic processing in advance, the library has a plurality of compound groups to which the compound is classified, and the analysis unit further comprises an analysis display part 42, the analysis display part 42 displays, in real time, the compound group to which the compound belongs during analysis of the sample spectrum as the analysis progress or analysis result.

Abstract: An Attenuated total reflection measuring apparatus capable of Raman spectral measurement has an infrared optical instrument and a Raman module. The infrared optical instrument is disposed on an ATR prism side of a sample, and is provided to irradiate the ATR prism with an infrared light, and collect the infrared light from the ATR prism. The Raman module is disposed on a side opposite to the ATR prism side relative to the sample, and has a guide tube that outputs an excitation light from an excitation light source to the sample, and a lens portion disposed inside thereof. An end of the guide tube is in a position to push the sample to the ATR prism. The Raman module has a lens position adjustment mechanism that moves the lens portion along an optical axis, and a spectroscope that detects a Raman scattering light collected by the lens portion.

Abstract: A circular dichroism measurement device includes: a sample part having a sample; a PEM that modulates a polarization state of an incoming light to the sample part or an outgoing light from the sample part; a photo detector that detects a change in a light intensity of the outgoing light from the sample part; an amplifier that amplifies a detection signal from the photo detector; an A/D converter that converts the detection signal amplified by the amplifier to a digital signal; and a digital processing device that executes a signal processing to the digital signal from the A/D converter to acquire a measurement value of circular dichroism of the sample. The A/D converter is configured to convert the detection signal, that is amplified in a state of containing the AC component and the DC component of the light intensity that changes with the same frequency as the modulation frequency of PEM.

Abstract: A circular dichroism measurement apparatus includes a laser light source (QCL) capable of sweeping a wavenumber of a laser light in an infrared wavenumber range containing at least one peak of the sample; a sample chamber where the sample is disposed; a photoelastic modulator that modulates a polarization state of the laser light before or after the laser light of a specific wavenumber in a wavenumber sweep transmits the sample; a detector that detects a variation in intensity of the laser light which transmitted the sample and of which its polarization state is modulated; and a signal processing device that extracts an alternating-current component (AC) that synchronize with a modulation frequency and a direct-current component (DC) from a detected signal of the detector, and calculates a value of infrared circular dichroism of the sample based on a ratio (AC/DC) of the AC and DC.

Abstract: A Fourier transform infrared spectrometer (FTIR) includes: an infrared light source; an interferometer; a semiconductor laser for position reference of a movable mirror thereof; and a computer that performs Fourier transformation to a detected signal of an infrared interference wave from a sample to calculate a spectrum based on a memorized wavelength of the semiconductor laser and a detected value of a laser interference wave by a laser detector. The computer executes a program for calculating a spectrum of a solid reference sample, interpolating the spectrum of the reference sample in a wavenumber region of a unique peak, reading out a wavenumber of the unique peak based on a data after interpolation, and updating the wavelength of the semiconductor laser used in Fourier transformation such that the read-out value of the wavenumber falls within a specific range having an original wavenumber of the unique peak as a reference.

Abstract: An infrared spectrometer includes: an openable sealed housing that houses optical components; an infrared light source that irradiates an infrared light into the housing; a dehumidifying agent that dehumidifies an inside of the housing; a thermos-hygro sensor that detects a humidity inside the housing; and a light source control apparatus that controls power supply to the infrared light source. The light source control apparatus: starts the infrared light source while limiting power supply to the infrared light source; determines presence/absence of a risk of condensation inside the sealed housing based on detected value of humidity detected while power is supplied to the infrared light source; if the risk of condensation is present, balances a rate of increase of the detected value of humidity and a rate of decrease of humidity, and at the same time, increases power supply to the infrared light source gradually.

Abstract: A spectrometer capable of providing information, to a measurer, necessary for determining whether a sample set to the spectrometer is a sample expected by the measurer or not before a main measurement includes a data processor and a display. The data processor calculates a preliminary spectral information of the sample based on at least n of a latest detected signal and a BKG information retained in advance, calculates and updates the preliminary spectral information based on at least n of the latest detected signal and the BKG information again, and repeats these calculations and updates. The display shows the preliminary spectral information that is calculated and updated in the preview display. The data processor starts integration of N (N>n) of the detected signal during a preview display of the preliminary spectral information, and acquires a spectral information of the sample.

Abstract: An Attenuated total reflection measuring apparatus capable of Raman spectral measurement has an infrared optical instrument and a Raman module. The infrared optical instrument is disposed on an ATR prism side of a sample, and is provided to irradiate the ATR prism with an infrared light, and collect the infrared light from the ATR prism. The Raman module is disposed on a side opposite to the ATR prism side relative to the sample, and has a guide tube that outputs an excitation light from an excitation light source to the sample, and a lens portion disposed inside thereof. An end of the guide tube is in a position to push the sample to the ATR prism. The Raman module has a lens position adjustment mechanism that moves the lens portion along an optical axis, and a spectroscope that detects a Raman scattering light collected by the lens portion.

Abstract: The present invention relates to improvement in accuracy of an automatic sample detection technique in spectrometry of a microspectroscope.

Abstract: The present invention provides a reflective polarized-light separating diffraction-element usable in a wide wavelength region including an ultraviolet region, and an optical measurement device comprising the same. The reflective polarized-light separating diffraction-element comprises: a substrate (1); a reflection surface (2) formed on a surface of the substrate (1); and a lattice structured body assembly (3) that is provided on the reflection surface (2) and shows a form birefringence (?n*). The lattice structured body assembly (3) consists of lattice structured bodies (3A, 3B, 3C and 3D) of four patterns having lattice structures of different azimuths. The lattice structured bodies (3A, 3B, 3C and 3D) of a plurality of patterns are aligned on the reflection surface 2 in a predetermined direction such that the azimuths of the lattice structures change in a structurally periodic manner.

Abstract: A filter unit for a Raman microscope mounted with a dark-field objective lens unit includes a frame body, a plurality of UV-LED elements that is disposed around a window part of the frame body to emit UV light, and a long-pass filter that is supported to the frame body to cover the window part of the frame body and transmits a light having a wavelength longer than the wavelength of the UV light. The filter unit has a dark-field UV irradiation function, and is able to impart a fluorescence observation function to the Raman microscope.

Abstract: A multiple-reflection apparatus and a multiple-reflection cell includes: a pair of parallel plane mirrors that multiply reflects a laser light, in zigzag, which enters at a specific angle of incidence; a right-angle double mirror having two perpendicular reflection surfaces for returning the multiple-reflection light that traveled to one end between the parallel plane mirrors; and a right-angle double mirror having two perpendicular reflection surfaces for returning the multiple-reflection light that traveled from the right-angle double mirror on one end side to the other end between the parallel plane mirrors. When the two parallel mirror surfaces configuring the parallel plane mirrors are disposed to be parallel to the z-x plane of the x-y-z axial coordinate system, the two reflection surfaces configuring the right-angle double mirror are perpendicular to the x-y plane, and the laser light entering at the angle ? of incidence crosses the x-y plane at a specific angle [[?z]].

Abstract: A phase difference control device comprises: a splitting polarizer splitting a light incident from a light source into a measurement light and a reference light, both of which are linearly polarized; a PEM imparting a phase difference to the measurement and reference lights to correspond to the spectrometry; a PEM driver supplying a modulation voltage to the PEM; a PEM control circuit inputting the reference light as a feedback signal and outputting a modulation control quantity signal to the PEM driver; and a CPU circuit monitoring the wavelength of the light in the splitting polarizer to input a wavelength variation as a wavelength signal, wherein the CPU circuit converts the wavelength signal to a feedforward signal which is output to the PEM control circuit; and the PEM control circuit performs arithmetic processing by the feedback and feedforward signals to output the modulation control quantity signal to the PEM driver.

Abstract: A sample injection device includes: a sample container; a sample loop; a syringe, a liquid transfer channel; a first channel switching valve that switches the sample loop to be detachable to the liquid transfer channel; and a second channel switching valve that switches the channel of the syringe together with the first channel switching valve.

Abstract: A method of reducing noise in an output signal of a differential refractive index detection part (RI detection part) of a dual-flow type with an analysis device having the RI detection part includes sending a sample liquid to a sample cell with a sample pump, sending a reference liquid to a reference cell with a reference pump, and detecting a change in direction of travel of light sequentially transmitted through the two cells with a light detector. Before starting RI measurement, a phase difference between the sample pump and the reference pump is adjusted so that a noise that occurs in an output signal of the light detector by propagation of pulsation from the sample pump within the sample cell and a noise that occurs in the output signal of the light detector by propagation of pulsation from the reference pump within the reference cell cancel each other.

Abstract: Based on an HT voltage value of each data point applied to a light detector and a plurality of reference spectra measured, in measurement of a reference substance performed for a plurality of times, a weighting function deriver of a spectrum measuring device derives a relation between the HT voltage value (HTi) and a degree of dispersion ?i of a plurality of spectral values as a weighting function (?=f(HT)). Moreover, a numerical evaluator of the spectrum measuring device is configured to calculate a degree of individual coincidence between a sample spectrum and the reference spectrum, acquire the degree of dispersion ?i by applying the HT voltage value at measuring the sample spectrum to the weighting function as a weighting value, and evaluate the difference between the reference spectrum and the sample spectrum based on the degree of individual coincidence to which the weighting value is applied.

Abstract: A circular dichroism measurement device includes: a sample part having a sample; a PEM that modulates a polarization state of an incoming light to the sample part or an outgoing light from the sample part; a photo detector that detects a change in a light intensity of the outgoing light from the sample part; an amplifier that amplifies a detection signal from the photo detector; an A/D converter that converts the detection signal amplified by the amplifier to a digital signal; and a digital processing device that executes a signal processing to the digital signal from the A/D converter to acquire a measurement value of circular dichroism of the sample. The A/D converter is configured to convert the detection signal, that is amplified in a state of containing the AC component and the DC component of the light intensity that changes with the same frequency as the modulation frequency of PEM.

Abstract: A method of analyzing foreign matter in a sample includes: measuring an optical spectrum for each of a plurality of measurement points of a measurement region on the sample by a microscopic spectroscope; calculating a feature value of each measured spectrum by a computer; determining whether each of the measurement points is on the foreign matter or not based on each feature value; retaining the spectrum of the measurement point that is determined to be on the foreign matter, and deleting the spectrum of the measurement point that is not determined to be on the foreign matter or storing the same to a storage unit; and executing multivariate analysis of the spectra of the plurality of the measurement points that are determined to be on the foreign matter or classifying the same with AI search.

Abstract: A method of analyzing foreign matter in a sample includes: measuring an optical spectrum for each of a plurality of measurement points of a measurement region on the sample by a microscopic spectroscope; calculating a feature value of each measured spectrum by a computer; determining whether each of the measurement points is on the foreign matter or not based on each feature value; retaining the spectrum of the measurement point that is determined to be on the foreign matter, and deleting the spectrum of the measurement point that is not determined to be on the foreign matter or storing the same to a storage unit; and executing multivariate analysis of the spectra of the plurality of the measurement points that are determined to be on the foreign matter or classifying the same with AI search.

Abstract: A filter unit for a Raman microscope mounted with a dark-field objective lens unit includes a frame body, a plurality of UV-LED elements that is disposed around a window part of the frame body to emit UV light, and a long-pass filter that is supported to the frame body to cover the window part of the frame body and transmits a light having a wavelength longer than the wavelength of the UV light. The filter unit has a dark-field UV irradiation function, and is able to impart a fluorescence observation function to the Raman microscope.